CZ20032169A3 - Tantal-křemíkové a niob-křemíkové substráty pro anody kondenzátorů - Google Patents

Tantal-křemíkové a niob-křemíkové substráty pro anody kondenzátorů Download PDF

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Publication number
CZ20032169A3
CZ20032169A3 CZ20032169A CZ20032169A CZ20032169A3 CZ 20032169 A3 CZ20032169 A3 CZ 20032169A3 CZ 20032169 A CZ20032169 A CZ 20032169A CZ 20032169 A CZ20032169 A CZ 20032169A CZ 20032169 A3 CZ20032169 A3 CZ 20032169A3
Authority
CZ
Czechia
Prior art keywords
silicon
tan
tantalum
fcfcfc
powder
Prior art date
Application number
CZ20032169A
Other languages
Czech (cs)
English (en)
Inventor
Leah Simkins
Anastasia Conlon
Original Assignee
H. C. Starck Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by H. C. Starck Inc. filed Critical H. C. Starck Inc.
Publication of CZ20032169A3 publication Critical patent/CZ20032169A3/cs

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/004Details
    • H01G9/04Electrodes or formation of dielectric layers thereon
    • H01G9/042Electrodes or formation of dielectric layers thereon characterised by the material
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25BELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
    • C25B11/00Electrodes; Manufacture thereof not otherwise provided for
    • C25B11/04Electrodes; Manufacture thereof not otherwise provided for characterised by the material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/004Details
    • H01G9/04Electrodes or formation of dielectric layers thereon
    • H01G9/048Electrodes or formation of dielectric layers thereon characterised by their structure
    • H01G9/052Sintered electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/004Details
    • H01G9/04Electrodes or formation of dielectric layers thereon
    • H01G9/048Electrodes or formation of dielectric layers thereon characterised by their structure
    • H01G9/052Sintered electrodes
    • H01G9/0525Powder therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Powder Metallurgy (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Inorganic Insulating Materials (AREA)
CZ20032169A 2001-02-12 2002-02-12 Tantal-křemíkové a niob-křemíkové substráty pro anody kondenzátorů CZ20032169A3 (cs)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26837801P 2001-02-12 2001-02-12

Publications (1)

Publication Number Publication Date
CZ20032169A3 true CZ20032169A3 (cs) 2004-03-17

Family

ID=23022730

Family Applications (1)

Application Number Title Priority Date Filing Date
CZ20032169A CZ20032169A3 (cs) 2001-02-12 2002-02-12 Tantal-křemíkové a niob-křemíkové substráty pro anody kondenzátorů

Country Status (12)

Country Link
EP (1) EP1370716A4 (de)
JP (1) JP2004518818A (de)
KR (1) KR20030086593A (de)
CN (1) CN1327035C (de)
AU (1) AU2002243956B2 (de)
BR (1) BR0207200A (de)
CA (1) CA2438246A1 (de)
CZ (1) CZ20032169A3 (de)
IL (1) IL157273A0 (de)
MX (1) MXPA03007171A (de)
RU (1) RU2003127948A (de)
WO (1) WO2002064858A1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CZ306436B6 (cs) * 2006-05-05 2017-01-25 Cabot Corporation Tantalový prášek a způsob jeho výroby a anoda elektrolytického kondenzátoru

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL157273A0 (en) * 2001-02-12 2004-02-19 Starck H C Inc Tantalum-silicon and niobium-silicon substrates for capacitor anodes
US7811355B2 (en) 2003-11-10 2010-10-12 Showa Denko K.K. Niobium powder for capacitor, niobium sintered body and capacitor
CN1913523A (zh) * 2005-08-09 2007-02-14 华为技术有限公司 实现层级化虚拟私有交换业务的方法
US7852615B2 (en) * 2008-01-22 2010-12-14 Avx Corporation Electrolytic capacitor anode treated with an organometallic compound

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1165510A (en) * 1968-12-13 1969-10-01 Standard Telephones Cables Ltd Solid Electrolytic Capacitors
US4432035A (en) * 1982-06-11 1984-02-14 International Business Machines Corp. Method of making high dielectric constant insulators and capacitors using same
US4859257A (en) * 1986-01-29 1989-08-22 Fansteel Inc. Fine grained embrittlement resistant tantalum wire
CN1010447B (zh) * 1987-06-17 1990-11-14 北京有色金属研究总院 固体电解电容器制造方法
US4957541A (en) * 1988-11-01 1990-09-18 Nrc, Inc. Capacitor grade tantalum powder
JP2895166B2 (ja) * 1990-05-31 1999-05-24 キヤノン株式会社 半導体装置の製造方法
US5965942A (en) * 1994-09-28 1999-10-12 Sharp Kabushiki Kaisha Semiconductor memory device with amorphous diffusion barrier between capacitor and plug
KR100240649B1 (ko) * 1996-11-07 2000-02-01 정선종 삼원계 확산 방지막 형성 방법
US6576069B1 (en) * 1998-05-22 2003-06-10 Cabot Corporation Tantalum-silicon alloys and products containing the same and processes of making the same
JP3667531B2 (ja) * 1998-07-07 2005-07-06 松下電器産業株式会社 電解コンデンサの製造方法
IL157273A0 (en) * 2001-02-12 2004-02-19 Starck H C Inc Tantalum-silicon and niobium-silicon substrates for capacitor anodes

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CZ306436B6 (cs) * 2006-05-05 2017-01-25 Cabot Corporation Tantalový prášek a způsob jeho výroby a anoda elektrolytického kondenzátoru

Also Published As

Publication number Publication date
KR20030086593A (ko) 2003-11-10
CN1327035C (zh) 2007-07-18
EP1370716A1 (de) 2003-12-17
WO2002064858A1 (en) 2002-08-22
CA2438246A1 (en) 2002-08-22
EP1370716A4 (de) 2007-08-08
AU2002243956B2 (en) 2007-08-02
BR0207200A (pt) 2004-01-27
JP2004518818A (ja) 2004-06-24
CN1491298A (zh) 2004-04-21
IL157273A0 (en) 2004-02-19
MXPA03007171A (es) 2005-02-14
RU2003127948A (ru) 2005-03-27

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