CN109690266B - 用于表征光源的方法和设备 - Google Patents

用于表征光源的方法和设备 Download PDF

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Publication number
CN109690266B
CN109690266B CN201780055643.8A CN201780055643A CN109690266B CN 109690266 B CN109690266 B CN 109690266B CN 201780055643 A CN201780055643 A CN 201780055643A CN 109690266 B CN109690266 B CN 109690266B
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China
Prior art keywords
radiation
light source
data item
wavelength
fabry
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Expired - Fee Related
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CN201780055643.8A
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English (en)
Chinese (zh)
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CN109690266A (zh
Inventor
约翰·乔治斯奥尔努瓦
本杰明·希曼斯基
伯特兰·哈迪-巴兰斯基
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Blue Industry and Science SAS
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Blue Industry and Science SAS
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0246—Measuring optical wavelength
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0257—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods multiple, e.g. Fabry Perot interferometer

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Character Input (AREA)
CN201780055643.8A 2016-07-12 2017-07-06 用于表征光源的方法和设备 Expired - Fee Related CN109690266B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1656663 2016-07-12
FR1656663A FR3054034B1 (fr) 2016-07-12 2016-07-12 Procede et dispositif de caracterisation d'une source optique
PCT/EP2017/067017 WO2018011063A1 (fr) 2016-07-12 2017-07-06 Procédé et dispositif de caractérisation d'une source optique

Publications (2)

Publication Number Publication Date
CN109690266A CN109690266A (zh) 2019-04-26
CN109690266B true CN109690266B (zh) 2021-12-07

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ID=57860930

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CN201780055643.8A Expired - Fee Related CN109690266B (zh) 2016-07-12 2017-07-06 用于表征光源的方法和设备

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US (1) US10768051B2 (https=)
EP (1) EP3485248B1 (https=)
JP (1) JP7114582B2 (https=)
CN (1) CN109690266B (https=)
FR (1) FR3054034B1 (https=)
WO (1) WO2018011063A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10845251B2 (en) * 2018-06-28 2020-11-24 Zygo Corporation Wavemeter using pairs of interferometric optical cavities

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6498800B1 (en) * 1999-08-10 2002-12-24 Coretek, Inc. Double etalon optical wavelength reference device
CN101490518A (zh) * 2006-07-07 2009-07-22 Tir科技公司 用于表征光源的设备和方法
CN102159926A (zh) * 2008-07-25 2011-08-17 国立科学研究中心 具有频率梳和同步方案的干涉仪
CN103067092A (zh) * 2012-12-28 2013-04-24 华为技术有限公司 多波长光源装置

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Publication number Priority date Publication date Assignee Title
US4864578A (en) * 1983-04-12 1989-09-05 Coherent, Inc. Scannable laser with integral wavemeter
JPS6422087A (en) * 1987-07-17 1989-01-25 Komatsu Mfg Co Ltd Control equipment for laser wavelength
US6088142A (en) * 1997-03-13 2000-07-11 Oplink Communications, Inc. System and method for precision wavelength monitoring
JP4197816B2 (ja) 1999-12-07 2008-12-17 株式会社小松製作所 波長検出装置
US20030035120A1 (en) * 2001-08-14 2003-02-20 Myatt Christopher J. Multiple-interferometer device for wavelength measuring and locking
JP2003315160A (ja) 2002-04-23 2003-11-06 Sun Tec Kk 偏波無依存型波長モニタ
GB2399875B (en) * 2003-03-24 2006-02-22 Tsunami Photonics Ltd Optical wavelength meter
JP4916647B2 (ja) 2003-05-23 2012-04-18 サムスン エレクトロニクス カンパニー リミテッド 外部共振器半導体レーザーおよびその製造方法
GB0405553D0 (en) 2004-03-12 2004-04-21 Xyz Imaging Inc A laser
JP4893026B2 (ja) 2005-03-03 2012-03-07 日本電気株式会社 波長可変共振器及びこれを用いた波長可変光源並びに多重共振器の波長可変方法
US7982944B2 (en) * 2007-05-04 2011-07-19 Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. Method and apparatus for optical frequency comb generation using a monolithic micro-resonator
EP2817613A4 (en) 2012-02-21 2016-08-03 Massachusetts Inst Technology SPECTROMETER DEVICE
US11415700B2 (en) * 2016-02-26 2022-08-16 Michigan Aerospace Corporation Multi-element Fabry-Perot etalon interferometer for direct detection lidar

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6498800B1 (en) * 1999-08-10 2002-12-24 Coretek, Inc. Double etalon optical wavelength reference device
CN101490518A (zh) * 2006-07-07 2009-07-22 Tir科技公司 用于表征光源的设备和方法
CN102159926A (zh) * 2008-07-25 2011-08-17 国立科学研究中心 具有频率梳和同步方案的干涉仪
CN103067092A (zh) * 2012-12-28 2013-04-24 华为技术有限公司 多波长光源装置

Also Published As

Publication number Publication date
CN109690266A (zh) 2019-04-26
JP7114582B2 (ja) 2022-08-08
JP2019526058A (ja) 2019-09-12
US20190293491A1 (en) 2019-09-26
FR3054034A1 (fr) 2018-01-19
EP3485248B1 (fr) 2023-01-18
WO2018011063A1 (fr) 2018-01-18
US10768051B2 (en) 2020-09-08
FR3054034B1 (fr) 2020-06-12
EP3485248A1 (fr) 2019-05-22

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Granted publication date: 20211207