CN204128496U - 光学膜贴合位置测定装置及光学显示装置生产线 - Google Patents

光学膜贴合位置测定装置及光学显示装置生产线 Download PDF

Info

Publication number
CN204128496U
CN204128496U CN201420442537.9U CN201420442537U CN204128496U CN 204128496 U CN204128496 U CN 204128496U CN 201420442537 U CN201420442537 U CN 201420442537U CN 204128496 U CN204128496 U CN 204128496U
Authority
CN
China
Prior art keywords
optical film
optical
bonding position
position measuring
display device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CN201420442537.9U
Other languages
English (en)
Chinese (zh)
Inventor
由良友和
小盐智
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to CN201420442537.9U priority Critical patent/CN204128496U/zh
Priority to JP2015004179A priority patent/JP5924511B2/ja
Application granted granted Critical
Publication of CN204128496U publication Critical patent/CN204128496U/zh
Priority to TW104105056A priority patent/TWI592715B/zh
Priority to KR1020150034962A priority patent/KR101756904B1/ko
Priority to PCT/JP2015/071515 priority patent/WO2016021463A1/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mathematical Physics (AREA)
CN201420442537.9U 2014-08-07 2014-08-07 光学膜贴合位置测定装置及光学显示装置生产线 Expired - Lifetime CN204128496U (zh)

Priority Applications (5)

Application Number Priority Date Filing Date Title
CN201420442537.9U CN204128496U (zh) 2014-08-07 2014-08-07 光学膜贴合位置测定装置及光学显示装置生产线
JP2015004179A JP5924511B2 (ja) 2014-08-07 2015-01-13 光学フィルム貼付位置測定装置
TW104105056A TWI592715B (zh) 2014-08-07 2015-02-13 光學膜黏貼位置測定裝置
KR1020150034962A KR101756904B1 (ko) 2014-08-07 2015-03-13 광학 필름 첩부 위치 측정 장치
PCT/JP2015/071515 WO2016021463A1 (ja) 2014-08-07 2015-07-29 光学フィルム貼付位置測定装置及び光学表示装置製造ライン

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201420442537.9U CN204128496U (zh) 2014-08-07 2014-08-07 光学膜贴合位置测定装置及光学显示装置生产线

Publications (1)

Publication Number Publication Date
CN204128496U true CN204128496U (zh) 2015-01-28

Family

ID=52384845

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201420442537.9U Expired - Lifetime CN204128496U (zh) 2014-08-07 2014-08-07 光学膜贴合位置测定装置及光学显示装置生产线

Country Status (5)

Country Link
JP (1) JP5924511B2 (enExample)
KR (1) KR101756904B1 (enExample)
CN (1) CN204128496U (enExample)
TW (1) TWI592715B (enExample)
WO (1) WO2016021463A1 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113155889A (zh) * 2020-10-20 2021-07-23 住华科技股份有限公司 光学膜检测系统及应用其的光学膜检测方法
CN114111607A (zh) * 2021-09-30 2022-03-01 杭州徐睿机械有限公司 一种跳转接头压装组件间隙的检测装置及检测方法
CN114505813A (zh) * 2022-01-19 2022-05-17 业成科技(成都)有限公司 贴合装置及贴合方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101955757B1 (ko) * 2016-06-08 2019-03-07 삼성에스디아이 주식회사 필름 처리장치 및 처리방법
WO2018003578A1 (ja) * 2016-06-30 2018-01-04 日本電産サンキョー株式会社 アライメント装置
JP6786381B2 (ja) * 2016-06-30 2020-11-18 日本電産サンキョー株式会社 アライメント装置
JP2022090281A (ja) * 2020-12-07 2022-06-17 日東電工株式会社 光学フィルムの縁部検出方法
JP2022090247A (ja) * 2020-12-07 2022-06-17 日東電工株式会社 光学フィルムの縁部検出方法
CN112596286B (zh) * 2020-12-15 2022-11-04 滁州惠科光电科技有限公司 一种偏光片检测方法、装置及偏光片贴附机
CN116176100A (zh) * 2022-12-22 2023-05-30 成都瑞波科材料科技有限公司 一种用于贴合光学膜片的贴膜设备及贴膜方法
TWI880689B (zh) * 2023-03-29 2025-04-11 日商芝浦機械電子裝置股份有限公司 黏附裝置及檢查方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3948522B2 (ja) 2003-01-30 2007-07-25 株式会社タカトリ 液晶パネルの偏光板貼付け精度検査方法
JP4197488B2 (ja) * 2003-12-04 2008-12-17 株式会社山武 偏光板貼り付け位置検査装置
KR100955486B1 (ko) * 2004-01-30 2010-04-30 삼성전자주식회사 디스플레이 패널의 검사장치 및 검사방법
JP2006126483A (ja) 2004-10-28 2006-05-18 Sharp Corp 液晶表示パネルの製造方法および液晶表示パネルの製造装置
JP2007212939A (ja) * 2006-02-13 2007-08-23 Hitachi High-Technologies Corp 位置ずれ検査方法、プログラム及び位置ずれ検査装置
JP4774123B1 (ja) 2010-03-18 2011-09-14 住友化学株式会社 偏光板の貼合精度検査方法および貼合精度検査装置
CN102736280A (zh) * 2012-05-22 2012-10-17 北京京东方光电科技有限公司 偏光板贴附精度检测装置及方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113155889A (zh) * 2020-10-20 2021-07-23 住华科技股份有限公司 光学膜检测系统及应用其的光学膜检测方法
CN114111607A (zh) * 2021-09-30 2022-03-01 杭州徐睿机械有限公司 一种跳转接头压装组件间隙的检测装置及检测方法
CN114111607B (zh) * 2021-09-30 2024-01-23 杭州徐睿机械有限公司 一种跳转接头压装组件间隙的检测装置及检测方法
CN114505813A (zh) * 2022-01-19 2022-05-17 业成科技(成都)有限公司 贴合装置及贴合方法
CN114505813B (zh) * 2022-01-19 2023-05-05 业成科技(成都)有限公司 贴合装置及贴合方法

Also Published As

Publication number Publication date
TWI592715B (zh) 2017-07-21
KR20160018328A (ko) 2016-02-17
TW201606382A (zh) 2016-02-16
JP2016038565A (ja) 2016-03-22
JP5924511B2 (ja) 2016-05-25
KR101756904B1 (ko) 2017-07-11
WO2016021463A1 (ja) 2016-02-11

Similar Documents

Publication Publication Date Title
CN204128496U (zh) 光学膜贴合位置测定装置及光学显示装置生产线
CN101051619B (zh) 基板检查装置及使用其的基板检查方法
US20120307041A1 (en) Image acquisition apparatus, pattern inspection apparatus, and image acquisition method
TWI537547B (zh) Polarized light irradiation device for light orientation and polarized light irradiation method for light orientation
TW201334090A (zh) 剝離裝置及電子元件之製造方法
KR101775458B1 (ko) 곡면 모델 디스플레이 정렬 상태 검사 시스템 및 곡면 모델 디스플레이 정렬 상태 검사 방법
KR20150085224A (ko) 기판의 에지부 검사장치
TWI512276B (zh) 量測發光二極體模組之光軸的方法
JP2016038565A5 (enExample)
KR100840832B1 (ko) 엘시디패널의 외관 검사장치
KR20110078958A (ko) 엘시디 패널 외관 검사장치
CN104990942A (zh) 透明玻璃容器制造缺陷视觉检测系统及方法
CN105450912B (zh) 扫描法面阵ccd探测器实时视场拼接方法
CN105044942A (zh) 液晶显示面板的对位检查设备及对位检查方法
CN104136969B (zh) 三维液晶显示装置的制造装置以及制造方法
CN110231003A (zh) 一种平整度测量装置
KR101506716B1 (ko) 기판과 베어 글라스의 합착을 위한 정렬방법
TW201509679A (zh) 薄膜貼合裝置、光學顯示設備之生產系統及光學顯示設備之生產方法
KR102246361B1 (ko) 패널 얼라인 장치 및 이를 이용한 패널 얼라인 방법
JP4396582B2 (ja) 光学装置の製造装置、およびその製造方法
CN211528226U (zh) 一种屏幕外观缺陷在线检测装置
TWM477571U (zh) 一種用以擷取一物件影像的擷取裝置以及影像檢測裝置
TWM451540U (zh) 檢測裝置
JP2014095617A (ja) パターン測定装置およびパターン測定方法
KR101995289B1 (ko) 이물질 검출 방법

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CX01 Expiry of patent term
CX01 Expiry of patent term

Granted publication date: 20150128