DE2014677A1 - - Google Patents
Info
- Publication number
- DE2014677A1 DE2014677A1 DE19702014677 DE2014677A DE2014677A1 DE 2014677 A1 DE2014677 A1 DE 2014677A1 DE 19702014677 DE19702014677 DE 19702014677 DE 2014677 A DE2014677 A DE 2014677A DE 2014677 A1 DE2014677 A1 DE 2014677A1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor
- superlattice
- energy
- semiconductor component
- component according
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims description 96
- 239000000463 material Substances 0.000 claims description 30
- 239000002800 charge carrier Substances 0.000 claims description 24
- 238000000034 method Methods 0.000 claims description 21
- 230000000737 periodic effect Effects 0.000 claims description 20
- 230000008569 process Effects 0.000 claims description 19
- 229910052732 germanium Inorganic materials 0.000 claims description 13
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 13
- 238000004519 manufacturing process Methods 0.000 claims description 9
- 239000000956 alloy Substances 0.000 claims description 8
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 claims description 7
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 7
- 229910045601 alloy Inorganic materials 0.000 claims description 7
- 239000000203 mixture Substances 0.000 claims description 6
- 229910000676 Si alloy Inorganic materials 0.000 claims description 5
- 238000005275 alloying Methods 0.000 claims description 5
- 238000005516 engineering process Methods 0.000 claims description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 4
- 239000010703 silicon Substances 0.000 claims description 4
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 claims description 3
- 230000002706 hydrostatic effect Effects 0.000 claims description 2
- 238000003780 insertion Methods 0.000 claims description 2
- 230000037431 insertion Effects 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 230000000694 effects Effects 0.000 description 22
- 239000013078 crystal Substances 0.000 description 14
- 230000003993 interaction Effects 0.000 description 11
- 230000008859 change Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 7
- 230000007704 transition Effects 0.000 description 6
- 239000000969 carrier Substances 0.000 description 5
- 239000004020 conductor Substances 0.000 description 4
- 239000000758 substrate Substances 0.000 description 3
- 229910000927 Ge alloy Inorganic materials 0.000 description 2
- 229910000673 Indium arsenide Inorganic materials 0.000 description 2
- 241001163743 Perlodes Species 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 230000005641 tunneling Effects 0.000 description 2
- 101100390736 Danio rerio fign gene Proteins 0.000 description 1
- 101100390738 Mus musculus Fign gene Proteins 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- MDPILPRLPQYEEN-UHFFFAOYSA-N aluminium arsenide Chemical compound [As]#[Al] MDPILPRLPQYEEN-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003534 oscillatory effect Effects 0.000 description 1
- 238000005381 potential energy Methods 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 238000009416 shuttering Methods 0.000 description 1
- 239000006104 solid solution Substances 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- RJAVVKVGAZUUIE-UHFFFAOYSA-N stibanylidynephosphane Chemical compound [Sb]#P RJAVVKVGAZUUIE-UHFFFAOYSA-N 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 230000003313 weakening effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N80/00—Bulk negative-resistance effect devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B9/00—Generation of oscillations using transit-time effects
- H03B9/12—Generation of oscillations using transit-time effects using solid state devices, e.g. Gunn-effect devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/81—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation
- H10D62/815—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW]
- H10D62/8161—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW] potential variation due to variations in composition or crystallinity, e.g. heterojunction superlattices
- H10D62/8162—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW] potential variation due to variations in composition or crystallinity, e.g. heterojunction superlattices having quantum effects only in the vertical direction, i.e. layered structures having quantum effects solely resulting from vertical potential variation
- H10D62/8164—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW] potential variation due to variations in composition or crystallinity, e.g. heterojunction superlattices having quantum effects only in the vertical direction, i.e. layered structures having quantum effects solely resulting from vertical potential variation comprising only semiconductor materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/81—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation
- H10D62/815—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW]
- H10D62/8171—Doping structures, e.g. doping superlattices or nipi superlattices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3425—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers comprising couples wells or superlattices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/065—Gp III-V generic compounds-processing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/067—Graded energy gap
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/072—Heterojunctions
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/097—Lattice strain and defects
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/169—Vacuum deposition, e.g. including molecular beam epitaxy
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Recrystallisation Techniques (AREA)
- Bipolar Transistors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US81187169A | 1969-04-01 | 1969-04-01 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| DE2014677A1 true DE2014677A1 (cg-RX-API-DMAC7.html) | 1970-10-15 |
| DE2014677B2 DE2014677B2 (de) | 1978-11-09 |
| DE2014677C3 DE2014677C3 (de) | 1979-07-19 |
Family
ID=25207828
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2014677A Expired DE2014677C3 (de) | 1969-04-01 | 1970-03-26 | Halbleiteroszillatorelement mit Übergitter |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US3626257A (cg-RX-API-DMAC7.html) |
| DE (1) | DE2014677C3 (cg-RX-API-DMAC7.html) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2388411A1 (fr) * | 1977-04-20 | 1978-11-17 | Ibm | Dispositif semi-conducteur et son procede de fabrication |
| EP0206117A1 (en) * | 1985-06-14 | 1986-12-30 | AT&T Corp. | A photodetector |
Families Citing this family (57)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2110317B1 (cg-RX-API-DMAC7.html) * | 1970-10-09 | 1975-04-18 | Siemens Ag | |
| DE2139436A1 (de) * | 1971-08-06 | 1973-02-22 | Licentia Gmbh | Halbleiterlaser |
| DE2261527C2 (de) * | 1972-12-15 | 1983-04-21 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen | Halbleiterkörper mit in einer vorgegebenen Richtung abwechselnd aufeinanderfolgenden n- und p-dotierten Zonen, Verfahren zu seiner Herstellung und Verwendungen des Halbleiterkörpers |
| FR2225207B1 (cg-RX-API-DMAC7.html) * | 1973-04-16 | 1978-04-21 | Ibm | |
| US3893148A (en) * | 1974-02-25 | 1975-07-01 | Us Navy | Layered superlattic switching and negative resistance devices |
| US4103312A (en) * | 1977-06-09 | 1978-07-25 | International Business Machines Corporation | Semiconductor memory devices |
| USRE33671E (en) * | 1978-04-24 | 1991-08-20 | At&T Bell Laboratories | Method of making high mobility multilayered heterojunction device employing modulated doping |
| US4163237A (en) * | 1978-04-24 | 1979-07-31 | Bell Telephone Laboratories, Incorporated | High mobility multilayered heterojunction devices employing modulated doping |
| US4194935A (en) * | 1978-04-24 | 1980-03-25 | Bell Telephone Laboratories, Incorporated | Method of making high mobility multilayered heterojunction devices employing modulated doping |
| US4205331A (en) * | 1978-06-09 | 1980-05-27 | The United States Of America As Represented By The Secretary Of The Army | Infrared optical devices of layered structure |
| US4250515A (en) * | 1978-06-09 | 1981-02-10 | The United States Of America As Represented By The Secretary Of The Army | Heterojunction superlattice with potential well depth greater than half the bandgap |
| US4198644A (en) * | 1978-06-09 | 1980-04-15 | The United States Of America As Represented By The Secretary Of The Army | Tunnel diode |
| US4208667A (en) * | 1978-06-09 | 1980-06-17 | The United States Of America As Represented By The Secretary Of The Army | Controlled absorption in heterojunction structures |
| US4163238A (en) * | 1978-06-09 | 1979-07-31 | The United States Of America As Represented By The Secretary Of The Army | Infrared semiconductor device with superlattice region |
| US4257055A (en) * | 1979-07-26 | 1981-03-17 | University Of Illinois Foundation | Negative resistance heterojunction devices |
| US4261771A (en) * | 1979-10-31 | 1981-04-14 | Bell Telephone Laboratories, Incorporated | Method of fabricating periodic monolayer semiconductor structures by molecular beam epitaxy |
| US4348686A (en) * | 1980-07-28 | 1982-09-07 | The United States Of America As Represented By The Secretary Of The Army | Microwave-infrared detector with semiconductor superlattice region |
| US4349796A (en) * | 1980-12-15 | 1982-09-14 | Bell Telephone Laboratories, Incorporated | Devices incorporating phonon filters |
| US4517047A (en) * | 1981-01-23 | 1985-05-14 | The United States Of America As Represented By The Secretary Of The Army | MBE growth technique for matching superlattices grown on GaAs substrates |
| US4378255A (en) * | 1981-05-06 | 1983-03-29 | University Of Illinois Foundation | Method for producing integrated semiconductor light emitter |
| GB2106314A (en) * | 1981-09-18 | 1983-04-07 | Philips Electronic Associated | Infra-red radiation imaging devices |
| US4675709A (en) * | 1982-06-21 | 1987-06-23 | Xerox Corporation | Quantized layered structures with adjusted indirect bandgap transitions |
| US4469977A (en) * | 1982-10-19 | 1984-09-04 | The United States Of America As Represented By The Secretary Of The Navy | Superlattice ultrasonic wave generator |
| US4597638A (en) * | 1983-02-28 | 1986-07-01 | At&T Bell Laboratories | Nonlinear optical apparatus |
| NL8301745A (nl) * | 1983-05-17 | 1984-12-17 | Philips Nv | Halfgeleiderinrichting. |
| DE3480631D1 (de) * | 1983-06-24 | 1990-01-04 | Nec Corp | Halbleiterstruktur mit uebergitter hoher traegerdichte. |
| JPS6028268A (ja) * | 1983-07-26 | 1985-02-13 | Agency Of Ind Science & Technol | 半導体装置 |
| US4642144A (en) * | 1983-10-06 | 1987-02-10 | Exxon Research And Engineering Company | Proximity doping of amorphous semiconductors |
| US4558336A (en) * | 1984-03-02 | 1985-12-10 | The United States Of America As Represented By The Secretary Of The Army | MBE Growth technique for matching superlattices grown on GaAs substrates |
| US4575924A (en) * | 1984-07-02 | 1986-03-18 | Texas Instruments Incorporated | Process for fabricating quantum-well devices utilizing etch and refill techniques |
| JPS61210679A (ja) * | 1985-03-15 | 1986-09-18 | Sony Corp | 半導体装置 |
| JPS61241985A (ja) * | 1985-04-19 | 1986-10-28 | Eizo Yamaga | 赤外線検知装置 |
| US4661829A (en) * | 1985-06-05 | 1987-04-28 | American Telephone And Telegraph Company, At&T Bell Laboratories | Device using ordered semiconductor alloy |
| USRE33693E (en) * | 1985-06-05 | 1991-09-17 | At&T Bell Laboratories | Device using ordered semiconductor alloy |
| US4843439A (en) * | 1985-08-28 | 1989-06-27 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Tailorable infrared sensing device with strain layer superlattice structure |
| CA1282671C (en) * | 1985-11-18 | 1991-04-09 | John Condon Bean | Device having strain induced region |
| US4725870A (en) * | 1985-11-18 | 1988-02-16 | American Telephone And Telegraph Company, At&T Bell Laboratories | Silicon germanium photodetector |
| DE3542482A1 (de) * | 1985-11-30 | 1987-06-04 | Licentia Gmbh | Modulationsdotierter feldeffekttransistor |
| US4814837A (en) * | 1986-03-13 | 1989-03-21 | The United States Of America As Represented By The Secretary Of The Navy | Quantum well electron barrier diode |
| JP2587623B2 (ja) * | 1986-11-22 | 1997-03-05 | 新技術事業団 | 化合物半導体のエピタキシヤル結晶成長方法 |
| US5194983A (en) * | 1986-11-27 | 1993-03-16 | Centre National De La Recherche Scientifique (C.N.R.S.) | Superlattice optical monitor |
| US4769341A (en) * | 1986-12-29 | 1988-09-06 | American Telephone And Telegraph Company, At&T Bell Laboratories | Method of fabricating non-silicon materials on silicon substrate using an alloy of Sb and Group IV semiconductors |
| US4947223A (en) * | 1987-08-31 | 1990-08-07 | The United States Of America As Represented By The United States Department Of Energy | Semiconductor devices incorporating multilayer interference regions |
| WO1989006050A1 (en) * | 1987-12-23 | 1989-06-29 | British Telecommunications Public Limited Company | Semiconductor heterostructures |
| US5138408A (en) * | 1988-04-15 | 1992-08-11 | Nec Corporation | Resonant tunneling hot carrier transistor |
| US5012318A (en) * | 1988-09-05 | 1991-04-30 | Nec Corporation | Hybrid semiconductor device implemented by combination of heterojunction bipolar transistor and field effect transistor |
| JP2687519B2 (ja) * | 1988-12-06 | 1997-12-08 | 日本電気株式会社 | 半導体装置及びその製造方法 |
| US5329257A (en) * | 1993-04-30 | 1994-07-12 | International Business Machines Corproation | SiGe transferred electron device and oscillator using same |
| DE4406085A1 (de) * | 1994-02-24 | 1995-08-31 | Renk Karl Friedrich | Halbleitervorrichtung |
| US5422533A (en) * | 1994-03-09 | 1995-06-06 | The United States Of America As Represented By The Secretary Of The Army | Piezoelectric resonator |
| EP0759640B1 (en) * | 1995-08-17 | 2003-06-11 | Paul-Drude-Institut für Festkörperelektronik | Semiconductor superlattice oscillator and methods of manufacturing and operating the same |
| US5684737A (en) * | 1995-12-08 | 1997-11-04 | The Regents Of The University Of California | SRAM cell utilizing bistable diode having GeSi structure therein |
| CN1195895A (zh) | 1997-04-10 | 1998-10-14 | 李炳辉 | 半导体量子振荡器件 |
| JP3427179B2 (ja) * | 2000-02-16 | 2003-07-14 | 東北大学長 | 核スピン制御素子及びその制御方法 |
| US7015494B2 (en) | 2002-07-10 | 2006-03-21 | Micron Technology, Inc. | Assemblies displaying differential negative resistance |
| US20060169592A1 (en) * | 2005-01-31 | 2006-08-03 | Hewlett-Packard Development Company, L.P. | Periodic layered structures and methods therefor |
| US8426845B2 (en) | 2010-05-07 | 2013-04-23 | Svt Associates, Inc. | Long wavelength infrared superlattice |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3171068A (en) * | 1960-10-19 | 1965-02-23 | Merck & Co Inc | Semiconductor diodes |
| US3328584A (en) * | 1964-01-17 | 1967-06-27 | Int Rectifier Corp | Five-layer light switch |
| US3479611A (en) * | 1966-01-21 | 1969-11-18 | Int Standard Electric Corp | Series operated gunn effect devices |
| US3467896A (en) * | 1966-03-28 | 1969-09-16 | Varian Associates | Heterojunctions and domain control in bulk negative conductivity semiconductors |
| US3356866A (en) * | 1966-08-17 | 1967-12-05 | Bell Telephone Labor Inc | Apparatus employing avalanche transit time diode |
-
1969
- 1969-04-01 US US811871A patent/US3626257A/en not_active Expired - Lifetime
-
1970
- 1970-03-26 DE DE2014677A patent/DE2014677C3/de not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2388411A1 (fr) * | 1977-04-20 | 1978-11-17 | Ibm | Dispositif semi-conducteur et son procede de fabrication |
| EP0206117A1 (en) * | 1985-06-14 | 1986-12-30 | AT&T Corp. | A photodetector |
Also Published As
| Publication number | Publication date |
|---|---|
| DE2014677B2 (de) | 1978-11-09 |
| US3626257A (en) | 1971-12-07 |
| DE2014677C3 (de) | 1979-07-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C3 | Grant after two publication steps (3rd publication) | ||
| 8340 | Patent of addition ceased/non-payment of fee of main patent |