DE2650779B2 - - Google Patents

Info

Publication number
DE2650779B2
DE2650779B2 DE2650779A DE2650779A DE2650779B2 DE 2650779 B2 DE2650779 B2 DE 2650779B2 DE 2650779 A DE2650779 A DE 2650779A DE 2650779 A DE2650779 A DE 2650779A DE 2650779 B2 DE2650779 B2 DE 2650779B2
Authority
DE
Germany
Prior art keywords
silicon
carbon content
tempering
atoms
irradiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE2650779A
Other languages
German (de)
English (en)
Other versions
DE2650779C3 (de
DE2650779A1 (de
Inventor
Peter Dr. 8000 Muenchen Voss
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE2650779A priority Critical patent/DE2650779C3/de
Priority to IT29091/77A priority patent/IT1088146B/it
Priority to JP13215477A priority patent/JPS5357968A/ja
Priority to DK491577A priority patent/DK491577A/da
Publication of DE2650779A1 publication Critical patent/DE2650779A1/de
Publication of DE2650779B2 publication Critical patent/DE2650779B2/de
Application granted granted Critical
Publication of DE2650779C3 publication Critical patent/DE2650779C3/de
Expired legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B31/00Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
    • C30B31/20Doping by irradiation with electromagnetic waves or by particle radiation
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B33/00After-treatment of single crystals or homogeneous polycrystalline material with defined structure
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P34/00Irradiation with electromagnetic or particle radiation of wafers, substrates or parts of devices
    • H10P34/20Irradiation with electromagnetic or particle radiation of wafers, substrates or parts of devices for inducing a nuclear reaction transmuting chemical elements

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
DE2650779A 1976-11-05 1976-11-05 Verfahren zum Ausheilen von Kristallgitterschäden in durch Neutroneneinstrahlung dotierten Siliciumkristallen Expired DE2650779C3 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE2650779A DE2650779C3 (de) 1976-11-05 1976-11-05 Verfahren zum Ausheilen von Kristallgitterschäden in durch Neutroneneinstrahlung dotierten Siliciumkristallen
IT29091/77A IT1088146B (it) 1976-11-05 1977-10-28 Procedimento per riparare lesioni del reticolo cristallino in cristalli di silicio drogato con l'isotopo del fosforo 31 p mediante irradiazione neutronica
JP13215477A JPS5357968A (en) 1976-11-05 1977-11-02 Method of recovering defects of silicon crystal irradiated by neutron
DK491577A DK491577A (da) 1976-11-05 1977-11-04 Fremgangsmaade til udbedring af krystalgitterskader i siliciumkrystaller der ved neutronbestraaling er doteret med phosphorisotopen 31p

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2650779A DE2650779C3 (de) 1976-11-05 1976-11-05 Verfahren zum Ausheilen von Kristallgitterschäden in durch Neutroneneinstrahlung dotierten Siliciumkristallen

Publications (3)

Publication Number Publication Date
DE2650779A1 DE2650779A1 (de) 1978-05-11
DE2650779B2 true DE2650779B2 (https=) 1979-01-11
DE2650779C3 DE2650779C3 (de) 1979-09-13

Family

ID=5992547

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2650779A Expired DE2650779C3 (de) 1976-11-05 1976-11-05 Verfahren zum Ausheilen von Kristallgitterschäden in durch Neutroneneinstrahlung dotierten Siliciumkristallen

Country Status (4)

Country Link
JP (1) JPS5357968A (https=)
DE (1) DE2650779C3 (https=)
DK (1) DK491577A (https=)
IT (1) IT1088146B (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04132693A (ja) * 1990-09-21 1992-05-06 Shin Etsu Handotai Co Ltd 中性子照射シリコン単結晶の熱処理方法

Also Published As

Publication number Publication date
IT1088146B (it) 1985-06-10
DE2650779C3 (de) 1979-09-13
DE2650779A1 (de) 1978-05-11
DK491577A (da) 1978-05-06
JPS6116760B2 (https=) 1986-05-01
JPS5357968A (en) 1978-05-25

Similar Documents

Publication Publication Date Title
DE19829309B4 (de) Verfahren zur Herstellung eines thermischen Oxidfilms auf Siliciumcarbid
DE2013576C3 (de) Verfahren zum Aufbringen von dotierten und undotierten Kieselsäurefilmen auf Halbleiteroberflächen
DE69022269T2 (de) Verfahren zur thermischen Behandlung von Silizium.
DE1489258C2 (de) Verfahren zum Herstellen des Stromkanals eines Feldeffekttransistors
DE2038564B2 (de) Quarzglasgeraeteteil, insbesondere quarzglasrohr, mit in seiner aussenoberflaechenschicht enthaltenen, kristallbildung foerdernden keimen zur verwendung bei hohen temperaturen, insbesondere fuer die durchfuehrung halbleitertechnologischer verfahren
DE4438398A1 (de) Wärmebehandlungsverfahren für Verbindungshalbleiter
DE2931432C2 (de) Verfahren zum Eindiffundieren von Aluminium in Silizium-Halbleiterscheiben
DE3827496C2 (https=)
DE1154878B (de) Verfahren zur Herstellung von Halbleiterkoerpern fuer Halbleiteranordnungen aus n-leitendem Silizium durch Bestrahlen mit thermischen Neutronen
DE2650779B2 (https=)
DE69222074T2 (de) Verfahren zur Herstellung eines neutronenumwandlungsdotierten Czochralski-Silizium-Einkristalls
DE2316520A1 (de) Verfahren zum dotieren von halbleiterplaettchen durch diffusion aus einer auf das halbleitermaterial aufgebrachten schicht
DE2063726B2 (de) Verfahren zum Herstellen eines Halbleiterbauelements
DE1644045B2 (de) Verfahren zur Herstellung dotierter Galliumphosphideinkristalle zur Verwendung als Halbleiterkörper in elektrolumineszenten Bauelementen mit pnÜbergang
EP4151782B1 (de) Verfahren zur herstellung einer halbleiterscheibe aus einkristallinem silizium und halbleiterscheibe aus einkristallinem silizium
DE112019004418T5 (de) Verfahren zur auswertung der kohlenstoffkonzentration einer siliziumprobe, verfahren zur auswertung eines siliziumwaferherstellungsprozesses, verfahren zur herstellung eines siliziumwafers und verfahren zur herstellung eines siliziumeinkristallingots
DE2516514C3 (de) Verfahren zum Herstellen von durch Neutronenaktivierung dotierten SiIiciumeinkristallen
DE2700094A1 (de) Verfahren zum herstellen von hybridoxiden
DE69705469T2 (de) Verfahren zur Wärmebehandlung eines ZnSe Kristalls
DE2352033A1 (de) Verfahren zur bearbeitung von halbleiterplaettchen
DE1248023B (de) Verfahren zum Eindiffundieren von Gallium in einen Koerper aus Halbleitermaterial
DE2516514B2 (de) Verfahren zum herstellen von durch neutronenaktivierung dotierten siliciumeinkristallen
Seretlo Annealing of defects produced by room temperature irradiation in KCl: Ca and KCl: Sr crystals (II)
DE2362320A1 (de) Verfahren zum herstellen von homogendotierten siliciumeinkristallen durch neutronenbestrahlung
DE2014903A1 (de) Halbleitervorrichtung mit niedrigem Rauschpegel und Verfahren zu deren Herstellung

Legal Events

Date Code Title Description
OAP Request for examination filed
OD Request for examination
C3 Grant after two publication steps (3rd publication)
8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee