DE112009002439A5 - 4D-Bildgebung in einem ultraschnellen Elektronenmikroskop - Google Patents

4D-Bildgebung in einem ultraschnellen Elektronenmikroskop Download PDF

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Publication number
DE112009002439A5
DE112009002439A5 DE112009002439T DE112009002439T DE112009002439A5 DE 112009002439 A5 DE112009002439 A5 DE 112009002439A5 DE 112009002439 T DE112009002439 T DE 112009002439T DE 112009002439 T DE112009002439 T DE 112009002439T DE 112009002439 A5 DE112009002439 A5 DE 112009002439A5
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DE
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Prior art keywords
imaging
electron microscope
ultrafast electron
ultrafast
microscope
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DE112009002439T
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DE112009002439T5 (de
Inventor
H. Zewail Ahmed
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California Institute of Technology CalTech
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California Institute of Technology CalTech
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Publication of DE112009002439T5 publication Critical patent/DE112009002439T5/de
Publication of DE112009002439A5 publication Critical patent/DE112009002439A5/de
Withdrawn legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/22—Optical or photographic arrangements associated with the tube
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/261—Details
    • H01J37/263—Contrast, resolution or power of penetration
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/248—Components associated with the control of the tube
    • H01J2237/2482—Optical means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes
    • H01J2237/2809—Scanning microscopes characterised by the imaging problems involved
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes
    • H01J2237/2813—Scanning microscopes characterised by the application

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Electron Tubes For Measurement (AREA)
DE112009002439T 2008-10-09 2009-10-07 4D-Bildgebung in einem ultraschnellen Elektronenmikroskop Withdrawn DE112009002439A5 (de)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US19563908P 2008-10-09 2008-10-09
US61/195,639 2008-10-09
US23674509P 2009-08-25 2009-08-25
US61/236,745 2009-08-25
US24094609P 2009-09-09 2009-09-09
US61/240,946 2009-09-09
PCT/US2009/059855 WO2010042629A2 (en) 2008-10-09 2009-10-07 4d imaging in an ultrafast electron microscope

Publications (2)

Publication Number Publication Date
DE112009002439T5 DE112009002439T5 (de) 2012-01-19
DE112009002439A5 true DE112009002439A5 (de) 2012-05-10

Family

ID=42101184

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112009002439T Withdrawn DE112009002439A5 (de) 2008-10-09 2009-10-07 4D-Bildgebung in einem ultraschnellen Elektronenmikroskop

Country Status (4)

Country Link
US (5) US8247769B2 (de)
JP (1) JP5802128B2 (de)
DE (1) DE112009002439A5 (de)
WO (1) WO2010042629A2 (de)

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Publication number Publication date
US20100108883A1 (en) 2010-05-06
US20120312986A1 (en) 2012-12-13
US8203120B2 (en) 2012-06-19
WO2010042629A2 (en) 2010-04-15
US20140158883A1 (en) 2014-06-12
US8247769B2 (en) 2012-08-21
DE112009002439T5 (de) 2012-01-19
US20130234023A1 (en) 2013-09-12
US8440970B2 (en) 2013-05-14
JP2012505521A (ja) 2012-03-01
US20100108882A1 (en) 2010-05-06
JP5802128B2 (ja) 2015-10-28
WO2010042629A3 (en) 2010-07-29
US9053903B2 (en) 2015-06-09
US8686359B2 (en) 2014-04-01

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