IL157273A0 - Tantalum-silicon and niobium-silicon substrates for capacitor anodes - Google Patents

Tantalum-silicon and niobium-silicon substrates for capacitor anodes

Info

Publication number
IL157273A0
IL157273A0 IL15727302A IL15727302A IL157273A0 IL 157273 A0 IL157273 A0 IL 157273A0 IL 15727302 A IL15727302 A IL 15727302A IL 15727302 A IL15727302 A IL 15727302A IL 157273 A0 IL157273 A0 IL 157273A0
Authority
IL
Israel
Prior art keywords
silicon
niobium
tantalum
capacitor anodes
substrates
Prior art date
Application number
IL15727302A
Original Assignee
Starck H C Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Starck H C Inc filed Critical Starck H C Inc
Publication of IL157273A0 publication Critical patent/IL157273A0/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/004Details
    • H01G9/04Electrodes or formation of dielectric layers thereon
    • H01G9/042Electrodes or formation of dielectric layers thereon characterised by the material
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25BELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
    • C25B11/00Electrodes; Manufacture thereof not otherwise provided for
    • C25B11/04Electrodes; Manufacture thereof not otherwise provided for characterised by the material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/004Details
    • H01G9/04Electrodes or formation of dielectric layers thereon
    • H01G9/048Electrodes or formation of dielectric layers thereon characterised by their structure
    • H01G9/052Sintered electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/004Details
    • H01G9/04Electrodes or formation of dielectric layers thereon
    • H01G9/048Electrodes or formation of dielectric layers thereon characterised by their structure
    • H01G9/052Sintered electrodes
    • H01G9/0525Powder therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Powder Metallurgy (AREA)
  • Inorganic Insulating Materials (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
IL15727302A 2001-02-12 2002-02-12 Tantalum-silicon and niobium-silicon substrates for capacitor anodes IL157273A0 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US26837801P 2001-02-12 2001-02-12
PCT/US2002/004073 WO2002064858A1 (en) 2001-02-12 2002-02-12 Tantalum-silicon and niobium-silicon substrates for capacitor anodes

Publications (1)

Publication Number Publication Date
IL157273A0 true IL157273A0 (en) 2004-02-19

Family

ID=23022730

Family Applications (1)

Application Number Title Priority Date Filing Date
IL15727302A IL157273A0 (en) 2001-02-12 2002-02-12 Tantalum-silicon and niobium-silicon substrates for capacitor anodes

Country Status (12)

Country Link
EP (1) EP1370716A4 (en)
JP (1) JP2004518818A (en)
KR (1) KR20030086593A (en)
CN (1) CN1327035C (en)
AU (1) AU2002243956B2 (en)
BR (1) BR0207200A (en)
CA (1) CA2438246A1 (en)
CZ (1) CZ20032169A3 (en)
IL (1) IL157273A0 (en)
MX (1) MXPA03007171A (en)
RU (1) RU2003127948A (en)
WO (1) WO2002064858A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2003127948A (en) * 2001-02-12 2005-03-27 Х.Ц. Штарк, Инк. (Us) TANTAL-SILICON AND NIOBI-SILICON SUBSTRATES FOR ANODES
KR101132267B1 (en) * 2003-11-10 2012-04-02 쇼와 덴코 가부시키가이샤 Niobium powder for capacitor, niobium sintered body and capacitor
CN1913523A (en) * 2005-08-09 2007-02-14 华为技术有限公司 Method for implementing layer level virtual private exchange service
JP2009536266A (en) * 2006-05-05 2009-10-08 キャボット コーポレイション Tantalum powder and method for producing the same
US7852615B2 (en) * 2008-01-22 2010-12-14 Avx Corporation Electrolytic capacitor anode treated with an organometallic compound

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1165510A (en) * 1968-12-13 1969-10-01 Standard Telephones Cables Ltd Solid Electrolytic Capacitors
US4432035A (en) * 1982-06-11 1984-02-14 International Business Machines Corp. Method of making high dielectric constant insulators and capacitors using same
US4859257A (en) * 1986-01-29 1989-08-22 Fansteel Inc. Fine grained embrittlement resistant tantalum wire
CN1010447B (en) * 1987-06-17 1990-11-14 北京有色金属研究总院 Production method of solid electrolytic capacitors
US4957541A (en) * 1988-11-01 1990-09-18 Nrc, Inc. Capacitor grade tantalum powder
JP2895166B2 (en) * 1990-05-31 1999-05-24 キヤノン株式会社 Method for manufacturing semiconductor device
US5965942A (en) * 1994-09-28 1999-10-12 Sharp Kabushiki Kaisha Semiconductor memory device with amorphous diffusion barrier between capacitor and plug
KR100240649B1 (en) * 1996-11-07 2000-02-01 정선종 Method for forming diffusion prevention film
US6576069B1 (en) * 1998-05-22 2003-06-10 Cabot Corporation Tantalum-silicon alloys and products containing the same and processes of making the same
JP3667531B2 (en) * 1998-07-07 2005-07-06 松下電器産業株式会社 Electrolytic capacitor manufacturing method
RU2003127948A (en) * 2001-02-12 2005-03-27 Х.Ц. Штарк, Инк. (Us) TANTAL-SILICON AND NIOBI-SILICON SUBSTRATES FOR ANODES

Also Published As

Publication number Publication date
CA2438246A1 (en) 2002-08-22
WO2002064858A1 (en) 2002-08-22
JP2004518818A (en) 2004-06-24
EP1370716A4 (en) 2007-08-08
KR20030086593A (en) 2003-11-10
BR0207200A (en) 2004-01-27
CN1327035C (en) 2007-07-18
CZ20032169A3 (en) 2004-03-17
CN1491298A (en) 2004-04-21
MXPA03007171A (en) 2005-02-14
AU2002243956B2 (en) 2007-08-02
RU2003127948A (en) 2005-03-27
EP1370716A1 (en) 2003-12-17

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