CN1789476A - 组织均匀的高熔点金属板及其制造方法 - Google Patents
组织均匀的高熔点金属板及其制造方法 Download PDFInfo
- Publication number
- CN1789476A CN1789476A CNA200510128891XA CN200510128891A CN1789476A CN 1789476 A CN1789476 A CN 1789476A CN A200510128891X A CNA200510128891X A CN A200510128891XA CN 200510128891 A CN200510128891 A CN 200510128891A CN 1789476 A CN1789476 A CN 1789476A
- Authority
- CN
- China
- Prior art keywords
- refractory metal
- metal plates
- thickness
- workpiece
- tantalum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000003870 refractory metal Substances 0.000 title claims abstract description 30
- 238000000034 method Methods 0.000 title claims description 36
- 229910052751 metal Inorganic materials 0.000 claims abstract description 19
- 239000002184 metal Substances 0.000 claims abstract description 19
- 238000005477 sputtering target Methods 0.000 claims abstract description 12
- 239000013078 crystal Substances 0.000 claims abstract description 10
- 238000004519 manufacturing process Methods 0.000 claims abstract description 7
- 229910052715 tantalum Inorganic materials 0.000 claims description 19
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 18
- 238000005242 forging Methods 0.000 claims description 17
- 239000000463 material Substances 0.000 claims description 15
- 238000000137 annealing Methods 0.000 claims description 12
- 229910052758 niobium Inorganic materials 0.000 claims description 8
- 239000010955 niobium Substances 0.000 claims description 8
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 8
- 238000005096 rolling process Methods 0.000 claims description 6
- 238000009826 distribution Methods 0.000 claims description 5
- 238000001953 recrystallisation Methods 0.000 claims description 5
- 229910001257 Nb alloy Inorganic materials 0.000 claims description 4
- 229910001362 Ta alloys Inorganic materials 0.000 claims description 3
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 239000000956 alloy Substances 0.000 claims description 2
- 230000002093 peripheral effect Effects 0.000 claims 1
- 238000004544 sputter deposition Methods 0.000 abstract description 22
- 239000000203 mixture Substances 0.000 abstract description 3
- 230000000694 effects Effects 0.000 abstract description 2
- 239000010408 film Substances 0.000 description 15
- 230000008569 process Effects 0.000 description 12
- 239000000758 substrate Substances 0.000 description 8
- 239000002245 particle Substances 0.000 description 5
- 230000007797 corrosion Effects 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 230000000739 chaotic effect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 2
- 238000004663 powder metallurgy Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000004080 punching Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910001936 tantalum oxide Inorganic materials 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- XKRFYHLGVUSROY-UHFFFAOYSA-N argon Substances [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- -1 argon Ion Chemical class 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000005555 metalworking Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- RHDUVDHGVHBHCL-UHFFFAOYSA-N niobium tantalum Chemical compound [Nb].[Ta] RHDUVDHGVHBHCL-UHFFFAOYSA-N 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000002294 plasma sputter deposition Methods 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000002689 soil Substances 0.000 description 1
- 238000005482 strain hardening Methods 0.000 description 1
- 150000003481 tantalum Chemical class 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000009721 upset forging Methods 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
- 230000037303 wrinkles Effects 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C27/00—Alloys based on rhenium or a refractory metal not mentioned in groups C22C14/00 or C22C16/00
- C22C27/02—Alloys based on vanadium, niobium, or tantalum
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
- C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
- C22F1/16—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of other metals or alloys based thereon
- C22F1/18—High-melting or refractory metals or alloys based thereon
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Thermal Sciences (AREA)
- Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Forging (AREA)
- Powder Metallurgy (AREA)
- Furnace Housings, Linings, Walls, And Ceilings (AREA)
- Manufacture And Refinement Of Metals (AREA)
- Aerials With Secondary Devices (AREA)
- Optical Elements Other Than Lenses (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US26998301P | 2001-02-20 | 2001-02-20 | |
| US60/269,983 | 2001-02-20 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB028051009A Division CN1238547C (zh) | 2001-02-20 | 2002-02-20 | 组织均匀的高熔点金属板及其制造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1789476A true CN1789476A (zh) | 2006-06-21 |
Family
ID=23029400
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA200510128891XA Pending CN1789476A (zh) | 2001-02-20 | 2002-02-20 | 组织均匀的高熔点金属板及其制造方法 |
| CNB028051009A Expired - Fee Related CN1238547C (zh) | 2001-02-20 | 2002-02-20 | 组织均匀的高熔点金属板及其制造方法 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB028051009A Expired - Fee Related CN1238547C (zh) | 2001-02-20 | 2002-02-20 | 组织均匀的高熔点金属板及其制造方法 |
Country Status (20)
| Country | Link |
|---|---|
| US (1) | US20020112789A1 (enExample) |
| EP (1) | EP1366203B1 (enExample) |
| JP (1) | JP4327460B2 (enExample) |
| KR (1) | KR100966682B1 (enExample) |
| CN (2) | CN1789476A (enExample) |
| AT (1) | ATE339532T1 (enExample) |
| AU (1) | AU2002257005B2 (enExample) |
| BR (1) | BR0207384A (enExample) |
| CA (1) | CA2438819A1 (enExample) |
| CZ (1) | CZ20032246A3 (enExample) |
| DE (1) | DE60214683T2 (enExample) |
| ES (1) | ES2272707T3 (enExample) |
| HU (1) | HUP0303269A3 (enExample) |
| IL (1) | IL157279A0 (enExample) |
| MX (1) | MXPA03007490A (enExample) |
| NO (1) | NO20033547L (enExample) |
| NZ (1) | NZ527628A (enExample) |
| PT (1) | PT1366203E (enExample) |
| WO (1) | WO2002070765A1 (enExample) |
| ZA (1) | ZA200306399B (enExample) |
Families Citing this family (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040016635A1 (en) * | 2002-07-19 | 2004-01-29 | Ford Robert B. | Monolithic sputtering target assembly |
| JP4263900B2 (ja) * | 2002-11-13 | 2009-05-13 | 日鉱金属株式会社 | Taスパッタリングターゲット及びその製造方法 |
| WO2004095501A2 (en) * | 2003-04-23 | 2004-11-04 | H.C. Starck Inc. | Molybdenum alloy x-ray targets having uniform grain structure |
| US7228722B2 (en) * | 2003-06-09 | 2007-06-12 | Cabot Corporation | Method of forming sputtering articles by multidirectional deformation |
| WO2004114355A2 (en) * | 2003-06-20 | 2004-12-29 | Cabot Corporation | Method and design for sputter target attachment to a backing plate |
| KR100760156B1 (ko) * | 2003-11-06 | 2007-09-18 | 닛코킨조쿠 가부시키가이샤 | 탄탈륨 스퍼터링 타겟트 |
| US20070144623A1 (en) * | 2004-02-18 | 2007-06-28 | Wickersham Charles E Jr | Ultrasonic method for detecting banding in metals |
| WO2005098073A1 (en) * | 2004-03-26 | 2005-10-20 | H.C. Starck Inc. | Refractory metal pots |
| US7666243B2 (en) | 2004-10-27 | 2010-02-23 | H.C. Starck Inc. | Fine grain niobium sheet via ingot metallurgy |
| US7998287B2 (en) | 2005-02-10 | 2011-08-16 | Cabot Corporation | Tantalum sputtering target and method of fabrication |
| EP1880035B1 (en) | 2005-05-05 | 2021-01-20 | Höganäs Germany GmbH | Method for coating a substrate surface and coated product |
| WO2006117145A2 (en) * | 2005-05-05 | 2006-11-09 | H.C. Starck Gmbh | Coating process for manufacture or reprocessing of sputter targets and x-ray anodes |
| US20070044873A1 (en) | 2005-08-31 | 2007-03-01 | H. C. Starck Inc. | Fine grain niobium sheet via ingot metallurgy |
| DE112007000440B4 (de) * | 2006-03-07 | 2021-01-07 | Global Advanced Metals, Usa, Inc. | Verfahren zum Erzeugen von verformten Metallartikeln |
| JP4974362B2 (ja) | 2006-04-13 | 2012-07-11 | 株式会社アルバック | Taスパッタリングターゲットおよびその製造方法 |
| US20080078268A1 (en) * | 2006-10-03 | 2008-04-03 | H.C. Starck Inc. | Process for preparing metal powders having low oxygen content, powders so-produced and uses thereof |
| US7776166B2 (en) * | 2006-12-05 | 2010-08-17 | Praxair Technology, Inc. | Texture and grain size controlled hollow cathode magnetron targets and method of manufacture |
| US20080145688A1 (en) | 2006-12-13 | 2008-06-19 | H.C. Starck Inc. | Method of joining tantalum clade steel structures |
| US8197894B2 (en) | 2007-05-04 | 2012-06-12 | H.C. Starck Gmbh | Methods of forming sputtering targets |
| US8250895B2 (en) * | 2007-08-06 | 2012-08-28 | H.C. Starck Inc. | Methods and apparatus for controlling texture of plates and sheets by tilt rolling |
| KR101201577B1 (ko) | 2007-08-06 | 2012-11-14 | 에이치. 씨. 스타아크 아이앤씨 | 향상된 조직 균일성을 가진 내화 금속판 |
| US8246903B2 (en) | 2008-09-09 | 2012-08-21 | H.C. Starck Inc. | Dynamic dehydriding of refractory metal powders |
| US8043655B2 (en) * | 2008-10-06 | 2011-10-25 | H.C. Starck, Inc. | Low-energy method of manufacturing bulk metallic structures with submicron grain sizes |
| CN101920436B (zh) * | 2010-08-20 | 2011-10-26 | 宁夏东方钽业股份有限公司 | 溅射钽环件用钽条的制备工艺 |
| CN102021523A (zh) * | 2010-09-29 | 2011-04-20 | 吴江南玻华东工程玻璃有限公司 | 一种解决镀膜玻璃边缘效应的方法 |
| US9412568B2 (en) | 2011-09-29 | 2016-08-09 | H.C. Starck, Inc. | Large-area sputtering targets |
| CN102658346A (zh) * | 2012-04-06 | 2012-09-12 | 宁夏东方钽业股份有限公司 | 一种大规格钽靶材的锻造方法 |
| CN102699247B (zh) * | 2012-05-18 | 2014-06-18 | 宁夏东方钽业股份有限公司 | 一种超导钽棒的锻造方法 |
| CN103861982B (zh) * | 2012-12-18 | 2016-06-15 | 宁夏东方钽业股份有限公司 | 一种铌旋转靶材铸锭的锻造方法 |
| CN104419901B (zh) * | 2013-08-27 | 2017-06-30 | 宁波江丰电子材料股份有限公司 | 一种钽靶材的制造方法 |
| WO2015146516A1 (ja) * | 2014-03-27 | 2015-10-01 | Jx日鉱日石金属株式会社 | タンタルスパッタリングターゲット及びその製造方法 |
| US10023953B2 (en) | 2014-04-11 | 2018-07-17 | H.C. Starck Inc. | High purity refractory metal powders and their use in sputtering targets which may have random texture |
| US10961613B2 (en) * | 2014-12-22 | 2021-03-30 | Agency For Defense Development | Method for controlling microstructure and texture of tantalum |
| EP3211118B1 (en) * | 2015-05-22 | 2020-09-09 | JX Nippon Mining & Metals Corporation | Tantalum sputtering target, and production method therefor |
| JP6293928B2 (ja) | 2015-05-22 | 2018-03-14 | Jx金属株式会社 | タンタルスパッタリングターゲット及びその製造方法 |
| JP6553813B2 (ja) * | 2017-03-30 | 2019-07-31 | Jx金属株式会社 | タンタルスパッタリングターゲット |
| US11062889B2 (en) | 2017-06-26 | 2021-07-13 | Tosoh Smd, Inc. | Method of production of uniform metal plates and sputtering targets made thereby |
| US20190161850A1 (en) * | 2017-11-30 | 2019-05-30 | Tosoh Smd, Inc. | Ultra-fine grain size tantalum sputtering targets with improved voltage performance and methods thereby |
| EP3951004A4 (en) * | 2019-03-26 | 2022-12-14 | JX Nippon Mining & Metals Corporation | Niobium sputtering target |
| CN110983218B (zh) * | 2019-12-25 | 2021-09-03 | 西部超导材料科技股份有限公司 | 一种组织均匀的小规格纯铌棒材的制备方法 |
| CN112143990B (zh) * | 2020-09-04 | 2022-01-07 | 中国航发北京航空材料研究院 | 一种钛合金β相大尺寸单晶的制备方法 |
| CN116288091A (zh) * | 2023-03-28 | 2023-06-23 | 南昌大学 | 一种低温制备超细晶粒钽片的退火工艺 |
| TW202540463A (zh) * | 2023-12-05 | 2025-10-16 | 美商塔沙Smd公司 | 具有改善的性能及可預測性之鉭濺射靶及其製造方法 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2603980B2 (ja) * | 1988-01-13 | 1997-04-23 | 株式会社東芝 | 高断熱性鋳鉄 |
| JP2796752B2 (ja) * | 1990-04-27 | 1998-09-10 | 日本軽金属株式会社 | 耐食皮膜用Al―Ni―Si合金製スパッタリングターゲット |
| JPH06264233A (ja) * | 1993-03-12 | 1994-09-20 | Nikko Kinzoku Kk | Tft製造用スパッタリングタ−ゲット |
| JP2857015B2 (ja) * | 1993-04-08 | 1999-02-10 | 株式会社ジャパンエナジー | 高純度アルミニウムまたはその合金からなるスパッタリングターゲット |
| US5590389A (en) * | 1994-12-23 | 1996-12-31 | Johnson Matthey Electronics, Inc. | Sputtering target with ultra-fine, oriented grains and method of making same |
| US5850755A (en) * | 1995-02-08 | 1998-12-22 | Segal; Vladimir M. | Method and apparatus for intensive plastic deformation of flat billets |
| JPH10235670A (ja) * | 1997-02-26 | 1998-09-08 | Tosoh Corp | ポリオレフィン樹脂連続気泡発泡体の製造方法 |
| US6569270B2 (en) * | 1997-07-11 | 2003-05-27 | Honeywell International Inc. | Process for producing a metal article |
| US6348139B1 (en) * | 1998-06-17 | 2002-02-19 | Honeywell International Inc. | Tantalum-comprising articles |
| US6348113B1 (en) * | 1998-11-25 | 2002-02-19 | Cabot Corporation | High purity tantalum, products containing the same, and methods of making the same |
| US6464809B2 (en) * | 1998-11-30 | 2002-10-15 | Outokumpu Oyj | Processes for producing articles with stress-free slit edges |
| JP3079378B1 (ja) * | 1999-02-10 | 2000-08-21 | 東京タングステン株式会社 | Moスパッターリングターゲット材及びその製造方法 |
| JP2001020065A (ja) * | 1999-07-07 | 2001-01-23 | Hitachi Metals Ltd | スパッタリング用ターゲット及びその製造方法ならびに高融点金属粉末材料 |
| US6878250B1 (en) * | 1999-12-16 | 2005-04-12 | Honeywell International Inc. | Sputtering targets formed from cast materials |
| US6331233B1 (en) * | 2000-02-02 | 2001-12-18 | Honeywell International Inc. | Tantalum sputtering target with fine grains and uniform texture and method of manufacture |
| AU2001296213A1 (en) * | 2000-05-22 | 2001-12-24 | Cabot Corporation | High purity niobium and products containing the same, and methods of making the same |
-
2002
- 2002-02-20 HU HU0303269A patent/HUP0303269A3/hu unknown
- 2002-02-20 JP JP2002570787A patent/JP4327460B2/ja not_active Expired - Lifetime
- 2002-02-20 BR BR0207384-6A patent/BR0207384A/pt not_active Application Discontinuation
- 2002-02-20 CA CA002438819A patent/CA2438819A1/en not_active Abandoned
- 2002-02-20 ES ES02726582T patent/ES2272707T3/es not_active Expired - Lifetime
- 2002-02-20 CZ CZ20032246A patent/CZ20032246A3/cs unknown
- 2002-02-20 AU AU2002257005A patent/AU2002257005B2/en not_active Expired - Fee Related
- 2002-02-20 MX MXPA03007490A patent/MXPA03007490A/es active IP Right Grant
- 2002-02-20 CN CNA200510128891XA patent/CN1789476A/zh active Pending
- 2002-02-20 PT PT02726582T patent/PT1366203E/pt unknown
- 2002-02-20 KR KR1020037010851A patent/KR100966682B1/ko not_active Expired - Lifetime
- 2002-02-20 IL IL15727902A patent/IL157279A0/xx unknown
- 2002-02-20 CN CNB028051009A patent/CN1238547C/zh not_active Expired - Fee Related
- 2002-02-20 NZ NZ527628A patent/NZ527628A/en unknown
- 2002-02-20 AT AT02726582T patent/ATE339532T1/de active
- 2002-02-20 WO PCT/US2002/005033 patent/WO2002070765A1/en not_active Ceased
- 2002-02-20 EP EP02726582A patent/EP1366203B1/en not_active Revoked
- 2002-02-20 DE DE60214683T patent/DE60214683T2/de not_active Expired - Lifetime
- 2002-02-20 US US10/079,286 patent/US20020112789A1/en not_active Abandoned
-
2003
- 2003-08-11 NO NO20033547A patent/NO20033547L/no not_active Application Discontinuation
- 2003-08-18 ZA ZA200306399A patent/ZA200306399B/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| MXPA03007490A (es) | 2004-09-06 |
| KR20030090645A (ko) | 2003-11-28 |
| EP1366203A4 (en) | 2004-07-28 |
| NO20033547D0 (no) | 2003-08-11 |
| CZ20032246A3 (cs) | 2004-03-17 |
| IL157279A0 (en) | 2004-02-19 |
| NO20033547L (no) | 2003-09-26 |
| JP4327460B2 (ja) | 2009-09-09 |
| ZA200306399B (en) | 2004-08-18 |
| DE60214683D1 (de) | 2006-10-26 |
| CA2438819A1 (en) | 2002-09-12 |
| KR100966682B1 (ko) | 2010-06-29 |
| WO2002070765A1 (en) | 2002-09-12 |
| HK1066833A1 (zh) | 2005-04-01 |
| ATE339532T1 (de) | 2006-10-15 |
| CN1238547C (zh) | 2006-01-25 |
| HUP0303269A2 (hu) | 2004-01-28 |
| EP1366203B1 (en) | 2006-09-13 |
| JP2004526863A (ja) | 2004-09-02 |
| CN1535322A (zh) | 2004-10-06 |
| AU2002257005B2 (en) | 2007-05-31 |
| ES2272707T3 (es) | 2007-05-01 |
| DE60214683T2 (de) | 2007-09-13 |
| PT1366203E (pt) | 2006-12-29 |
| NZ527628A (en) | 2004-07-30 |
| HUP0303269A3 (en) | 2004-05-28 |
| EP1366203A1 (en) | 2003-12-03 |
| US20020112789A1 (en) | 2002-08-22 |
| BR0207384A (pt) | 2004-02-10 |
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