CN109963820B - 玻璃基板的制造装置及制造方法 - Google Patents
玻璃基板的制造装置及制造方法 Download PDFInfo
- Publication number
- CN109963820B CN109963820B CN201780070959.4A CN201780070959A CN109963820B CN 109963820 B CN109963820 B CN 109963820B CN 201780070959 A CN201780070959 A CN 201780070959A CN 109963820 B CN109963820 B CN 109963820B
- Authority
- CN
- China
- Prior art keywords
- glass substrate
- surface treatment
- main surface
- opening portion
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- 239000011521 glass Substances 0.000 title claims abstract description 141
- 239000000758 substrate Substances 0.000 title claims abstract description 105
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 59
- 238000004381 surface treatment Methods 0.000 claims abstract description 79
- 238000000034 method Methods 0.000 claims abstract description 70
- 238000004891 communication Methods 0.000 claims description 18
- 238000007789 sealing Methods 0.000 claims description 4
- 239000007789 gas Substances 0.000 description 104
- 239000005357 flat glass Substances 0.000 description 19
- 238000012545 processing Methods 0.000 description 11
- 230000003746 surface roughness Effects 0.000 description 7
- 238000003780 insertion Methods 0.000 description 6
- 230000037431 insertion Effects 0.000 description 6
- 238000011144 upstream manufacturing Methods 0.000 description 5
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 3
- 238000002438 flame photometric detection Methods 0.000 description 3
- 229910000040 hydrogen fluoride Inorganic materials 0.000 description 3
- 238000007788 roughening Methods 0.000 description 3
- 239000012159 carrier gas Substances 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 238000003280 down draw process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 238000006124 Pilkington process Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000007600 charging Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007786 electrostatic charging Methods 0.000 description 1
- 230000002401 inhibitory effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000007500 overflow downdraw method Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 239000013585 weight reducing agent Substances 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C15/00—Surface treatment of glass, not in the form of fibres or filaments, by etching
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/063—Transporting devices for sheet glass
- B65G49/064—Transporting devices for sheet glass in a horizontal position
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31105—Etching inorganic layers
- H01L21/31111—Etching inorganic layers by chemical means
- H01L21/31116—Etching inorganic layers by chemical means by dry-etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2201/00—Indexing codes relating to handling devices, e.g. conveyors, characterised by the type of product or load being conveyed or handled
- B65G2201/02—Articles
- B65G2201/0214—Articles of special size, shape or weigh
- B65G2201/022—Flat
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Geochemistry & Mineralogy (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Inorganic Chemistry (AREA)
- Surface Treatment Of Glass (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016-223248 | 2016-11-16 | ||
JP2016223248A JP6665760B2 (ja) | 2016-11-16 | 2016-11-16 | ガラス基板の製造装置及び製造方法 |
PCT/JP2017/037958 WO2018092506A1 (ja) | 2016-11-16 | 2017-10-20 | ガラス基板の製造装置及び製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN109963820A CN109963820A (zh) | 2019-07-02 |
CN109963820B true CN109963820B (zh) | 2021-12-31 |
Family
ID=62146441
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201780070959.4A Active CN109963820B (zh) | 2016-11-16 | 2017-10-20 | 玻璃基板的制造装置及制造方法 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6665760B2 (ko) |
KR (1) | KR102312556B1 (ko) |
CN (1) | CN109963820B (ko) |
TW (1) | TWI722251B (ko) |
WO (1) | WO2018092506A1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3998284A4 (en) | 2019-07-11 | 2023-08-02 | Good T Cells, Inc. | COMPOSITION FOR PREVENTING, IMPROVING OR TREATMENT OF IMMUNECHECKPOINT INHIBITOR RESISTANT CANCER |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1577762A (zh) * | 2003-07-28 | 2005-02-09 | 禧沛股份有限公司 | 基板支持装置及基板取出方法 |
CN1638033A (zh) * | 2004-01-08 | 2005-07-13 | 大日本网目版制造株式会社 | 基板处理装置 |
CN101159228A (zh) * | 2006-10-02 | 2008-04-09 | 东京毅力科创株式会社 | 处理气体供给机构、供给方法及气体处理装置 |
US20100212832A1 (en) * | 2005-12-28 | 2010-08-26 | Sharp Kabushiki Kaisha | Stage device and plasma treatment apparatus |
CN102473627A (zh) * | 2009-07-23 | 2012-05-23 | 夏普株式会社 | 湿蚀刻装置和湿蚀刻方法 |
JP2013157418A (ja) * | 2012-01-30 | 2013-08-15 | Sumitomo Precision Prod Co Ltd | エッチング装置 |
WO2014123089A1 (ja) * | 2013-02-07 | 2014-08-14 | 旭硝子株式会社 | ガラス製造方法 |
CN104882395A (zh) * | 2014-02-27 | 2015-09-02 | 圆益Ips股份有限公司 | 基板处理装置及基板处理方法 |
WO2015159927A1 (ja) * | 2014-04-16 | 2015-10-22 | 旭硝子株式会社 | エッチング装置、エッチング方法、基板の製造方法、および基板 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4045592B2 (ja) * | 2002-08-22 | 2008-02-13 | 三菱マテリアル株式会社 | プラズマエッチング用シリコン電極板 |
JP4381160B2 (ja) * | 2003-07-16 | 2009-12-09 | 積水化学工業株式会社 | 表面処理装置 |
JP5444599B2 (ja) * | 2007-09-28 | 2014-03-19 | 東京エレクトロン株式会社 | ガス供給装置及び成膜装置 |
JP5874393B2 (ja) * | 2011-12-28 | 2016-03-02 | 日本電気硝子株式会社 | ガラス板加工装置およびその加工方法 |
JP2014080331A (ja) | 2012-10-17 | 2014-05-08 | Asahi Glass Co Ltd | 反射防止性ガラスの製造方法 |
JP6048817B2 (ja) * | 2012-12-27 | 2016-12-21 | 日本電気硝子株式会社 | 板状ガラスの表面処理装置及び表面処理方法 |
JP2016064926A (ja) * | 2013-02-07 | 2016-04-28 | 旭硝子株式会社 | ガラス製造方法 |
JP6360064B2 (ja) * | 2013-09-30 | 2018-07-18 | 日本板硝子株式会社 | ガラス板の製造方法 |
KR101413626B1 (ko) * | 2013-12-31 | 2014-08-06 | 김호권 | 화학강화를 이용한 강화유리 제조장치 및 제조방법 |
EP3100986B1 (en) * | 2014-01-31 | 2018-12-05 | Nippon Sheet Glass Company, Limited | Process for producing glass plate and uses of glass plate |
-
2016
- 2016-11-16 JP JP2016223248A patent/JP6665760B2/ja active Active
-
2017
- 2017-10-20 WO PCT/JP2017/037958 patent/WO2018092506A1/ja active Application Filing
- 2017-10-20 KR KR1020197016656A patent/KR102312556B1/ko active IP Right Grant
- 2017-10-20 CN CN201780070959.4A patent/CN109963820B/zh active Active
- 2017-10-31 TW TW106137517A patent/TWI722251B/zh active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1577762A (zh) * | 2003-07-28 | 2005-02-09 | 禧沛股份有限公司 | 基板支持装置及基板取出方法 |
CN1638033A (zh) * | 2004-01-08 | 2005-07-13 | 大日本网目版制造株式会社 | 基板处理装置 |
US20100212832A1 (en) * | 2005-12-28 | 2010-08-26 | Sharp Kabushiki Kaisha | Stage device and plasma treatment apparatus |
CN101159228A (zh) * | 2006-10-02 | 2008-04-09 | 东京毅力科创株式会社 | 处理气体供给机构、供给方法及气体处理装置 |
CN102473627A (zh) * | 2009-07-23 | 2012-05-23 | 夏普株式会社 | 湿蚀刻装置和湿蚀刻方法 |
JP2013157418A (ja) * | 2012-01-30 | 2013-08-15 | Sumitomo Precision Prod Co Ltd | エッチング装置 |
WO2014123089A1 (ja) * | 2013-02-07 | 2014-08-14 | 旭硝子株式会社 | ガラス製造方法 |
CN104882395A (zh) * | 2014-02-27 | 2015-09-02 | 圆益Ips股份有限公司 | 基板处理装置及基板处理方法 |
WO2015159927A1 (ja) * | 2014-04-16 | 2015-10-22 | 旭硝子株式会社 | エッチング装置、エッチング方法、基板の製造方法、および基板 |
Also Published As
Publication number | Publication date |
---|---|
WO2018092506A1 (ja) | 2018-05-24 |
KR20190084098A (ko) | 2019-07-15 |
TWI722251B (zh) | 2021-03-21 |
CN109963820A (zh) | 2019-07-02 |
JP6665760B2 (ja) | 2020-03-13 |
JP2018080079A (ja) | 2018-05-24 |
KR102312556B1 (ko) | 2021-10-14 |
TW201829339A (zh) | 2018-08-16 |
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