CN1849520B - 用于执行互连测试的方法和设备 - Google Patents

用于执行互连测试的方法和设备 Download PDF

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Publication number
CN1849520B
CN1849520B CN2004800260713A CN200480026071A CN1849520B CN 1849520 B CN1849520 B CN 1849520B CN 2004800260713 A CN2004800260713 A CN 2004800260713A CN 200480026071 A CN200480026071 A CN 200480026071A CN 1849520 B CN1849520 B CN 1849520B
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China
Prior art keywords
component
pattern
communication path
buffer
coupled
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Expired - Fee Related
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CN2004800260713A
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English (en)
Chinese (zh)
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CN1849520A (zh
Inventor
菲利普·尤恩格
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Rambus Inc
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Rambus Inc
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Publication of CN1849520A publication Critical patent/CN1849520A/zh
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Publication of CN1849520B publication Critical patent/CN1849520B/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/31855—Interconnection testing, e.g. crosstalk, shortcircuits

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
CN2004800260713A 2003-09-15 2004-06-29 用于执行互连测试的方法和设备 Expired - Fee Related CN1849520B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/663,572 2003-09-15
US10/663,572 US7031868B2 (en) 2003-09-15 2003-09-15 Method and apparatus for performing testing of interconnections
PCT/US2004/021369 WO2005036190A1 (en) 2003-09-15 2004-06-29 Method and apparatus for performing testing of interconnections

Publications (2)

Publication Number Publication Date
CN1849520A CN1849520A (zh) 2006-10-18
CN1849520B true CN1849520B (zh) 2012-01-11

Family

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Family Applications (1)

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CN2004800260713A Expired - Fee Related CN1849520B (zh) 2003-09-15 2004-06-29 用于执行互连测试的方法和设备

Country Status (4)

Country Link
US (2) US7031868B2 (https=)
JP (1) JP4728238B2 (https=)
CN (1) CN1849520B (https=)
WO (1) WO2005036190A1 (https=)

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JP2007526992A (ja) * 2003-07-09 2007-09-20 イスラーユック エレクトロニクス リミテッド 電気故障検出のためのシステム、装置、及び方法
US7478005B2 (en) 2005-04-28 2009-01-13 Rambus Inc. Technique for testing interconnections between electronic components
US9053164B2 (en) * 2005-05-05 2015-06-09 International Business Machines Corporation Method, system, and program product for using analysis views to identify data synchronization problems between databases
US7375541B1 (en) * 2005-11-08 2008-05-20 Mediatek Inc. Testing method utilizing at least one signal between integrated circuits, and integrated circuit and testing system thereof
US20080204040A1 (en) * 2007-02-28 2008-08-28 Harry Muljono Systems and arrangements for determining properties of a transmission path
US7791982B2 (en) * 2007-06-29 2010-09-07 Karr Lawrence J Impact energy powered golf ball transmitter
US9501302B1 (en) * 2008-06-06 2016-11-22 Amdocs Software Systems Limited System, method, and computer program for combining results of event processing received from a plurality of virtual servers
US8850458B1 (en) * 2008-06-06 2014-09-30 Amdocs Software Systems Limited System, method, and computer program for combining results of event processing received from a plurality of servers
JP5655534B2 (ja) * 2009-12-18 2015-01-21 日本電波工業株式会社 電圧制御可変容量及び電圧制御発振器
US8495758B2 (en) * 2010-06-18 2013-07-23 Alcatel Lucent Method and apparatus for providing scan chain security
CN101995546B (zh) * 2010-11-16 2013-02-27 复旦大学 基于边界扫描的可编程逻辑器件自动测试系统与方法
CN102435797A (zh) * 2011-09-29 2012-05-02 上海交通大学 示波器无线探头
US9190146B2 (en) 2013-02-28 2015-11-17 Kabushiki Kaisha Toshiba Variable resistance memory system with redundancy lines and shielded bit lines
US9454499B2 (en) 2013-06-11 2016-09-27 Intel Corporation Asynchronous communication between devices
CN104502835B (zh) * 2014-12-09 2017-05-17 中国航空工业集团公司第六三一研究所 一种串行链路片内信号质量示波电路及方法
US9768834B2 (en) * 2015-02-11 2017-09-19 International Business Machines Corporation Parallel testing of a controller area network bus cable
CN109901044B (zh) * 2017-12-07 2021-11-12 英业达科技有限公司 多电路板的中央处理单元差分测试系统及其方法
CN109901048B (zh) * 2017-12-09 2021-04-27 英业达科技有限公司 以不同扫描链测试差分线路的系统及其方法
CN112305398A (zh) 2019-08-01 2021-02-02 富港电子（东莞）有限公司 自动化电路板测试系统及其方法
CN110412403B (zh) * 2019-08-07 2021-09-17 中核控制系统工程有限公司 核安全级系统通用输入输出端口动态诊断电路及方法
US11204849B2 (en) * 2020-03-13 2021-12-21 Nvidia Corporation Leveraging low power states for fault testing of processing cores at runtime

Citations (3)

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Publication number Priority date Publication date Assignee Title
US5621741A (en) * 1993-03-01 1997-04-15 Fujitsu Limited Method and apparatus for testing terminal connections of semiconductor integrated circuits
US6208571B1 (en) * 1999-04-30 2001-03-27 Fujitsu Limited Semiconductor memory device, circuit board mounted with semiconductor memory device, and method for testing interconnection between a semiconductor memory device with a circuit board
US6505317B1 (en) * 2000-03-24 2003-01-07 Sun Microsystems, Inc. System and method for testing signal interconnections using built-in self test

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JPH02247754A (ja) * 1989-03-20 1990-10-03 Pfu Ltd メモリシステムの断線検出処理装置
US5624741A (en) * 1990-05-31 1997-04-29 E. I. Du Pont De Nemours And Company Interconnect structure having electrical conduction paths formable therein
JPH0436857A (ja) * 1990-06-01 1992-02-06 Oki Electric Ind Co Ltd マルチプロセッサシステムにおけるバス診断方式
JPH09237164A (ja) * 1996-03-04 1997-09-09 Oki Electric Ind Co Ltd 半導体ディスク装置
US5717701A (en) * 1996-08-13 1998-02-10 International Business Machines Corporation Apparatus and method for testing interconnections between semiconductor devices
WO1999039218A2 (en) * 1998-02-02 1999-08-05 Koninklijke Philips Electronics N.V. Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit
AR022137A1 (es) 1998-12-31 2002-09-04 Kimberly Clark Co Una composicion de materia, una pelicula y un articulo que comprenden dicha composicion
JP3771393B2 (ja) * 1999-04-30 2006-04-26 富士通株式会社 半導体記憶装置、この半導体記憶装置を搭載した回路基板、および、この半導体記憶装置の接続試験方法
US6609221B1 (en) * 1999-08-31 2003-08-19 Sun Microsystems, Inc. Method and apparatus for inducing bus saturation during operational testing of busses using a pattern generator
US6885209B2 (en) * 2002-08-21 2005-04-26 Intel Corporation Device testing
US7047458B2 (en) * 2002-12-16 2006-05-16 Intel Corporation Testing methodology and apparatus for interconnects

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5621741A (en) * 1993-03-01 1997-04-15 Fujitsu Limited Method and apparatus for testing terminal connections of semiconductor integrated circuits
US6208571B1 (en) * 1999-04-30 2001-03-27 Fujitsu Limited Semiconductor memory device, circuit board mounted with semiconductor memory device, and method for testing interconnection between a semiconductor memory device with a circuit board
US6505317B1 (en) * 2000-03-24 2003-01-07 Sun Microsystems, Inc. System and method for testing signal interconnections using built-in self test

Also Published As

Publication number Publication date
US20050060116A1 (en) 2005-03-17
CN1849520A (zh) 2006-10-18
US7031868B2 (en) 2006-04-18
US20060167646A1 (en) 2006-07-27
JP4728238B2 (ja) 2011-07-20
WO2005036190A1 (en) 2005-04-21
JP2007506160A (ja) 2007-03-15

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Granted publication date: 20120111

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CF01 Termination of patent right due to non-payment of annual fee