CN117157755A - 半导体器件和半导体器件的制造方法 - Google Patents
半导体器件和半导体器件的制造方法 Download PDFInfo
- Publication number
- CN117157755A CN117157755A CN202280026359.9A CN202280026359A CN117157755A CN 117157755 A CN117157755 A CN 117157755A CN 202280026359 A CN202280026359 A CN 202280026359A CN 117157755 A CN117157755 A CN 117157755A
- Authority
- CN
- China
- Prior art keywords
- semiconductor device
- bonding
- thickness direction
- back surface
- pad
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/40—Leadframes
- H10W70/464—Additional interconnections in combination with leadframes
- H10W70/465—Bumps or wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/01—Manufacture or treatment
- H10W70/04—Manufacture or treatment of leadframes
- H10W70/041—Connecting or disconnecting interconnections to or from leadframes, e.g. connecting bond wires or bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/01—Manufacture or treatment
- H10W70/04—Manufacture or treatment of leadframes
- H10W70/048—Mechanical treatments, e.g. punching, cutting, deforming or cold welding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/40—Leadframes
- H10W70/411—Chip-supporting parts, e.g. die pads
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/40—Leadframes
- H10W70/421—Shapes or dispositions
- H10W70/424—Cross-sectional shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/40—Leadframes
- H10W70/481—Leadframes for devices being provided for in groups H10D8/00 - H10D48/00
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/40—Leadframes
- H10W70/421—Shapes or dispositions
- H10W70/424—Cross-sectional shapes
- H10W70/427—Bent parts
- H10W70/429—Bent parts being the outer leads
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07511—Treating the bonding area before connecting, e.g. by applying flux or cleaning
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07521—Aligning
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07551—Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting
- H10W72/07554—Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting changes in dispositions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/547—Dispositions of multiple bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/547—Dispositions of multiple bond wires
- H10W72/5473—Dispositions of multiple bond wires multiple bond wires connected to a common bond pad
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
Landscapes
- Wire Bonding (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021-062894 | 2021-04-01 | ||
| JP2021062894 | 2021-04-01 | ||
| PCT/JP2022/011312 WO2022209819A1 (ja) | 2021-04-01 | 2022-03-14 | 半導体装置および半導体装置の製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117157755A true CN117157755A (zh) | 2023-12-01 |
Family
ID=83458909
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202280026359.9A Pending CN117157755A (zh) | 2021-04-01 | 2022-03-14 | 半导体器件和半导体器件的制造方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20240030178A1 (https=) |
| JP (1) | JPWO2022209819A1 (https=) |
| CN (1) | CN117157755A (https=) |
| DE (1) | DE112022000758T5 (https=) |
| WO (1) | WO2022209819A1 (https=) |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05175266A (ja) * | 1991-12-20 | 1993-07-13 | Mitsubishi Electric Corp | 半導体装置 |
| JP2001168261A (ja) * | 1999-12-03 | 2001-06-22 | Mitsui High Tec Inc | 半導体装置 |
| JP2001185671A (ja) * | 1999-12-22 | 2001-07-06 | Mitsubishi Electric Corp | 半導体装置の製造方法及び該半導体装置の製造に用いられるリードフレームの製造方法 |
| JP2001339029A (ja) * | 2000-05-26 | 2001-12-07 | Shinko Electric Ind Co Ltd | 多層リードフレーム及びこれを用いた半導体装置 |
| JP3470111B2 (ja) * | 2001-06-28 | 2003-11-25 | 松下電器産業株式会社 | 樹脂封止型半導体装置の製造方法 |
| JP2005166943A (ja) * | 2003-12-02 | 2005-06-23 | Sony Corp | リードフレーム、それを用いた半導体装置の製造におけるワイヤーボンディング方法及び樹脂封止型半導体装置 |
| JP2005191240A (ja) * | 2003-12-25 | 2005-07-14 | Renesas Technology Corp | 半導体装置及びその製造方法 |
| JP2008130660A (ja) * | 2006-11-17 | 2008-06-05 | Matsushita Electric Ind Co Ltd | 半導体装置の製造方法 |
| US7838339B2 (en) * | 2008-04-04 | 2010-11-23 | Gem Services, Inc. | Semiconductor device package having features formed by stamping |
| JP6857035B2 (ja) | 2017-01-12 | 2021-04-14 | ローム株式会社 | 半導体装置 |
-
2022
- 2022-03-14 WO PCT/JP2022/011312 patent/WO2022209819A1/ja not_active Ceased
- 2022-03-14 DE DE112022000758.3T patent/DE112022000758T5/de not_active Ceased
- 2022-03-14 JP JP2023510872A patent/JPWO2022209819A1/ja active Pending
- 2022-03-14 CN CN202280026359.9A patent/CN117157755A/zh active Pending
-
2023
- 2023-09-29 US US18/478,122 patent/US20240030178A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2022209819A1 (ja) | 2022-10-06 |
| US20240030178A1 (en) | 2024-01-25 |
| DE112022000758T5 (de) | 2023-11-16 |
| JPWO2022209819A1 (https=) | 2022-10-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10312171B2 (en) | Semiconductor device | |
| US12046541B2 (en) | Packaging of a semiconductor device with a plurality of leads | |
| US6992386B2 (en) | Semiconductor device and a method of manufacturing the same | |
| EP2930747A1 (en) | Lead for connection to a semiconductor device | |
| US7800206B2 (en) | Semiconductor device | |
| JP7037368B2 (ja) | 半導体装置および半導体装置の製造方法 | |
| JP2023015224A (ja) | 半導体装置 | |
| US11227827B2 (en) | Semiconductor device | |
| CN117616567A (zh) | 半导体器件 | |
| JP7594950B2 (ja) | 半導体装置 | |
| CN111373517B (zh) | 半导体装置 | |
| CN117157755A (zh) | 半导体器件和半导体器件的制造方法 | |
| JP7649127B2 (ja) | 半導体装置 | |
| TW201629511A (zh) | 半導體裝置之製造方法 | |
| JP2005101293A (ja) | 半導体装置 | |
| US20240030106A1 (en) | Semiconductor device | |
| CN101019226B (zh) | 表面贴装的正面接触制备 | |
| JP3869755B2 (ja) | 半導体装置 | |
| US20240030298A1 (en) | Semiconductor device | |
| WO2024219244A1 (ja) | 半導体装置 | |
| US20240304590A1 (en) | Semiconductor device | |
| JP2026034900A (ja) | 半導体装置 | |
| JP3644555B2 (ja) | リードフレームおよび半導体装置 | |
| JP2025082486A (ja) | 半導体装置 | |
| JP2025075374A (ja) | 電子装置及び実装構造体 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |