CN112837266A - 自动检查 - Google Patents

自动检查 Download PDF

Info

Publication number
CN112837266A
CN112837266A CN202110016463.7A CN202110016463A CN112837266A CN 112837266 A CN112837266 A CN 112837266A CN 202110016463 A CN202110016463 A CN 202110016463A CN 112837266 A CN112837266 A CN 112837266A
Authority
CN
China
Prior art keywords
inspection
images
parameters
implementations
model
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202110016463.7A
Other languages
English (en)
Chinese (zh)
Inventor
尼尔·阿瓦拉哈米
约瑟夫·鲁柏纳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kitov Systems Ltd
Original Assignee
Kitov Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kitov Systems Ltd filed Critical Kitov Systems Ltd
Publication of CN112837266A publication Critical patent/CN112837266A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/0006Industrial image inspection using a design-rule based approach
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/418Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/70Determining position or orientation of objects or cameras
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/35Nc in input of data, input till input file format
    • G05B2219/35012Cad cam
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/45Nc applications
    • G05B2219/45066Inspection robot
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2200/00Indexing scheme for image data processing or generation, in general
    • G06T2200/24Indexing scheme for image data processing or generation, in general involving graphical user interfaces [GUIs]
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/80Management or planning

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • General Factory Administration (AREA)
  • Manipulator (AREA)
  • Architecture (AREA)
  • Software Systems (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN202110016463.7A 2014-11-24 2015-11-24 自动检查 Pending CN112837266A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201462083807P 2014-11-24 2014-11-24
US62/083,807 2014-11-24
CN201580074364.7A CN107408297B (zh) 2014-11-24 2015-11-24 自动检查

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN201580074364.7A Division CN107408297B (zh) 2014-11-24 2015-11-24 自动检查

Publications (1)

Publication Number Publication Date
CN112837266A true CN112837266A (zh) 2021-05-25

Family

ID=56075093

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201580074364.7A Active CN107408297B (zh) 2014-11-24 2015-11-24 自动检查
CN202110016463.7A Pending CN112837266A (zh) 2014-11-24 2015-11-24 自动检查

Family Applications Before (1)

Application Number Title Priority Date Filing Date
CN201580074364.7A Active CN107408297B (zh) 2014-11-24 2015-11-24 自动检查

Country Status (5)

Country Link
US (2) US10916005B2 (enExample)
EP (1) EP3224806B1 (enExample)
JP (2) JP7108247B2 (enExample)
CN (2) CN107408297B (enExample)
WO (1) WO2016083897A2 (enExample)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10916005B2 (en) 2014-11-24 2021-02-09 Kitov Systems Ltd Automated inspection
US10514614B2 (en) * 2015-02-13 2019-12-24 Asml Netherlands B.V. Process variability aware adaptive inspection and metrology
FR3037429B1 (fr) * 2015-06-15 2018-09-07 Donecle Systeme et procede d'inspection automatique de surface
JP6745156B2 (ja) * 2016-07-15 2020-08-26 ニッタン株式会社 飛行体
US10706530B2 (en) * 2017-09-11 2020-07-07 International Business Machines Corporation Object detection
US11086315B2 (en) 2017-10-26 2021-08-10 2KR Systems, LLC Building rooftop intelligence gathering, decision-support and snow load removal system for protecting buildings from excessive snow load conditions, and automated methods for carrying out the same
US10969521B2 (en) 2017-10-26 2021-04-06 2KR Systems, LLC Flexible networked array for measuring snow water equivalent (SWE) and system network for providing environmental monitoring services using the same
IL257256A (en) 2018-01-30 2018-03-29 HYATT Yonatan System and method for establishing production line tests
EP3740948B1 (en) * 2018-01-15 2025-09-03 Kitov Systems Ltd. Automated inspection and part enrollment
WO2019139172A1 (ja) * 2018-01-15 2019-07-18 本郷飛行機株式会社 情報処理システム
JP6917925B2 (ja) * 2018-03-12 2021-08-11 株式会社日立製作所 Cadデータ検査システム
US11087446B2 (en) * 2018-03-25 2021-08-10 Matthew Henry Ranson Automated arthropod detection system
CN108764029A (zh) * 2018-04-16 2018-11-06 南京维拓科技股份有限公司 模型智能检查方法
US11049052B2 (en) 2018-05-02 2021-06-29 International Business Machines Corporation Automated managing of a data center installation
CN109000559B (zh) * 2018-06-11 2020-09-11 广东工业大学 一种物体体积的测量方法、装置、系统和可读存储介质
EP3807730B1 (en) * 2018-06-14 2025-11-12 Gestamp Servicios, S.A. Quality monitoring of industrial processes
IL263399B (en) * 2018-11-29 2022-09-01 Inspekto A M V Ltd Centralized analyzes of multiple devices for visual inspection of a production line
US11682113B2 (en) 2018-11-29 2023-06-20 Inspekto A.M.V. Ltd. Multi-camera visual inspection appliance and method of use
WO2020110129A1 (en) * 2018-11-29 2020-06-04 Inspekto A.M.V Ltd Centralized analytics of multiple visual inspection appliances
JP7221038B2 (ja) * 2018-12-10 2023-02-13 大和ハウス工業株式会社 留め付け検査システムおよび留め付け検査方法
US10670539B1 (en) * 2018-12-11 2020-06-02 General Electric Company Coating quality inspection system and method
US10964015B2 (en) * 2019-01-15 2021-03-30 International Business Machines Corporation Product defect detection
US11210770B2 (en) * 2019-03-15 2021-12-28 Hitachi, Ltd. AI-based inspection in transportation
US12288390B2 (en) 2019-08-12 2025-04-29 Qc Hero, Inc. System and method of object detection using AI deep learning models
TWI802374B (zh) * 2019-11-07 2023-05-11 美商奈米創尼克影像公司 用於校正製造程序之系統、方法及非暫態電腦可讀媒體
JP7525266B2 (ja) * 2020-02-14 2024-07-30 株式会社日立製作所 検査システム及び検査方法
WO2021171287A1 (en) * 2020-02-24 2021-09-02 Saccade Vision Ltd. System and method for controlling automatic inspection of articles
US11162770B2 (en) * 2020-02-27 2021-11-02 Proto Labs, Inc. Methods and systems for an in-line automated inspection of a mechanical part
US12131459B2 (en) * 2021-06-07 2024-10-29 Elementary Robotics, Inc. Machine-learning based continuous camera image triggering for quality assurance inspection processes
DE102020209509A1 (de) * 2020-07-28 2022-02-03 Sivantos Pte. Ltd. Verfahren zur Fehlererkennung bei einem Hörgerät sowie System
JP2023542609A (ja) * 2020-08-05 2023-10-11 キトフ システムズ リミテッド コンポーネント間の検査要件の設計符号化
US11410417B2 (en) * 2020-08-17 2022-08-09 Google Llc Modular system for automatic hard disk processing and verification
IL301729A (en) * 2020-09-29 2023-05-01 Kitov Systems Ltd Semantic segmentation of inspection targets
US11625821B2 (en) * 2020-10-14 2023-04-11 Baker Hughes Oilfield Operations Llc Automated inspection-plan based detection
US11782167B2 (en) 2020-11-03 2023-10-10 2KR Systems, LLC Methods of and systems, networks and devices for remotely detecting and monitoring the displacement, deflection and/or distortion of stationary and mobile systems using GNSS-based technologies
CN112419299B (zh) * 2020-12-04 2024-01-19 中冶建筑研究总院(深圳)有限公司 一种螺栓缺失检测方法、装置、设备及存储介质
DE102021208648A1 (de) * 2021-08-09 2023-02-09 Robert Bosch Gesellschaft mit beschränkter Haftung Prüfverfahren zur Prozessqualitätsüberprüfung und Prüfvorrichtung
US20240386541A1 (en) * 2021-09-23 2024-11-21 Kitov Systems Ltd Self-integrating inspection line system
US12482085B2 (en) 2021-11-15 2025-11-25 Advanced Vision Technology (A.V.T.) Ltd. Method and process for automated auditing of inline quality inspection
JP7734604B2 (ja) * 2022-02-04 2025-09-05 三菱電機株式会社 外観検査支援装置、外観検査支援方法、及び外観検査支援プログラム
US12269224B2 (en) 2022-06-24 2025-04-08 The Boeing Company Systems for forming composite parts, methods of forming composite parts, and methods of precisely performing a plurality of operations on a composite part
WO2025195902A1 (en) 2024-03-20 2025-09-25 Lem Surgical Ag Methods and apparatus for validation and modeling of robotic surgical tools

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6324298B1 (en) * 1998-07-15 2001-11-27 August Technology Corp. Automated wafer defect inspection system and a process of performing such inspection
WO2002088688A1 (en) * 2001-05-02 2002-11-07 Teradyne, Inc. Inspection system using dynamically obtained values and related techniques
CN1440543A (zh) * 2000-06-28 2003-09-03 泰拉丁公司 使用检查系统的图像处理系统
US20080281548A1 (en) * 2005-08-26 2008-11-13 Camtek Ltd Method and System for Automatic Defect Detection of Articles in Visual Inspection Machines
US20140050389A1 (en) * 2012-08-14 2014-02-20 Kla-Tencor Corporation Automated Inspection Scenario Generation

Family Cites Families (49)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07107511B2 (ja) * 1986-05-07 1995-11-15 オムロン株式会社 プリント基板検査装置
US5859923A (en) * 1992-12-29 1999-01-12 Cognex Corporation Mark quality inspection apparatus and method
JP3583450B2 (ja) * 1993-09-28 2004-11-04 川崎重工業株式会社 3次元物体の自動検査装置および方法
US5815198A (en) * 1996-05-31 1998-09-29 Vachtsevanos; George J. Method and apparatus for analyzing an image to detect and identify defects
US6408429B1 (en) * 1997-01-17 2002-06-18 Cognex Corporation Machine vision system for identifying and assessing features of an article
DE19713521B4 (de) * 1997-04-02 2004-09-23 Festo Ag & Co Vorrichtung zur Erkennung falsch orientierter und/oder von einem vorgegebenen Muster abweichender Teile
EP1032912B8 (en) * 1997-10-09 2008-01-09 Easton Hunt Capital Partners, L.P. Electronic assembly video inspection system
US6445812B1 (en) * 1999-01-22 2002-09-03 Siemens Corporate Research, Inc. Illumination compensation system for industrial inspection
JP4246319B2 (ja) * 1999-06-16 2009-04-02 パナソニック株式会社 照明むら測定方法および測定装置
US6581202B1 (en) * 2000-11-10 2003-06-17 Viasystems Group, Inc. System and method for monitoring and improving dimensional stability and registration accuracy of multi-layer PCB manufacture
GB0210990D0 (en) 2002-05-14 2002-06-19 Rolls Royce Plc Method of generating an inspection program and method of generating a visual display
JP4250931B2 (ja) 2002-08-30 2009-04-08 日本電気株式会社 外観検査装置および外観検査方法
US7183120B2 (en) * 2002-10-31 2007-02-27 Honeywell International Inc. Etch-stop material for improved manufacture of magnetic devices
US6927003B2 (en) * 2003-02-11 2005-08-09 Synopsys, Inc. Simulation based PSM clear defect repair method and system
GB0303270D0 (en) 2003-02-13 2003-03-19 Renishaw Plc A machine tool control process and apparatus therefor
US20040223053A1 (en) 2003-05-07 2004-11-11 Mitutoyo Corporation Machine vision inspection system and method having improved operations for increased precision inspection throughput
DE102004007829B4 (de) 2004-02-18 2007-04-05 Isra Vision Systems Ag Verfahren zur Bestimmung von zu inspizierenden Bereichen
US7111783B2 (en) 2004-06-25 2006-09-26 Board Of Trustees Operating Michigan State University Automated dimensional inspection
US7398129B2 (en) * 2004-10-07 2008-07-08 Amada Company, Limited Representation of sheet metal part models
JP3960346B2 (ja) 2004-12-27 2007-08-15 オムロン株式会社 画像処理方法、基板検査方法、基板検査装置、および基板検査用の検査データ作成方法
US7570796B2 (en) * 2005-11-18 2009-08-04 Kla-Tencor Technologies Corp. Methods and systems for utilizing design data in combination with inspection data
US7689003B2 (en) 2006-03-20 2010-03-30 Siemens Energy, Inc. Combined 2D and 3D nondestructive examination
US20080099675A1 (en) * 2006-10-31 2008-05-01 Hitachi High-Technologies Corporation Inspection apparatus and an inspection method
JP4943304B2 (ja) * 2006-12-05 2012-05-30 株式会社 Ngr パターン検査装置および方法
CN101680860A (zh) * 2007-02-21 2010-03-24 洛克希德马丁公司 用于激光超声波探伤的关节型机器人
US8976242B2 (en) * 2007-10-03 2015-03-10 Kabushiki Kaisha Toshiba Visual inspection apparatus and visual inspection method
JP5156452B2 (ja) * 2008-03-27 2013-03-06 東京エレクトロン株式会社 欠陥分類方法、プログラム、コンピュータ記憶媒体及び欠陥分類装置
JP5369643B2 (ja) * 2008-06-10 2013-12-18 富士通セミコンダクター株式会社 欠陥検査装置
JP5414215B2 (ja) * 2008-07-30 2014-02-12 株式会社日立ハイテクノロジーズ 回路パターン検査装置、および回路パターンの検査方法
WO2010030773A1 (en) * 2008-09-11 2010-03-18 Rudolph Technologies, Inc. Probe mark inspection
FR2940449A1 (fr) * 2008-12-24 2010-06-25 Snecma Procede de controle non destructif d'une piece mecanique
US8746089B2 (en) * 2009-01-19 2014-06-10 Babcock & Wilcox Nuclear Energy, Inc. Apparatus for automated positioning of eddy current test probe
GB0905718D0 (en) * 2009-04-02 2009-05-20 Roke Manor Research Automated 3D image analysis
EP2425232B1 (en) 2009-04-30 2013-01-09 Wilcox Associates, Inc. An inspection method and an inspection apparatus
JP2011174896A (ja) * 2010-02-25 2011-09-08 Mitsubishi Heavy Ind Ltd 撮像装置及び撮像方法
JP5518571B2 (ja) * 2010-05-24 2014-06-11 株式会社ブリヂストン タイヤの外観検査装置及び外観検査方法
US8699784B2 (en) 2010-08-10 2014-04-15 Camtek Ltd. Inspection recipe generation and inspection based on an inspection recipe
KR101240947B1 (ko) 2010-12-30 2013-03-18 주식회사 미르기술 비전검사장치
US9201022B2 (en) * 2011-06-02 2015-12-01 Taiwan Semiconductor Manufacturing Company, Ltd. Extraction of systematic defects
JP5647999B2 (ja) * 2012-01-04 2015-01-07 株式会社日立ハイテクノロジーズ パターンマッチング装置、検査システム、及びコンピュータプログラム
JP5948138B2 (ja) * 2012-05-11 2016-07-06 株式会社日立ハイテクノロジーズ 欠陥解析支援装置、欠陥解析支援装置で実行されるプログラム、および欠陥解析システム
US9251582B2 (en) 2012-12-31 2016-02-02 General Electric Company Methods and systems for enhanced automated visual inspection of a physical asset
US9091935B2 (en) * 2013-03-11 2015-07-28 Kla-Tencor Corporation Multistage extreme ultra-violet mask qualification
US20140336928A1 (en) 2013-05-10 2014-11-13 Michael L. Scott System and Method of Automated Civil Infrastructure Metrology for Inspection, Analysis, and Information Modeling
US9430824B2 (en) * 2013-05-14 2016-08-30 Kla-Tencor Corporation Machine learning method and apparatus for inspecting reticles
US9934565B2 (en) * 2013-06-07 2018-04-03 Asti Holdings Limited Systems and methods for automatically verifying correct die removal from film frames
US9187188B2 (en) 2013-07-02 2015-11-17 Premium Aerotec Gmbh Assembly inspection system and method
JP6329397B2 (ja) * 2014-03-07 2018-05-23 株式会社ダイヘン 画像検査装置及び画像検査方法
US10916005B2 (en) 2014-11-24 2021-02-09 Kitov Systems Ltd Automated inspection

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6324298B1 (en) * 1998-07-15 2001-11-27 August Technology Corp. Automated wafer defect inspection system and a process of performing such inspection
CN1440543A (zh) * 2000-06-28 2003-09-03 泰拉丁公司 使用检查系统的图像处理系统
WO2002088688A1 (en) * 2001-05-02 2002-11-07 Teradyne, Inc. Inspection system using dynamically obtained values and related techniques
US20080281548A1 (en) * 2005-08-26 2008-11-13 Camtek Ltd Method and System for Automatic Defect Detection of Articles in Visual Inspection Machines
US20140050389A1 (en) * 2012-08-14 2014-02-20 Kla-Tencor Corporation Automated Inspection Scenario Generation

Also Published As

Publication number Publication date
US20210166364A1 (en) 2021-06-03
JP7108247B2 (ja) 2022-07-28
WO2016083897A3 (en) 2016-08-18
US10916005B2 (en) 2021-02-09
EP3224806A4 (en) 2018-07-18
WO2016083897A2 (en) 2016-06-02
EP3224806B1 (en) 2024-06-05
JP2018506127A (ja) 2018-03-01
JP7550462B2 (ja) 2024-09-13
JP2022078043A (ja) 2022-05-24
CN107408297A (zh) 2017-11-28
CN107408297B (zh) 2021-02-02
EP3224806A2 (en) 2017-10-04
US20190213724A1 (en) 2019-07-11

Similar Documents

Publication Publication Date Title
JP7550462B2 (ja) 自動検査方法
EP3791336B1 (en) System and method for detecting defects on imaged items
EP4009038A1 (en) Method and device for detecting mechanical equipment parts
US20250232573A1 (en) System and method of object detection using ai deep learning
CN111712769A (zh) 用于设定照明条件的方法、装置、系统及程序以及存储介质
US20230410364A1 (en) Semantic segmentation of inspection targets
US20220020136A1 (en) Optimizing a set-up stage in an automatic visual inspection process
CN112585672A (zh) 自动检查和零件登记
CN115035092A (zh) 基于图像的瓶体检测方法、装置、设备及存储介质
WO2020079694A1 (en) Optimizing defect detection in an automatic visual inspection process
Son et al. Path planning of multi-patched freeform surfaces for laser scanning
CN118305101A (zh) 一种自动化轴承缺陷检测系统及方法
Farrokhsiar et al. A comprehensive review on integrating vision-based sensing in extrusion-based 3D printing processes: toward geometric monitoring of extrusion-based 3D concrete printing
JP2024119748A (ja) 自動視覚検査システムの柔軟で直感的な配置システム
TWM631676U (zh) 具人工智慧模組進行檢測緊固件的設備
Pillai et al. Burr registration using image processing
JP2025013743A (ja) ゾーンガイド型修理範囲最適化のためのシステム及び方法
CN121089599A (zh) 一种平板显示基板用厚度检测装置
Chen et al. Size Detection System for Integrated Circuit Lead Frame Using Machine Vision

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20210525

WD01 Invention patent application deemed withdrawn after publication