CN112492887B - 玻璃瓶的检查方法和玻璃瓶的制造方法 - Google Patents

玻璃瓶的检查方法和玻璃瓶的制造方法 Download PDF

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Publication number
CN112492887B
CN112492887B CN202080003078.2A CN202080003078A CN112492887B CN 112492887 B CN112492887 B CN 112492887B CN 202080003078 A CN202080003078 A CN 202080003078A CN 112492887 B CN112492887 B CN 112492887B
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glass bottle
image
pattern
preform
inspecting
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CN202080003078.2A
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Chinese (zh)
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CN112492887A (zh
Inventor
原田崇
铃木岳
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Toyo Glass Co Ltd
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Toyo Glass Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
CN202080003078.2A 2019-06-21 2020-03-13 玻璃瓶的检查方法和玻璃瓶的制造方法 Active CN112492887B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019-115236 2019-06-21
JP2019115236A JP7220128B2 (ja) 2019-06-21 2019-06-21 ガラスびんの検査方法及びガラスびんの製造方法
PCT/JP2020/011122 WO2020255498A1 (ja) 2019-06-21 2020-03-13 ガラスびんの検査方法及びガラスびんの製造方法

Publications (2)

Publication Number Publication Date
CN112492887A CN112492887A (zh) 2021-03-12
CN112492887B true CN112492887B (zh) 2024-07-02

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Country Link
JP (1) JP7220128B2 (ko)
KR (1) KR102540808B1 (ko)
CN (1) CN112492887B (ko)
PH (1) PH12020552062A1 (ko)
TW (1) TWI753384B (ko)
WO (1) WO2020255498A1 (ko)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4325206A1 (en) 2022-08-18 2024-02-21 F. Hoffmann-La Roche AG Method for compensating defective partitions of a microfluidic chip

Citations (4)

* Cited by examiner, † Cited by third party
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JP2004219399A (ja) * 2002-12-27 2004-08-05 Kirin Techno-System Corp 異物検査方法、及び異物検査装置並びに異物検査用の照明装置
JP2018095501A (ja) * 2016-12-12 2018-06-21 東洋ガラス株式会社 製びん機の金型制御システム
WO2018158824A1 (ja) * 2017-02-28 2018-09-07 東洋ガラス株式会社 容器の検査装置及び容器の検査方法
WO2018198248A1 (ja) * 2017-04-26 2018-11-01 東洋ガラス株式会社 容器の検査装置及び容器の検査方法

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JPS58216906A (ja) 1983-05-12 1983-12-16 Toyo Glass Kk びん方向自動検査方法
KR900007548B1 (ko) * 1985-10-04 1990-10-15 다이닛뽕스쿠링세이소오 가부시키가이샤 패턴 마스킹 방법 및 그 장치
DE68923653T2 (de) * 1988-05-30 1996-01-18 Kirin Techno Syst Yokohama Verfahren und Vorrichtung zur Prüfung der Seitenwände von Flaschen.
JP3283356B2 (ja) * 1993-09-22 2002-05-20 マツダ株式会社 表面検査方法
JPH07160887A (ja) * 1993-12-13 1995-06-23 Hewtec:Kk パターンマッチング検査方法とその装置
JPH09161056A (ja) * 1995-12-08 1997-06-20 Fuji Electric Co Ltd 円形容器内面検査方法
JP2002140695A (ja) 2000-11-01 2002-05-17 Omron Corp 検査方法およびその装置
JP3934359B2 (ja) 2001-04-23 2007-06-20 日立エンジニアリング株式会社 透明容器内充填液体中の異物検査装置
JP2005509855A (ja) * 2001-11-16 2005-04-14 ハイネケン・テクニカル・サービシズ・ベスローテン・フエンノートシャップ とりわけ容器を選択するための方法および装置
JP2004251662A (ja) 2003-02-18 2004-09-09 Shibuya Kogyo Co Ltd 物品検査方法と物品検査装置
JP2005114783A (ja) * 2003-10-03 2005-04-28 Sony Corp マスク欠陥検査装置およびマスク欠陥検査方法
JP4508838B2 (ja) 2004-11-11 2010-07-21 大日本印刷株式会社 容器の口部の検査装置
JP2008107311A (ja) * 2006-09-29 2008-05-08 Hitachi Chem Co Ltd 欠陥検査方法及び欠陥検査装置
JP2009250653A (ja) * 2008-04-02 2009-10-29 Nikon Corp 表面検査方法および装置
JP2010048745A (ja) * 2008-08-25 2010-03-04 Asahi Glass Co Ltd 欠陥検査システムおよび欠陥検査方法
JP2010060312A (ja) 2008-09-01 2010-03-18 Kirin Techno-System Co Ltd 異物検査装置及び異物検査システム
JP5726045B2 (ja) * 2011-11-07 2015-05-27 株式会社神戸製鋼所 タイヤ形状検査方法、及びタイヤ形状検査装置
JP2013134101A (ja) 2011-12-26 2013-07-08 Kirin Techno-System Co Ltd 異物検査装置
US9807316B2 (en) * 2014-09-04 2017-10-31 Htc Corporation Method for image segmentation
JP6585992B2 (ja) 2015-10-16 2019-10-02 株式会社キーエンス 画像検査装置
CN114813787A (zh) * 2017-02-06 2022-07-29 东洋玻璃株式会社 玻璃瓶的检查装置
CN206974915U (zh) * 2017-06-22 2018-02-06 山东明佳科技有限公司 一种玻璃容器视觉在线检测设备
CN207181324U (zh) * 2017-06-27 2018-04-03 建湖国创机械制造有限公司 一种透明玻璃瓶全方位智能检测装置
TWM578796U (zh) * 2019-01-31 2019-06-01 統一企業股份有限公司 Container defect detecting device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004219399A (ja) * 2002-12-27 2004-08-05 Kirin Techno-System Corp 異物検査方法、及び異物検査装置並びに異物検査用の照明装置
JP2018095501A (ja) * 2016-12-12 2018-06-21 東洋ガラス株式会社 製びん機の金型制御システム
WO2018158824A1 (ja) * 2017-02-28 2018-09-07 東洋ガラス株式会社 容器の検査装置及び容器の検査方法
WO2018198248A1 (ja) * 2017-04-26 2018-11-01 東洋ガラス株式会社 容器の検査装置及び容器の検査方法

Also Published As

Publication number Publication date
CN112492887A (zh) 2021-03-12
KR102540808B1 (ko) 2023-06-12
KR20210002528A (ko) 2021-01-08
TW202100988A (zh) 2021-01-01
JP7220128B2 (ja) 2023-02-09
JP2021001793A (ja) 2021-01-07
PH12020552062A1 (en) 2021-05-31
TWI753384B (zh) 2022-01-21
WO2020255498A1 (ja) 2020-12-24

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