DE2819861A1 - Integrierte schaltung mit komplementaeren mos-transistoren - Google Patents
Integrierte schaltung mit komplementaeren mos-transistorenInfo
- Publication number
- DE2819861A1 DE2819861A1 DE19782819861 DE2819861A DE2819861A1 DE 2819861 A1 DE2819861 A1 DE 2819861A1 DE 19782819861 DE19782819861 DE 19782819861 DE 2819861 A DE2819861 A DE 2819861A DE 2819861 A1 DE2819861 A1 DE 2819861A1
- Authority
- DE
- Germany
- Prior art keywords
- doping
- transistor
- type
- integrated circuit
- transistors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/637—Lateral IGFETs having no inversion channels, e.g. buried channel lateral IGFETs, normally-on lateral IGFETs or depletion-mode lateral IGFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/40—Resistors
- H10D1/43—Resistors having PN junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/8311—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET] the IGFETs characterised by having different channel structures
Landscapes
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CH563777A CH616024A5 (enExample) | 1977-05-05 | 1977-05-05 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2819861A1 true DE2819861A1 (de) | 1978-11-09 |
Family
ID=4296944
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19782819861 Withdrawn DE2819861A1 (de) | 1977-05-05 | 1978-05-05 | Integrierte schaltung mit komplementaeren mos-transistoren |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4205342A (enExample) |
| JP (1) | JPS549589A (enExample) |
| CH (1) | CH616024A5 (enExample) |
| DE (1) | DE2819861A1 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4295897B1 (en) * | 1979-10-03 | 1997-09-09 | Texas Instruments Inc | Method of making cmos integrated circuit device |
| US4391650A (en) * | 1980-12-22 | 1983-07-05 | Ncr Corporation | Method for fabricating improved complementary metal oxide semiconductor devices |
| NL8304035A (nl) * | 1983-11-24 | 1985-06-17 | Philips Nv | Blooming ongevoelige beeldopneeminrichting en werkwijze ter vervaardiging daarvan. |
| EP0182876B1 (en) * | 1984-05-25 | 1990-10-24 | American Microsystems, Incorporated | Tri-well cmos technology |
| JPS61229366A (ja) * | 1985-04-03 | 1986-10-13 | Rohm Co Ltd | 半導体装置の製造方法 |
| JPS61229367A (ja) * | 1985-04-04 | 1986-10-13 | Rohm Co Ltd | 半導体装置およびその製造方法 |
| US4717836A (en) * | 1986-02-04 | 1988-01-05 | Burr-Brown Corporation | CMOS input level shifting circuit with temperature-compensating n-channel field effect transistor structure |
| JPS6384067A (ja) * | 1986-09-27 | 1988-04-14 | Toshiba Corp | 半導体装置の製造方法 |
| JPH0191446A (ja) * | 1987-10-02 | 1989-04-11 | Matsushita Electric Ind Co Ltd | 半導体装置およびその製造方法 |
| US6211555B1 (en) | 1998-09-29 | 2001-04-03 | Lsi Logic Corporation | Semiconductor device with a pair of transistors having dual work function gate electrodes |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3374406A (en) * | 1964-06-01 | 1968-03-19 | Rca Corp | Insulated-gate field-effect transistor |
| US3436622A (en) * | 1966-12-20 | 1969-04-01 | Texas Instruments Inc | Compound channel insulated gate triode |
| US3593069A (en) * | 1969-10-08 | 1971-07-13 | Nat Semiconductor Corp | Integrated circuit resistor and method of making the same |
| US3608189A (en) * | 1970-01-07 | 1971-09-28 | Gen Electric | Method of making complementary field-effect transistors by single step diffusion |
| US3646665A (en) * | 1970-05-22 | 1972-03-07 | Gen Electric | Complementary mis-fet devices and method of fabrication |
| US3821776A (en) * | 1970-12-28 | 1974-06-28 | Kogyo Gijutsuin | Diffusion self aligned mosfet with pinch off isolation |
| US3898105A (en) * | 1973-10-25 | 1975-08-05 | Mostek Corp | Method for making FET circuits |
| US3967295A (en) * | 1975-04-03 | 1976-06-29 | Rca Corporation | Input transient protection for integrated circuit element |
-
1977
- 1977-05-05 CH CH563777A patent/CH616024A5/fr not_active IP Right Cessation
-
1978
- 1978-04-21 US US05/898,681 patent/US4205342A/en not_active Expired - Lifetime
- 1978-05-02 JP JP5242878A patent/JPS549589A/ja active Pending
- 1978-05-05 DE DE19782819861 patent/DE2819861A1/de not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| CH616024A5 (enExample) | 1980-02-29 |
| US4205342A (en) | 1980-05-27 |
| JPS549589A (en) | 1979-01-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE69419871T2 (de) | Doppelt-implantierte MOS-Anordnung mit seitlicher Diffusion und Verfahren zur Herstellung | |
| DE3853778T2 (de) | Verfahren zur Herstellung eines Halbleiterbauelements. | |
| DE2728167A1 (de) | Verfahren zur vorbereitung eines siliziumsubstrats fuer die herstellung von mos-bauelementen | |
| DE68920491T2 (de) | Integrierte Halbleiterschaltung, bestehend aus einer Differenztransistorschaltung mit einem Paar von FETs. | |
| EP0033003B1 (de) | Zweifach diffundierter Metalloxidsilicium-Feldeffekttransistor und Verfahren zu seiner Herstellung | |
| DE2911132A1 (de) | Verfahren zur bildung einer kontaktzone zwischen schichten aus polysilizium | |
| DE2655998C2 (de) | Isolierschicht-Feldeffekttransistor mit zusammengesetztem Kanal und Verfahren zu seiner Herstellung | |
| DE2933694A1 (de) | Integrierter schaltkreis | |
| DE1076275B (de) | Halbleiteranordnung mit mindestens einem flaechenhaften pn-UEbergang | |
| DE2500047A1 (de) | Verfahren zur herstellung von metalloxid-halbleitereinrichtungen | |
| DE2902368A1 (de) | Komplementaer-mos-inverter | |
| DE3228574A1 (de) | Referenzspannungsgenerator | |
| DE2160462C2 (de) | Halbleiteranordnung und Verfahren zu ihrer Herstellung | |
| DE2819861A1 (de) | Integrierte schaltung mit komplementaeren mos-transistoren | |
| DE2064886A1 (de) | Integrierte Schaltung mit Feldeffekt transistoren Ausscheidung aus 2047672 | |
| DE2833068C2 (enExample) | ||
| DE2851954A1 (de) | Logisches schaltungsglied mit mos- transistoren | |
| DE2727944C2 (enExample) | ||
| DE2533460A1 (de) | Verfahren zur einstellung der schwellenspannung von feldeffekttransistoren | |
| DE2724165A1 (de) | Oberflaechen-feldeffekttransistorvorrichtung | |
| DE3230510C2 (de) | Variabler MIS-Widerstand | |
| DE102017217234A1 (de) | Halbleitervorrichtung | |
| DE69131390T2 (de) | Verfahren zur Herstellung einer vergrabenen Drain- oder Kollektorzone für monolythische Halbleiteranordnungen | |
| DE2729657A1 (de) | Feldeffekttransistor mit extrem kurzer kanallaenge | |
| DE2904480A1 (de) | Integrierte halbleiterschaltung und verfahren zu ihrem herstellen |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8110 | Request for examination paragraph 44 | ||
| 8139 | Disposal/non-payment of the annual fee |