DD287572A5 - Sonden - Google Patents

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Publication number
DD287572A5
DD287572A5 DD89330464A DD33046489A DD287572A5 DD 287572 A5 DD287572 A5 DD 287572A5 DD 89330464 A DD89330464 A DD 89330464A DD 33046489 A DD33046489 A DD 33046489A DD 287572 A5 DD287572 A5 DD 287572A5
Authority
DD
German Democratic Republic
Prior art keywords
probe
light
support assembly
probe according
sensing
Prior art date
Application number
DD89330464A
Other languages
German (de)
English (en)
Inventor
Clive Butler
Original Assignee
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Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ��������@��������@����������@���k�� filed Critical ��������@��������@����������@���k��
Publication of DD287572A5 publication Critical patent/DD287572A5/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G01B11/007—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012—Contact-making feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
    • G01B7/012—Contact-making feeler heads therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DD89330464A 1988-07-05 1989-07-05 Sonden DD287572A5 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB888815984A GB8815984D0 (en) 1988-07-05 1988-07-05 Probes

Publications (1)

Publication Number Publication Date
DD287572A5 true DD287572A5 (de) 1991-02-28

Family

ID=10639900

Family Applications (1)

Application Number Title Priority Date Filing Date
DD89330464A DD287572A5 (de) 1988-07-05 1989-07-05 Sonden

Country Status (7)

Country Link
US (1) US5222304A (fr)
EP (1) EP0423209B1 (fr)
JP (1) JPH03502603A (fr)
DD (1) DD287572A5 (fr)
DE (1) DE68921003T2 (fr)
GB (2) GB8815984D0 (fr)
WO (1) WO1990000717A1 (fr)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2644883B1 (fr) * 1989-03-23 1992-11-20 Commissariat Energie Atomique Capteur de contact multidirectionnel pour machines de controle
GB2238616B (en) * 1989-10-18 1993-06-23 Mitutoyo Corp Touch signal probe
US5491904A (en) * 1990-02-23 1996-02-20 Mcmurtry; David R. Touch probe
GB9004117D0 (en) * 1990-02-23 1990-04-18 Renishaw Plc Touch probe
EP0521092B1 (fr) * 1990-03-23 1997-08-13 Geotronics Ab Capteur a deplacement analogique
GB9116044D0 (en) * 1991-07-24 1991-09-11 Nat Res Dev Probes
JP3153111B2 (ja) * 1995-09-18 2001-04-03 株式会社ミツトヨ 手動操作型三次元測定機
IT1299954B1 (it) * 1998-04-06 2000-04-04 Marposs Spa Sonda a rilevamento di contatto.
DE19848067B4 (de) * 1998-10-19 2004-05-19 Siemens Ag Einrichtung zur Erfassung der räumlichen Verlagerung von Konstruktionsteilen und/oder Strukturen
GB9907643D0 (en) * 1999-04-06 1999-05-26 Renishaw Plc Measuring probe
JP4663378B2 (ja) * 2005-04-01 2011-04-06 パナソニック株式会社 形状測定装置及び方法
US7422634B2 (en) 2005-04-07 2008-09-09 Cree, Inc. Three inch silicon carbide wafer with low warp, bow, and TTV
GB0508388D0 (en) * 2005-04-26 2005-06-01 Renishaw Plc Surface sensing device with optical sensor
DE102005054593B4 (de) * 2005-11-14 2018-04-26 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Messonde zur Messung der Dicke dünner Schichten
GB0608998D0 (en) * 2006-05-08 2006-06-14 Renishaw Plc Contact sensing probe
JP5276803B2 (ja) * 2007-06-11 2013-08-28 パナソニック株式会社 形状測定方法
EP2028439A1 (fr) * 2007-07-26 2009-02-25 Renishaw plc Appareil de mesure pouvant être désactivé
EP2018934A1 (fr) * 2007-07-26 2009-01-28 Renishaw plc Dispositif de mesure doté d'un module d'authentification
KR20120006979A (ko) * 2009-03-24 2012-01-19 코니카 미놀타 옵토 인코포레이티드 형상 측정 장치
EP2385339A1 (fr) * 2010-05-05 2011-11-09 Leica Geosystems AG Dispositif de détection de surface doté d'un système de surveillance optique
EP2665987B1 (fr) 2011-01-19 2015-04-15 Renishaw PLC Sonde de mesure analogique pour un appareil de machine-outil et procédé de fonctionnement
EP2615425B1 (fr) * 2012-01-13 2018-03-07 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Système de mesure pour déclencheur tactile optique ou sonde de balayage doté d'un miroir concave
CN102749032A (zh) * 2012-06-26 2012-10-24 浙江省质量检测科学研究院 光磁结合的全角度三维探测系统
JP6108757B2 (ja) 2012-10-19 2017-04-05 株式会社ミツトヨ 複円錐型スタイラスの校正方法
EP2977714B1 (fr) * 2014-07-22 2016-05-18 Tschorn GmbH Palpeur de mesure doté d'un bras palpeur et d'un corps de palpeur conique
US9791262B2 (en) * 2015-12-17 2017-10-17 Mitutoyo Corporation Measurement device with multiplexed position signals
US9803972B2 (en) * 2015-12-17 2017-10-31 Mitutoyo Corporation Optical configuration for measurement device
DE102016117970A1 (de) * 2016-09-23 2018-03-29 M & H Inprocess Messtechnik Gmbh Tastfühler
DE102016117980A1 (de) * 2016-09-23 2018-03-29 M & H Inprocess Messtechnik Gmbh Tastfühler
GB201806828D0 (en) * 2018-04-26 2018-06-13 Renishaw Plc Surface finish stylus
GB201806830D0 (en) * 2018-04-26 2018-06-13 Renishaw Plc Surface finish stylus
JP6799815B2 (ja) * 2018-05-21 2020-12-16 パナソニックＩｐマネジメント株式会社 形状測定用プローブ
IT201900006536A1 (it) 2019-05-06 2020-11-06 Marposs Spa Sonda per il controllo della posizione o di dimensioni lineari di una parte meccanica

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB773238A (en) * 1955-01-12 1957-04-24 Ass Elect Ind Improvements relating to apparatus for indicating small movements
US3571934A (en) * 1968-06-24 1971-03-23 Lockheed Aircraft Corp Three-axis inspection probe
US3520063A (en) * 1968-08-30 1970-07-14 Rohr Corp Multiaxis inspection probe
CH611196A5 (fr) * 1976-09-27 1979-05-31 Int De Rech Tech Et De Consule
DE2712181C3 (de) * 1977-03-19 1981-01-22 Fa. Carl Zeiss, 7920 Heidenheim Tastsystem
FR2458791A1 (fr) * 1979-06-13 1981-01-02 Seiv Automation Dispositif de mesure a commande numerique
JPS5828601A (ja) * 1981-08-13 1983-02-19 Hitachi Metals Ltd タツチセンサ−
JPS58169001A (ja) * 1982-03-31 1983-10-05 Mitsutoyo Mfg Co Ltd ２方向タツチセンサ
DE3215878A1 (de) * 1982-04-29 1983-11-03 Fa. Carl Zeiss, 7920 Heidenheim Tastkopf fuer koordinatenmessgeraete
DE3229992C2 (de) * 1982-08-12 1986-02-06 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Mehrkoordinaten-Tastkopf
DE8222757U1 (de) * 1982-08-12 1986-10-23 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Mehrkoordinaten-Tastkopf
US4513507A (en) * 1983-09-02 1985-04-30 Bendix Automation Company Contact sensing probe for a measuring apparatus
JPS631207U (fr) * 1986-06-20 1988-01-07
FR2614690B1 (fr) * 1987-04-28 1990-11-09 Essilor Int Appareil de lecture de contour, notamment pour monture de lunettes

Also Published As

Publication number Publication date
EP0423209A1 (fr) 1991-04-24
GB2220748A (en) 1990-01-17
GB8915303D0 (en) 1989-08-23
WO1990000717A1 (fr) 1990-01-25
GB8815984D0 (en) 1988-08-10
GB2220748B (en) 1992-07-29
US5222304A (en) 1993-06-29
JPH03502603A (ja) 1991-06-13
DE68921003T2 (de) 1995-06-22
DE68921003D1 (de) 1995-03-16
EP0423209B1 (fr) 1995-02-01

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Legal Events

Date Code Title Description
RPI Change in the person, name or address of the patentee (searches according to art. 11 and 12 extension act)
RPI Change in the person, name or address of the patentee (searches according to art. 11 and 12 extension act)
RPV Change in the person, the name or the address of the representative (searches according to art. 11 and 12 extension act)
ENJ Ceased due to non-payment of renewal fee