CN111051853B - 粒子检测系统以及粒子检测方法 - Google Patents

粒子检测系统以及粒子检测方法 Download PDF

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Publication number
CN111051853B
CN111051853B CN201880055079.4A CN201880055079A CN111051853B CN 111051853 B CN111051853 B CN 111051853B CN 201880055079 A CN201880055079 A CN 201880055079A CN 111051853 B CN111051853 B CN 111051853B
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China
Prior art keywords
particle detection
temperature
sensor
light
gas
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Chinese (zh)
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CN111051853A (zh
Inventor
安池则之
中川贵司
川人圭子
永谷吉祥
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Panasonic Intellectual Property Management Co Ltd
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Panasonic Intellectual Property Management Co Ltd
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    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F24—HEATING; RANGES; VENTILATING
    • F24F—AIR-CONDITIONING; AIR-HUMIDIFICATION; VENTILATION; USE OF AIR CURRENTS FOR SCREENING
    • F24F7/00—Ventilation
    • F24F7/007—Ventilation with forced flow
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
CN201880055079.4A 2017-08-29 2018-07-20 粒子检测系统以及粒子检测方法 Active CN111051853B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2017-164406 2017-08-29
JP2017164406 2017-08-29
PCT/JP2018/027222 WO2019044251A1 (ja) 2017-08-29 2018-07-20 粒子検出システム及び粒子検出方法

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CN111051853A CN111051853A (zh) 2020-04-21
CN111051853B true CN111051853B (zh) 2022-09-23

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JP (1) JP6861396B2 (ja)
CN (1) CN111051853B (ja)
WO (1) WO2019044251A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021039145A1 (ja) * 2019-08-29 2021-03-04 パナソニックＩｐマネジメント株式会社 空気質情報処理システム、及び、空気質情報処理方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04259845A (ja) * 1991-02-15 1992-09-16 Matsushita Electric Works Ltd 浮遊微粒子検出装置
CN1912482A (zh) * 2005-08-12 2007-02-14 三星电子株式会社 通风系统和用于驱动该通风系统的方法
CN101040567A (zh) * 2004-05-14 2007-09-19 目标系统电子有限责任公司 稳定led的光辐射的温度相关性的方法
CN102918380A (zh) * 2010-09-24 2013-02-06 株式会社堀场制作所 排气分析系统和排气分析程序
CN203929618U (zh) * 2012-07-05 2014-11-05 深圳市赛纳威环境科技有限公司 一种pm2.5浓度检测系统
CN105181544A (zh) * 2015-09-21 2015-12-23 劲天环境科技（上海）有限公司 一种空气中颗粒物浓度的检测装置及检测方法
CN106226209A (zh) * 2016-07-27 2016-12-14 广东美的制冷设备有限公司 一种室内空气尘埃粒子浓度检测方法、系统和家用电器

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3532274B2 (ja) * 1994-11-30 2004-05-31 ミドリ安全株式会社 粒子検出装置
US9429509B2 (en) * 2002-01-28 2016-08-30 Sysmex Corporation Particle analyzer and particle analysis method
JP5141419B2 (ja) * 2008-07-24 2013-02-13 いすゞ自動車株式会社 すす濃度測定装置
JP2016080431A (ja) * 2014-10-14 2016-05-16 住友電気工業株式会社 光プローブ、測定装置及び測定方法
EP3214429B1 (en) * 2014-10-31 2021-03-03 Panasonic Intellectual Property Management Co., Ltd. Particle detection sensor
JP2016156696A (ja) * 2015-02-24 2016-09-01 アズビル株式会社 粒子検出装置
JP6515683B2 (ja) * 2015-05-29 2019-05-22 富士通株式会社 測定装置および測定システム
JP6441195B2 (ja) * 2015-09-14 2018-12-19 東芝メモリ株式会社 粒子検知装置
JP6620983B2 (ja) * 2015-12-28 2019-12-18 パナソニックＩｐマネジメント株式会社 粒子検出センサ
JP6880756B2 (ja) * 2017-01-13 2021-06-02 富士通株式会社 測定装置および測定方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04259845A (ja) * 1991-02-15 1992-09-16 Matsushita Electric Works Ltd 浮遊微粒子検出装置
CN101040567A (zh) * 2004-05-14 2007-09-19 目标系统电子有限责任公司 稳定led的光辐射的温度相关性的方法
CN1912482A (zh) * 2005-08-12 2007-02-14 三星电子株式会社 通风系统和用于驱动该通风系统的方法
CN102918380A (zh) * 2010-09-24 2013-02-06 株式会社堀场制作所 排气分析系统和排气分析程序
CN203929618U (zh) * 2012-07-05 2014-11-05 深圳市赛纳威环境科技有限公司 一种pm2.5浓度检测系统
CN105181544A (zh) * 2015-09-21 2015-12-23 劲天环境科技（上海）有限公司 一种空气中颗粒物浓度的检测装置及检测方法
CN106226209A (zh) * 2016-07-27 2016-12-14 广东美的制冷设备有限公司 一种室内空气尘埃粒子浓度检测方法、系统和家用电器

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CN111051853A (zh) 2020-04-21
JP6861396B2 (ja) 2021-04-21
JPWO2019044251A1 (ja) 2020-02-27

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