FR2634285B1 - Procede et dispositif de mesure de signaux electro-optiques - Google Patents
Procede et dispositif de mesure de signaux electro-optiquesInfo
- Publication number
- FR2634285B1 FR2634285B1 FR898909552A FR8909552A FR2634285B1 FR 2634285 B1 FR2634285 B1 FR 2634285B1 FR 898909552 A FR898909552 A FR 898909552A FR 8909552 A FR8909552 A FR 8909552A FR 2634285 B1 FR2634285 B1 FR 2634285B1
- Authority
- FR
- France
- Prior art keywords
- optic signals
- measuring electro
- electro
- measuring
- optic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
- G01R1/071—Non contact-making probes containing electro-optic elements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Current Or Voltage (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/218,178 US4873485A (en) | 1988-07-13 | 1988-07-13 | Electro-optic signal measurement |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2634285A1 FR2634285A1 (fr) | 1990-01-19 |
FR2634285B1 true FR2634285B1 (fr) | 1992-08-28 |
Family
ID=22814059
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR898909552A Expired - Fee Related FR2634285B1 (fr) | 1988-07-13 | 1989-07-13 | Procede et dispositif de mesure de signaux electro-optiques |
Country Status (5)
Country | Link |
---|---|
US (1) | US4873485A (fr) |
JP (1) | JP2768744B2 (fr) |
DE (1) | DE3923177A1 (fr) |
FR (1) | FR2634285B1 (fr) |
GB (2) | GB2222674B (fr) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5164664A (en) * | 1990-10-09 | 1992-11-17 | Siemens Aktiengesellschaft | Method for the optical measurement of electrical potentials |
US5280173A (en) * | 1992-01-31 | 1994-01-18 | Brown University Research Foundation | Electric and electromagnetic field sensing system including an optical transducer |
JP3220252B2 (ja) * | 1992-09-10 | 2001-10-22 | 浜松ホトニクス株式会社 | Eoプローブ |
US5406194A (en) * | 1992-09-21 | 1995-04-11 | At&T Corp. | Alx Ga1-x as probe for use in electro-optic sampling |
WO1997045747A1 (fr) * | 1996-05-31 | 1997-12-04 | Rensselaer Polytechnic Institute | Dispositif electro-optique et magneto-optique et procede pour deceler le rayonnement electromagnetique dans l'espace libre |
US5952818A (en) * | 1996-05-31 | 1999-09-14 | Rensselaer Polytechnic Institute | Electro-optical sensing apparatus and method for characterizing free-space electromagnetic radiation |
US6414473B1 (en) | 1996-05-31 | 2002-07-02 | Rensselaer Polytechnic Institute | Electro-optic/magneto-optic measurement of electromagnetic radiation using chirped optical pulse |
JP2001050985A (ja) * | 1999-05-31 | 2001-02-23 | Ando Electric Co Ltd | 電気光学プローブ |
JP4841124B2 (ja) * | 2004-07-29 | 2011-12-21 | Necエンベデッドプロダクツ株式会社 | 電子機器およびその製造方法 |
US11125815B2 (en) * | 2019-09-27 | 2021-09-21 | Advanced Micro Devices, Inc. | Electro-optic waveform analysis process |
CN112462154A (zh) * | 2020-11-10 | 2021-03-09 | 武汉大学 | 测量电气设备金具表面电场强度的装置及方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2433432C2 (de) * | 1974-07-11 | 1976-08-05 | Siemens AG, 1000 Berlin und 8000 München | Magnetooptischer HochspannungsstrommeBwandler |
US4482863A (en) * | 1981-08-14 | 1984-11-13 | At&T Bell Laboratories | Apparatus and method for measuring electronic response of high speed devices and materials |
US4446425A (en) * | 1982-02-12 | 1984-05-01 | The University Of Rochester | Measurement of electrical signals with picosecond resolution |
US4525687A (en) * | 1983-02-28 | 1985-06-25 | At&T Bell Laboratories | High speed light modulator using multiple quantum well structures |
US4618819A (en) * | 1984-03-27 | 1986-10-21 | The University Of Rochester | Measurement of electrical signals with subpicosecond resolution |
US4603293A (en) * | 1984-03-27 | 1986-07-29 | University Of Rochester | Measurement of electrical signals with subpicosecond resolution |
US4681449A (en) * | 1984-09-07 | 1987-07-21 | Stanford University | High speed testing of electronic circuits by electro-optic sampling |
EP0197196A1 (fr) * | 1985-03-08 | 1986-10-15 | The University Of Rochester | Oscilloscope électro-optique-électronique pour pouvoir analyser dans le temps des ondes électriques dans le domaine de pico-seconde |
US4761620A (en) * | 1986-12-03 | 1988-08-02 | American Telephone And Telegraph Company, At&T Bell Laboratories | Optical reading of quantum well device |
JPH0660912B2 (ja) * | 1987-09-07 | 1994-08-10 | 浜松ホトニクス株式会社 | 電圧検出装置 |
-
1988
- 1988-07-13 US US07/218,178 patent/US4873485A/en not_active Expired - Fee Related
-
1989
- 1989-07-05 GB GB8915428A patent/GB2222674B/en not_active Expired - Fee Related
- 1989-07-12 JP JP1178188A patent/JP2768744B2/ja not_active Expired - Lifetime
- 1989-07-13 FR FR898909552A patent/FR2634285B1/fr not_active Expired - Fee Related
- 1989-07-13 DE DE3923177A patent/DE3923177A1/de not_active Ceased
-
1992
- 1992-11-16 GB GB9224028A patent/GB2259569B/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
FR2634285A1 (fr) | 1990-01-19 |
GB9224028D0 (en) | 1993-01-06 |
JPH02134584A (ja) | 1990-05-23 |
US4873485A (en) | 1989-10-10 |
GB8915428D0 (en) | 1989-08-23 |
GB2259569A (en) | 1993-03-17 |
GB2222674B (en) | 1993-06-02 |
DE3923177A1 (de) | 1990-01-18 |
GB2259569B (en) | 1993-06-02 |
JP2768744B2 (ja) | 1998-06-25 |
GB2222674A (en) | 1990-03-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |