CN1122279C - 用于半导体集成电路的输入缓冲电路 - Google Patents
用于半导体集成电路的输入缓冲电路 Download PDFInfo
- Publication number
- CN1122279C CN1122279C CN99100198A CN99100198A CN1122279C CN 1122279 C CN1122279 C CN 1122279C CN 99100198 A CN99100198 A CN 99100198A CN 99100198 A CN99100198 A CN 99100198A CN 1122279 C CN1122279 C CN 1122279C
- Authority
- CN
- China
- Prior art keywords
- circuit
- input
- enable signal
- signal
- differential amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318572—Input/Output interfaces
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Logic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
Claims (2)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP008044/1998 | 1998-01-19 | ||
JP10008044A JP2950313B2 (ja) | 1998-01-19 | 1998-01-19 | 半導体集積回路の入力バッファ回路 |
JP008044/98 | 1998-01-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1224219A CN1224219A (zh) | 1999-07-28 |
CN1122279C true CN1122279C (zh) | 2003-09-24 |
Family
ID=11682354
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN99100198A Expired - Fee Related CN1122279C (zh) | 1998-01-19 | 1999-01-19 | 用于半导体集成电路的输入缓冲电路 |
Country Status (4)
Country | Link |
---|---|
US (1) | US6091277A (zh) |
JP (1) | JP2950313B2 (zh) |
KR (1) | KR100295115B1 (zh) |
CN (1) | CN1122279C (zh) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4557342B2 (ja) * | 2000-01-13 | 2010-10-06 | 富士通セミコンダクター株式会社 | 半導体装置 |
US6300816B1 (en) * | 2000-10-24 | 2001-10-09 | Rosun Technologies, Inc. | Feedforward-controlled sense amplifier |
KR100532477B1 (ko) * | 2003-10-24 | 2005-12-01 | 삼성전자주식회사 | 입력 신호의 트랜지션 구간에서 안정적으로 동작하는 패스게이트 회로와 이를 구비하는 셀프 리프레쉬 회로 및 패스게이트 회로의 제어방법 |
JP2006118995A (ja) * | 2004-10-21 | 2006-05-11 | Oki Electric Ind Co Ltd | 半導体集積回路 |
JP4221426B2 (ja) | 2006-08-16 | 2009-02-12 | エルピーダメモリ株式会社 | 入出力回路 |
JP5322457B2 (ja) * | 2008-02-19 | 2013-10-23 | スパンション エルエルシー | 電圧比較装置、電子システム |
US8476917B2 (en) * | 2010-01-29 | 2013-07-02 | Freescale Semiconductor, Inc. | Quiescent current (IDDQ) indication and testing apparatus and methods |
US9111795B2 (en) | 2011-04-29 | 2015-08-18 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device with capacitor connected to memory element through oxide semiconductor film |
JP2013201526A (ja) | 2012-03-23 | 2013-10-03 | Elpida Memory Inc | 半導体装置および入力信号受信回路 |
US9841455B2 (en) * | 2015-05-20 | 2017-12-12 | Xilinx, Inc. | Transmitter configured for test signal injection to test AC-coupled interconnect |
CN105738789B (zh) * | 2016-02-23 | 2018-09-28 | 工业和信息化部电子第五研究所 | Mos管参数退化的失效预警电路 |
KR102536639B1 (ko) * | 2018-08-14 | 2023-05-26 | 에스케이하이닉스 주식회사 | 메모리 장치의 버퍼 제어 회로 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3207745B2 (ja) * | 1995-03-31 | 2001-09-10 | 東芝マイクロエレクトロニクス株式会社 | コンパレータ回路 |
US5828236A (en) * | 1997-02-20 | 1998-10-27 | Xilinx, Inc. | Selectable inverter circuit |
-
1998
- 1998-01-19 JP JP10008044A patent/JP2950313B2/ja not_active Expired - Fee Related
-
1999
- 1999-01-18 KR KR1019990001219A patent/KR100295115B1/ko not_active IP Right Cessation
- 1999-01-19 CN CN99100198A patent/CN1122279C/zh not_active Expired - Fee Related
- 1999-01-19 US US09/233,128 patent/US6091277A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR19990067951A (ko) | 1999-08-25 |
JPH11202029A (ja) | 1999-07-30 |
KR100295115B1 (ko) | 2001-07-12 |
US6091277A (en) | 2000-07-18 |
JP2950313B2 (ja) | 1999-09-20 |
CN1224219A (zh) | 1999-07-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C06 | Publication | ||
PB01 | Publication | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: NEC ELECTRONICS TAIWAN LTD. Free format text: FORMER OWNER: NIPPON ELECTRIC CO., LTD. Effective date: 20031015 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20031015 Address after: Kanagawa, Japan Patentee after: NEC Corp. Address before: Tokyo, Japan Patentee before: NEC Corp. |
|
C56 | Change in the name or address of the patentee |
Owner name: RENESAS ELECTRONICS CORPORATION Free format text: FORMER NAME: NEC CORP. |
|
CP01 | Change in the name or title of a patent holder |
Address after: Kanagawa, Japan Patentee after: Renesas Electronics Corporation Address before: Kanagawa, Japan Patentee before: NEC Corp. |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20030924 Termination date: 20140119 |