CN1703653A - 消除包含在电化学设备内点缺陷的方法 - Google Patents
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Abstract
本发明涉及一种使用激光辐射束消除层压设备内的缺陷的方法,该层压系统由至少一个第一基材和至少一个第二基材组成,所述的压是将至少一种《智能》活性系统加入所述的第一基材与第二基材之间。所述的方法包括是对位于该活性系统内的至少一个缺陷进行定位的阶段,是使用所述的激光束烧蚀限制的缺陷的阶段。
Description
本发明的主题是一种在电化学设备内,特别是在光电装置或电致发光设备内的具有可变光学和/或能量性能的玻璃板类电控(électrocommandable)系统内,可能存在的点缺陷(défauts ponctuels)的消除方法。
更确切地,本发明涉及一种在设备生产的先行阶段,尤其在该设备市场值很高的阶段可能会出现的缺陷的消除方法。
尽管生产这些设备时十分小心(在清洁的室、层沉积的阴极脉冲电源、垂直沉积线、质量良好的基材条件下加工),但可能发生通常称之的针孔表面缺陷。产生这些“针孔”的途径很多。可能牵涉到未被处理室空气过滤设备截留和/或除去环境尘埃,或也可能牵涉到按照这些活性系统(电致变色(électrochromes)、光电、电致发光系统等)在保证不同层沉积之前,从一些设备散发出的残留物,尤其在靶处,或基材质量很差。这些缺陷是不可接受的,因为它们与电极接触而可能造成这些玻璃板功能的永久性损坏。
考虑到一件设备因有不多的缺陷而报废所造成的金融损失,研究了消除这些缺陷的方法,特别是研究了在生产过程的先行阶段消除这些缺陷的方法。
第一种消除表面缺陷的技术是在目视检测以晕圆形式出现的缺陷后,使用刀具或等效类的刮削设备在晕圆处对构成该层材料进行烧蚀。
这第一种技术能够有效地消除这些缺陷,但只是这些活性系统层还是易接近时才可以进行烧蚀,即在安置薄板夹层阶段和装配一些基材之前,对于层状风挡就进行烧蚀,这样就显著减少了这种技术应用范围(这种基材和该活性系统完全装配时就不能使用这种技术,因为这些活性系统层是不易接近的)。
人们知道第二种活性系统层烧蚀技术,该技术使用激光辐射。这第二种技术通常用于层的边缘部分,还能够借助激光辐射例如在玻璃基材周边消除银层,以避免整个活性系统出现腐蚀现象,或者限制电致变色或光电类活性系统的漏电电流现象。
这第二种技术对于部分或全部消除构成活性系统的一些层是非常有效的(使用激光可全部或部分消除一些层的材料)。
此外,这种边缘技术是只是限于烧蚀基材周边一些层的方法,即在有利于排除已破坏材料的地方烧蚀一些层的方法。人们很容易想到不可能通过层压基层进行操作,事实上需要采用激光辐射破坏的材料不应该仍滞留在构成层压材料的两个基材之间。
本发明人非常出乎意外地发现了,通过调整激光辐射的操作条件,有可能使用这类辐射清除活性系统层,甚至它们不是在层压的基材周边也是如此。
本发明的目标方法特别用于所谓《智能化(intelligents)》玻璃板,它们能按照使用者需要进行调节。
关于《智能化》玻璃板,可能涉及通过安装在建筑物或汽车、火车或飞机类外部的玻璃窗控制太阳光输入量。其目的是能够限制座舱/房间内过度加热,但只是在强太阳光的情况下才如此。
还可能涉及控制通过玻璃板的视觉度,特别地为了使太阳光变暗,使它们漫射,甚至需要时阻止全部视觉。这可能涉及在房间、火车、飞机内在内壁板上安装的玻璃板,或在汽车侧窗安装的玻璃板。这还涉及防止驾驶员耀眼的作为后视镜使用的这些镜,或涉及需要时出现信息时,或断续地提醒人们更加注意时作为提示板使用的这些镜。希望时可以使用随心所欲地使其变成漫射光的玻璃板,如银幕。
目前有许多不同的电控系统,它们有可能对外观/热性能进行这种修改。
为了调节玻璃板的透光性或吸光性,有这些所谓的viologène系统,如专利US-5 239 406和EP-612 826中所描述的那些系统。
为了调节玻璃板的透光性和/或传热性,也有这些所谓的电致变色系统。已知这些系统通常包括两个电致变色材料层,它们被一层电解质分开,还被两层导电层围绕。每个电致变色材料层可以可逆地加入阳离子和电子,由于加入/放出这些阳离子和电子而使它们的氧化度改变,导致其光学和/或热性能发生改变。
还有一些称之《光学阀》的系统,这样的系统涉及薄膜,它含有一种通常交联的聚合物基体,其中分散了含有微粒的微滴,这些微粒在磁场或电场作用下能够按照优选方向取向排列。由专利WO93/09460还知道一种光学阀,该阀含有聚有机硅烷基体和聚碘化物类微粒,拉伸这种薄膜时它们截获非常少的光。
还可以列举这些所谓的电致发光系统,已知这些系统通常包括至少一薄层有机或无机电致发光材料的层,该层夹在两个适当电极之间。
按照惯例将这些电致发光系统分成几类,依此它们是有机类的,通常将“有机发光二极管”称之OLEDs系统,或将“聚合物发光二极管”称之PLED,或者它们是无机类的,在这种情况下,通常将“薄膜电致发光”称之TFEL系统。
本发明还在属于光电系统(它们将光能转换成电能)类的《智能系统中获得应用。一个光电功能层层压(feuillété)实例是例如Mo/ClS:Ga/CdS/ZnO类或Al/a-Si/ZnO:Al类的。
因此,本发明的目的是提出一种使用激光辐射束消除位于层压设备中外观缺陷,该系统由至少一个第一基材和至少一个第二基材构成,所述的层压是将至少一种如前面定义的《智能》活性系统加在所述的第一与第二基材之间。
首先,本发明的主题是一种方法,该方法包括:
-一个阶段是对活性系统内至少一个缺陷进行定位,
-一个阶段是使用所述的激光束烧蚀所限制的缺陷。
借助这些布局,或者为了再赋予它们开始的市场价值而在其生产先行阶段,或者在其生产之后在修复过程中,例如在维护操作后,有可能对加入活性系统的设备进行修理。
在本发明的优选实施方式中,可以任选地另外利用一个和/或另一个下述布局:
-使用连续激光束限制这种缺陷,
-使用多个激光脉冲限制这种缺陷,
-使用图像处理软件,或者以手工方式(人介入),或者以自动方式,采用光学方法实施缺陷定位阶段,
-使用至少一个第一激光束脉冲瞄准这种缺陷的阶段,
-根据所述第一脉冲与缺陷之间的偏差,该瞄准阶段加一个激光束再调节的中间阶段,
-使用降低的激光束功率实施其瞄准阶段,
-烧蚀缺陷包括基本上沿着缺陷周边移动激光束,
-改变激光束波长,这样一方面让构成这个活性系统的这些层可吸收激光束,而另一方面通过基材可传送激光束,
-烧蚀缺陷包括缺陷周边区域相对于包括缺陷在内的活性系统的电绝缘,
-通过第一基材进行烧蚀缺陷,
-通过第二基材进行烧蚀缺陷。
通过阅读下面作为非限制性实施例给出的多个实施方式将体会到本发明的其它特点和优点。
-图1说明了采用本发明目标方法能消除的缺陷,
-图2与图1类似,但是在消除缺陷后的。
本发明应用于广泛意义上的玻璃板:这些承载基材一般是玻璃或聚合物类的硬的透明基材,例如聚碳酸酯或聚甲基丙烯酸甲酯(PMMA)。然而,本发明还包括软或半软的聚合物基的基材。
使用一种或多种EVA(乙烯醋酸乙烯酯共聚物)、PVB(聚乙烯缩丁醛)、PU(聚氨酯)类热塑性聚合物薄膜,将这些基材并置成一个层压设备,而该层压夹层将至少一个第一基材与至少一个第二基材合并起来。
使用自支持或无自支持的双面粘合性薄板代替通常的热塑性夹层薄板时,还可以免去在加热下,任选地在压力下进行的层压操作,所述的双面粘合剂薄板是可从市场上获得的,并且具有非常薄的优点。
在这些第一与第二基材之间,可以插入至少一个如前面定义的《智能》活性系统以及一些导电层,这些导电层构成阳极、阴极,而更一般地讲一些电极,因此装配这些导电层,可借助电源线与电流源和/或电压源连接,以激活/失活该活性系统。
为了简便起见,术语《活性层叠》或《电活性层叠》是指该系统的这个或这些活性层,即除属于电极的这些层之外的所有系统层。例如,对于电致变色系统,因此,它基本上是由阳极电致变色材料层、电解质层和阴极电致变色材料层组成的,这些层中每层都可能由单层构成或由具有同样功能的并行叠置的多层构成。
一般而言,每个电极含有一个导电层或多个叠置的导电层,在下面它们都看作是单个层。关于该导电层的合适电源,该层有矩形、正方形形状或平行四边形的类似几何形状时,一般要求沿着该层两个相对边缘配置两根电线。
一个导电层实例是一个掺杂的金属氧化物基的层,特别地例如掺杂锡的铟氧化物(称之ITO),或掺杂氟的锡氧化物(SnO2:F),任选地沉积在氧化硅、碳氧化硅或氮氧化硅类预层上这种基材是用玻璃制成时,可以另外包括具有光学功能和/或阻挡碱金属功能的层。
作为实例,这些电极的电线可以呈导线形式(或多根集合导线)。这些导线可以是用铜、钨或石墨化钨制成的。它们的直径可以是10-600μm。这类导线事实上足以令人满意地向这些电极供电,并且显著分散:装配这种设备时可能不必遮盖它们。
这种电线结构是非常适合的。描述了一些基本矩形的活性系统,但是它们可能有许多不同的几何形状,特别是取决于它们承载基材的几何形状:圆形、正方形、半圆形、椭圆形、任何多角形、菱形、梯形、正方形、任何平行四边形等。而在这些不同的情况下,对于一些彼此相对的电线“对”给每个电极供电,这些电线不再是必需的。于是可能涉及例如其导电层所有方面都已触及到的电线(或至少触及其周边好的部分),这种电线为简单导线时,这是可实施的。同样涉及点式电线,特别是该设备尺寸较小时更如此。
本发明的设备在其本体中可以使用一种或多种用着色玻璃制成的基材。有利地,如果涉及一种层压玻璃板,则其本体中的着色玻璃是用于朝向房间或座舱内的玻璃,而外部玻璃是透明的。这种着色玻璃能够调节玻璃板的透光水平。置于其内侧时,限制它通过吸收加热。这种或这些玻璃可以是弯曲的,即在特别作为电致变色车顶的这些应用中便是这种情况。
本发明的玻璃板可以有一些附加的功能:例如它可以包括反射红外光的涂层,如专利EP-825478所描述的。它还可以包括亲水涂层、抗反射涂层、疏水涂层、含有锐钛矿型二氧化钛的具有防污性能的光催化涂层,如专利WO 00/03290所描述的。
这样一种层压基材是可接受的,尽管在生产时十分小心,但总是有一些本发明目标方法要消除缺陷(《针孔》)。
图1说明了这些外观缺陷,并且这些缺陷呈可见的脱色晕圆形式,其特征尺寸可以是约0.2mm-10cm。这个可见的脱色晕圆是电致变色类《智能》活性系统缺陷的主要特征。这个着色区域并不代表严格意义上的缺陷真实尺寸,它只是这种缺陷存在的一个物理结果。这种可见的缺陷具体体现在有能够测量的漏电电流。
实际上,这种缺陷或《针孔》的真实尺寸是约20-50μm,但是它存包括这种活性系统中在其周围产生了可能的井喷现象,其效果表现在以其缺陷为中心显著脱色,其脱色区域可飞快地达到前面提到的2-100mm。
在使用者用工具《手工》修复,任选地采用光学放大设备(照相机,光学设备)补充修复这种缺陷后,或者以光学设备与光学处理软件联用的自动方式修复这种缺陷后,将这种层压基材相对于激光进行定位。
事实上,调节激光束波长,使其通过该基材而不被吸收,另外也不被构成活性系统叠层的这些材料吸收。
对于图1表示的实例,该活性系统是电致变色类的,其选择的波长是约1.06μm和使用的激光是脉冲YAG类的。
还可以使用连续类型的激光。不管使用激光类型如何(脉冲型,连续的),都使用激光束划出缺陷的界线。
这时使用降低激光功率的脉冲群瞄准缺陷,再任选地显示靶与缺陷之间的偏移。烧蚀这种缺陷时,将一并测定这个偏移。
严格意义上的烧蚀包括基本上围绕这个缺陷画一个圆,以便与这个缺陷的有效区域进行电绝缘,并且因此对这种烧蚀可见影响降至最低。将这种激光束瞄准缺陷(考虑到位移值),并且围绕这个缺陷画一个圆,同时脉冲调制激光束,这时就会消除构成活性系统层压的结构。
作为实例,为了烧蚀图1表示的缺陷,这些激光束参数如下:30%最大功率,50kHz,半径0.5mm,激光束宽度80μm,激光束位移速度5m/s)。
通过测量漏电电流能够对激光烧蚀质量进行定量分析,该漏电电流是由存在的缺陷引起的。事实上,在缺陷表面(对于活性系统,涉及一个未着色的晕圆)与漏电电流强度值之间存在一个比例关系。因此,采用本发明的目标方法,漏电电流强度是除以在围绕该玻璃板边缘的中心的因子约10。
根据构成这种活性系统的层叠类型,修改其激光操作条件。
另外,有可能从面1(朝向外部)或从面4(朝向内部)毫无差别地烧蚀该玻璃基材的缺陷。不过,更多的是在非对称构型(防晒层,着色玻璃等)中实施,以选择产生最少可见缺陷还能更好烧蚀《活性》层的烧蚀侧。
Claims (13)
1.一种使用激光辐射束消除层压设备内缺陷的方法,该层压设备由至少一个第一基材和至少一个第二基材构成,所述的层压是将至少一种《智能》活性系统加在所述的第一与第二基材之间,其特征在于该方法包括:
-一个阶段是对活性系统内的至少一个缺陷进行定位,
-一个阶段是使用所述的激光束烧蚀限制的缺陷。
2.根据权利要求1所述的方法,其特征在于使用连续激光束限制这种缺陷。
3.根据权利要求1所述的方法,其特征在于使用多个激光脉冲限制这种缺陷。
4.根据权利要求1-3中任一项权利要求所述的方法,其特征在于使用图像处理软件,或者以手工方式(人介入),或者以自动方式,采用光学方法实施缺陷定位阶段。
5.根据权利要求1所述的方法,其特征在于实施使用至少一个第一激光束脉冲瞄准缺陷的阶段。
6.根据权利要求5所述的方法,其特征在于根据所述第一脉冲与缺陷之间的偏差,该瞄准阶段加入中间的激光束再调节的阶段。
7.根据权利要求1或6中任一项权利要求所述的方法,其特征在于使用降低的激光束功率实施其瞄准阶段。
8.根据上述权利要求中任一项权利要求所述的方法,其特征在于烧蚀缺陷包括基本上沿着缺陷周边移动激光束。
9.根据上述权利要求中任一项权利要求所述的方法,其特征在于改变激光束波长,这样一方面让构成这个活性系统的这些层可吸收激光束,而另一方面通过基材可发射激光束。
10.根据上述权利要求中任一项权利要求所述的方法,其特征在于烧蚀缺陷包括让缺陷周边区域相对于包括缺陷在内的活性系统达到电绝缘。
11.根据上述权利要求中任一项权利要求所述的方法,其特征在于通过第一基材进行这种缺陷烧蚀。
12.根据权利要求1-10中任一项权利要求所述的方法,其特征在于通过第二基材进行这种缺陷烧蚀。
13.玻璃板,包括至少一种电化学设备,特别地光电设备或电致发光设备内的具有可变光学和/或能量性能的玻璃板类电控系统,所述的电化学设备插入两个定位电极两侧,该设备已采用根据上述权利要求中任一项权利要求所述方法修复,其特征在于漏电电流强度是除以在围绕该玻璃板边缘中心的因子10。
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US6878900B2 (en) * | 2000-01-27 | 2005-04-12 | National Research Council Of Canada | Method and apparatus for repair of defects in materials with short laser pulses |
US6518539B2 (en) * | 2000-10-23 | 2003-02-11 | The Regents Of The University Of California | Method for producing damage resistant optics |
JP2002260857A (ja) * | 2000-12-28 | 2002-09-13 | Semiconductor Energy Lab Co Ltd | 発光装置の作製方法および薄膜形成装置 |
US6639177B2 (en) * | 2001-03-29 | 2003-10-28 | Gsi Lumonics Corporation | Method and system for processing one or more microstructures of a multi-material device |
-
2002
- 2002-10-09 FR FR0212520A patent/FR2845684B1/fr not_active Expired - Fee Related
-
2003
- 2003-10-01 KR KR1020057005907A patent/KR101122635B1/ko not_active IP Right Cessation
- 2003-10-01 ES ES03807862.2T patent/ES2498736T3/es not_active Expired - Lifetime
- 2003-10-01 PL PL375208A patent/PL219027B1/pl unknown
- 2003-10-01 CN CNB2003801012595A patent/CN100444014C/zh not_active Expired - Fee Related
- 2003-10-01 JP JP2004542540A patent/JP2006502545A/ja active Pending
- 2003-10-01 WO PCT/FR2003/002871 patent/WO2004034138A1/fr active Application Filing
- 2003-10-01 US US10/530,285 patent/US7531101B2/en not_active Expired - Lifetime
- 2003-10-01 EP EP03807862.2A patent/EP1550000B1/fr not_active Expired - Lifetime
- 2003-10-01 AU AU2003299440A patent/AU2003299440A1/en not_active Abandoned
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US10684524B2 (en) | 2010-11-08 | 2020-06-16 | View, Inc. | Electrochromic window fabrication methods |
US9885934B2 (en) | 2011-09-14 | 2018-02-06 | View, Inc. | Portable defect mitigators for electrochromic windows |
TWI567469B (zh) * | 2011-09-14 | 2017-01-21 | 唯景公司 | 用於電致變色窗之可攜缺陷緩解器 |
US9507232B2 (en) | 2011-09-14 | 2016-11-29 | View, Inc. | Portable defect mitigator for electrochromic windows |
TWI636310B (zh) * | 2011-09-14 | 2018-09-21 | 唯景公司 | 用於電致變色窗之可攜缺陷緩解器 |
TWI656392B (zh) * | 2011-09-14 | 2019-04-11 | 美商唯景公司 | 用於電致變色窗之可攜缺陷緩解器 |
US11886088B2 (en) | 2011-09-14 | 2024-01-30 | View, Inc. | Portable defect mitigators for electrochromic windows |
US10532948B2 (en) | 2011-09-14 | 2020-01-14 | View, Inc. | Portable defect mitigator for electrochromic windows |
US10884310B2 (en) | 2011-09-14 | 2021-01-05 | View, Inc. | Portable defect mitigators for electrochromic windows |
US10914118B2 (en) | 2012-03-13 | 2021-02-09 | View, Inc. | Multi-zone EC windows |
US9638977B2 (en) | 2012-03-13 | 2017-05-02 | View, Inc. | Pinhole mitigation for optical devices |
US11550197B2 (en) | 2012-03-13 | 2023-01-10 | View, Inc. | Pinhole mitigation for optical devices |
US10534237B2 (en) | 2012-03-13 | 2020-01-14 | View, Inc. | Pinhole mitigation for optical devices |
US10583523B2 (en) | 2012-05-18 | 2020-03-10 | View, Inc. | Circumscribing defects in optical devices |
CN112654907A (zh) * | 2018-09-26 | 2021-04-13 | Sage电致变色显示有限公司 | 电活性器件及方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20050060091A (ko) | 2005-06-21 |
FR2845684B1 (fr) | 2006-12-15 |
PL219027B1 (pl) | 2015-03-31 |
US7531101B2 (en) | 2009-05-12 |
US20070141360A1 (en) | 2007-06-21 |
KR101122635B1 (ko) | 2012-03-09 |
PL375208A1 (en) | 2005-11-28 |
CN100444014C (zh) | 2008-12-17 |
FR2845684A1 (fr) | 2004-04-16 |
EP1550000B1 (fr) | 2014-06-11 |
WO2004034138A1 (fr) | 2004-04-22 |
ES2498736T3 (es) | 2014-09-25 |
AU2003299440A1 (en) | 2004-05-04 |
EP1550000A1 (fr) | 2005-07-06 |
JP2006502545A (ja) | 2006-01-19 |
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