CN1280691A - 电子组装的图象检验系统 - Google Patents
电子组装的图象检验系统 Download PDFInfo
- Publication number
- CN1280691A CN1280691A CN98811638A CN98811638A CN1280691A CN 1280691 A CN1280691 A CN 1280691A CN 98811638 A CN98811638 A CN 98811638A CN 98811638 A CN98811638 A CN 98811638A CN 1280691 A CN1280691 A CN 1280691A
- Authority
- CN
- China
- Prior art keywords
- assembly
- root
- image
- tree name
- video camera
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0008—Industrial image inspection checking presence/absence
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
- H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
- H04N7/185—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source from a mobile camera, e.g. for remote control
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30141—Printed circuit board [PCB]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30152—Solder
Abstract
Description
Claims (20)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US94775697A | 1997-10-09 | 1997-10-09 | |
US08/947,756 | 1997-10-09 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1280691A true CN1280691A (zh) | 2001-01-17 |
CN1232924C CN1232924C (zh) | 2005-12-21 |
Family
ID=25486709
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB988116383A Expired - Fee Related CN1232924C (zh) | 1997-10-09 | 1998-10-08 | 电子组装的图象检验方法 |
Country Status (12)
Country | Link |
---|---|
US (3) | US6681038B2 (zh) |
EP (1) | EP1032912B8 (zh) |
JP (1) | JP2001520422A (zh) |
KR (1) | KR100628344B1 (zh) |
CN (1) | CN1232924C (zh) |
AT (1) | ATE371915T1 (zh) |
AU (1) | AU9796398A (zh) |
BR (1) | BR9815246A (zh) |
CA (1) | CA2307031C (zh) |
DE (1) | DE69838342T2 (zh) |
HK (1) | HK1033019A1 (zh) |
WO (1) | WO1999019825A1 (zh) |
Cited By (5)
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CN104390982A (zh) * | 2014-11-25 | 2015-03-04 | 深圳华普通用自动化设备有限公司 | 一种用于smt首件检测的测试方法 |
CN104889959A (zh) * | 2008-08-08 | 2015-09-09 | 实耐宝公司 | 基于图像的库存控制系统和方法 |
CN105572148A (zh) * | 2015-12-14 | 2016-05-11 | 天津华迈科技有限公司 | 一种贴片质检组件 |
CN106153639A (zh) * | 2015-04-21 | 2016-11-23 | 凯吉凯精密电子技术开发(苏州)有限公司 | 基于人工智能的电路板检测方法及其检测装置 |
CN111832324A (zh) * | 2019-04-17 | 2020-10-27 | 深圳长城开发科技股份有限公司 | 用于smt生产线的在线自动扫描条码方法和系统 |
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US7366341B2 (en) * | 1996-10-09 | 2008-04-29 | Easton Hunt Capital Partners, L.P. | Electronic assembly video inspection system |
DE69838342T2 (de) * | 1997-10-09 | 2008-05-29 | Easton Hunt Capital Partners, L.P. | Elektronisches video-aufbau-inspektions-system |
US7486813B2 (en) * | 1998-10-08 | 2009-02-03 | Easton Hunt Capital Partners, L.P. | Electronic assembly video inspection system |
KR20000072235A (ko) * | 2000-08-21 | 2000-12-05 | 여희주 | 비전 시스템을 이용한 자동차 퓨즈박스 검사장치 및 그 방법 |
US6958768B1 (en) * | 2000-10-20 | 2005-10-25 | Asti Holdings Limited | CMOS inspection apparatus |
JP4049559B2 (ja) * | 2001-08-17 | 2008-02-20 | 富士フイルム株式会社 | 検査装置 |
US7101508B2 (en) * | 2002-07-31 | 2006-09-05 | Agilent Technologies, Inc. | Chemical array fabrication errors |
US7742071B2 (en) * | 2003-01-23 | 2010-06-22 | Oracle America, Inc. | Methods and apparatus for inspecting centerplane connectors |
NL1022515C2 (nl) * | 2003-01-29 | 2004-08-03 | Vitronics Soltec B V | Inrichting en werkwijze voor correctief solderen. |
US7458055B2 (en) * | 2003-02-19 | 2008-11-25 | Diversified Systems, Inc. | Apparatus, system, method, and program for facilitating the design of electronic assemblies |
US7240319B2 (en) * | 2003-02-19 | 2007-07-03 | Diversified Systems, Inc. | Apparatus, system, method, and program for facilitating the design of bare circuit boards |
GB0307105D0 (en) * | 2003-03-27 | 2003-04-30 | Pillarhouse Int Ltd | Soldering method and apparatus |
DE10344409A1 (de) * | 2003-09-25 | 2005-04-28 | Marconi Comm Gmbh | Verfahren zum Fertigen einer Hochfrequenzbaugruppe |
WO2005096688A1 (en) * | 2004-04-02 | 2005-10-13 | Original Solutions Inc. | System and method for defect detection and process improvement for printed circuit board assemblies |
US7813638B2 (en) * | 2004-06-07 | 2010-10-12 | Rudolph Technologies, Inc. | System for generating camera triggers |
EP1628493A1 (en) * | 2004-08-17 | 2006-02-22 | Dialog Semiconductor GmbH | Camera handling system |
US20060092274A1 (en) * | 2004-11-04 | 2006-05-04 | Rockwell Automation Technologies, Inc. | Image sensor annotation method and apparatus |
US7587080B1 (en) * | 2004-11-04 | 2009-09-08 | Rockwell Automation Technologies, Inc. | Image retention user interface |
DE102004056698B3 (de) * | 2004-11-24 | 2006-08-17 | Stratus Vision Gmbh | Inspektionsvorrichtung für ein Substrat, das mindestens eine aufgedruckte Schicht aufweist |
GB0616410D0 (en) * | 2006-08-21 | 2006-10-18 | Anaglyph Ltd | Visual aid for manufacturing assembly/component placement |
US7735626B2 (en) * | 2006-11-13 | 2010-06-15 | Pioneer Hi-Bred International, Inc. | Apparatus, method and system for handling, positioning, and/or automatically orienting objects |
US7915006B2 (en) * | 2006-11-13 | 2011-03-29 | Pioneer Hi-Bred International, Inc. | Methodologies, processes and automated devices for the orientation, sampling and collection of seed tissues from individual seed |
WO2008064005A2 (en) * | 2006-11-13 | 2008-05-29 | Pioneer Hi-Bred International, Inc. | Apparatus, method and system for handling, positioning, and/or automatically orienting objects |
US20080290885A1 (en) * | 2007-05-23 | 2008-11-27 | Texas Instruments Incorporated | Probe test system and method for testing a semiconductor package |
CN102066896B (zh) | 2007-12-17 | 2014-05-14 | 先锋国际良种公司 | 制作、处理、收集以及标引种子和来自植物种子的种子部分的设备、方法以及系统 |
AU2009202512B2 (en) | 2008-06-25 | 2012-02-02 | Aristocrat Technologies Australia Pty Limited | A method and system for setting display resolution |
US7869645B2 (en) * | 2008-07-22 | 2011-01-11 | Seiko Epson Corporation | Image capture and calibratiion |
US8090184B2 (en) * | 2008-07-23 | 2012-01-03 | Seiko Epson Corporation | Fault detection of a printed dot-pattern bitmap |
US8269836B2 (en) * | 2008-07-24 | 2012-09-18 | Seiko Epson Corporation | Image capture, alignment, and registration |
US7989769B2 (en) * | 2008-08-21 | 2011-08-02 | Rockwell Automation Technologies, Inc. | In-cabinet thermal monitoring method and system |
EP2398600A1 (en) | 2009-02-18 | 2011-12-28 | Pioneer Hi-Bred International, Inc. | Apparatus and system for preparing ears of corn for automated handling, positioning and orienting |
CN102175309A (zh) * | 2011-03-01 | 2011-09-07 | 飞迅科技(苏州)有限公司 | 检测汽车多媒体控制面板指示灯亮度的检测设备 |
EP2684026A4 (en) * | 2011-03-08 | 2014-09-10 | Spectral Instr Imaging Llc | IMAGING SYSTEM COMPRISING PRIMARY AND AUXILIARY CAMERA SYSTEMS |
US9706137B2 (en) | 2011-06-10 | 2017-07-11 | Flir Systems, Inc. | Electrical cabinet infrared monitor |
DE102011112532B4 (de) * | 2011-09-05 | 2019-03-21 | Audi Ag | Prüfeinrichtung und Verfahren zum Prüfen von Batteriezellen |
EP2834968B1 (en) * | 2012-04-06 | 2019-09-11 | Flir Systems, Inc. | Electrical cabinet infrared monitor |
DE102013014112A1 (de) * | 2013-08-22 | 2015-02-26 | J.G. WEISSER SöHNE GMBH & CO. KG | Maschine und Verfahren zur Diagnose einer Maschine |
KR101639262B1 (ko) * | 2014-09-30 | 2016-07-13 | (주)아세아에프에이 | 커넥터용 하우징 공급장치 |
CN104375293B (zh) * | 2014-11-20 | 2017-05-17 | 武汉精测电子技术股份有限公司 | 基于机器视觉的lcd屏自动检测机台 |
WO2016083897A2 (en) * | 2014-11-24 | 2016-06-02 | Kitov Systems Ltd. | Automated inspection |
US20180157246A1 (en) * | 2015-01-30 | 2018-06-07 | Arima Communications Corp. | Automated production system for mobile phone |
TWM505131U (zh) * | 2015-01-30 | 2015-07-11 | Arima Communication Corp | 手機自動化生產系統 |
KR102314613B1 (ko) * | 2015-02-11 | 2021-10-20 | (주)테크윙 | 전자부품의 안착상태를 확인하기 위한 장치 |
US11167384B2 (en) | 2015-07-02 | 2021-11-09 | Serenity Data Security, Llc | Hard drive non-destructive dismantling system |
US10556240B2 (en) | 2015-07-02 | 2020-02-11 | Serenity Data Security, Llc | Product verification for hard drive data destroying device |
EP3317019A4 (en) | 2015-07-02 | 2019-02-06 | Serenity Data Security, LLC | DISK REMOVAL SYSTEM |
US11330746B2 (en) * | 2018-02-28 | 2022-05-10 | Raytheon Company | Device and method for reworking flip chip components |
DE102018118103B3 (de) | 2018-07-26 | 2019-12-05 | Ersa Gmbh | Reworksystem zum Aus- und/oder Einlöten von elektronischen Komponenten auf einer Leiterplatte |
CN110426400B (zh) * | 2019-07-18 | 2021-03-05 | 成都新西旺自动化科技有限公司 | 针对触摸屏可操作区的自动打光方法 |
US11538148B2 (en) | 2020-05-22 | 2022-12-27 | Future Dial, Inc. | Defect detection of a component in an assembly |
US11551349B2 (en) | 2020-05-22 | 2023-01-10 | Future Dial, Inc. | Defect detection and image comparison of components in an assembly |
CN114324343A (zh) * | 2020-10-09 | 2022-04-12 | 泰连服务有限公司 | 具有视觉检查系统的零件制造机器 |
US11867749B2 (en) | 2020-10-22 | 2024-01-09 | Teradyne, Inc. | Vision system for an automated test system |
US11953519B2 (en) | 2020-10-22 | 2024-04-09 | Teradyne, Inc. | Modular automated test system |
US11754596B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Test site configuration in an automated test system |
US11899042B2 (en) | 2020-10-22 | 2024-02-13 | Teradyne, Inc. | Automated test system |
US11754622B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Thermal control system for an automated test system |
US20230153986A1 (en) * | 2021-11-12 | 2023-05-18 | Future Dial, Inc. | Grading cosmetic appearance of a test object |
CN116322014A (zh) * | 2023-03-02 | 2023-06-23 | 惠州市天睿电子有限公司 | 电路板自动贴片装置 |
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JPS61293657A (ja) * | 1985-06-21 | 1986-12-24 | Matsushita Electric Works Ltd | 半田付け外観検査方法 |
US4729062A (en) * | 1986-06-16 | 1988-03-01 | Hughes Aircraft Company | Reworkable encapsulated electronic assembly |
DE68929481T2 (de) * | 1988-05-09 | 2004-06-09 | Omron Corp. | Vorrichtung und Verfahren zur Anzeige der Ergebnisse einer Leiterplattenprüfung |
WO1994000969A1 (en) * | 1992-06-19 | 1994-01-06 | Motorola, Inc. | Self-aligning electrical contact array |
TW331599B (en) * | 1995-09-26 | 1998-05-11 | Toshiba Co Ltd | Array substrate for LCD and method of making same |
US5754678A (en) * | 1996-01-17 | 1998-05-19 | Photon Dynamics, Inc. | Substrate inspection apparatus and method |
US5917332A (en) * | 1996-05-09 | 1999-06-29 | Advanced Micro Devices, Inc. | Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer |
DE69838342T2 (de) * | 1997-10-09 | 2008-05-29 | Easton Hunt Capital Partners, L.P. | Elektronisches video-aufbau-inspektions-system |
-
1998
- 1998-10-08 DE DE69838342T patent/DE69838342T2/de not_active Revoked
- 1998-10-08 BR BR9815246-7A patent/BR9815246A/pt not_active Application Discontinuation
- 1998-10-08 US US09/486,234 patent/US6681038B2/en not_active Expired - Fee Related
- 1998-10-08 WO PCT/US1998/021383 patent/WO1999019825A1/en active IP Right Grant
- 1998-10-08 EP EP98952209A patent/EP1032912B8/en not_active Revoked
- 1998-10-08 CA CA002307031A patent/CA2307031C/en not_active Expired - Fee Related
- 1998-10-08 AT AT98952209T patent/ATE371915T1/de not_active IP Right Cessation
- 1998-10-08 CN CNB988116383A patent/CN1232924C/zh not_active Expired - Fee Related
- 1998-10-08 JP JP2000516307A patent/JP2001520422A/ja active Pending
- 1998-10-08 KR KR1020007003672A patent/KR100628344B1/ko not_active IP Right Cessation
- 1998-10-08 AU AU97963/98A patent/AU9796398A/en not_active Abandoned
-
2001
- 2001-05-25 HK HK01103640A patent/HK1033019A1/xx not_active IP Right Cessation
-
2003
- 2003-10-08 US US10/682,262 patent/US20040071335A1/en not_active Abandoned
-
2004
- 2004-05-04 US US10/838,960 patent/US7043070B2/en not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104889959A (zh) * | 2008-08-08 | 2015-09-09 | 实耐宝公司 | 基于图像的库存控制系统和方法 |
CN104390982A (zh) * | 2014-11-25 | 2015-03-04 | 深圳华普通用自动化设备有限公司 | 一种用于smt首件检测的测试方法 |
CN106153639A (zh) * | 2015-04-21 | 2016-11-23 | 凯吉凯精密电子技术开发(苏州)有限公司 | 基于人工智能的电路板检测方法及其检测装置 |
CN105572148A (zh) * | 2015-12-14 | 2016-05-11 | 天津华迈科技有限公司 | 一种贴片质检组件 |
CN111832324A (zh) * | 2019-04-17 | 2020-10-27 | 深圳长城开发科技股份有限公司 | 用于smt生产线的在线自动扫描条码方法和系统 |
CN111832324B (zh) * | 2019-04-17 | 2024-01-30 | 深圳长城开发科技股份有限公司 | 用于smt生产线的在线自动扫描条码方法和系统 |
Also Published As
Publication number | Publication date |
---|---|
AU9796398A (en) | 1999-05-03 |
CN1232924C (zh) | 2005-12-21 |
US6681038B2 (en) | 2004-01-20 |
US20020186877A1 (en) | 2002-12-12 |
BR9815246A (pt) | 2000-11-21 |
DE69838342D1 (de) | 2007-10-11 |
US7043070B2 (en) | 2006-05-09 |
ATE371915T1 (de) | 2007-09-15 |
US20040071335A1 (en) | 2004-04-15 |
EP1032912B8 (en) | 2008-01-09 |
DE69838342T2 (de) | 2008-05-29 |
KR20010024424A (ko) | 2001-03-26 |
US20040208354A1 (en) | 2004-10-21 |
CA2307031A1 (en) | 1999-04-22 |
EP1032912A1 (en) | 2000-09-06 |
JP2001520422A (ja) | 2001-10-30 |
HK1033019A1 (en) | 2001-08-10 |
EP1032912A4 (en) | 2001-04-04 |
KR100628344B1 (ko) | 2006-09-27 |
WO1999019825A1 (en) | 1999-04-22 |
EP1032912B1 (en) | 2007-08-29 |
CA2307031C (en) | 2007-03-27 |
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PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: VICCHUANG COMPANY Free format text: FORMER OWNER: JOSEPH L. VILELLA Effective date: 20020613 |
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C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20020613 Address after: American California Applicant after: VICTRON CO. Address before: American California Applicant before: Joseph L. Vilella |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20051221 Termination date: 20111008 |