CN107850506B - 电离压力计和操作电离压力计的方法 - Google Patents
电离压力计和操作电离压力计的方法 Download PDFInfo
- Publication number
- CN107850506B CN107850506B CN201680040313.7A CN201680040313A CN107850506B CN 107850506 B CN107850506 B CN 107850506B CN 201680040313 A CN201680040313 A CN 201680040313A CN 107850506 B CN107850506 B CN 107850506B
- Authority
- CN
- China
- Prior art keywords
- electron emission
- cathode
- current
- emission current
- bias voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L21/00—Vacuum gauges
- G01L21/30—Vacuum gauges by making use of ionisation effects
- G01L21/32—Vacuum gauges by making use of ionisation effects using electric discharge tubes with thermionic cathodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/14—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
- G01L1/142—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors
- G01L1/144—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors with associated circuitry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L21/00—Vacuum gauges
- G01L21/30—Vacuum gauges by making use of ionisation effects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L21/00—Vacuum gauges
- G01L21/30—Vacuum gauges by making use of ionisation effects
- G01L21/34—Vacuum gauges by making use of ionisation effects using electric discharge tubes with cold cathodes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measuring Fluid Pressure (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/795,729 | 2015-07-09 | ||
| US14/795,729 US9927317B2 (en) | 2015-07-09 | 2015-07-09 | Ionization pressure gauge with bias voltage and emission current control and measurement |
| PCT/US2016/032070 WO2017007531A1 (en) | 2015-07-09 | 2016-05-12 | Ionization pressure gauge with bias voltage and emission current control and measurement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107850506A CN107850506A (zh) | 2018-03-27 |
| CN107850506B true CN107850506B (zh) | 2020-09-11 |
Family
ID=56084395
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201680040313.7A Active CN107850506B (zh) | 2015-07-09 | 2016-05-12 | 电离压力计和操作电离压力计的方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9927317B2 (https=) |
| EP (1) | EP3298374B1 (https=) |
| JP (1) | JP6814789B2 (https=) |
| KR (1) | KR102228612B1 (https=) |
| CN (1) | CN107850506B (https=) |
| DK (1) | DK3298374T3 (https=) |
| WO (1) | WO2017007531A1 (https=) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9927317B2 (en) | 2015-07-09 | 2018-03-27 | Mks Instruments, Inc. | Ionization pressure gauge with bias voltage and emission current control and measurement |
| JP6826131B2 (ja) * | 2016-05-02 | 2021-02-03 | エム ケー エス インストルメンツ インコーポレーテッドMks Instruments,Incorporated | 複数の陰極を備える冷陰極電離真空計 |
| JP6772391B2 (ja) * | 2018-06-18 | 2020-10-21 | 株式会社アルバック | 電離真空計及び制御装置 |
| CN108918026B (zh) * | 2018-09-11 | 2020-12-25 | 北京东方计量测试研究所 | 一种热阴极电离真空计电参数校准装置及方法 |
| CN116362179B (zh) * | 2023-03-24 | 2023-11-17 | 深圳京鸿源科技有限公司 | 一种基于动态调节mosfet电路功耗的控制方法 |
Family Cites Families (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4035720A (en) * | 1975-12-31 | 1977-07-12 | Harvey Philip C | Ion gauge system |
| US4158794A (en) * | 1978-07-14 | 1979-06-19 | P. R. Mallory & Co. Inc. | Drive means and method for vacuum fluorescent display systems |
| JPS5697865A (en) * | 1980-01-07 | 1981-08-06 | Hitachi Ltd | Ionization detector |
| GB2105047B (en) | 1981-08-28 | 1986-04-03 | British Oxygen Co Ltd | Pirani gauges |
| JPS60157151A (ja) * | 1984-01-25 | 1985-08-17 | Hitachi Ltd | 真空排気制御装置 |
| CN85200112U (zh) * | 1985-04-01 | 1986-09-24 | 北京大学 | 饿流放大式电离真空计发射电流稳定器 |
| JP2672950B2 (ja) * | 1987-10-20 | 1997-11-05 | 株式会社芝浦製作所 | エミッションコントロール装置 |
| DE3930699C2 (de) * | 1989-09-14 | 1994-02-03 | Perzl Peter | Vorrichtung zur Energieeinkopplung in eine durchströmte elektrische Gasentladung |
| US5250906A (en) | 1991-10-17 | 1993-10-05 | Granville-Phillips Company | Ionization gauge and method of using and calibrating same |
| US5608384A (en) | 1992-10-23 | 1997-03-04 | Sentech Corporation | Method and apparatus for monitoring for the presence of a gas |
| US5801535A (en) | 1996-11-12 | 1998-09-01 | Granville-Phillips Company | Ionization gauge and method of using and calibrating same |
| JP3734913B2 (ja) | 1997-01-27 | 2006-01-11 | 株式会社アルバック | 電離真空計制御装置 |
| US6025723A (en) * | 1997-08-27 | 2000-02-15 | Granville-Phillips Company | Miniature ionization gauge utilizing multiple ion collectors |
| JP3324522B2 (ja) | 1998-09-16 | 2002-09-17 | 日本電気株式会社 | 可変利得増幅回路及び利得制御方法 |
| JP4339948B2 (ja) | 1999-02-25 | 2009-10-07 | キヤノンアネルバ株式会社 | 熱陰極電離真空計 |
| JP4493139B2 (ja) | 2000-02-02 | 2010-06-30 | キヤノンアネルバ株式会社 | 電離真空計 |
| JP4092246B2 (ja) | 2002-05-27 | 2008-05-28 | インフィネオン テクノロジーズ アクチエンゲゼルシャフト | パワースイッチデバイス |
| US6756785B2 (en) | 2002-07-25 | 2004-06-29 | Mks Instruments, Inc. | Pressure controlled degas system for hot cathode ionization pressure gauges |
| US7295015B2 (en) | 2004-02-19 | 2007-11-13 | Brooks Automation, Inc. | Ionization gauge |
| CN1965219A (zh) * | 2004-03-12 | 2007-05-16 | 布鲁克斯自动化有限公司 | 电离真空计 |
| JP3108712U (ja) | 2004-11-11 | 2005-04-28 | アルプス電気株式会社 | 可変利得増幅回路 |
| EP1698878A1 (en) | 2005-03-04 | 2006-09-06 | Inficon GmbH | Electrode configuration and pressure measuring apparatus |
| JP5127042B2 (ja) | 2005-05-09 | 2013-01-23 | 株式会社アンペール | 電離真空計 |
| EP2002623A1 (en) | 2006-03-27 | 2008-12-17 | Nxp B.V. | A low voltage and low power differential driver with matching output impedances |
| US7429863B2 (en) | 2006-07-18 | 2008-09-30 | Brooks Automation, Inc. | Method and apparatus for maintaining emission capabilities of hot cathodes in harsh environments |
| WO2008133074A1 (ja) * | 2007-04-16 | 2008-11-06 | Ulvac, Inc. | 質量分析計の制御方法及び質量分析計 |
| US8686733B2 (en) | 2007-12-19 | 2014-04-01 | Brooks Automation, Inc. | Ionization gauge having electron multiplier cold emission source |
| CN101990630B (zh) * | 2008-02-21 | 2013-08-14 | 布鲁克机械公司 | 具有设计用于高压操作的操作参数和几何形状的电离计 |
| JP5136892B2 (ja) * | 2008-03-03 | 2013-02-06 | 株式会社ネットコムセック | 電圧制御装置、電源装置、電子管及び高周波回路システム |
| JP5223497B2 (ja) | 2008-06-27 | 2013-06-26 | 富士通セミコンダクター株式会社 | ピークホールド回路 |
| WO2010033427A1 (en) | 2008-09-19 | 2010-03-25 | Brooks Automation, Inc. | Ionization gauge with emission current and bias potential control |
| JP4636461B2 (ja) | 2009-01-13 | 2011-02-23 | セイコーインスツル株式会社 | 電源電圧監視回路、および該電源電圧監視回路を備える電子回路 |
| WO2010106792A1 (ja) | 2009-03-18 | 2010-09-23 | 株式会社アルバック | 酸素の検出方法,空気リークの判別方法,ガス成分検出装置,及び真空処理装置 |
| JP5716346B2 (ja) | 2010-10-13 | 2015-05-13 | 株式会社リコー | 信号バッファ回路とセンサ制御基板と画像読取装置および画像形成装置 |
| JP2014164577A (ja) | 2013-02-26 | 2014-09-08 | Sumitomo Electric Ind Ltd | 駆動回路 |
| US9927317B2 (en) | 2015-07-09 | 2018-03-27 | Mks Instruments, Inc. | Ionization pressure gauge with bias voltage and emission current control and measurement |
-
2015
- 2015-07-09 US US14/795,729 patent/US9927317B2/en active Active
-
2016
- 2016-05-12 CN CN201680040313.7A patent/CN107850506B/zh active Active
- 2016-05-12 WO PCT/US2016/032070 patent/WO2017007531A1/en not_active Ceased
- 2016-05-12 JP JP2018500386A patent/JP6814789B2/ja not_active Expired - Fee Related
- 2016-05-12 EP EP16725689.0A patent/EP3298374B1/en active Active
- 2016-05-12 DK DK16725689T patent/DK3298374T3/da active
- 2016-05-12 KR KR1020187003398A patent/KR102228612B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US9927317B2 (en) | 2018-03-27 |
| DK3298374T3 (da) | 2019-11-11 |
| JP2018519528A (ja) | 2018-07-19 |
| US20170010172A1 (en) | 2017-01-12 |
| EP3298374A1 (en) | 2018-03-28 |
| WO2017007531A1 (en) | 2017-01-12 |
| EP3298374B1 (en) | 2019-09-25 |
| CN107850506A (zh) | 2018-03-27 |
| JP6814789B2 (ja) | 2021-01-20 |
| KR20180027542A (ko) | 2018-03-14 |
| KR102228612B1 (ko) | 2021-03-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |