DE102019112447A1 - Verfahren und Auswerteeinheit zur Ermittlung eines Zeitpunkts einer Flanke in einem Signal - Google Patents

Verfahren und Auswerteeinheit zur Ermittlung eines Zeitpunkts einer Flanke in einem Signal Download PDF

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Publication number
DE102019112447A1
DE102019112447A1 DE102019112447.6A DE102019112447A DE102019112447A1 DE 102019112447 A1 DE102019112447 A1 DE 102019112447A1 DE 102019112447 A DE102019112447 A DE 102019112447A DE 102019112447 A1 DE102019112447 A1 DE 102019112447A1
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DE
Germany
Prior art keywords
signal
time
serdes
clock
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE102019112447.6A
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German (de)
English (en)
Inventor
Dirk Berner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik Optical Systems GmbH
Original Assignee
Jenoptik Optical Systems GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jenoptik Optical Systems GmbH filed Critical Jenoptik Optical Systems GmbH
Priority to DE102019112447.6A priority Critical patent/DE102019112447A1/de
Priority to KR1020217036342A priority patent/KR102392037B1/ko
Priority to CN202080034865.3A priority patent/CN113811779B/zh
Priority to PCT/EP2020/062591 priority patent/WO2020229265A1/de
Priority to US17/611,001 priority patent/US11422242B2/en
Priority to FIEP20725673.6T priority patent/FI3931580T3/de
Priority to EP20725673.6A priority patent/EP3931580B1/de
Priority to JP2021567853A priority patent/JP7288086B2/ja
Publication of DE102019112447A1 publication Critical patent/DE102019112447A1/de
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G01R13/0218—Circuits therefor
    • G01R13/0254—Circuits therefor for triggering, synchronisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/486—Receivers
    • G01S7/4865—Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G01S17/10—Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/50—Systems of measurement based on relative movement of target
    • G01S17/58—Velocity or trajectory determination systems; Sense-of-movement determination systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/486—Receivers
    • G01S7/4861—Circuits for detection, sampling, integration or read-out
    • G—PHYSICS
    • G08—SIGNALLING
    • G08G—TRAFFIC CONTROL SYSTEMS
    • G08G1/00—Traffic control systems for road vehicles
    • G08G1/01—Detecting movement of traffic to be counted or controlled
    • G08G1/052—Detecting movement of traffic to be counted or controlled with provision for determining speed or overspeed
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/153—Arrangements in which a pulse is delivered at the instant when a predetermined characteristic of an input signal is present or at a fixed time interval after this instant
    • H03K5/1534—Transition or edge detectors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M9/00—Parallel/series conversion or vice versa

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • General Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Manipulation Of Pulses (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE102019112447.6A 2019-05-13 2019-05-13 Verfahren und Auswerteeinheit zur Ermittlung eines Zeitpunkts einer Flanke in einem Signal Pending DE102019112447A1 (de)

Priority Applications (8)

Application Number Priority Date Filing Date Title
DE102019112447.6A DE102019112447A1 (de) 2019-05-13 2019-05-13 Verfahren und Auswerteeinheit zur Ermittlung eines Zeitpunkts einer Flanke in einem Signal
KR1020217036342A KR102392037B1 (ko) 2019-05-13 2020-05-06 신호 내의 플랭크의 시간을 결정하기 위한 방법 및 평가 유닛
CN202080034865.3A CN113811779B (zh) 2019-05-13 2020-05-06 用于测定信号中边沿的时间点的方法和评估单元
PCT/EP2020/062591 WO2020229265A1 (de) 2019-05-13 2020-05-06 Verfahren und auswerteeinheit zur ermittlung eines zeitpunkts einer flanke in einem signal
US17/611,001 US11422242B2 (en) 2019-05-13 2020-05-06 Method and evaluation unit for determining a time of a flank in a signal
FIEP20725673.6T FI3931580T3 (en) 2019-05-13 2020-05-06 Method and evaluation unit for determining a time of a flank in a signal
EP20725673.6A EP3931580B1 (de) 2019-05-13 2020-05-06 Verfahren und auswerteeinheit zur ermittlung eines zeitpunkts einer flanke in einem signal
JP2021567853A JP7288086B2 (ja) 2019-05-13 2020-05-06 信号のエッジの時点を検出するための方法及び評価ユニット

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102019112447.6A DE102019112447A1 (de) 2019-05-13 2019-05-13 Verfahren und Auswerteeinheit zur Ermittlung eines Zeitpunkts einer Flanke in einem Signal

Publications (1)

Publication Number Publication Date
DE102019112447A1 true DE102019112447A1 (de) 2020-11-19

Family

ID=70682836

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102019112447.6A Pending DE102019112447A1 (de) 2019-05-13 2019-05-13 Verfahren und Auswerteeinheit zur Ermittlung eines Zeitpunkts einer Flanke in einem Signal

Country Status (8)

Country Link
US (1) US11422242B2 (zh)
EP (1) EP3931580B1 (zh)
JP (1) JP7288086B2 (zh)
KR (1) KR102392037B1 (zh)
CN (1) CN113811779B (zh)
DE (1) DE102019112447A1 (zh)
FI (1) FI3931580T3 (zh)
WO (1) WO2020229265A1 (zh)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050069031A1 (en) * 2003-09-25 2005-03-31 Sunter Stephen K. Circuit and method for measuring jitter of high speed signals
US7627790B2 (en) * 2003-08-21 2009-12-01 Credence Systems Corporation Apparatus for jitter testing an IC
US8098787B1 (en) * 2007-12-13 2012-01-17 Altera Corporation Method and apparatus for precision quantization of temporal spacing between two events
US20120176159A1 (en) * 2011-01-07 2012-07-12 Webb Iii Charles A Systems and methods for precise event timing measurements
US8265902B1 (en) * 2009-08-20 2012-09-11 Xilinx, Inc. Circuit for measuring a time interval using a high-speed serial receiver
US20120290885A1 (en) * 2011-05-12 2012-11-15 Lsi Corporation Oversampled clock and data recovery with extended rate acquisition
US20130341518A1 (en) * 2012-06-21 2013-12-26 General Electric Company Time-to-digital converter for a medical imaging system
US20150358150A1 (en) * 2014-06-10 2015-12-10 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Rising and falling edge detection and re-assembly for high speed serial data communications

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US5757297A (en) * 1996-06-07 1998-05-26 International Business Machines Corporation Method and apparatus for recovering a serial data stream using a local clock
US6393502B1 (en) * 1999-08-31 2002-05-21 Advanced Micro Devices, Inc. System and method for initiating a serial data transfer between two clock domains
US6694462B1 (en) * 2000-08-09 2004-02-17 Teradyne, Inc. Capturing and evaluating high speed data streams
JP3706031B2 (ja) 2001-01-25 2005-10-12 三菱電機株式会社 目標識別装置
JP4615904B2 (ja) 2004-06-14 2011-01-19 富士通株式会社 レーダ装置
EP1801701A1 (en) * 2005-12-22 2007-06-27 Deutsche Thomson-Brandt Gmbh Serial data transfer in a numerically controlled control system to update an output value of the control system
CN101558568B (zh) * 2006-07-21 2013-05-22 爱德万测试(新加坡)私人有限公司 用于对重复信号进行处理的信号处理装置及方法
JP5103816B2 (ja) 2006-07-27 2012-12-19 株式会社デンソー 信号処理装置
US7802166B2 (en) * 2006-09-27 2010-09-21 Qimonda Ag Memory controller, memory circuit and memory system with a memory controller and a memory circuit
US7801203B2 (en) 2007-08-20 2010-09-21 Trendchip Technologies, Corp. Clock and data recovery circuits
US20090265490A1 (en) 2008-04-04 2009-10-22 Tarun Setya High-Speed Video Serializer and Deserializer
JP5666813B2 (ja) * 2010-03-15 2015-02-12 株式会社テセック 時間幅測定装置
DE102011056963C5 (de) 2011-12-23 2018-03-01 Sick Ag Messung von Entfernungen nach dem Signallaufzeitprinzip
US9842071B2 (en) * 2014-11-11 2017-12-12 Microchip Technology Incorporated Multi-channel I2S transmit control system and method
CN107209743B (zh) * 2015-02-06 2020-04-21 高通股份有限公司 串行总线的接收时钟校准
EP3098626B1 (de) * 2015-05-29 2021-05-19 Hexagon Technology Center GmbH Zeitmessschaltung und optoelektronischer distanzmesser mit einer ebensolchen zeitmessschaltung
US10527650B2 (en) * 2016-03-01 2020-01-07 Keysight Technologies, Inc. Measurement system having a digital edge trigger detection circuit that is capable of operating at the full signal bandwidth of the measurement system
CN107659392B (zh) 2017-03-13 2019-12-13 广东高云半导体科技股份有限公司 一种时钟数据恢复系统
KR102410014B1 (ko) * 2017-08-03 2022-06-21 삼성전자주식회사 클락 지터 측정 회로 및 이를 포함하는 반도체 장치

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7627790B2 (en) * 2003-08-21 2009-12-01 Credence Systems Corporation Apparatus for jitter testing an IC
US20050069031A1 (en) * 2003-09-25 2005-03-31 Sunter Stephen K. Circuit and method for measuring jitter of high speed signals
US8098787B1 (en) * 2007-12-13 2012-01-17 Altera Corporation Method and apparatus for precision quantization of temporal spacing between two events
US8265902B1 (en) * 2009-08-20 2012-09-11 Xilinx, Inc. Circuit for measuring a time interval using a high-speed serial receiver
US20120176159A1 (en) * 2011-01-07 2012-07-12 Webb Iii Charles A Systems and methods for precise event timing measurements
US20120290885A1 (en) * 2011-05-12 2012-11-15 Lsi Corporation Oversampled clock and data recovery with extended rate acquisition
US20130341518A1 (en) * 2012-06-21 2013-12-26 General Electric Company Time-to-digital converter for a medical imaging system
US20150358150A1 (en) * 2014-06-10 2015-12-10 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Rising and falling edge detection and re-assembly for high speed serial data communications

Also Published As

Publication number Publication date
FI3931580T3 (en) 2023-01-13
JP7288086B2 (ja) 2023-06-06
EP3931580B1 (de) 2022-10-12
CN113811779B (zh) 2022-07-29
WO2020229265A1 (de) 2020-11-19
US20220206126A1 (en) 2022-06-30
KR20210141755A (ko) 2021-11-23
EP3931580A1 (de) 2022-01-05
KR102392037B1 (ko) 2022-04-27
US11422242B2 (en) 2022-08-23
CN113811779A (zh) 2021-12-17
JP2022524235A (ja) 2022-04-28

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