CN108702137B - 用于放大器的共模增益微调 - Google Patents

用于放大器的共模增益微调 Download PDF

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Publication number
CN108702137B
CN108702137B CN201780013582.9A CN201780013582A CN108702137B CN 108702137 B CN108702137 B CN 108702137B CN 201780013582 A CN201780013582 A CN 201780013582A CN 108702137 B CN108702137 B CN 108702137B
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CN
China
Prior art keywords
trim
impedance matching
amplifier
mode gain
input
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CN201780013582.9A
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English (en)
Chinese (zh)
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CN108702137A (zh
Inventor
W·谭
M·加格
N·纳尔库-泰特
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Texas Instruments Inc
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Texas Instruments Inc
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Publication of CN108702137A publication Critical patent/CN108702137A/zh
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
    • H03F3/45636—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by using feedback means
    • H03F3/45663—Measuring at the active amplifying circuit of the differential amplifier
    • H03F3/45677—Controlling the active amplifying circuit of the differential amplifier
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C29/50008—Marginal testing, e.g. race, voltage or current testing of impedance
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02P—CONTROL OR REGULATION OF ELECTRIC MOTORS, ELECTRIC GENERATORS OR DYNAMO-ELECTRIC CONVERTERS; CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS
    • H02P31/00—Arrangements for regulating or controlling electric motors not provided for in groups H02P1/00 - H02P5/00, H02P7/00 or H02P21/00 - H02P29/00
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/56—Modifications of input or output impedances, not otherwise provided for
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0407—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals on power on
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/387—A circuit being added at the output of an amplifier to adapt the output impedance of the amplifier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/481—A resistor being used as sensor
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45306—Indexing scheme relating to differential amplifiers the common gate stage implemented as dif amp eventually for cascode dif amp

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Amplifiers (AREA)
CN201780013582.9A 2016-03-30 2017-03-30 用于放大器的共模增益微调 Active CN108702137B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201662315328P 2016-03-30 2016-03-30
US62/315,328 2016-03-30
US15/142,134 2016-04-29
US15/142,134 US10027295B2 (en) 2016-03-30 2016-04-29 Common mode gain trimming for amplifier
PCT/US2017/025093 WO2017173120A1 (en) 2016-03-30 2017-03-30 Common mode gain trimming for amplifier

Publications (2)

Publication Number Publication Date
CN108702137A CN108702137A (zh) 2018-10-23
CN108702137B true CN108702137B (zh) 2023-06-27

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201780013582.9A Active CN108702137B (zh) 2016-03-30 2017-03-30 用于放大器的共模增益微调

Country Status (5)

Country Link
US (1) US10027295B2 (https=)
EP (1) EP3437188A4 (https=)
JP (1) JP7104275B2 (https=)
CN (1) CN108702137B (https=)
WO (1) WO2017173120A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10643944B2 (en) 2018-07-30 2020-05-05 Texas Instruments Incorporated Additively manufactured programmable resistive jumpers
US10727116B2 (en) 2018-07-30 2020-07-28 Texas Instruments Incorporated Programming reactive components
US11533034B2 (en) * 2020-09-22 2022-12-20 Infineon Technologies Austria Ag Current monitoring and amplifier gain control
US11929769B2 (en) 2021-05-28 2024-03-12 Skyworks Solutions, Inc. Power amplifier trimming based on coefficients for digital pre-distortion
US11563462B1 (en) 2021-07-22 2023-01-24 Texas Instruments Incorporated Rejection of end-of-packet dribble in high speed universal serial bus repeaters
US12085605B1 (en) * 2023-02-23 2024-09-10 Meta Platforms Technologies, Llc Systems and methods for adjusting input-output impedance for I/O interfaces

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1957527A (zh) * 2004-03-31 2007-05-02 模拟设备股份有限公司 差分级电压偏置微调电路
JP2012044260A (ja) * 2010-08-12 2012-03-01 Fuji Electric Co Ltd 電荷検出回路
WO2015098893A1 (ja) * 2013-12-27 2015-07-02 株式会社村田製作所 容量トリミング回路

Family Cites Families (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3652913A (en) * 1970-07-01 1972-03-28 George M Holley Jr Control system including common mode feedback
US5027116A (en) 1987-02-24 1991-06-25 Micro Linear Corporation Self-calibrating analog to digital converter
US5142238A (en) * 1991-07-18 1992-08-25 Silicon Systems, Inc. Switched-capacitor differential amplifier
US5194802A (en) * 1991-10-25 1993-03-16 General Electric Company Transconductance current regulator using precisely sampled charges for current control
JPH08213855A (ja) * 1995-02-02 1996-08-20 Seikosha Co Ltd 差動増幅回路
JP3125675B2 (ja) * 1996-03-29 2001-01-22 三菱電機株式会社 容量型センサインターフェース回路
DE10004996C2 (de) * 2000-02-04 2002-09-26 Infineon Technologies Ag Vorrichtung und Verfahren zur Selbstkalibrierung von Faltungs-Analog/Digitalwandlern
DE10043436B4 (de) 2000-09-04 2008-10-09 Infineon Technologies Ag Verfahren und Schaltung zur automatischen Verstärkungsregelung eines Signalverstärkers
US6853510B2 (en) * 2000-10-05 2005-02-08 Texas Instruments Incorporated High-speed low-capacitive load common mode feedback
US6876266B2 (en) * 2002-06-10 2005-04-05 Gct Semiconductor, Inc. LC oscillator with wide tuning range and low phase noise
US7176438B2 (en) * 2003-04-11 2007-02-13 Canesta, Inc. Method and system to differentially enhance sensor dynamic range using enhanced common mode reset
US6784698B1 (en) * 2003-06-11 2004-08-31 Agere Systems Inc. Sense amplifier with improved common mode rejection
KR100513387B1 (ko) 2003-07-25 2005-09-07 삼성전자주식회사 증폭기 및 그 증폭방법과 이를 이용한 아날로그 처리회로및 이미지 픽업회로
US7352242B1 (en) * 2005-09-30 2008-04-01 National Semiconductor Corporation Programmable gain trim circuit
DE102005047171B4 (de) * 2005-09-30 2010-04-01 Xignal Technologies Ag Schaltungsanordnung mit einem rückgekoppelten Operationsverstärker
US7561812B2 (en) * 2005-10-13 2009-07-14 Lite-On Technology Corp. Optical receiver with matched photodetector capacitance
DE102005055426B4 (de) * 2005-11-21 2011-12-29 Xignal Technologies Ag Schaltungsanordnung mit einem rückgekoppelten, voll-differentiellen Operationsverstärker
US7902778B2 (en) * 2006-06-07 2011-03-08 Texas Instruments Incorporated Programmable constant voltage retract of disk drive actuator
US7649330B2 (en) * 2006-06-07 2010-01-19 Texas Instruments Incorporated Low-power pulse-width-modulated retract of disk drive actuator
US7948199B2 (en) * 2007-06-01 2011-05-24 Texas Instruments Incorporated Single-ended gain stage and disk drive
US7812673B1 (en) * 2007-10-03 2010-10-12 Analog Devices, Inc. Amplifier having input/output cells with discrete gain steps
US7733179B2 (en) * 2007-10-31 2010-06-08 Texas Instruments Incorporated Combination trim and CMFB circuit and method for differential amplifiers
TWI407352B (zh) * 2008-01-15 2013-09-01 Pixcir Microelectronics Co Ltd 量化電不平衡的裝置及加入有該裝置之觸摸檢測系統
US7724063B1 (en) * 2008-12-02 2010-05-25 Himax Media Solutions, Inc. Integrator-based common-mode stabilization technique for pseudo-differential switched-capacitor circuits
US8057239B2 (en) * 2009-04-29 2011-11-15 GM Global Technology Operations LLC Power module assembly
US8384239B2 (en) * 2009-07-16 2013-02-26 GM Global Technology Operations LLC DC source assemblies
TWI398090B (zh) * 2009-11-11 2013-06-01 Princeton Technology Corp 應用於複數種控制模式之馬達控制電路
JP5437506B2 (ja) * 2010-03-05 2014-03-12 エプコス アクチエンゲゼルシャフト 回路ユニットを有するバイアス回路、並びに第１及び第２の回路ユニットを有する差動増幅回路
US8208213B2 (en) * 2010-06-02 2012-06-26 Lsi Corporation Systems and methods for hybrid algorithm gain adaptation
US8599053B2 (en) * 2010-12-22 2013-12-03 Microchip Technology Incorporated Switched-capacitance gain amplifier with improved input impedance
US8198937B1 (en) * 2011-03-15 2012-06-12 Freescale Semiconductor, Inc. Switched-capacitor amplifier circuit
JP2013243479A (ja) 2012-05-18 2013-12-05 Rohm Co Ltd 可変利得増幅器、それを用いた電流検出回路、モータ駆動回路および電子機器
JP6011273B2 (ja) * 2012-11-26 2016-10-19 住友電気工業株式会社 増幅器
US20140176239A1 (en) * 2012-12-24 2014-06-26 Lsi Corporation Adaptive control mechanisms to control input and output common-mode voltages of differential amplifier circuits
KR101881912B1 (ko) * 2013-01-24 2018-07-26 삼성전자주식회사 신호 처리 장치 및 신호 처리 방법
JP6207871B2 (ja) * 2013-04-17 2017-10-04 ルネサスエレクトロニクス株式会社 半導体装置及びインバータシステム
JP2014222162A (ja) * 2013-05-13 2014-11-27 株式会社デンソー センサ回路及びセンサ
US9065400B2 (en) * 2013-09-20 2015-06-23 Honeywell International Inc. Programmable-gain instrumentation amplifier
US9385673B2 (en) * 2014-02-14 2016-07-05 Analog Devices Global Amplifier with offset compensation
US9419596B2 (en) 2014-09-05 2016-08-16 Macronix International Co., Ltd. Sense amplifier with improved margin

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1957527A (zh) * 2004-03-31 2007-05-02 模拟设备股份有限公司 差分级电压偏置微调电路
JP2012044260A (ja) * 2010-08-12 2012-03-01 Fuji Electric Co Ltd 電荷検出回路
WO2015098893A1 (ja) * 2013-12-27 2015-07-02 株式会社村田製作所 容量トリミング回路

Also Published As

Publication number Publication date
EP3437188A4 (en) 2019-04-10
US10027295B2 (en) 2018-07-17
US20170288622A1 (en) 2017-10-05
JP7104275B2 (ja) 2022-07-21
WO2017173120A1 (en) 2017-10-05
JP2019514275A (ja) 2019-05-30
EP3437188A1 (en) 2019-02-06
CN108702137A (zh) 2018-10-23

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