DE102004026948A1 - Röntgen- und CT-Bilddetektor - Google Patents
Röntgen- und CT-Bilddetektor Download PDFInfo
- Publication number
- DE102004026948A1 DE102004026948A1 DE102004026948A DE102004026948A DE102004026948A1 DE 102004026948 A1 DE102004026948 A1 DE 102004026948A1 DE 102004026948 A DE102004026948 A DE 102004026948A DE 102004026948 A DE102004026948 A DE 102004026948A DE 102004026948 A1 DE102004026948 A1 DE 102004026948A1
- Authority
- DE
- Germany
- Prior art keywords
- layer
- ray detector
- photoreceptor
- base layer
- connection points
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 108091008695 photoreceptors Proteins 0.000 claims abstract description 53
- 239000011521 glass Substances 0.000 claims abstract description 37
- 239000010410 layer Substances 0.000 claims description 213
- 238000000034 method Methods 0.000 claims description 19
- 239000000919 ceramic Substances 0.000 claims description 16
- 239000011229 interlayer Substances 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 claims description 4
- 238000012545 processing Methods 0.000 description 14
- 229920000642 polymer Polymers 0.000 description 12
- 238000003384 imaging method Methods 0.000 description 11
- 230000008569 process Effects 0.000 description 11
- 239000011159 matrix material Substances 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- 239000013078 crystal Substances 0.000 description 5
- 229920001721 polyimide Polymers 0.000 description 5
- 229940098465 tincture Drugs 0.000 description 5
- 239000004642 Polyimide Substances 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 230000008901 benefit Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 229920000307 polymer substrate Polymers 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 230000007704 transition Effects 0.000 description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 4
- 229910052721 tungsten Inorganic materials 0.000 description 4
- 239000010937 tungsten Substances 0.000 description 4
- 239000004593 Epoxy Substances 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 238000013170 computed tomography imaging Methods 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- 238000003491 array Methods 0.000 description 2
- 229910010293 ceramic material Inorganic materials 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
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- 239000003822 epoxy resin Substances 0.000 description 2
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- 229910052751 metal Inorganic materials 0.000 description 2
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- 230000003287 optical effect Effects 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
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- 229910052716 thallium Inorganic materials 0.000 description 2
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910000640 Fe alloy Inorganic materials 0.000 description 1
- 239000005041 Mylar™ Substances 0.000 description 1
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- 229910002804 graphite Inorganic materials 0.000 description 1
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- 229920003223 poly(pyromellitimide-1,4-diphenyl ether) Polymers 0.000 description 1
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- 230000007727 signaling mechanism Effects 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000004408 titanium dioxide Substances 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
- 230000002792 vascular Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/452,460 US6982424B2 (en) | 2003-06-02 | 2003-06-02 | X-ray and CT image detector |
| US10/452460 | 2003-06-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102004026948A1 true DE102004026948A1 (de) | 2004-12-30 |
Family
ID=33452003
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102004026948A Withdrawn DE102004026948A1 (de) | 2003-06-02 | 2004-06-01 | Röntgen- und CT-Bilddetektor |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6982424B2 (https=) |
| JP (1) | JP4647938B2 (https=) |
| DE (1) | DE102004026948A1 (https=) |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IL143851A0 (en) * | 2001-06-19 | 2002-04-21 | Real Time Radiography Ltd | Systems for detection, imaging and absorption of high energy radiation |
| US20050017182A1 (en) * | 2003-07-25 | 2005-01-27 | Siemens Medical Solutions Usa, Inc. | Registered collimator device for nuclear imaging camera and method of forming the same |
| US7476040B2 (en) * | 2004-02-02 | 2009-01-13 | Jds Uniphase Corporation | Compact optical sub-assembly with ceramic package |
| GB0504415D0 (en) | 2005-03-03 | 2005-04-06 | E2V Tech Uk Ltd | Non-planar x-ray sensor |
| US7291842B2 (en) * | 2005-06-14 | 2007-11-06 | Varian Medical Systems Technologies, Inc. | Photoconductor imagers with sandwich structure |
| JP2007101256A (ja) * | 2005-09-30 | 2007-04-19 | Fujifilm Corp | Ｘ線撮像装置及びｘ線ｃｔ装置 |
| DE102006002083B4 (de) * | 2006-01-16 | 2009-06-10 | Siemens Ag | Halterung mit Röntgendetektor |
| US7687790B2 (en) * | 2007-06-07 | 2010-03-30 | General Electric Company | EMI shielding of digital x-ray detectors with non-metallic enclosures |
| WO2009024895A2 (en) * | 2007-08-22 | 2009-02-26 | Koninklijke Philips Electronics N.V. | Reflector and light collimator arrangement for improved light collection in scintillation detectors |
| US7945019B2 (en) * | 2008-09-29 | 2011-05-17 | Mir Medical Imaging Research Holding Gmbh | Method and device for thermal breast tumor treatment with 3D monitoring function |
| WO2010058309A2 (en) | 2008-11-18 | 2010-05-27 | Koninklijke Philips Electronics N.V. | Spectral imaging detector |
| US20100128843A1 (en) * | 2008-11-22 | 2010-05-27 | Mir Medical Imaging Research Holding Gmbh | Device for Locating a Female Breast for Diagnostic Imaging and Intervention |
| KR101111011B1 (ko) | 2008-12-26 | 2012-02-15 | 연세대학교 산학협력단 | 감마선 영상측정을 위한 다층 평판형 검출기 및 3차원 위치검출방법 |
| US8525119B2 (en) * | 2009-05-20 | 2013-09-03 | Koninklijke Philips N. V. | Detector array with pre-focused anti-scatter grid |
| WO2011030240A2 (en) | 2009-09-08 | 2011-03-17 | Koninklijke Philips Electronics N.V. | Imaging measurement system with a printed photodetector array |
| BR112012014166A2 (pt) * | 2009-12-15 | 2016-05-17 | Koninkl Philips Electronics Nv | recorte de imagem do detector de um sistema de geração de imagens e método |
| JP2011247686A (ja) * | 2010-05-25 | 2011-12-08 | Fujifilm Corp | 放射線画像撮影装置 |
| US8204171B2 (en) * | 2010-10-11 | 2012-06-19 | General Electric Company | Multi-faceted tileable detector for volumetric computed tomography imaging |
| US8399847B2 (en) | 2010-11-11 | 2013-03-19 | General Electric Company | Ruggedized enclosure for a radiographic device |
| JP2013050364A (ja) * | 2011-08-30 | 2013-03-14 | Fujifilm Corp | 放射線画像検出装置 |
| US9935152B2 (en) | 2012-12-27 | 2018-04-03 | General Electric Company | X-ray detector having improved noise performance |
| US9917133B2 (en) | 2013-12-12 | 2018-03-13 | General Electric Company | Optoelectronic device with flexible substrate |
| US10732131B2 (en) | 2014-03-13 | 2020-08-04 | General Electric Company | Curved digital X-ray detector for weld inspection |
| US9515276B2 (en) | 2014-09-02 | 2016-12-06 | General Electric Company | Organic X-ray detector and X-ray systems |
| US9689997B2 (en) | 2014-09-04 | 2017-06-27 | General Electric Company | Systems and methods for modular imaging detectors |
| US9535173B2 (en) | 2014-09-11 | 2017-01-03 | General Electric Company | Organic x-ray detector and x-ray systems |
| CN105628717B (zh) * | 2014-10-30 | 2020-05-19 | 通用电气公司 | 光检测器、x射线检测装置和x射线成像设备 |
| US10890669B2 (en) * | 2015-01-14 | 2021-01-12 | General Electric Company | Flexible X-ray detector and methods for fabricating the same |
| WO2017145578A1 (ja) * | 2016-02-22 | 2017-08-31 | ソニー株式会社 | 撮像装置、撮像表示システムおよび表示装置 |
| CN109196385B (zh) * | 2016-05-26 | 2023-08-15 | 皇家飞利浦有限公司 | 多功能辐射检测器 |
| CN110582708A (zh) * | 2017-05-01 | 2019-12-17 | 皇家飞利浦有限公司 | 多层辐射探测器 |
| KR102051957B1 (ko) * | 2017-11-13 | 2019-12-04 | 주식회사 토비스 | 곡면 디텍터의 제조방법 |
| CN110148602B (zh) * | 2019-05-07 | 2022-07-19 | 上海奕瑞光电子科技股份有限公司 | 一种x射线探测器 |
| US12372672B2 (en) | 2019-10-18 | 2025-07-29 | The University Of North Carolina At Chapel Hill | Membrane-perovskite films, devices, and methods of preparation |
| KR102373241B1 (ko) * | 2021-06-15 | 2022-03-15 | 주식회사 디알텍 | 방사선 디텍터 및 이를 포함하는 방사선 검사장치 |
| JP7636284B2 (ja) | 2021-07-19 | 2025-02-26 | 富士フイルム株式会社 | 放射線検出器、および放射線撮影装置 |
| CN115144417A (zh) * | 2022-06-08 | 2022-10-04 | 北京纳米维景科技有限公司 | 一种柔性ct探测器及其静态ct系统 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4403939A (en) * | 1979-02-21 | 1983-09-13 | Trustees Boston University | Process and apparatus for producing a molecularly oriented film |
| JPS6243585A (ja) * | 1985-08-21 | 1987-02-25 | Toshiba Corp | Ｘ線ｃｔ用検出器 |
| JPS6314469A (ja) * | 1986-07-07 | 1988-01-21 | Komatsu Ltd | フオトセンサアレイ装置およびその製造方法 |
| JPS6457871A (en) * | 1987-08-28 | 1989-03-06 | Hitachi Ltd | Image sensor |
| JPH01126584A (ja) * | 1987-11-12 | 1989-05-18 | Toshiba Corp | Ｘ線ｃｔ用放射線検出器 |
| JPH01202989A (ja) * | 1988-02-09 | 1989-08-15 | Nec Corp | 固体撮像装置 |
| JPH0637331B2 (ja) * | 1988-08-12 | 1994-05-18 | 吉田工業株式会社 | セラミックス押出長尺形材の焼成方法 |
| US5864146A (en) * | 1996-11-13 | 1999-01-26 | University Of Massachusetts Medical Center | System for quantitative radiographic imaging |
| JPH0511301U (ja) * | 1991-07-26 | 1993-02-12 | 日本板硝子株式会社 | Ｘ線イメージセンサ |
| JPH0634763A (ja) * | 1992-07-17 | 1994-02-10 | Fuji Electric Co Ltd | 放射線検出器 |
| US5315113A (en) * | 1992-09-29 | 1994-05-24 | The Perkin-Elmer Corporation | Scanning and high resolution x-ray photoelectron spectroscopy and imaging |
| US5515411A (en) * | 1993-03-31 | 1996-05-07 | Shimadzu Corporation | X-ray image pickup tube |
| US5686733A (en) * | 1996-03-29 | 1997-11-11 | Mcgill University | Megavoltage imaging method using a combination of a photoreceptor with a high energy photon converter and intensifier |
| EP0816873B1 (en) * | 1996-06-27 | 2002-10-09 | Analogic Corporation | Quadrature transverse computed tomography detection system |
| JP3597017B2 (ja) * | 1996-07-16 | 2004-12-02 | 日本碍子株式会社 | セラミック部材 |
| CA2184667C (en) * | 1996-09-03 | 2000-06-20 | Bradley Trent Polischuk | Multilayer plate for x-ray imaging and method of producing same |
| US6011575A (en) * | 1996-09-10 | 2000-01-04 | Konica Corporation | Image forming apparatus with line-shaped image exposure means |
| US6091795A (en) * | 1997-10-10 | 2000-07-18 | Analogic Corporation | Area detector array for computer tomography scanning system |
| US6139337A (en) | 1997-11-26 | 2000-10-31 | General Electric Company | Elastomeric connection for computed tomography system |
| GB2332608B (en) * | 1997-12-18 | 2000-09-06 | Simage Oy | Modular imaging apparatus |
| JP2000058995A (ja) * | 1998-08-11 | 2000-02-25 | Sumitomo Kinzoku Electro Device:Kk | セラミック回路基板及び半導体モジュール |
| WO2000062093A1 (en) | 1999-04-14 | 2000-10-19 | Juni Jack E | Single photon emission computed tomography system |
| US20010054723A1 (en) * | 2000-03-17 | 2001-12-27 | Tadashi Narui | Image sensor, method of fabricating the same, and exposure apparatus, measuring device, alignment device, and aberration measuring device using the image sensor |
| US6510195B1 (en) * | 2001-07-18 | 2003-01-21 | Koninklijke Philips Electronics, N.V. | Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same |
-
2003
- 2003-06-02 US US10/452,460 patent/US6982424B2/en not_active Expired - Lifetime
-
2004
- 2004-06-01 DE DE102004026948A patent/DE102004026948A1/de not_active Withdrawn
- 2004-06-01 JP JP2004162780A patent/JP4647938B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US6982424B2 (en) | 2006-01-03 |
| JP2004361402A (ja) | 2004-12-24 |
| JP4647938B2 (ja) | 2011-03-09 |
| US20040238750A1 (en) | 2004-12-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed |
Effective date: 20110511 |
|
| R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee | ||
| R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |
Effective date: 20150101 |