DE2362560A1 - Doppeltfokussierendes massenspektrometer mit mehreren ionenstrahlen - Google Patents
Doppeltfokussierendes massenspektrometer mit mehreren ionenstrahlenInfo
- Publication number
- DE2362560A1 DE2362560A1 DE2362560A DE2362560A DE2362560A1 DE 2362560 A1 DE2362560 A1 DE 2362560A1 DE 2362560 A DE2362560 A DE 2362560A DE 2362560 A DE2362560 A DE 2362560A DE 2362560 A1 DE2362560 A1 DE 2362560A1
- Authority
- DE
- Germany
- Prior art keywords
- electric field
- ion beams
- mass spectrometer
- ion
- ion beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000010884 ion-beam technique Methods 0.000 claims description 91
- 230000005684 electric field Effects 0.000 claims description 36
- 230000001133 acceleration Effects 0.000 claims description 30
- 150000002500 ions Chemical class 0.000 claims description 29
- 239000006185 dispersion Substances 0.000 claims description 7
- 230000003252 repetitive effect Effects 0.000 claims description 5
- 238000010894 electron beam technology Methods 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 239000010813 municipal solid waste Substances 0.000 claims 1
- 238000001819 mass spectrum Methods 0.000 description 6
- 230000004075 alteration Effects 0.000 description 5
- 230000006870 function Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 238000000926 separation method Methods 0.000 description 4
- 230000002411 adverse Effects 0.000 description 3
- 230000000737 periodic effect Effects 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 230000003111 delayed effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000001965 increasing effect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 102000004310 Ion Channels Human genes 0.000 description 1
- 208000007101 Muscle Cramp Diseases 0.000 description 1
- 108091081062 Repeated sequence (DNA) Proteins 0.000 description 1
- 208000005392 Spasm Diseases 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 230000000763 evoking effect Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/32—Static spectrometers using double focusing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47126947A JPS5222558B2 (OSRAM) | 1972-12-18 | 1972-12-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2362560A1 true DE2362560A1 (de) | 1974-06-20 |
Family
ID=14947820
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2362560A Ceased DE2362560A1 (de) | 1972-12-18 | 1973-12-17 | Doppeltfokussierendes massenspektrometer mit mehreren ionenstrahlen |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3886357A (OSRAM) |
| JP (1) | JPS5222558B2 (OSRAM) |
| DE (1) | DE2362560A1 (OSRAM) |
| FR (1) | FR2210821B3 (OSRAM) |
| GB (1) | GB1441290A (OSRAM) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3984682A (en) * | 1974-07-12 | 1976-10-05 | Nihon Denshi Kabushiki Kaisha | Mass spectrometer with superimposed electric and magnetic fields |
| JPH0273723U (OSRAM) * | 1988-11-26 | 1990-06-05 | ||
| GB9026777D0 (en) * | 1990-12-10 | 1991-01-30 | Vg Instr Group | Mass spectrometer with electrostatic energy filter |
| JP2005514737A (ja) * | 2002-01-03 | 2005-05-19 | インディアナ・ユニバーシティ・リサーチ・アンド・テクノロジー・コーポレーション | 化学情報の同時取得 |
| WO2004093123A2 (en) * | 2003-03-31 | 2004-10-28 | Beckman Coulter, Inc. | Mass analyzer capable of parallel processing one or more analytes |
| US6777670B1 (en) * | 2003-03-31 | 2004-08-17 | Beckman Coulter, Inc. | Mass analyzer capable of parallel processing one or more analytes |
| CN118778494A (zh) * | 2024-06-06 | 2024-10-15 | 中国核电工程有限公司 | 一种双聚焦质谱仪的电控系统、双聚焦质谱仪 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2945126A (en) * | 1958-06-23 | 1960-07-12 | Bell & Howell Co | Mass spectrometer |
| US3233099A (en) * | 1963-09-16 | 1966-02-01 | Cons Electrodynamics Corp | Double-focusing mass spectrometer having electrically adjustable electrostatic an alyzer and adjustable electrostatic lens |
| GB1134448A (en) * | 1965-09-30 | 1968-11-20 | Hitachi Ltd | Double focussing mass spectrometer |
| GB1149426A (en) * | 1966-12-01 | 1969-04-23 | Ass Elect Ind | Improvements relating to mass spectrometry |
| US3796872A (en) * | 1970-12-18 | 1974-03-12 | Ass Elect Ind | Mass spectrometry |
-
1972
- 1972-12-18 JP JP47126947A patent/JPS5222558B2/ja not_active Expired
-
1973
- 1973-12-17 FR FR7345066A patent/FR2210821B3/fr not_active Expired
- 1973-12-17 DE DE2362560A patent/DE2362560A1/de not_active Ceased
- 1973-12-18 GB GB5866573A patent/GB1441290A/en not_active Expired
- 1973-12-18 US US425923A patent/US3886357A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| FR2210821A1 (OSRAM) | 1974-07-12 |
| US3886357A (en) | 1975-05-27 |
| GB1441290A (en) | 1976-06-30 |
| JPS5222558B2 (OSRAM) | 1977-06-17 |
| JPS4984489A (OSRAM) | 1974-08-14 |
| FR2210821B3 (OSRAM) | 1976-10-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OD | Request for examination | ||
| 8131 | Rejection |