DE102004023407B8 - Testvorrichtung und Verfahren zum Testen eines eingebetteten Speicherkerns sowie zugehöriger Halbleiterchip - Google Patents

Testvorrichtung und Verfahren zum Testen eines eingebetteten Speicherkerns sowie zugehöriger Halbleiterchip Download PDF

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Publication number
DE102004023407B8
DE102004023407B8 DE102004023407.8A DE102004023407A DE102004023407B8 DE 102004023407 B8 DE102004023407 B8 DE 102004023407B8 DE 102004023407 A DE102004023407 A DE 102004023407A DE 102004023407 B8 DE102004023407 B8 DE 102004023407B8
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DE
Germany
Prior art keywords
testing
semiconductor chip
test device
memory core
embedded memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE102004023407.8A
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English (en)
Other versions
DE102004023407B4 (de
DE102004023407A1 (de
Inventor
Thomas Boehler
Jairam Vasudev Dasappa
Li Wang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
GlobalFoundries US Inc
Original Assignee
Infineon Technologies AG
International Business Machines Corp
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Publication date
Application filed by Infineon Technologies AG, International Business Machines Corp filed Critical Infineon Technologies AG
Publication of DE102004023407A1 publication Critical patent/DE102004023407A1/de
Publication of DE102004023407B4 publication Critical patent/DE102004023407B4/de
Application granted granted Critical
Publication of DE102004023407B8 publication Critical patent/DE102004023407B8/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56004—Pattern generation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0401—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals in embedded memories
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5606—Error catch memory
DE102004023407.8A 2003-05-12 2004-05-12 Testvorrichtung und Verfahren zum Testen eines eingebetteten Speicherkerns sowie zugehöriger Halbleiterchip Expired - Fee Related DE102004023407B8 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/435,842 US7159145B2 (en) 2003-05-12 2003-05-12 Built-in self test system and method
US10/435842 2003-05-12

Publications (3)

Publication Number Publication Date
DE102004023407A1 DE102004023407A1 (de) 2004-12-09
DE102004023407B4 DE102004023407B4 (de) 2013-10-10
DE102004023407B8 true DE102004023407B8 (de) 2014-01-23

Family

ID=33417019

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102004023407.8A Expired - Fee Related DE102004023407B8 (de) 2003-05-12 2004-05-12 Testvorrichtung und Verfahren zum Testen eines eingebetteten Speicherkerns sowie zugehöriger Halbleiterchip

Country Status (3)

Country Link
US (1) US7159145B2 (de)
CN (1) CN100399473C (de)
DE (1) DE102004023407B8 (de)

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DE10323865B4 (de) * 2003-05-26 2005-04-21 Infineon Technologies Ag Integrierte Schaltung, insbesondere integrierter Speicher, sowie Verfahren zum Betrieb einer integrierten Schaltung
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DE102006009224B4 (de) * 2006-02-28 2017-04-06 Advanced Micro Devices, Inc. Auswahl eines Testalgorithmus in einer Steuerung für eingebauten Speicherselbsttest
US7475315B1 (en) 2007-01-10 2009-01-06 Altera Corporation Configurable built in self test circuitry for testing memory arrays
JP4939427B2 (ja) * 2007-03-23 2012-05-23 株式会社アドバンテスト 試験装置及び電子デバイス
US7930601B2 (en) * 2008-02-22 2011-04-19 International Business Machines Corporation AC ABIST diagnostic method, apparatus and program product
US7847572B2 (en) * 2008-06-01 2010-12-07 Advantest Corporation Test system, electronic device, and test apparatus
US7830737B2 (en) * 2008-06-27 2010-11-09 International Business Machines Corporation SMI memory read data capture margin characterization circuits and methods
US8413036B2 (en) * 2008-11-28 2013-04-02 Agere Systems Llc Pseudorandom binary sequence checker with control circuitry for end-of-test check
CN101887758B (zh) * 2009-05-12 2013-01-16 北京兆易创新科技有限公司 非挥发性存储器的仿真验证方法
US8381019B2 (en) * 2010-06-24 2013-02-19 International Business Machines Corporation EDRAM macro disablement in cache memory
KR20120136474A (ko) * 2011-06-09 2012-12-20 삼성전자주식회사 반도체 테스트 장치 및 그 테스트 방법
CN103077748B (zh) * 2011-10-25 2015-09-16 珠海扬智电子科技有限公司 静态随机存取存储器的合并内建自我测试方法
US20150106673A1 (en) * 2013-10-16 2015-04-16 Taiwan Semiconductor Manufacturing Company Ltd. Method and apparatus for on-the-fly memory channel built-in-self-test
KR102185871B1 (ko) * 2014-01-23 2020-12-02 삼성전자주식회사 부분 칩과 이를 포함하는 시스템
US9514842B2 (en) * 2014-09-24 2016-12-06 Apple Inc. Memory testing system
CN106771982B (zh) * 2017-01-20 2019-12-10 珠海全志科技股份有限公司 芯片自动测试方法及系统
US10509074B2 (en) 2018-02-22 2019-12-17 Taiwan Semiconductor Manufacturing Company, Ltd. Electrical testing apparatus for spintronics devices
CN110427292A (zh) * 2019-07-29 2019-11-08 深圳忆联信息系统有限公司 利用内嵌rom对flash进行测试的方法及装置
CN113391184A (zh) 2020-03-11 2021-09-14 长鑫存储技术有限公司 控制芯片的测试方法及相关设备
CN113393892A (zh) 2020-03-11 2021-09-14 长鑫存储技术有限公司 控制芯片的测试方法及相关设备
CN113393887B (zh) 2020-03-11 2022-04-12 长鑫存储技术有限公司 存储器的测试方法及相关设备
CN111312328B (zh) * 2020-03-24 2023-10-20 上海华虹宏力半导体制造有限公司 嵌入式闪存的测试方法、测试设备和嵌入式闪存芯片
CN113032270B (zh) * 2021-03-31 2023-08-22 上海天旦网络科技发展有限公司 一种基于流量对比的白盒仿真测试方法及系统
CN115691632B (zh) * 2022-10-19 2023-07-07 中科声龙科技发展（北京）有限公司 测试控制系统和方法

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Also Published As

Publication number Publication date
DE102004023407B4 (de) 2013-10-10
CN1551225A (zh) 2004-12-01
CN100399473C (zh) 2008-07-02
DE102004023407A1 (de) 2004-12-09
US7159145B2 (en) 2007-01-02
US20040230870A1 (en) 2004-11-18

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