JP7104275B2 - 増幅器のための同相利得トリミング - Google Patents

増幅器のための同相利得トリミング Download PDF

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Publication number
JP7104275B2
JP7104275B2 JP2018551870A JP2018551870A JP7104275B2 JP 7104275 B2 JP7104275 B2 JP 7104275B2 JP 2018551870 A JP2018551870 A JP 2018551870A JP 2018551870 A JP2018551870 A JP 2018551870A JP 7104275 B2 JP7104275 B2 JP 7104275B2
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trim
coupled
amplifier
impedance matching
node
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JP2019514275A (ja
JP2019514275A5 (https=
Inventor
タン ウェンシャオ
ガーグ マヤンク
ナークテッテ ノーブル
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テキサス インスツルメンツ インコーポレイテッド
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
    • H03F3/45636—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by using feedback means
    • H03F3/45663—Measuring at the active amplifying circuit of the differential amplifier
    • H03F3/45677—Controlling the active amplifying circuit of the differential amplifier
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C29/50008—Marginal testing, e.g. race, voltage or current testing of impedance
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02P—CONTROL OR REGULATION OF ELECTRIC MOTORS, ELECTRIC GENERATORS OR DYNAMO-ELECTRIC CONVERTERS; CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS
    • H02P31/00—Arrangements for regulating or controlling electric motors not provided for in groups H02P1/00 - H02P5/00, H02P7/00 or H02P21/00 - H02P29/00
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/56—Modifications of input or output impedances, not otherwise provided for
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0407—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals on power on
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/387—A circuit being added at the output of an amplifier to adapt the output impedance of the amplifier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/481—A resistor being used as sensor
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45306—Indexing scheme relating to differential amplifiers the common gate stage implemented as dif amp eventually for cascode dif amp

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Amplifiers (AREA)
JP2018551870A 2016-03-30 2017-03-30 増幅器のための同相利得トリミング Active JP7104275B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201662315328P 2016-03-30 2016-03-30
US62/315,328 2016-03-30
US15/142,134 2016-04-29
US15/142,134 US10027295B2 (en) 2016-03-30 2016-04-29 Common mode gain trimming for amplifier
PCT/US2017/025093 WO2017173120A1 (en) 2016-03-30 2017-03-30 Common mode gain trimming for amplifier

Publications (3)

Publication Number Publication Date
JP2019514275A JP2019514275A (ja) 2019-05-30
JP2019514275A5 JP2019514275A5 (https=) 2020-04-16
JP7104275B2 true JP7104275B2 (ja) 2022-07-21

Family

ID=59961985

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018551870A Active JP7104275B2 (ja) 2016-03-30 2017-03-30 増幅器のための同相利得トリミング

Country Status (5)

Country Link
US (1) US10027295B2 (https=)
EP (1) EP3437188A4 (https=)
JP (1) JP7104275B2 (https=)
CN (1) CN108702137B (https=)
WO (1) WO2017173120A1 (https=)

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US10643944B2 (en) 2018-07-30 2020-05-05 Texas Instruments Incorporated Additively manufactured programmable resistive jumpers
US10727116B2 (en) 2018-07-30 2020-07-28 Texas Instruments Incorporated Programming reactive components
US11533034B2 (en) * 2020-09-22 2022-12-20 Infineon Technologies Austria Ag Current monitoring and amplifier gain control
US11929769B2 (en) 2021-05-28 2024-03-12 Skyworks Solutions, Inc. Power amplifier trimming based on coefficients for digital pre-distortion
US11563462B1 (en) 2021-07-22 2023-01-24 Texas Instruments Incorporated Rejection of end-of-packet dribble in high speed universal serial bus repeaters
US12085605B1 (en) * 2023-02-23 2024-09-10 Meta Platforms Technologies, Llc Systems and methods for adjusting input-output impedance for I/O interfaces

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US20140203873A1 (en) 2013-01-24 2014-07-24 Samsung Electronics Co., Ltd Signal processing apparatus and method
JP2015125088A (ja) 2013-12-27 2015-07-06 株式会社村田製作所 容量トリミング回路

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US20070086790A1 (en) 2005-10-13 2007-04-19 Tai Wai K Optical receiver with matched photodetector capacitance
JP2012044260A (ja) 2010-08-12 2012-03-01 Fuji Electric Co Ltd 電荷検出回路
JP2014107630A (ja) 2012-11-26 2014-06-09 Sumitomo Electric Ind Ltd 増幅器
US20140203873A1 (en) 2013-01-24 2014-07-24 Samsung Electronics Co., Ltd Signal processing apparatus and method
JP2015125088A (ja) 2013-12-27 2015-07-06 株式会社村田製作所 容量トリミング回路

Also Published As

Publication number Publication date
EP3437188A4 (en) 2019-04-10
US10027295B2 (en) 2018-07-17
US20170288622A1 (en) 2017-10-05
WO2017173120A1 (en) 2017-10-05
JP2019514275A (ja) 2019-05-30
EP3437188A1 (en) 2019-02-06
CN108702137A (zh) 2018-10-23
CN108702137B (zh) 2023-06-27

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