DE2158612C3 - Vorrichtung zum Prüfen von Schaltungsbaugruppen - Google Patents
Vorrichtung zum Prüfen von SchaltungsbaugruppenInfo
- Publication number
- DE2158612C3 DE2158612C3 DE2158612A DE2158612A DE2158612C3 DE 2158612 C3 DE2158612 C3 DE 2158612C3 DE 2158612 A DE2158612 A DE 2158612A DE 2158612 A DE2158612 A DE 2158612A DE 2158612 C3 DE2158612 C3 DE 2158612C3
- Authority
- DE
- Germany
- Prior art keywords
- test
- area
- rocker arm
- contact
- test area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 title claims description 105
- 230000000712 assembly Effects 0.000 title claims description 33
- 238000000429 assembly Methods 0.000 title claims description 33
- 238000000034 method Methods 0.000 claims description 8
- 230000005484 gravity Effects 0.000 claims description 5
- 230000000149 penetrating effect Effects 0.000 claims 1
- 238000010276 construction Methods 0.000 description 5
- 238000013461 design Methods 0.000 description 3
- 241001465754 Metazoa Species 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 210000003608 fece Anatomy 0.000 description 2
- 241000554155 Andes Species 0.000 description 1
- 229920002494 Zein Polymers 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000881 depressing effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007688 edging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000010871 livestock manure Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000013022 venting Methods 0.000 description 1
- 239000005019 zein Substances 0.000 description 1
- 229940093612 zein Drugs 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Relating To Insulation (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US9332270A | 1970-11-27 | 1970-11-27 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| DE2158612A1 DE2158612A1 (de) | 1972-07-20 |
| DE2158612B2 DE2158612B2 (de) | 1974-01-24 |
| DE2158612C3 true DE2158612C3 (de) | 1974-08-15 |
Family
ID=22238299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2158612A Expired DE2158612C3 (de) | 1970-11-27 | 1971-11-26 | Vorrichtung zum Prüfen von Schaltungsbaugruppen |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US3701021A (enExample) |
| JP (1) | JPS5110947B1 (enExample) |
| CA (1) | CA943186A (enExample) |
| DE (1) | DE2158612C3 (enExample) |
| FR (1) | FR2116102A5 (enExample) |
| GB (1) | GB1364695A (enExample) |
| IT (1) | IT941788B (enExample) |
| NL (1) | NL7116275A (enExample) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58169710U (ja) * | 1982-04-30 | 1983-11-12 | 日本ビクター株式会社 | 増幅回路 |
| DE3340185A1 (de) * | 1983-11-07 | 1985-05-15 | Multitest Elektronische Systeme GmbH, 8200 Rosenheim | Vorrichtung zum aufnehmen von bauteilen, insbesondere von integrierten chips, in einem eingangs- und/oder ausgangsmagazin einer bauteile-pruefmaschine |
| US4588092A (en) * | 1983-11-15 | 1986-05-13 | Automated Electronic Technology, Inc. | Integrated circuit handling and contact system |
| US4564110A (en) * | 1984-06-22 | 1986-01-14 | At&T Technologies, Inc. | Apparatus for positioning gravity fed components in an electrical test facility |
| US4691831A (en) * | 1984-06-25 | 1987-09-08 | Takeda Riken Co., Ltd. | IC test equipment |
| US4703858A (en) * | 1986-01-02 | 1987-11-03 | Multitest Elektronische Systeme Gmbh | Apparatus for testing and sorting oblong, electronic components, more particularly integrated chips |
| US4776747A (en) * | 1986-01-03 | 1988-10-11 | Motorola Inc. | High speed integrated circuit handler |
| US4674625A (en) * | 1986-01-03 | 1987-06-23 | Motorola Inc. | Transport mechanism for an automated integrated circuit handler |
| US4676359A (en) * | 1986-01-03 | 1987-06-30 | Motorola Inc. | Article ejector/sorter for an automated article handling system |
| US4660710A (en) * | 1986-01-03 | 1987-04-28 | Motorola Inc. | Integrated circuit sleeve handler |
| US4709801A (en) * | 1986-01-03 | 1987-12-01 | Motorola, Inc. | Input buffer and article injector mechanism for an automated article handler |
| DE8605799U1 (de) * | 1986-03-03 | 1986-09-11 | Microhandling Handhabungsgeräte GmbH, 8000 München | Vorrichtung zum Vereinzeln von IC's |
| US4970460A (en) * | 1987-10-05 | 1990-11-13 | Aetrium, Inc. | Controlled impedance testsite |
| US5065089A (en) * | 1990-06-01 | 1991-11-12 | Tovex Tech, Inc. | Circuit handler with sectioned rail |
| US5436567A (en) * | 1993-02-08 | 1995-07-25 | Automated Test Engineering, Inc. | Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts |
| US6794890B1 (en) * | 1999-07-27 | 2004-09-21 | Mitsubishi Denki Kabushiki Kaisha | Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested |
| JP2004509479A (ja) | 2000-09-19 | 2004-03-25 | ナノピアス・テクノロジーズ・インコーポレイテッド | 無線周波数識別装置における複数の部品および複数のアンテナを組み立てる方法 |
| CN1636167A (zh) * | 2000-10-24 | 2005-07-06 | 纳诺皮尔斯技术公司 | 用于印刷微粒改良的电触点的方法和材料 |
| US6897668B1 (en) * | 2003-11-28 | 2005-05-24 | Premtek International Inc. | Double-faced detecting devices for an electronic substrate |
| TWI271832B (en) * | 2005-10-07 | 2007-01-21 | King Yuan Electronics Co Ltd | Feeding apparatus |
| KR20100062326A (ko) * | 2008-12-02 | 2010-06-10 | 삼성전자주식회사 | 반도체 디바이스 테스트 장치 |
| CN114084570B (zh) * | 2022-01-20 | 2022-06-03 | 百信信息技术有限公司 | 一种服务器包装测试线 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3274534A (en) * | 1963-12-02 | 1966-09-20 | Gen Dynamics Corp | Electrical connector |
| US3363179A (en) * | 1964-03-23 | 1968-01-09 | Tektronix Inc | Apparatus for automatically testing electronic devices with movable probe containinga test circuit |
| US3408565A (en) * | 1966-03-02 | 1968-10-29 | Philco Ford Corp | Apparatus for sequentially testing electrical components under controlled environmental conditions including a component support mating test head |
-
1970
- 1970-11-27 US US93322A patent/US3701021A/en not_active Expired - Lifetime
-
1971
- 1971-11-16 GB GB5318571A patent/GB1364695A/en not_active Expired
- 1971-11-26 IT IT31700/71A patent/IT941788B/it active
- 1971-11-26 NL NL7116275A patent/NL7116275A/xx unknown
- 1971-11-26 DE DE2158612A patent/DE2158612C3/de not_active Expired
- 1971-11-26 FR FR7142478A patent/FR2116102A5/fr not_active Expired
- 1971-11-26 CA CA128,731A patent/CA943186A/en not_active Expired
- 1971-11-27 JP JP46095707A patent/JPS5110947B1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| DE2158612A1 (de) | 1972-07-20 |
| JPS5110947B1 (enExample) | 1976-04-07 |
| FR2116102A5 (enExample) | 1972-07-07 |
| IT941788B (it) | 1973-03-10 |
| DE2158612B2 (de) | 1974-01-24 |
| US3701021A (en) | 1972-10-24 |
| NL7116275A (enExample) | 1972-05-30 |
| GB1364695A (en) | 1974-08-29 |
| CA943186A (en) | 1974-03-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C3 | Grant after two publication steps (3rd publication) | ||
| E77 | Valid patent as to the heymanns-index 1977 | ||
| EHJ | Ceased/non-payment of the annual fee |