DE112021002303B4 - Halbleiterbauelement - Google Patents

Halbleiterbauelement Download PDF

Info

Publication number
DE112021002303B4
DE112021002303B4 DE112021002303.9T DE112021002303T DE112021002303B4 DE 112021002303 B4 DE112021002303 B4 DE 112021002303B4 DE 112021002303 T DE112021002303 T DE 112021002303T DE 112021002303 B4 DE112021002303 B4 DE 112021002303B4
Authority
DE
Germany
Prior art keywords
sub
contacts
semiconductor component
substrate
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE112021002303.9T
Other languages
German (de)
English (en)
Other versions
DE112021002303T5 (de
Inventor
Shuhei Takagiwa
Hiroshi Furutani
Takeshi Seike
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Publication of DE112021002303T5 publication Critical patent/DE112021002303T5/de
Application granted granted Critical
Publication of DE112021002303B4 publication Critical patent/DE112021002303B4/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45Differential amplifiers
    • H03F3/45071Differential amplifiers with semiconductor devices only
    • H03F3/45076Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45475Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/60Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
    • H10D84/645Combinations of only lateral BJTs
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45Differential amplifiers
    • H03F3/45071Differential amplifiers with semiconductor devices only
    • H03F3/45076Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/4508Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using bipolar transistors as the active amplifying circuit
    • H03F3/45085Long tailed pairs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/60Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
    • H10D84/67Complementary BJTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00Interconnections in chips, wafers or substrates
    • H10W20/40Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
    • H10W20/41Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes characterised by their conductive parts
    • H10W20/427Power or ground buses
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F2203/00Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45Indexing scheme relating to differential amplifiers
    • H03F2203/45528Indexing scheme relating to differential amplifiers the FBC comprising one or more passive resistors and being coupled between the LC and the IC
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F2203/00Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45Indexing scheme relating to differential amplifiers
    • H03F2203/45612Indexing scheme relating to differential amplifiers the IC comprising one or more input source followers as input stages in the IC
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D10/00Bipolar junction transistors [BJT]
    • H10D10/40Vertical BJTs
    • H10D10/421Vertical BJTs having both emitter-base and base-collector junctions ending at the same surface of the body
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D10/00Bipolar junction transistors [BJT]
    • H10D10/60Lateral BJTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/60Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
    • H10D84/63Combinations of vertical and lateral BJTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/19Preparing inhomogeneous wafers
    • H10P90/1904Preparing vertically inhomogeneous wafers
    • H10P90/1906Preparing SOI wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W10/00Isolation regions in semiconductor bodies between components of integrated devices
    • H10W10/10Isolation regions comprising dielectric materials
    • H10W10/181Semiconductor-on-insulator [SOI] isolation regions, e.g. buried oxide regions of SOI wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/5449Dispositions of bond wires not being orthogonal to a side surface of the chip, e.g. fan-out arrangements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/941Dispositions of bond pads
    • H10W72/944Dispositions of multiple bond pads
    • H10W72/9445Top-view layouts, e.g. mirror arrays
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE112021002303.9T 2020-06-08 2021-05-19 Halbleiterbauelement Active DE112021002303B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020-099164 2020-06-08
JP2020099164 2020-06-08
PCT/JP2021/018899 WO2021251081A1 (ja) 2020-06-08 2021-05-19 半導体装置、電子機器

Publications (2)

Publication Number Publication Date
DE112021002303T5 DE112021002303T5 (de) 2023-03-16
DE112021002303B4 true DE112021002303B4 (de) 2023-09-21

Family

ID=78847227

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112021002303.9T Active DE112021002303B4 (de) 2020-06-08 2021-05-19 Halbleiterbauelement

Country Status (5)

Country Link
US (1) US20230223403A1 (https=)
JP (1) JP7731879B2 (https=)
CN (1) CN115702500A (https=)
DE (1) DE112021002303B4 (https=)
WO (1) WO2021251081A1 (https=)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002246553A (ja) 2001-02-16 2002-08-30 Matsushita Electric Ind Co Ltd 半導体集積回路のノイズ低減装置
JP2008193019A (ja) 2007-02-08 2008-08-21 Matsushita Electric Ind Co Ltd 半導体集積回路装置
US20110284973A1 (en) 2010-05-21 2011-11-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor element and semiconductor device
DE102012211547A1 (de) 2011-07-05 2013-01-10 Denso Corporation Halbleitervorrichtung

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08115985A (ja) * 1994-10-17 1996-05-07 Nec Corp 低雑音の半導体集積回路
JP3408164B2 (ja) * 1998-09-29 2003-05-19 三洋電機株式会社 半導体集積回路装置
JP2005039320A (ja) * 2003-07-15 2005-02-10 Renesas Technology Corp 半導体素子及び高周波電力増幅装置
JP4513575B2 (ja) * 2005-01-12 2010-07-28 三菱電機株式会社 保持解放機構
JP5090696B2 (ja) * 2006-09-12 2012-12-05 ルネサスエレクトロニクス株式会社 半導体装置
JP2008112857A (ja) * 2006-10-30 2008-05-15 Nec Electronics Corp 半導体集積回路装置
JP6842553B2 (ja) * 2017-08-22 2021-03-17 ローム株式会社 オペアンプ
US10608168B2 (en) * 2017-10-04 2020-03-31 Allegro Microsystems, Llc Isolated hall effect element with improved electro-magnetic isolation
JP7308595B2 (ja) * 2018-07-02 2023-07-14 Tianma Japan株式会社 イメージセンサ
JP2020004936A (ja) * 2018-07-02 2020-01-09 株式会社デンソー 半導体装置およびその製造方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002246553A (ja) 2001-02-16 2002-08-30 Matsushita Electric Ind Co Ltd 半導体集積回路のノイズ低減装置
JP2008193019A (ja) 2007-02-08 2008-08-21 Matsushita Electric Ind Co Ltd 半導体集積回路装置
US20110284973A1 (en) 2010-05-21 2011-11-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor element and semiconductor device
DE102012211547A1 (de) 2011-07-05 2013-01-10 Denso Corporation Halbleitervorrichtung

Also Published As

Publication number Publication date
DE112021002303T5 (de) 2023-03-16
WO2021251081A1 (ja) 2021-12-16
CN115702500A (zh) 2023-02-14
US20230223403A1 (en) 2023-07-13
JPWO2021251081A1 (https=) 2021-12-16
JP7731879B2 (ja) 2025-09-01

Similar Documents

Publication Publication Date Title
DE102020125553B4 (de) Halbleitervorrichtung und verfahren zur herstellung von selbiger
DE69935182T2 (de) Halbleiteranordnung
DE10302628B4 (de) Leistungshalbleitervorrichtung
DE102016100292A1 (de) Bidirektionale Klemmschaltungen mit geringem Verlust und Verfahren zu ihrer Bildung
DE10322593A1 (de) Halbleiterbauteil und dieses verwendender integrierter Schaltkreis
DE102014112823B4 (de) Halbleiterschalter mit integriertem Temperatursensor
DE4200884A1 (de) Integrierte halbleiterschaltungsvorrichtung
DE102014212651A1 (de) Widerstandselement
DE1614373B1 (de) Monolithische integrierte Halbleiterschaltung
DE102018126311A1 (de) Leistungshalbleitermodul
DE3486077T2 (de) Integrierte halbleiterschaltungsanordnung.
DE102015208430A1 (de) Vertikale Hall-Effekt-Vorrichtung
DE112018003872T5 (de) Operationsverstärker
DE202015105413U1 (de) Integrierte, floatende Diodenstruktur
DE3309223C2 (https=)
DE2300116A1 (de) Hochfrequenz-feldeffekttransistor mit isolierter gate-elektrode fuer breitbandbetrieb
DE102021005989A1 (de) Grabenimplementierte polydioden und widerstände
DE112021002303B4 (de) Halbleiterbauelement
DE10109174A1 (de) Verfahren zum Strukturentwurf von integrierten Halbleiterschaltungen und Vorrichtung zur Durchführung desselben
DE102014211904A1 (de) Halbleitervorrichtung
EP0656659B1 (de) ESD-Schutzstruktur für integrierte Schaltungen
DE102023124363A1 (de) Halbleitervorrichtung
DE102023121901A1 (de) Photonische integrierte Schaltung mit einer Vielzahl von diskreten optischen Schutzelementen
DE112020006584T5 (de) Platine und elektronisches Gerät
DE68929148T2 (de) Integrierte Halbleiterschaltung

Legal Events

Date Code Title Description
R012 Request for examination validly filed
R016 Response to examination communication
R018 Grant decision by examination section/examining division
R020 Patent grant now final
R079 Amendment of ipc main class

Free format text: PREVIOUS MAIN CLASS: H01L0027060000

Ipc: H10D0084000000