FR3054034B1 - Procede et dispositif de caracterisation d'une source optique - Google Patents

Procede et dispositif de caracterisation d'une source optique Download PDF

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Publication number
FR3054034B1
FR3054034B1 FR1656663A FR1656663A FR3054034B1 FR 3054034 B1 FR3054034 B1 FR 3054034B1 FR 1656663 A FR1656663 A FR 1656663A FR 1656663 A FR1656663 A FR 1656663A FR 3054034 B1 FR3054034 B1 FR 3054034B1
Authority
FR
France
Prior art keywords
datum
source
radiation
characterizing
optical source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1656663A
Other languages
English (en)
French (fr)
Other versions
FR3054034A1 (fr
Inventor
Johann Georges Des Aulnois
Benjamin Szymanski
Bertrand HARDY-BARANSKI
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Blue Industry and Science SAS
Original Assignee
Blue Industry and Science SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Blue Industry and Science SAS filed Critical Blue Industry and Science SAS
Priority to FR1656663A priority Critical patent/FR3054034B1/fr
Priority to US16/316,409 priority patent/US10768051B2/en
Priority to JP2019523171A priority patent/JP7114582B2/ja
Priority to CN201780055643.8A priority patent/CN109690266B/zh
Priority to EP17740684.0A priority patent/EP3485248B1/fr
Priority to PCT/EP2017/067017 priority patent/WO2018011063A1/fr
Publication of FR3054034A1 publication Critical patent/FR3054034A1/fr
Application granted granted Critical
Publication of FR3054034B1 publication Critical patent/FR3054034B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0246—Measuring optical wavelength
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0257—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods multiple, e.g. Fabry Perot interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Character Input (AREA)
FR1656663A 2016-07-12 2016-07-12 Procede et dispositif de caracterisation d'une source optique Expired - Fee Related FR3054034B1 (fr)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FR1656663A FR3054034B1 (fr) 2016-07-12 2016-07-12 Procede et dispositif de caracterisation d'une source optique
US16/316,409 US10768051B2 (en) 2016-07-12 2017-07-06 Process and device including a fixed cavity with a free spectral range for characterizing an optical source
JP2019523171A JP7114582B2 (ja) 2016-07-12 2017-07-06 光源を特徴付ける工程および装置
CN201780055643.8A CN109690266B (zh) 2016-07-12 2017-07-06 用于表征光源的方法和设备
EP17740684.0A EP3485248B1 (fr) 2016-07-12 2017-07-06 Procédé et dispositif de caractérisation d'une source optique
PCT/EP2017/067017 WO2018011063A1 (fr) 2016-07-12 2017-07-06 Procédé et dispositif de caractérisation d'une source optique

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1656663 2016-07-12
FR1656663A FR3054034B1 (fr) 2016-07-12 2016-07-12 Procede et dispositif de caracterisation d'une source optique

Publications (2)

Publication Number Publication Date
FR3054034A1 FR3054034A1 (fr) 2018-01-19
FR3054034B1 true FR3054034B1 (fr) 2020-06-12

Family

ID=57860930

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1656663A Expired - Fee Related FR3054034B1 (fr) 2016-07-12 2016-07-12 Procede et dispositif de caracterisation d'une source optique

Country Status (6)

Country Link
US (1) US10768051B2 (https=)
EP (1) EP3485248B1 (https=)
JP (1) JP7114582B2 (https=)
CN (1) CN109690266B (https=)
FR (1) FR3054034B1 (https=)
WO (1) WO2018011063A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10845251B2 (en) * 2018-06-28 2020-11-24 Zygo Corporation Wavemeter using pairs of interferometric optical cavities

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4864578A (en) * 1983-04-12 1989-09-05 Coherent, Inc. Scannable laser with integral wavemeter
JPS6422087A (en) * 1987-07-17 1989-01-25 Komatsu Mfg Co Ltd Control equipment for laser wavelength
US6088142A (en) * 1997-03-13 2000-07-11 Oplink Communications, Inc. System and method for precision wavelength monitoring
WO2001011738A1 (en) * 1999-08-10 2001-02-15 Coretek, Inc. Double etalon optical wavelength reference device
JP4197816B2 (ja) 1999-12-07 2008-12-17 株式会社小松製作所 波長検出装置
US20030035120A1 (en) * 2001-08-14 2003-02-20 Myatt Christopher J. Multiple-interferometer device for wavelength measuring and locking
JP2003315160A (ja) 2002-04-23 2003-11-06 Sun Tec Kk 偏波無依存型波長モニタ
GB2399875B (en) * 2003-03-24 2006-02-22 Tsunami Photonics Ltd Optical wavelength meter
JP4916647B2 (ja) 2003-05-23 2012-04-18 サムスン エレクトロニクス カンパニー リミテッド 外部共振器半導体レーザーおよびその製造方法
GB0405553D0 (en) 2004-03-12 2004-04-21 Xyz Imaging Inc A laser
JP4893026B2 (ja) 2005-03-03 2012-03-07 日本電気株式会社 波長可変共振器及びこれを用いた波長可変光源並びに多重共振器の波長可変方法
BRPI0714032A2 (pt) * 2006-07-07 2012-12-18 Tir Technology Lp aparelho e método para determinar propriedades da luz emitida por uma fonte de luz
US7982944B2 (en) * 2007-05-04 2011-07-19 Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. Method and apparatus for optical frequency comb generation using a monolithic micro-resonator
EP2310816A1 (en) * 2008-07-25 2011-04-20 Centre National de la Recherche Scientifique - CNRS - Fourier transform spectrometer with a frequency comb light source
EP2817613A4 (en) 2012-02-21 2016-08-03 Massachusetts Inst Technology SPECTROMETER DEVICE
CN103067092A (zh) * 2012-12-28 2013-04-24 华为技术有限公司 多波长光源装置
US11415700B2 (en) * 2016-02-26 2022-08-16 Michigan Aerospace Corporation Multi-element Fabry-Perot etalon interferometer for direct detection lidar

Also Published As

Publication number Publication date
CN109690266A (zh) 2019-04-26
JP7114582B2 (ja) 2022-08-08
JP2019526058A (ja) 2019-09-12
CN109690266B (zh) 2021-12-07
US20190293491A1 (en) 2019-09-26
FR3054034A1 (fr) 2018-01-19
EP3485248B1 (fr) 2023-01-18
WO2018011063A1 (fr) 2018-01-18
US10768051B2 (en) 2020-09-08
EP3485248A1 (fr) 2019-05-22

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