CN1090813C - 制造半导体器件的方法 - Google Patents

制造半导体器件的方法 Download PDF

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Publication number
CN1090813C
CN1090813C CN95121314A CN95121314A CN1090813C CN 1090813 C CN1090813 C CN 1090813C CN 95121314 A CN95121314 A CN 95121314A CN 95121314 A CN95121314 A CN 95121314A CN 1090813 C CN1090813 C CN 1090813C
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CN
China
Prior art keywords
metallic element
surfactant
semiconductor device
film
silicon film
Prior art date
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Expired - Fee Related
Application number
CN95121314A
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English (en)
Chinese (zh)
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CN1132409A (zh
Inventor
山崎舜平
宫永昭治
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Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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Publication of CN1132409A publication Critical patent/CN1132409A/zh
Application granted granted Critical
Publication of CN1090813C publication Critical patent/CN1090813C/zh
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Expired - Fee Related legal-status Critical Current

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  • Thin Film Transistor (AREA)
  • Recrystallisation Techniques (AREA)
CN95121314A 1994-12-09 1995-12-09 制造半导体器件的方法 Expired - Fee Related CN1090813C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP33160894A JP3418647B2 (ja) 1994-12-09 1994-12-09 半導体装置作製方法および結晶成長促進剤
JP331608/94 1994-12-09

Publications (2)

Publication Number Publication Date
CN1132409A CN1132409A (zh) 1996-10-02
CN1090813C true CN1090813C (zh) 2002-09-11

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ID=18245564

Family Applications (1)

Application Number Title Priority Date Filing Date
CN95121314A Expired - Fee Related CN1090813C (zh) 1994-12-09 1995-12-09 制造半导体器件的方法

Country Status (4)

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JP (1) JP3418647B2 (enrdf_load_stackoverflow)
KR (1) KR100444655B1 (enrdf_load_stackoverflow)
CN (1) CN1090813C (enrdf_load_stackoverflow)
TW (1) TW285778B (enrdf_load_stackoverflow)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0144643B1 (ko) * 1994-12-28 1998-08-17 심상철 금속흡착법에 의한 다결정 규소박막의 제조방법
JPH10228248A (ja) 1996-12-09 1998-08-25 Semiconductor Energy Lab Co Ltd アクティブマトリクス表示装置およびその作製方法
JPH10198292A (ja) 1996-12-30 1998-07-31 Semiconductor Energy Lab Co Ltd 半導体装置およびその作製方法
US6794229B2 (en) 2000-04-28 2004-09-21 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method for semiconductor device
CN100337304C (zh) * 2003-08-22 2007-09-12 友达光电股份有限公司 形成多晶硅层的方法
JP2007108785A (ja) * 2006-12-25 2007-04-26 Semiconductor Energy Lab Co Ltd 半導体装置
CN105632923B (zh) * 2014-10-28 2018-11-16 中芯国际集成电路制造(上海)有限公司 半导体结构的形成方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1090426A (zh) * 1992-12-04 1994-08-03 株式会社半导体能源研究所 半导体器件及其制造方法
EP0612102A2 (en) * 1993-02-15 1994-08-24 Semiconductor Energy Laboratory Co., Ltd. Crystallized semiconductor layer, semiconductor device using the same and process for their fabrication

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1090426A (zh) * 1992-12-04 1994-08-03 株式会社半导体能源研究所 半导体器件及其制造方法
EP0612102A2 (en) * 1993-02-15 1994-08-24 Semiconductor Energy Laboratory Co., Ltd. Crystallized semiconductor layer, semiconductor device using the same and process for their fabrication

Also Published As

Publication number Publication date
KR100444655B1 (ko) 2004-11-26
JP3418647B2 (ja) 2003-06-23
CN1132409A (zh) 1996-10-02
TW285778B (enrdf_load_stackoverflow) 1996-09-11
JPH08167572A (ja) 1996-06-25

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Granted publication date: 20020911

Termination date: 20121209