DE112014005099T5 - Magnetfeld-Erfassungssensor - Google Patents

Magnetfeld-Erfassungssensor Download PDF

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Publication number
DE112014005099T5
DE112014005099T5 DE112014005099.7T DE112014005099T DE112014005099T5 DE 112014005099 T5 DE112014005099 T5 DE 112014005099T5 DE 112014005099 T DE112014005099 T DE 112014005099T DE 112014005099 T5 DE112014005099 T5 DE 112014005099T5
Authority
DE
Germany
Prior art keywords
magnetic
magnetic field
time
impedance element
field detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE112014005099.7T
Other languages
German (de)
English (en)
Inventor
Junya TANIGAWA
Makoto Ishii
Hiroki Sugiyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yazaki Corp
Original Assignee
Yazaki Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yazaki Corp filed Critical Yazaki Corp
Publication of DE112014005099T5 publication Critical patent/DE112014005099T5/de
Granted legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/063—Magneto-impedance sensors; Nanocristallin sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0017—Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G01R33/0041—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration using feed-back or modulation techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/028—Electrodynamic magnetometers

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
DE112014005099.7T 2013-11-08 2014-10-29 Magnetfeld-Erfassungssensor Granted DE112014005099T5 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP2013231743 2013-11-08
JP2013231743A JP6325797B2 (ja) 2013-11-08 2013-11-08 磁界検出センサ
PCT/JP2014/078820 WO2015068629A1 (ja) 2013-11-08 2014-10-29 磁界検出センサ

Publications (1)

Publication Number Publication Date
DE112014005099T5 true DE112014005099T5 (de) 2016-09-01

Family

ID=53041409

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112014005099.7T Granted DE112014005099T5 (de) 2013-11-08 2014-10-29 Magnetfeld-Erfassungssensor

Country Status (4)

Country Link
US (1) US9791522B2 (enExample)
JP (1) JP6325797B2 (enExample)
DE (1) DE112014005099T5 (enExample)
WO (1) WO2015068629A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2895947B2 (ja) 1990-10-16 1999-05-31 三洋電機株式会社 洗濯機
JP6500273B2 (ja) * 2015-04-28 2019-04-17 株式会社大都技研 遊技台
JP6370768B2 (ja) 2015-11-26 2018-08-08 矢崎総業株式会社 磁界検出センサ
CN105676151B (zh) * 2016-01-18 2018-06-22 华东师范大学 一种负反馈式磁场传感器
FR3054323A1 (fr) * 2016-07-25 2018-01-26 Centre National De La Recherche Scientifique Capteur de champ magnetique
JP6870960B2 (ja) * 2016-11-18 2021-05-12 矢崎総業株式会社 磁界検出センサ
JP2018091643A (ja) 2016-11-30 2018-06-14 矢崎総業株式会社 磁界検出センサ
JP6661570B2 (ja) * 2017-05-11 2020-03-11 矢崎総業株式会社 磁界検出センサ

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3096413B2 (ja) 1995-11-02 2000-10-10 キヤノン電子株式会社 磁気検出素子、磁気センサー、地磁気検出型方位センサー、及び姿勢制御用センサー
JP4233161B2 (ja) 1998-12-10 2009-03-04 ミネベア株式会社 磁気センサ
JP2001116814A (ja) * 1999-10-22 2001-04-27 Canon Electronics Inc 磁気インピーダンス素子
US6653831B2 (en) * 2001-11-20 2003-11-25 Gentex Corporation Magnetometer having a dynamically adjustable bias setting and electronic vehicle compass incorporating the same
JP4735930B2 (ja) * 2004-08-23 2011-07-27 Ｎｅｃトーキン株式会社 磁界検出方法及び装置
JP5540180B2 (ja) * 2007-12-14 2014-07-02 国立大学法人東北大学 磁界検出素子および磁界検出装置
JP2014071061A (ja) * 2012-10-01 2014-04-21 Fujikura Ltd 信号処理用半導体集積回路、及び磁界検出装置
US9261571B2 (en) * 2013-08-15 2016-02-16 Texas Instruments Incorporated Fluxgate magnetic sensor readout apparatus

Also Published As

Publication number Publication date
US20160245879A1 (en) 2016-08-25
JP6325797B2 (ja) 2018-05-16
JP2015092144A (ja) 2015-05-14
WO2015068629A1 (ja) 2015-05-14
US9791522B2 (en) 2017-10-17

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R018 Grant decision by examination section/examining division