DE19781697T1 - Elektrisch leitfähiges Kontakteinheitssystem - Google Patents
Elektrisch leitfähiges KontakteinheitssystemInfo
- Publication number
- DE19781697T1 DE19781697T1 DE19781697T DE19781697T DE19781697T1 DE 19781697 T1 DE19781697 T1 DE 19781697T1 DE 19781697 T DE19781697 T DE 19781697T DE 19781697 T DE19781697 T DE 19781697T DE 19781697 T1 DE19781697 T1 DE 19781697T1
- Authority
- DE
- Germany
- Prior art keywords
- electrically conductive
- conductive contact
- contact unit
- unit system
- electrically
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11578296 | 1996-04-12 | ||
JP30405896A JP3165648B2 (ja) | 1996-04-12 | 1996-10-30 | 導電性接触子構造 |
JP35068096 | 1996-12-27 | ||
PCT/JP1997/001237 WO1997039361A1 (fr) | 1996-04-12 | 1997-04-10 | Systeme unitaire de contact conducteur |
Publications (1)
Publication Number | Publication Date |
---|---|
DE19781697T1 true DE19781697T1 (de) | 1999-03-18 |
Family
ID=27313025
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19781697A Expired - Fee Related DE19781697B4 (de) | 1996-04-12 | 1997-04-10 | Elektrisch leitfähige Kontakteinheit |
DE19781697T Pending DE19781697T1 (de) | 1996-04-12 | 1997-04-10 | Elektrisch leitfähiges Kontakteinheitssystem |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19781697A Expired - Fee Related DE19781697B4 (de) | 1996-04-12 | 1997-04-10 | Elektrisch leitfähige Kontakteinheit |
Country Status (7)
Country | Link |
---|---|
US (1) | US6150616A (de) |
KR (1) | KR100326723B1 (de) |
CN (1) | CN1255686C (de) |
DE (2) | DE19781697B4 (de) |
HK (1) | HK1022351A1 (de) |
MY (1) | MY117647A (de) |
WO (2) | WO1997039361A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014215595A1 (de) * | 2014-08-06 | 2016-02-11 | Schaeffler Technologies AG & Co. KG | Kontaktierungsstecksystem, Hybridmodul mit Kontaktierungsstecksystem und Verfahren zum Zusammenbau eines Steckergehäuses des Kontaktierungsstecksystems |
Families Citing this family (39)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IL125320A (en) * | 1997-07-14 | 2003-04-10 | Nhk Spring Co Ltd | Electric contact probe unit |
CN1226632C (zh) * | 1998-07-10 | 2005-11-09 | 日本发条株式会社 | 导电的接触单元 |
DE69933038T2 (de) * | 1998-07-10 | 2007-04-12 | NHK Spring Co., Ltd., Yokohama | Leitfähiger kontakt |
JP4124520B2 (ja) * | 1998-07-30 | 2008-07-23 | 日本発条株式会社 | 導電性接触子のホルダ及びその製造方法 |
JP2000138104A (ja) * | 1998-08-26 | 2000-05-16 | Yazaki Corp | 回路保護素子の検査構造 |
FR2798516A1 (fr) * | 1999-09-10 | 2001-03-16 | Marechal Sepm | Contact electrique elastique pourvu d'un ressort helicoidal a pas variable |
JP2001318107A (ja) * | 2000-05-01 | 2001-11-16 | Nhk Spring Co Ltd | 導電性接触子 |
AU2001264297A1 (en) * | 2000-06-16 | 2001-12-24 | Nhk Spring Co. Ltd. | Microcontactor probe and electric probe unit |
DE60127837T2 (de) * | 2000-06-28 | 2007-09-06 | NHK Spring Co., Ltd., Yokohama | Leitender kontakt |
DE10297011T5 (de) * | 2001-07-02 | 2004-07-22 | NHK Spring Co., Ltd., Yokohama | Elektrisch leitende Kontakteinheit |
JP2003014779A (ja) * | 2001-07-02 | 2003-01-15 | Nhk Spring Co Ltd | 導電性接触子 |
US6781390B2 (en) * | 2001-07-20 | 2004-08-24 | Nhk Spring Co., Ltd. | Conductive coil contact member |
USRE41663E1 (en) | 2002-01-17 | 2010-09-14 | Ardent Concepts, Inc. | Compliant electrical contact assembly |
US6909056B2 (en) * | 2002-01-17 | 2005-06-21 | Ardent Concepts, Inc. | Compliant electrical contact assembly |
US7019222B2 (en) * | 2002-01-17 | 2006-03-28 | Ardent Concepts, Inc. | Compliant electrical contact assembly |
US7126062B1 (en) * | 2002-01-17 | 2006-10-24 | Ardent Concepts, Inc. | Compliant electrical contact assembly |
US6787709B2 (en) * | 2002-01-17 | 2004-09-07 | Ardent Concepts, Inc. | Compliant electrical contact |
US20040157483A1 (en) * | 2003-02-11 | 2004-08-12 | Methode Electronics, Inc. | Vibration resistant wireless interconnection system |
KR100679663B1 (ko) * | 2005-10-31 | 2007-02-06 | (주)티에스이 | 반도체 디바이스 테스트 소켓 |
WO2007100059A1 (ja) * | 2006-03-03 | 2007-09-07 | Nhk Spring Co., Ltd. | 導電性接触子ユニット |
US7247050B1 (en) * | 2006-10-24 | 2007-07-24 | Fci Americas Technology, Inc. | Press-fit electrical contact |
US7754972B2 (en) * | 2006-12-18 | 2010-07-13 | Illinois Tool Works Inc. | Grounded manifold and method for making the same |
JP4999079B2 (ja) | 2007-04-10 | 2012-08-15 | サンユー工業株式会社 | プローブ |
JP2009206506A (ja) * | 2008-01-31 | 2009-09-10 | Sanyo Electric Co Ltd | 素子搭載用基板およびその製造方法、半導体モジュールおよびこれを搭載した携帯機器 |
US20100102841A1 (en) * | 2008-10-28 | 2010-04-29 | Ibiden Co., Ltd. | Device, method and probe for inspecting substrate |
JP2010276579A (ja) * | 2009-06-01 | 2010-12-09 | Koyo Technos:Kk | 電気接触子およびそれを備える検査治具 |
AT509760B1 (de) * | 2010-04-23 | 2012-07-15 | Smaxtec Animal Care Sales Gmbh | Gefederter sensor und sensorarray |
KR101020025B1 (ko) * | 2010-06-01 | 2011-03-09 | 주식회사 엔티에스 | 전자부품 검침 프로브 |
KR101415722B1 (ko) * | 2010-06-25 | 2014-07-25 | 니혼 하츠쵸 가부시키가이샤 | 콘택트 프로브 및 프로브 유닛 |
DE102010037498B4 (de) | 2010-09-13 | 2013-11-07 | Hachadorian Design & Calculation Gmbh | Elektrischer Kontakt |
JP5858781B2 (ja) | 2011-12-29 | 2016-02-10 | 株式会社エンプラス | プローブピン及び電気部品用ソケット |
CN102709735B (zh) * | 2012-05-31 | 2014-10-22 | 南京康尼科技实业有限公司 | 用于地热地板的插座、插头及电缆连接线 |
KR101552553B1 (ko) * | 2014-09-23 | 2015-10-01 | 리노공업주식회사 | 검사장치용 컨택트 프로브 |
JP6837283B2 (ja) | 2016-02-29 | 2021-03-03 | 株式会社ヨコオ | ソケット |
JP2018005960A (ja) * | 2016-07-01 | 2018-01-11 | エヌイーシー ショット コンポーネンツ株式会社 | 接触子を有する気密端子 |
US11002760B1 (en) * | 2017-02-06 | 2021-05-11 | Johnstech International Corporation | High isolation housing for testing integrated circuits |
CN109803484B (zh) * | 2019-01-10 | 2021-07-02 | 东华大学 | 一种织物电路板与电子元器件的可拆卸连接方法 |
CN112129975A (zh) * | 2019-06-25 | 2020-12-25 | 中国探针股份有限公司 | 电连接组件 |
DE102022208922A1 (de) * | 2022-08-29 | 2024-02-29 | Robert Bosch Gesellschaft mit beschränkter Haftung | EMV-Kontaktfeder |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3648220A (en) * | 1970-05-19 | 1972-03-07 | Itt | Electrical connector |
US4029375A (en) * | 1976-06-14 | 1977-06-14 | Electronic Engineering Company Of California | Miniature electrical connector |
DE3249770C2 (en) * | 1982-11-05 | 1987-11-12 | Martin Maelzer | Device for testing electrical circuit boards |
DE3340431C2 (de) * | 1983-11-09 | 1985-12-19 | Feinmetall Gmbh, 7033 Herrenberg | Gefederter Kontaktstift für Prüfzwecke |
DK291184D0 (da) * | 1984-06-13 | 1984-06-13 | Boeegh Petersen Allan | Fremgangsmaade og indretning til test af kredsloebsplader |
US4667148A (en) * | 1985-06-26 | 1987-05-19 | General Electric Company | Generator air-gap flux probe for detecting shorted rotor turns |
JPS63161366A (ja) * | 1986-12-23 | 1988-07-05 | 千代田化工建設株式会社 | 化学式熱変換器 |
JPS63161366U (de) * | 1987-04-10 | 1988-10-21 | ||
JPS63257239A (ja) * | 1987-04-15 | 1988-10-25 | Hitachi Ltd | プロ−ブ検査装置 |
EP0385142B1 (de) * | 1989-02-28 | 1995-09-27 | Fujitsu Limited | Elektrische Verbindungsvorrichtung |
JP2993980B2 (ja) * | 1989-12-29 | 1999-12-27 | 新光電気工業株式会社 | 基板用コンタクトプローブ |
JPH04127581A (ja) * | 1990-09-19 | 1992-04-28 | Kawasaki Steel Corp | 太陽電池モジュール |
JPH04127581U (ja) * | 1991-02-08 | 1992-11-20 | 山形日本電気株式会社 | ポゴピン |
JPH0674972A (ja) * | 1992-08-27 | 1994-03-18 | Shinko Electric Ind Co Ltd | コンタクトプローブ |
EP0616394A1 (de) * | 1993-03-16 | 1994-09-21 | Hewlett-Packard Company | Verfahren und Vorrichtung für die Herstellung von elektrisch zusammengeschalteten Schaltungen |
-
1997
- 1997-04-10 DE DE19781697A patent/DE19781697B4/de not_active Expired - Fee Related
- 1997-04-10 WO PCT/JP1997/001237 patent/WO1997039361A1/ja active IP Right Grant
- 1997-04-10 KR KR1019980707958A patent/KR100326723B1/ko not_active IP Right Cessation
- 1997-04-10 US US09/171,067 patent/US6150616A/en not_active Expired - Fee Related
- 1997-04-10 DE DE19781697T patent/DE19781697T1/de active Pending
- 1997-04-10 CN CNB971944970A patent/CN1255686C/zh not_active Expired - Fee Related
- 1997-04-11 MY MYPI97001585A patent/MY117647A/en unknown
- 1997-12-26 WO PCT/JP1997/004877 patent/WO1998029751A1/en active IP Right Grant
-
1999
- 1999-12-01 HK HK99105574A patent/HK1022351A1/xx not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014215595A1 (de) * | 2014-08-06 | 2016-02-11 | Schaeffler Technologies AG & Co. KG | Kontaktierungsstecksystem, Hybridmodul mit Kontaktierungsstecksystem und Verfahren zum Zusammenbau eines Steckergehäuses des Kontaktierungsstecksystems |
Also Published As
Publication number | Publication date |
---|---|
DE19781697B4 (de) | 2010-04-22 |
WO1998029751A1 (en) | 1998-07-09 |
WO1997039361A1 (fr) | 1997-10-23 |
KR20000005260A (ko) | 2000-01-25 |
MY117647A (en) | 2004-07-31 |
KR100326723B1 (ko) | 2002-04-17 |
US6150616A (en) | 2000-11-21 |
HK1022351A1 (en) | 2000-08-04 |
CN1218554A (zh) | 1999-06-02 |
CN1255686C (zh) | 2006-05-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8110 | Request for examination paragraph 44 | ||
8128 | New person/name/address of the agent |
Representative=s name: ACKMANN MENGES PATENT- UND RECHTSANWAELTE, 80469 M |