JP2019526058A5 - - Google Patents

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Publication number
JP2019526058A5
JP2019526058A5 JP2019523171A JP2019523171A JP2019526058A5 JP 2019526058 A5 JP2019526058 A5 JP 2019526058A5 JP 2019523171 A JP2019523171 A JP 2019523171A JP 2019523171 A JP2019523171 A JP 2019523171A JP 2019526058 A5 JP2019526058 A5 JP 2019526058A5
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JP
Japan
Prior art keywords
radiation
light source
data item
wavelength
sensor
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JP2019523171A
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English (en)
Japanese (ja)
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JP7114582B2 (ja
JP2019526058A (ja
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Priority claimed from FR1656663A external-priority patent/FR3054034B1/fr
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Publication of JP2019526058A publication Critical patent/JP2019526058A/ja
Publication of JP2019526058A5 publication Critical patent/JP2019526058A5/ja
Application granted granted Critical
Publication of JP7114582B2 publication Critical patent/JP7114582B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2019523171A 2016-07-12 2017-07-06 光源を特徴付ける工程および装置 Expired - Fee Related JP7114582B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1656663 2016-07-12
FR1656663A FR3054034B1 (fr) 2016-07-12 2016-07-12 Procede et dispositif de caracterisation d'une source optique
PCT/EP2017/067017 WO2018011063A1 (fr) 2016-07-12 2017-07-06 Procédé et dispositif de caractérisation d'une source optique

Publications (3)

Publication Number Publication Date
JP2019526058A JP2019526058A (ja) 2019-09-12
JP2019526058A5 true JP2019526058A5 (https=) 2020-07-02
JP7114582B2 JP7114582B2 (ja) 2022-08-08

Family

ID=57860930

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019523171A Expired - Fee Related JP7114582B2 (ja) 2016-07-12 2017-07-06 光源を特徴付ける工程および装置

Country Status (6)

Country Link
US (1) US10768051B2 (https=)
EP (1) EP3485248B1 (https=)
JP (1) JP7114582B2 (https=)
CN (1) CN109690266B (https=)
FR (1) FR3054034B1 (https=)
WO (1) WO2018011063A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10845251B2 (en) * 2018-06-28 2020-11-24 Zygo Corporation Wavemeter using pairs of interferometric optical cavities

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4864578A (en) * 1983-04-12 1989-09-05 Coherent, Inc. Scannable laser with integral wavemeter
JPS6422087A (en) * 1987-07-17 1989-01-25 Komatsu Mfg Co Ltd Control equipment for laser wavelength
US6088142A (en) * 1997-03-13 2000-07-11 Oplink Communications, Inc. System and method for precision wavelength monitoring
WO2001011738A1 (en) * 1999-08-10 2001-02-15 Coretek, Inc. Double etalon optical wavelength reference device
JP4197816B2 (ja) 1999-12-07 2008-12-17 株式会社小松製作所 波長検出装置
US20030035120A1 (en) * 2001-08-14 2003-02-20 Myatt Christopher J. Multiple-interferometer device for wavelength measuring and locking
JP2003315160A (ja) 2002-04-23 2003-11-06 Sun Tec Kk 偏波無依存型波長モニタ
GB2399875B (en) * 2003-03-24 2006-02-22 Tsunami Photonics Ltd Optical wavelength meter
JP4916647B2 (ja) 2003-05-23 2012-04-18 サムスン エレクトロニクス カンパニー リミテッド 外部共振器半導体レーザーおよびその製造方法
GB0405553D0 (en) 2004-03-12 2004-04-21 Xyz Imaging Inc A laser
JP4893026B2 (ja) 2005-03-03 2012-03-07 日本電気株式会社 波長可変共振器及びこれを用いた波長可変光源並びに多重共振器の波長可変方法
BRPI0714032A2 (pt) * 2006-07-07 2012-12-18 Tir Technology Lp aparelho e método para determinar propriedades da luz emitida por uma fonte de luz
US7982944B2 (en) * 2007-05-04 2011-07-19 Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. Method and apparatus for optical frequency comb generation using a monolithic micro-resonator
EP2310816A1 (en) * 2008-07-25 2011-04-20 Centre National de la Recherche Scientifique - CNRS - Fourier transform spectrometer with a frequency comb light source
EP2817613A4 (en) 2012-02-21 2016-08-03 Massachusetts Inst Technology SPECTROMETER DEVICE
CN103067092A (zh) * 2012-12-28 2013-04-24 华为技术有限公司 多波长光源装置
US11415700B2 (en) * 2016-02-26 2022-08-16 Michigan Aerospace Corporation Multi-element Fabry-Perot etalon interferometer for direct detection lidar

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