JP7114582B2 - 光源を特徴付ける工程および装置 - Google Patents

光源を特徴付ける工程および装置 Download PDF

Info

Publication number
JP7114582B2
JP7114582B2 JP2019523171A JP2019523171A JP7114582B2 JP 7114582 B2 JP7114582 B2 JP 7114582B2 JP 2019523171 A JP2019523171 A JP 2019523171A JP 2019523171 A JP2019523171 A JP 2019523171A JP 7114582 B2 JP7114582 B2 JP 7114582B2
Authority
JP
Japan
Prior art keywords
radiation
light source
wavelength
data item
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2019523171A
Other languages
English (en)
Japanese (ja)
Other versions
JP2019526058A5 (https=
JP2019526058A (ja
Inventor
デ オルノワ，ジョアン ジョルジュ
シマンスキー，バンジャマン
ハーディ＝バランスキー，ベルトラン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Blue Industry and Science SAS
Original Assignee
Blue Industry and Science SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Blue Industry and Science SAS filed Critical Blue Industry and Science SAS
Publication of JP2019526058A publication Critical patent/JP2019526058A/ja
Publication of JP2019526058A5 publication Critical patent/JP2019526058A5/ja
Application granted granted Critical
Publication of JP7114582B2 publication Critical patent/JP7114582B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0246—Measuring optical wavelength
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0257—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods multiple, e.g. Fabry Perot interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Character Input (AREA)
JP2019523171A 2016-07-12 2017-07-06 光源を特徴付ける工程および装置 Expired - Fee Related JP7114582B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1656663 2016-07-12
FR1656663A FR3054034B1 (fr) 2016-07-12 2016-07-12 Procede et dispositif de caracterisation d'une source optique
PCT/EP2017/067017 WO2018011063A1 (fr) 2016-07-12 2017-07-06 Procédé et dispositif de caractérisation d'une source optique

Publications (3)

Publication Number Publication Date
JP2019526058A JP2019526058A (ja) 2019-09-12
JP2019526058A5 JP2019526058A5 (https=) 2020-07-02
JP7114582B2 true JP7114582B2 (ja) 2022-08-08

Family

ID=57860930

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019523171A Expired - Fee Related JP7114582B2 (ja) 2016-07-12 2017-07-06 光源を特徴付ける工程および装置

Country Status (6)

Country Link
US (1) US10768051B2 (https=)
EP (1) EP3485248B1 (https=)
JP (1) JP7114582B2 (https=)
CN (1) CN109690266B (https=)
FR (1) FR3054034B1 (https=)
WO (1) WO2018011063A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10845251B2 (en) * 2018-06-28 2020-11-24 Zygo Corporation Wavemeter using pairs of interferometric optical cavities

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001168421A (ja) 1999-12-07 2001-06-22 Komatsu Ltd 波長検出装置
JP2003315160A (ja) 2002-04-23 2003-11-06 Sun Tec Kk 偏波無依存型波長モニタ
JP2004348136A (ja) 2003-05-23 2004-12-09 Rohm & Haas Electronic Materials Llc 外部共振器半導体レーザーおよびその製造方法
US20050201426A1 (en) 2004-03-12 2005-09-15 Cotteverte Jean-Charles J.C. Laser
JP2006279030A (ja) 2005-03-03 2006-10-12 Nec Corp 波長可変共振器及びこれを用いた波長可変光源並びに多重共振器の波長可変方法
JP2015518134A (ja) 2012-02-21 2015-06-25 マサチューセッツ インスティテュート オブ テクノロジー 分光器装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4864578A (en) * 1983-04-12 1989-09-05 Coherent, Inc. Scannable laser with integral wavemeter
JPS6422087A (en) * 1987-07-17 1989-01-25 Komatsu Mfg Co Ltd Control equipment for laser wavelength
US6088142A (en) * 1997-03-13 2000-07-11 Oplink Communications, Inc. System and method for precision wavelength monitoring
WO2001011738A1 (en) * 1999-08-10 2001-02-15 Coretek, Inc. Double etalon optical wavelength reference device
US20030035120A1 (en) * 2001-08-14 2003-02-20 Myatt Christopher J. Multiple-interferometer device for wavelength measuring and locking
GB2399875B (en) * 2003-03-24 2006-02-22 Tsunami Photonics Ltd Optical wavelength meter
BRPI0714032A2 (pt) * 2006-07-07 2012-12-18 Tir Technology Lp aparelho e método para determinar propriedades da luz emitida por uma fonte de luz
US7982944B2 (en) * 2007-05-04 2011-07-19 Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. Method and apparatus for optical frequency comb generation using a monolithic micro-resonator
EP2310816A1 (en) * 2008-07-25 2011-04-20 Centre National de la Recherche Scientifique - CNRS - Fourier transform spectrometer with a frequency comb light source
CN103067092A (zh) * 2012-12-28 2013-04-24 华为技术有限公司 多波长光源装置
US11415700B2 (en) * 2016-02-26 2022-08-16 Michigan Aerospace Corporation Multi-element Fabry-Perot etalon interferometer for direct detection lidar

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001168421A (ja) 1999-12-07 2001-06-22 Komatsu Ltd 波長検出装置
JP2003315160A (ja) 2002-04-23 2003-11-06 Sun Tec Kk 偏波無依存型波長モニタ
JP2004348136A (ja) 2003-05-23 2004-12-09 Rohm & Haas Electronic Materials Llc 外部共振器半導体レーザーおよびその製造方法
US20050201426A1 (en) 2004-03-12 2005-09-15 Cotteverte Jean-Charles J.C. Laser
JP2006279030A (ja) 2005-03-03 2006-10-12 Nec Corp 波長可変共振器及びこれを用いた波長可変光源並びに多重共振器の波長可変方法
JP2015518134A (ja) 2012-02-21 2015-06-25 マサチューセッツ インスティテュート オブ テクノロジー 分光器装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
HONDA C , et al.，Transient local magnetic field measurement in a bumpy torus by rapid-frequency-scan laser spectroscopy，Review of Scientific Instruments，1987年09月，Vol.58, No.9，pp.1593-1596，https://doi.org/10.1063/1.1139406

Also Published As

Publication number Publication date
CN109690266A (zh) 2019-04-26
JP2019526058A (ja) 2019-09-12
CN109690266B (zh) 2021-12-07
US20190293491A1 (en) 2019-09-26
FR3054034A1 (fr) 2018-01-19
EP3485248B1 (fr) 2023-01-18
WO2018011063A1 (fr) 2018-01-18
US10768051B2 (en) 2020-09-08
FR3054034B1 (fr) 2020-06-12
EP3485248A1 (fr) 2019-05-22

Similar Documents

Publication Publication Date Title
CN108700401B (zh) 用干涉频谱法测量腔体
EP3376169B1 (en) Temperature or strain distribution sensor
US7292345B2 (en) Fibre-optic interferometric remote sensor
CN103196584B (zh) 测量光纤中温度和应力的方法、以及布里渊光时域反射仪
JP5511163B2 (ja) 光波干渉による距離測定方法及び装置
EP2904347B1 (en) Position monitoring system with reduced noise
US9441947B2 (en) N-wavelength interrogation system and method for multiple wavelength interferometers
US9696211B2 (en) Time-multiplexed spectrally controlled interferometry
JP7114582B2 (ja) 光源を特徴付ける工程および装置
US9581428B2 (en) Time-multiplexed spectrally controlled interferometry
JP7256631B2 (ja) 距離測定装置
JP7679945B2 (ja) レイリー強度パターン計測装置およびレイリー強度パターン計測方法
TWI524062B (zh) 用於測量折射指數之方法和裝置及用於製造光學元件之方法
CN116793239A (zh) 基于相位解调的光纤应变确定方法、装置和电子设备
JP3711723B2 (ja) 半導体厚測定装置
JPH0634446A (ja) 固定検光子を用いた偏波分散測定方法及び装置
JP2019526058A5 (https=)
JPH09311018A (ja) 半導体厚測定装置及びその測定方法
JP7351365B1 (ja) 光ファイバセンサ及びブリルアン周波数シフト測定方法
EP3338052B1 (en) Time-multiplexed spectrally controlled interferometry
RU149559U1 (ru) Измеритель длины волны монохроматического излучения
WO2010119561A1 (ja) レーザ測距方法及びレーザ測距装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20200522

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20200522

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20210519

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20210525

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20210812

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20211119

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20220315

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20220613

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20220705

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20220727

R150 Certificate of patent or registration of utility model

Ref document number: 7114582

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

LAPS Cancellation because of no payment of annual fees