CN1244121C - 具有平面发射区和聚焦结构的电子源 - Google Patents

具有平面发射区和聚焦结构的电子源 Download PDF

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Publication number
CN1244121C
CN1244121C CNB011395001A CN01139500A CN1244121C CN 1244121 C CN1244121 C CN 1244121C CN B011395001 A CNB011395001 A CN B011395001A CN 01139500 A CN01139500 A CN 01139500A CN 1244121 C CN1244121 C CN 1244121C
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CN
China
Prior art keywords
region
layer
electron source
electron
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CNB011395001A
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English (en)
Chinese (zh)
Other versions
CN1372290A (zh
Inventor
H·－P·顾
H·比雷基
S·-T·林
S·L·纳伯惠斯
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Samsung Electronics Co Ltd
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Hewlett Packard Co
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Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of CN1372290A publication Critical patent/CN1372290A/zh
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Publication of CN1244121C publication Critical patent/CN1244121C/zh
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Expired - Lifetime legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
    • H01J3/02—Electron guns
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/10—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using electron beam; Record carriers therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1409—Heads
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2201/00—Electrodes common to discharge tubes
    • H01J2201/30—Cold cathodes
    • H01J2201/308—Semiconductor cathodes, e.g. having PN junction layers

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Cold Cathode And The Manufacture (AREA)
  • Cathode-Ray Tubes And Fluorescent Screens For Display (AREA)
  • Electrodes For Cathode-Ray Tubes (AREA)
CNB011395001A 2001-02-27 2001-11-27 具有平面发射区和聚焦结构的电子源 Expired - Lifetime CN1244121C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/795,240 US6815875B2 (en) 2001-02-27 2001-02-27 Electron source having planar emission region and focusing structure
US09/795240 2001-02-27

Publications (2)

Publication Number Publication Date
CN1372290A CN1372290A (zh) 2002-10-02
CN1244121C true CN1244121C (zh) 2006-03-01

Family

ID=25165082

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB011395001A Expired - Lifetime CN1244121C (zh) 2001-02-27 2001-11-27 具有平面发射区和聚焦结构的电子源

Country Status (5)

Country Link
US (2) US6815875B2 (enExample)
EP (1) EP1237174A1 (enExample)
JP (1) JP2002260546A (enExample)
CN (1) CN1244121C (enExample)
HK (1) HK1048014A1 (enExample)

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* Cited by examiner, † Cited by third party
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US6649431B2 (en) * 2001-02-27 2003-11-18 Ut. Battelle, Llc Carbon tips with expanded bases grown with simultaneous application of carbon source and etchant gases
US6781146B2 (en) * 2001-04-30 2004-08-24 Hewlett-Packard Development Company, L.P. Annealed tunneling emitter
JP4830217B2 (ja) * 2001-06-18 2011-12-07 日本電気株式会社 電界放出型冷陰極およびその製造方法
DE10225266A1 (de) * 2001-12-19 2003-07-03 Zeiss Carl Smt Ag Abbildungseinrichtung in einer Projektionsbelichtungsanlage
JP2004111292A (ja) * 2002-09-20 2004-04-08 Hitachi Displays Ltd 表示装置及びその製造方法
JP4298399B2 (ja) * 2003-06-26 2009-07-15 キヤノン株式会社 電子線装置及び該電子線装置を用いた電子線描画装置
US7456491B2 (en) * 2004-07-23 2008-11-25 Pilla Subrahmanyam V S Large area electron emission system for application in mask-based lithography, maskless lithography II and microscopy
US8035293B2 (en) * 2004-12-16 2011-10-11 Vu1 Corporation Cold-cathode light-emitting device with defocusing grid and associated methods of manufacturing
KR20060095318A (ko) * 2005-02-28 2006-08-31 삼성에스디아이 주식회사 전자 방출 소자와 이의 제조 방법
KR100889527B1 (ko) * 2007-11-21 2009-03-19 삼성에스디아이 주식회사 발광 장치 및 이 발광 장치를 광원으로 사용하는 표시 장치
US8084929B2 (en) 2009-04-29 2011-12-27 Atti International Services Company, Inc. Multiple device shaping uniform distribution of current density in electro-static focusing systems
WO2011074038A1 (ja) * 2009-12-17 2011-06-23 パイオニア株式会社 電子放出素子およびこれを備えた撮像装置
CN102696089B (zh) * 2010-01-07 2015-02-04 日本先锋公司 电子发射元件以及具备该电子发射元件的摄像装置
NL2007604C2 (en) * 2011-10-14 2013-05-01 Mapper Lithography Ip Bv Charged particle system comprising a manipulator device for manipulation of one or more charged particle beams.
NL2006868C2 (en) 2011-05-30 2012-12-03 Mapper Lithography Ip Bv Charged particle multi-beamlet apparatus.
US9116290B1 (en) * 2011-10-07 2015-08-25 Bae Systems Information And Electronic Systems Integration Inc. Faceted, germanium slotted waveguide
JP6834817B2 (ja) * 2016-08-08 2021-02-24 株式会社ニューフレアテクノロジー マルチビーム検査用アパーチャ、マルチビーム用ビーム検査装置、及びマルチ荷電粒子ビーム描画装置
CN107331619A (zh) * 2017-06-28 2017-11-07 京东方科技集团股份有限公司 薄膜晶体管及其制作方法、显示装置、曝光装置

Family Cites Families (19)

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Publication number Priority date Publication date Assignee Title
DE3070002D1 (en) * 1980-06-07 1985-03-07 Hell Rudolf Dr Ing Gmbh Process for operating a high stability electron gun for the shaping of materials
US4904895A (en) * 1987-05-06 1990-02-27 Canon Kabushiki Kaisha Electron emission device
FR2641412B1 (fr) * 1988-12-30 1991-02-15 Thomson Tubes Electroniques Source d'electrons du type a emission de champ
JPH0512988A (ja) * 1990-10-13 1993-01-22 Canon Inc 半導体電子放出素子
JPH05242794A (ja) * 1991-11-29 1993-09-21 Motorola Inc 集積化された静電界レンズを有する電界放出デバイス
JP3243471B2 (ja) 1994-09-16 2002-01-07 三菱電機株式会社 電子放出素子の製造方法
US5557596A (en) * 1995-03-20 1996-09-17 Gibson; Gary Ultra-high density storage device
TW413828B (en) * 1995-07-07 2000-12-01 Nippon Electric Co Electron gun provided with a field emission cold cathode and an improved gate structure
JP2765533B2 (ja) 1995-10-31 1998-06-18 日本電気株式会社 直線ビームマイクロ波管
JP3512933B2 (ja) * 1996-01-25 2004-03-31 株式会社東芝 電界放出型冷陰極装置及びその製造方法
TW391022B (en) 1997-10-29 2000-05-21 Mitsubishi Rayon Co Field emission electron source, method of producing the same, and use of the same
US6326725B1 (en) * 1998-05-26 2001-12-04 Micron Technology, Inc. Focusing electrode for field emission displays and method
US6190223B1 (en) * 1998-07-02 2001-02-20 Micron Technology, Inc. Method of manufacture of composite self-aligned extraction grid and in-plane focusing ring
TW436837B (en) * 1998-11-16 2001-05-28 Matsushita Electric Works Ltd Field emission-type electron source and manufacturing method thereof and display using the electron source
JP2000268706A (ja) 1999-03-18 2000-09-29 Matsushita Electric Ind Co Ltd 電子放出素子及びそれを用いた画像描画装置
JP2000294122A (ja) 1999-04-08 2000-10-20 Nec Corp 電界放出型冷陰極及び平面ディスプレイの製造方法
US6498426B1 (en) * 1999-04-23 2002-12-24 Matsushita Electric Works, Ltd. Field emission-type electron source and manufacturing method thereof
US6538367B1 (en) 1999-07-15 2003-03-25 Agere Systems Inc. Field emitting device comprising field-concentrating nanoconductor assembly and method for making the same
JP3487229B2 (ja) 1999-07-27 2004-01-13 松下電工株式会社 電界放射型電子源およびその製造方法

Also Published As

Publication number Publication date
EP1237174A1 (en) 2002-09-04
US20020117953A1 (en) 2002-08-29
JP2002260546A (ja) 2002-09-13
US20050001530A1 (en) 2005-01-06
US7208867B2 (en) 2007-04-24
CN1372290A (zh) 2002-10-02
US6815875B2 (en) 2004-11-09
HK1048014A1 (zh) 2003-03-14

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