CN112525936A - 一种硬质合金中钴相xrd分析用样品的制备方法 - Google Patents
一种硬质合金中钴相xrd分析用样品的制备方法 Download PDFInfo
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- CN112525936A CN112525936A CN201910886927.2A CN201910886927A CN112525936A CN 112525936 A CN112525936 A CN 112525936A CN 201910886927 A CN201910886927 A CN 201910886927A CN 112525936 A CN112525936 A CN 112525936A
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- hard alloy
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- 239000000956 alloy Substances 0.000 title claims abstract description 34
- 229910045601 alloy Inorganic materials 0.000 title claims abstract description 34
- 238000002441 X-ray diffraction Methods 0.000 title claims abstract description 21
- 239000010941 cobalt Substances 0.000 title claims abstract description 18
- 229910017052 cobalt Inorganic materials 0.000 title claims abstract description 18
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 title claims abstract description 18
- 238000002360 preparation method Methods 0.000 title claims abstract description 10
- 239000003792 electrolyte Substances 0.000 claims abstract description 49
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 claims abstract description 30
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 29
- 238000005498 polishing Methods 0.000 claims abstract description 24
- VLTRZXGMWDSKGL-UHFFFAOYSA-N perchloric acid Chemical compound OCl(=O)(=O)=O VLTRZXGMWDSKGL-UHFFFAOYSA-N 0.000 claims abstract description 22
- 239000008367 deionised water Substances 0.000 claims abstract description 17
- 229910021641 deionized water Inorganic materials 0.000 claims abstract description 17
- 238000000034 method Methods 0.000 claims abstract description 15
- 238000005868 electrolysis reaction Methods 0.000 claims abstract description 12
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 11
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 claims abstract description 11
- 229910052802 copper Inorganic materials 0.000 claims abstract description 11
- 239000010949 copper Substances 0.000 claims abstract description 11
- HELHAJAZNSDZJO-OLXYHTOASA-L sodium L-tartrate Chemical compound [Na+].[Na+].[O-]C(=O)[C@H](O)[C@@H](O)C([O-])=O HELHAJAZNSDZJO-OLXYHTOASA-L 0.000 claims abstract description 11
- 239000001433 sodium tartrate Substances 0.000 claims abstract description 11
- 229960002167 sodium tartrate Drugs 0.000 claims abstract description 11
- 235000011004 sodium tartrates Nutrition 0.000 claims abstract description 11
- 238000005406 washing Methods 0.000 claims abstract description 11
- 238000005520 cutting process Methods 0.000 claims abstract description 10
- 239000001509 sodium citrate Substances 0.000 claims abstract description 10
- NLJMYIDDQXHKNR-UHFFFAOYSA-K sodium citrate Chemical compound O.O.[Na+].[Na+].[Na+].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O NLJMYIDDQXHKNR-UHFFFAOYSA-K 0.000 claims abstract description 10
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims abstract description 4
- 238000001035 drying Methods 0.000 claims description 6
- 239000000203 mixture Substances 0.000 claims description 6
- 238000004506 ultrasonic cleaning Methods 0.000 claims description 6
- 238000007517 polishing process Methods 0.000 claims description 3
- 239000013078 crystal Substances 0.000 abstract description 5
- 230000003628 erosive effect Effects 0.000 abstract description 3
- 238000002604 ultrasonography Methods 0.000 abstract 1
- 239000012071 phase Substances 0.000 description 19
- 238000004140 cleaning Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 5
- 238000000227 grinding Methods 0.000 description 5
- 239000007787 solid Substances 0.000 description 5
- 239000006104 solid solution Substances 0.000 description 5
- 238000009210 therapy by ultrasound Methods 0.000 description 4
- UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 3
- 230000007797 corrosion Effects 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 229910003460 diamond Inorganic materials 0.000 description 3
- 239000010432 diamond Substances 0.000 description 3
- 230000007704 transition Effects 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000011230 binding agent Substances 0.000 description 1
- 230000000536 complexating effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004299 exfoliation Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000004626 scanning electron microscopy Methods 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000007790 solid phase Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/2005—Preparation of powder samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
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- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
Description
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201910886927.2A CN112525936A (zh) | 2019-09-19 | 2019-09-19 | 一种硬质合金中钴相xrd分析用样品的制备方法 |
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CN201910886927.2A CN112525936A (zh) | 2019-09-19 | 2019-09-19 | 一种硬质合金中钴相xrd分析用样品的制备方法 |
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Publication Number | Publication Date |
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CN112525936A true CN112525936A (zh) | 2021-03-19 |
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CN201910886927.2A Pending CN112525936A (zh) | 2019-09-19 | 2019-09-19 | 一种硬质合金中钴相xrd分析用样品的制备方法 |
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CN (1) | CN112525936A (zh) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030129456A1 (en) * | 2001-09-26 | 2003-07-10 | Keiji Usami | Cemented carbide and cutting tool |
CN102445426A (zh) * | 2011-09-28 | 2012-05-09 | 中国一拖集团有限公司 | 一种测定硬质合金制品中钴含量的方法 |
CN103913475A (zh) * | 2013-01-07 | 2014-07-09 | 厦门钨业股份有限公司 | 一种测定WC-Co硬质合金中钴相结构的方法 |
CN106596616A (zh) * | 2016-12-26 | 2017-04-26 | 株洲硬质合金集团有限公司 | WC‑Co硬质合金中两种钴相的分析检测方法 |
-
2019
- 2019-09-19 CN CN201910886927.2A patent/CN112525936A/zh active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030129456A1 (en) * | 2001-09-26 | 2003-07-10 | Keiji Usami | Cemented carbide and cutting tool |
CN102445426A (zh) * | 2011-09-28 | 2012-05-09 | 中国一拖集团有限公司 | 一种测定硬质合金制品中钴含量的方法 |
CN103913475A (zh) * | 2013-01-07 | 2014-07-09 | 厦门钨业股份有限公司 | 一种测定WC-Co硬质合金中钴相结构的方法 |
CN106596616A (zh) * | 2016-12-26 | 2017-04-26 | 株洲硬质合金集团有限公司 | WC‑Co硬质合金中两种钴相的分析检测方法 |
Non-Patent Citations (3)
Title |
---|
刘奉妍 等: "柠檬酸钠对电解抛光金属钨的影响", 《功能材料》 * |
张圣弼: "《冶金物理化学实验》", 31 October 1994 * |
肖满斗 等: "WC-Co硬质合金的Co相结构", 《粉末冶金材料科学与工程》 * |
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Effective date of registration: 20230420 Address after: 101407 No. 11 Xingke East Street, Yanqi Economic Development Zone, Huairou District, Beijing Applicant after: GUOBIAO (BEIJING) TESTING & CERTIFICATION CO.,LTD. Address before: 101407 No. 11 Xingke East Street, Yanqi Economic Development Zone, Huairou District, Beijing Applicant before: GUOBIAO (BEIJING) TESTING & CERTIFICATION CO.,LTD. Applicant before: YOUYAN ENGINEERING TECHNOLOGY RESEARCH INSTITUTE Co.,Ltd. |
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Application publication date: 20210319 |