CN1750231A - 从基体表面去除材料的方法和装置 - Google Patents
从基体表面去除材料的方法和装置 Download PDFInfo
- Publication number
- CN1750231A CN1750231A CNA2005100905052A CN200510090505A CN1750231A CN 1750231 A CN1750231 A CN 1750231A CN A2005100905052 A CNA2005100905052 A CN A2005100905052A CN 200510090505 A CN200510090505 A CN 200510090505A CN 1750231 A CN1750231 A CN 1750231A
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- China
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- electrode
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- plasma
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Links
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31127—Etching organic layers
- H01L21/31133—Etching organic layers by chemical means
- H01L21/31138—Etching organic layers by chemical means by dry-etching
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/70—Maintenance
- B29C33/72—Cleaning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32018—Glow discharge
- H01J37/32027—DC powered
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
- H01L21/02068—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/02—Details
- H01J2237/0203—Protection arrangements
- H01J2237/0206—Extinguishing, preventing or controlling unwanted discharges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/335—Cleaning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/85009—Pre-treatment of the connector or the bonding area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/85009—Pre-treatment of the connector or the bonding area
- H01L2224/8501—Cleaning, e.g. oxide removal step, desmearing
- H01L2224/85013—Plasma cleaning
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/26—Cleaning or polishing of the conductive pattern
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Cleaning In General (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Drying Of Semiconductors (AREA)
- Wire Bonding (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
Description
Claims (31)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0418494.1 | 2004-08-18 | ||
GB0418494A GB2417251A (en) | 2004-08-18 | 2004-08-18 | Removing material from a substrate surface using plasma |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1750231A true CN1750231A (zh) | 2006-03-22 |
CN100468613C CN100468613C (zh) | 2009-03-11 |
Family
ID=33042295
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005100905052A Active CN100468613C (zh) | 2004-08-18 | 2005-08-17 | 从基体表面去除材料的方法和装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20060037700A1 (zh) |
JP (1) | JP2006093669A (zh) |
CN (1) | CN100468613C (zh) |
GB (1) | GB2417251A (zh) |
SG (1) | SG120253A1 (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101874293B (zh) * | 2008-02-26 | 2011-11-30 | 株式会社岛津制作所 | 等离子体成膜方法以及等离子体cvd装置 |
CN105448667A (zh) * | 2015-12-23 | 2016-03-30 | 苏州工业园区纳米产业技术研究院有限公司 | 一种wafer表面脏污清洗方法 |
CN109643664A (zh) * | 2016-07-20 | 2019-04-16 | 佳科仪器控股有限责任公司 | 电子设备的解封装 |
CN113272939A (zh) * | 2019-12-17 | 2021-08-17 | 株式会社日立高新技术 | 等离子体处理装置以及等离子体处理装置的工作方法 |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4760609B2 (ja) * | 2006-08-17 | 2011-08-31 | パナソニック株式会社 | 基板への部品実装方法及び装置 |
JP2008078515A (ja) * | 2006-09-25 | 2008-04-03 | Tokyo Electron Ltd | プラズマ処理方法 |
JP5380308B2 (ja) * | 2007-03-12 | 2014-01-08 | アイクストロン、エスイー | 改善された処理能力のための新規なプラズマシステムおよびプラズマ処理方法 |
US7563725B2 (en) * | 2007-04-05 | 2009-07-21 | Solyndra, Inc. | Method of depositing materials on a non-planar surface |
US7855156B2 (en) * | 2007-05-09 | 2010-12-21 | Solyndra, Inc. | Method of and apparatus for inline deposition of materials on a non-planar surface |
US20090011573A1 (en) * | 2007-07-02 | 2009-01-08 | Solyndra, Inc. | Carrier used for deposition of materials on a non-planar surface |
US8443558B2 (en) * | 2007-10-15 | 2013-05-21 | Solyndra Llc | Support system for solar energy generator panels |
US20090308439A1 (en) * | 2008-06-11 | 2009-12-17 | Solar Implant Technologies Inc. | Solar cell fabrication using implantation |
US8749053B2 (en) | 2009-06-23 | 2014-06-10 | Intevac, Inc. | Plasma grid implant system for use in solar cell fabrications |
JP5769451B2 (ja) * | 2011-03-07 | 2015-08-26 | キヤノン株式会社 | インプリント装置および物品の製造方法 |
SG10201508582WA (en) | 2011-11-08 | 2015-11-27 | Intevac Inc | Substrate processing system and method |
US9198274B2 (en) * | 2012-07-05 | 2015-11-24 | Sputtering Components, Inc. | Ion control for a plasma source |
US9318332B2 (en) | 2012-12-19 | 2016-04-19 | Intevac, Inc. | Grid for plasma ion implant |
FR3004465B1 (fr) * | 2013-04-11 | 2015-05-08 | Ion Beam Services | Machine d'implantation ionique presentant une productivite accrue |
US11759980B2 (en) * | 2019-10-31 | 2023-09-19 | Alcon Inc. | Method for removing lens forming material deposited on a lens forming surface |
US11984306B2 (en) * | 2021-06-09 | 2024-05-14 | Applied Materials, Inc. | Plasma chamber and chamber component cleaning methods |
CN117943365A (zh) * | 2024-03-21 | 2024-04-30 | 通威微电子有限公司 | 刷片包装一体机 |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4555612A (en) * | 1983-10-17 | 1985-11-26 | General Electric Co. | Plasma jet cleaning apparatus and method |
DD264344A3 (de) * | 1986-04-21 | 1989-02-01 | Veb Zft Mikroelektronic | Verfahren und Schaltungsanordnung zur Herstellung oder zum Ätzen von Schichten auf halbleitersubstraten unter Plasmaeinwirkung |
JPS63234532A (ja) * | 1987-03-24 | 1988-09-29 | Toshiba Corp | プラズマエツチング装置 |
US4797178A (en) * | 1987-05-13 | 1989-01-10 | International Business Machines Corporation | Plasma etch enhancement with large mass inert gas |
US4853081A (en) * | 1987-10-30 | 1989-08-01 | Ibm Corporation | Process for removing contaminant |
KR900013595A (ko) * | 1989-02-15 | 1990-09-06 | 미다 가쓰시게 | 플라즈마 에칭방법 및 장치 |
US20020004309A1 (en) * | 1990-07-31 | 2002-01-10 | Kenneth S. Collins | Processes used in an inductively coupled plasma reactor |
JP3099525B2 (ja) * | 1992-07-01 | 2000-10-16 | 松下電器産業株式会社 | 基板のプラズマクリーニング装置 |
JP3278732B2 (ja) * | 1993-12-27 | 2002-04-30 | 株式会社アルバック | エッチング装置及びエッチング方法 |
JPH07326605A (ja) * | 1994-05-31 | 1995-12-12 | Kokusai Electric Co Ltd | ガスクリーニング方法及びその装置 |
JP3799073B2 (ja) * | 1994-11-04 | 2006-07-19 | 株式会社日立製作所 | ドライエッチング方法 |
US6794301B2 (en) * | 1995-10-13 | 2004-09-21 | Mattson Technology, Inc. | Pulsed plasma processing of semiconductor substrates |
JPH09129596A (ja) * | 1995-10-26 | 1997-05-16 | Toshiba Corp | 反応室のクリーニング方法 |
JP3812966B2 (ja) * | 1996-02-07 | 2006-08-23 | 沖電気工業株式会社 | プラズマ処理装置及びプラズマ処理方法 |
DE19911046B4 (de) * | 1999-03-12 | 2006-10-26 | Robert Bosch Gmbh | Plasmaverfahren |
JP4329229B2 (ja) * | 1999-06-30 | 2009-09-09 | 住友電気工業株式会社 | Iii−v族窒化物半導体の成長方法および気相成長装置 |
JP2002324789A (ja) * | 2001-04-24 | 2002-11-08 | Sekisui Chem Co Ltd | プラズマ処理装置 |
US6853142B2 (en) * | 2002-11-04 | 2005-02-08 | Zond, Inc. | Methods and apparatus for generating high-density plasma |
JP4013745B2 (ja) * | 2002-11-20 | 2007-11-28 | 松下電器産業株式会社 | プラズマ処理方法 |
DE112004000057B4 (de) * | 2003-05-27 | 2008-09-25 | Matsushita Electric Works, Ltd., Kadoma | Plasmabehandlungsapparat und Plasmabehandlungsverfahren |
US7314537B2 (en) * | 2003-09-30 | 2008-01-01 | Tokyo Electron Limited | Method and apparatus for detecting a plasma |
US7041608B2 (en) * | 2004-02-06 | 2006-05-09 | Eastman Kodak Company | Providing fluorocarbon layers on conductive electrodes in making electronic devices such as OLED devices |
-
2004
- 2004-08-18 GB GB0418494A patent/GB2417251A/en not_active Withdrawn
-
2005
- 2005-08-05 SG SG200504992A patent/SG120253A1/en unknown
- 2005-08-15 US US11/203,895 patent/US20060037700A1/en not_active Abandoned
- 2005-08-16 JP JP2005235884A patent/JP2006093669A/ja active Pending
- 2005-08-17 CN CNB2005100905052A patent/CN100468613C/zh active Active
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101874293B (zh) * | 2008-02-26 | 2011-11-30 | 株式会社岛津制作所 | 等离子体成膜方法以及等离子体cvd装置 |
CN105448667A (zh) * | 2015-12-23 | 2016-03-30 | 苏州工业园区纳米产业技术研究院有限公司 | 一种wafer表面脏污清洗方法 |
CN109643664A (zh) * | 2016-07-20 | 2019-04-16 | 佳科仪器控股有限责任公司 | 电子设备的解封装 |
CN109643664B (zh) * | 2016-07-20 | 2023-05-30 | 佳科仪器控股有限责任公司 | 电子设备的解封装 |
CN113272939A (zh) * | 2019-12-17 | 2021-08-17 | 株式会社日立高新技术 | 等离子体处理装置以及等离子体处理装置的工作方法 |
CN113272939B (zh) * | 2019-12-17 | 2023-11-14 | 株式会社日立高新技术 | 等离子体处理装置以及等离子体处理装置的工作方法 |
Also Published As
Publication number | Publication date |
---|---|
GB0418494D0 (en) | 2004-09-22 |
JP2006093669A (ja) | 2006-04-06 |
US20060037700A1 (en) | 2006-02-23 |
CN100468613C (zh) | 2009-03-11 |
GB2417251A (en) | 2006-02-22 |
SG120253A1 (en) | 2006-03-28 |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: NANOFILM VACUUM COATING (SHANGHAI) CO., LTD. Free format text: FORMER OWNER: NANOFILM TECHNOLOGIES INTERNAT Effective date: 20120809 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; TO: 201700 QINGPU, SHANGHAI |
|
TR01 | Transfer of patent right |
Effective date of registration: 20120809 Address after: 2, No. 201700, 1 floor, No. 99, Lane 99, Huafang Road, Qingpu District, Shanghai, Patentee after: Nano peak vacuum coating (Shanghai) Co., Ltd. Address before: Singapore Yi Jalan provoked Patentee before: Nanofilm Technologies Internat |