CN106919006B - 光刻系统、在光刻系统内转移基板的装置及方法 - Google Patents
光刻系统、在光刻系统内转移基板的装置及方法 Download PDFInfo
- Publication number
- CN106919006B CN106919006B CN201710164699.9A CN201710164699A CN106919006B CN 106919006 B CN106919006 B CN 106919006B CN 201710164699 A CN201710164699 A CN 201710164699A CN 106919006 B CN106919006 B CN 106919006B
- Authority
- CN
- China
- Prior art keywords
- substrate
- support structure
- fingers
- substrate support
- transfer device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
- G03F7/7075—Handling workpieces outside exposure position, e.g. SMIF box
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0451—Apparatus for manufacturing or treating in a plurality of work-stations
- H10P72/0452—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers
- H10P72/0458—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers vertical arrangement
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0451—Apparatus for manufacturing or treating in a plurality of work-stations
- H10P72/0468—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H10P72/0474—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one lithography chamber
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
- H10P72/3304—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber characterised by movements or sequence of movements of transfer devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Electron Beam Exposure (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161480163P | 2011-04-28 | 2011-04-28 | |
| US61/480,163 | 2011-04-28 | ||
| CN201280032577.XA CN103649837B (zh) | 2011-04-28 | 2012-05-01 | 在光刻系统中处理基板的方法 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280032577.XA Division CN103649837B (zh) | 2011-04-28 | 2012-05-01 | 在光刻系统中处理基板的方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106919006A CN106919006A (zh) | 2017-07-04 |
| CN106919006B true CN106919006B (zh) | 2020-03-13 |
Family
ID=46017897
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710164699.9A Expired - Fee Related CN106919006B (zh) | 2011-04-28 | 2012-05-01 | 光刻系统、在光刻系统内转移基板的装置及方法 |
| CN201280032577.XA Expired - Fee Related CN103649837B (zh) | 2011-04-28 | 2012-05-01 | 在光刻系统中处理基板的方法 |
| CN201710164697.XA Pending CN106896650A (zh) | 2011-04-28 | 2012-05-01 | 将目标从基板转移系统转移至光刻系统的装置和方法 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280032577.XA Expired - Fee Related CN103649837B (zh) | 2011-04-28 | 2012-05-01 | 在光刻系统中处理基板的方法 |
| CN201710164697.XA Pending CN106896650A (zh) | 2011-04-28 | 2012-05-01 | 将目标从基板转移系统转移至光刻系统的装置和方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (4) | US8936994B2 (https=) |
| EP (1) | EP2702452B1 (https=) |
| JP (2) | JP5805851B2 (https=) |
| KR (4) | KR20180031082A (https=) |
| CN (3) | CN106919006B (https=) |
| TW (2) | TWI514089B (https=) |
| WO (2) | WO2012146789A1 (https=) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2681624B1 (en) * | 2010-12-14 | 2016-07-20 | Mapper Lithography IP B.V. | Lithography system and method of processing substrates in such a lithography system |
| JP6049367B2 (ja) | 2012-09-13 | 2016-12-21 | 株式会社Screenセミコンダクターソリューションズ | 基板処理装置および基板処理システム |
| NL2010624C2 (en) * | 2013-04-08 | 2014-10-09 | Mapper Lithography Ip Bv | Cabinet for electronic equipment. |
| CN106462084B (zh) | 2014-05-07 | 2018-10-19 | 迈普尔平版印刷Ip有限公司 | 用于目标处理机械的封闭件 |
| KR101681185B1 (ko) * | 2014-11-04 | 2016-12-02 | 세메스 주식회사 | 인터페이스 모듈 및 이를 포함하는 기판 처리 장치 및 방법 |
| KR20170084240A (ko) | 2014-11-14 | 2017-07-19 | 마퍼 리쏘그라피 아이피 비.브이. | 리소그래피 시스템에서 기판을 이송하기 위한 로드 로크 시스템 및 방법 |
| NL2015784B1 (en) * | 2015-11-13 | 2017-06-02 | Mapper Lithography Ip Bv | Load lock system and method for transferring substrates in a lithography system. |
| US10153282B1 (en) * | 2017-08-11 | 2018-12-11 | Lam Research Corporation | Ultra-high vacuum transport and storage |
| CN108287454A (zh) * | 2018-01-29 | 2018-07-17 | 信利(惠州)智能显示有限公司 | 掩膜板装载系统 |
| CN112970089A (zh) | 2018-11-06 | 2021-06-15 | Asml荷兰有限公司 | 用于在带电粒子束设备中对晶片进行热调节的系统和方法 |
| KR101977100B1 (ko) * | 2018-11-15 | 2019-05-10 | 이지메카시스템(주) | 렌즈 어셈블리 어닐링 시스템 |
| US10910239B1 (en) * | 2019-07-10 | 2021-02-02 | Mikro Mesa Technology Co., Ltd. | Method of transferring micro devices and device transfer system |
| JP2021086889A (ja) * | 2019-11-27 | 2021-06-03 | 株式会社日立ハイテク | 荷電粒子線装置 |
| US20250266285A1 (en) * | 2024-02-15 | 2025-08-21 | Tel Manufacturing And Engineering Of America, Inc. | Multi-wafer handling system |
| CN119742259B (zh) * | 2025-03-05 | 2025-05-23 | 常州科瑞尔科技有限公司 | 集成式dsc芯片输送治具及其工作方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6573520B1 (en) * | 1999-03-26 | 2003-06-03 | Hitachi, Ltd. | Electron beam lithography system |
Family Cites Families (80)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3157308A (en) | 1961-09-05 | 1964-11-17 | Clark Mfg Co J L | Canister type container and method of making the same |
| US3159408A (en) | 1961-10-05 | 1964-12-01 | Grace W R & Co | Chuck |
| US4524308A (en) | 1984-06-01 | 1985-06-18 | Sony Corporation | Circuits for accomplishing electron beam convergence in color cathode ray tubes |
| US4951601A (en) | 1986-12-19 | 1990-08-28 | Applied Materials, Inc. | Multi-chamber integrated process system |
| US5536128A (en) | 1988-10-21 | 1996-07-16 | Hitachi, Ltd. | Method and apparatus for carrying a variety of products |
| JPH05136247A (ja) * | 1991-11-13 | 1993-06-01 | Fuji Electric Co Ltd | 半導体ウエハ処理装置 |
| WO1994025880A1 (en) | 1993-04-30 | 1994-11-10 | Board Of Regents, The University Of Texas System | Megavoltage scanning imager and method for its use |
| JPH0729787A (ja) | 1993-07-15 | 1995-01-31 | Toshiba Mach Co Ltd | 恒温部材の温度保持装置 |
| DE634699T1 (de) * | 1993-07-16 | 1996-02-15 | Semiconductor Systems Inc | Gruppiertes fotolithografisches System. |
| DE4446489C1 (de) | 1994-12-23 | 1996-05-15 | Fraunhofer Ges Forschung | Verfahren zum Manipulieren von Mikrobauteilen und Vorrichtung zur Durchführung des Verfahrens |
| EP0766405A1 (en) | 1995-09-29 | 1997-04-02 | STMicroelectronics S.r.l. | Successive approximation register without redundancy |
| JP3892494B2 (ja) * | 1996-01-26 | 2007-03-14 | 東京エレクトロン株式会社 | 基板搬送装置 |
| JP3579228B2 (ja) * | 1997-01-24 | 2004-10-20 | 大日本スクリーン製造株式会社 | 基板処理装置 |
| US5944476A (en) * | 1997-03-26 | 1999-08-31 | Kensington Laboratories, Inc. | Unitary specimen prealigner and continuously rotatable multiple link robot arm mechanism |
| JP4048387B2 (ja) * | 1997-09-10 | 2008-02-20 | 東京エレクトロン株式会社 | ロードロック機構及び処理装置 |
| JPH11121362A (ja) | 1997-10-20 | 1999-04-30 | Canon Inc | 露光装置およびデバイス製造方法 |
| US6719516B2 (en) * | 1998-09-28 | 2004-04-13 | Applied Materials, Inc. | Single wafer load lock with internal wafer transport |
| US6364762B1 (en) * | 1999-09-30 | 2002-04-02 | Lam Research Corporation | Wafer atmospheric transport module having a controlled mini-environment |
| US6949143B1 (en) | 1999-12-15 | 2005-09-27 | Applied Materials, Inc. | Dual substrate loadlock process equipment |
| JP2002009139A (ja) | 2000-06-20 | 2002-01-11 | Nikon Corp | 静電チャック |
| KR100885082B1 (ko) * | 2000-09-01 | 2009-02-25 | 어사이스트 테크놀로지스, 인코포레이티드 | 버퍼링 성능을 가진 에지 그립 얼라이너 |
| TW559855B (en) * | 2000-09-06 | 2003-11-01 | Olympus Optical Co | Wafer transfer apparatus |
| KR20030032034A (ko) | 2000-09-15 | 2003-04-23 | 어플라이드 머티어리얼스, 인코포레이티드 | 처리 장비용 두 개의 이중 슬롯 로드록 |
| ATE257277T1 (de) | 2000-10-31 | 2004-01-15 | Sez Ag | Vorrichtung zur flüssigkeitsbehandlung von scheibenförmigen gegenständen |
| WO2003008157A2 (en) | 2001-07-14 | 2003-01-30 | Brooks Automation, Inc. | Centering double side edge grip end effector with integrated mapping sensor |
| JP2003045947A (ja) * | 2001-07-27 | 2003-02-14 | Canon Inc | 基板処理装置及び露光装置 |
| JP2003068600A (ja) | 2001-08-22 | 2003-03-07 | Canon Inc | 露光装置、および基板チャックの冷却方法 |
| US6786996B2 (en) | 2001-10-16 | 2004-09-07 | Applied Materials Inc. | Apparatus and method for edge bead removal |
| US6778258B2 (en) | 2001-10-19 | 2004-08-17 | Asml Holding N.V. | Wafer handling system for use in lithography patterning |
| CN101650528B (zh) * | 2002-02-22 | 2012-09-26 | Asml控股股份有限公司 | 使用两件式盖子保护模版的系统和方法 |
| CN100397558C (zh) | 2002-08-31 | 2008-06-25 | 应用材料有限公司 | 向处理工具提供衬底的方法和设备 |
| ATE538412T1 (de) | 2002-10-25 | 2012-01-15 | Mapper Lithography Ip Bv | Lithographisches system |
| AU2003276779A1 (en) | 2002-10-30 | 2004-05-25 | Mapper Lithography Ip B.V. | Electron beam exposure system |
| TWI601199B (zh) * | 2002-11-15 | 2017-10-01 | 荏原製作所股份有限公司 | 基板處理裝置及基板處理方法 |
| KR101068607B1 (ko) * | 2003-03-10 | 2011-09-30 | 마퍼 리쏘그라피 아이피 비.브이. | 복수 개의 빔렛 발생 장치 |
| SG115631A1 (en) * | 2003-03-11 | 2005-10-28 | Asml Netherlands Bv | Lithographic projection assembly, load lock and method for transferring objects |
| TWI234692B (en) * | 2003-03-11 | 2005-06-21 | Asml Netherlands Bv | Lithographic projection assembly, handling apparatus for handling substrates and method of handling a substrate |
| EP1457829A1 (en) | 2003-03-11 | 2004-09-15 | ASML Netherlands B.V. | Lithographic projection assembly, handling apparatus for handling substrates and method of handling a substrate |
| JP2004281474A (ja) | 2003-03-12 | 2004-10-07 | Seiko Epson Corp | 製造対象物の受け渡し装置および製造対象物の受け渡し装置を有する搬送システム |
| JP3674864B2 (ja) * | 2003-03-25 | 2005-07-27 | 忠素 玉井 | 真空処理装置 |
| US7010388B2 (en) | 2003-05-22 | 2006-03-07 | Axcelis Technologies, Inc. | Work-piece treatment system having load lock and buffer |
| ATE524822T1 (de) * | 2003-05-28 | 2011-09-15 | Mapper Lithography Ip Bv | Belichtungsverfahren für strahlen aus geladenen teilchen |
| ATE381728T1 (de) | 2003-07-30 | 2008-01-15 | Mapper Lithography Ip Bv | Modulator-schaltkreise |
| US7158211B2 (en) | 2003-09-29 | 2007-01-02 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| WO2005113853A1 (en) | 2004-05-14 | 2005-12-01 | The Boc Group, Inc. | Methods and apparatuses for transferring articles through a load lock chamber under vacuum |
| JP2006066690A (ja) | 2004-08-27 | 2006-03-09 | Hitachi High-Technologies Corp | 電子線描画装置、電子線描画装置の温度制御方法、および回路パターン製造装置 |
| US20070134821A1 (en) * | 2004-11-22 | 2007-06-14 | Randhir Thakur | Cluster tool for advanced front-end processing |
| US7706908B2 (en) * | 2005-02-22 | 2010-04-27 | Oc Oerlikon Balzers Ag | Method for positioning a wafer |
| TWI424260B (zh) | 2005-03-18 | 2014-01-21 | 尼康股份有限公司 | A board member, a substrate holding device, an exposure apparatus and an exposure method, and a device manufacturing method |
| JP4667140B2 (ja) | 2005-06-30 | 2011-04-06 | キヤノン株式会社 | 露光装置およびデバイス製造方法 |
| JP5336184B2 (ja) * | 2005-07-11 | 2013-11-06 | ブルックス オートメーション インコーポレイテッド | 自動位置合わせ基板搬送装置 |
| KR20070029032A (ko) * | 2005-09-08 | 2007-03-13 | 주성엔지니어링(주) | 이동식 이송챔버와 이를 포함하는 기판처리장치 |
| US7709815B2 (en) | 2005-09-16 | 2010-05-04 | Mapper Lithography Ip B.V. | Lithography system and projection method |
| DE102006021647A1 (de) | 2005-11-09 | 2007-11-15 | Coenen, Wolfgang, Dipl.-Ing. | Verfahren zur Vereinzelung von scheibenförmigen Substraten unter Nutzung von Adhäsionskräften |
| KR100655079B1 (ko) | 2005-11-11 | 2006-12-08 | 삼성전자주식회사 | 트랜스퍼 챔버와 프로세스 챔버 사이의 기밀유지장치 |
| US8325321B2 (en) | 2006-07-28 | 2012-12-04 | Mapper Lithography Ip B.V. | Lithography system, method of heat dissipation and frame |
| JP5048352B2 (ja) | 2007-01-31 | 2012-10-17 | 東京エレクトロン株式会社 | 基板処理方法及び基板処理装置 |
| US8950998B2 (en) * | 2007-02-27 | 2015-02-10 | Brooks Automation, Inc. | Batch substrate handling |
| US20080225261A1 (en) | 2007-03-13 | 2008-09-18 | Noriyuki Hirayanagi | Exposure apparatus and device manufacturing method |
| WO2008144668A1 (en) | 2007-05-17 | 2008-11-27 | Brooks Automation, Inc. | Side opening substrate carrier and load port |
| US7817241B2 (en) | 2007-07-05 | 2010-10-19 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| TWI450047B (zh) | 2007-07-13 | 2014-08-21 | 瑪波微影Ip公司 | 微影系統、夾緊方法及晶圓台 |
| US8705010B2 (en) * | 2007-07-13 | 2014-04-22 | Mapper Lithography Ip B.V. | Lithography system, method of clamping and wafer table |
| US20090110532A1 (en) * | 2007-10-29 | 2009-04-30 | Sokudo Co., Ltd. | Method and apparatus for providing wafer centering on a track lithography tool |
| KR101570974B1 (ko) | 2008-02-26 | 2015-11-23 | 마퍼 리쏘그라피 아이피 비.브이. | 투사 렌즈 배열체 |
| JP5408674B2 (ja) | 2008-02-26 | 2014-02-05 | マッパー・リソグラフィー・アイピー・ビー.ブイ. | 投影レンズ構成体 |
| NL1036673A1 (nl) | 2008-04-09 | 2009-10-12 | Asml Holding Nv | Robot Position Calibration Tool (RPCT). |
| JP5268170B2 (ja) * | 2008-04-15 | 2013-08-21 | マッパー・リソグラフィー・アイピー・ビー.ブイ. | 投影レンズ構成体 |
| US8757026B2 (en) | 2008-04-15 | 2014-06-24 | Dynamic Micro Systems, Semiconductor Equipment Gmbh | Clean transfer robot |
| WO2009141428A1 (en) | 2008-05-23 | 2009-11-26 | Mapper Lithography Ip B.V. | Imaging system |
| WO2009147202A1 (en) | 2008-06-04 | 2009-12-10 | Mapper Lithography Ip B.V. | Writing strategy |
| TWI479530B (zh) | 2008-10-01 | 2015-04-01 | Mapper Lithography Ip Bv | 靜電透鏡結構、靜電透鏡陣列、帶電粒子的子束微影系統以及製造絕緣結構的方法 |
| JP5548430B2 (ja) | 2008-11-26 | 2014-07-16 | 株式会社日立国際電気 | 基板処理装置及び半導体装置の製造方法 |
| JP5000627B2 (ja) | 2008-11-27 | 2012-08-15 | 東京エレクトロン株式会社 | 基板処理システム |
| US8991330B2 (en) * | 2009-02-22 | 2015-03-31 | Mapper Lithography Ip B.V. | Substrate support structure, clamp preparation unit, and lithography system |
| KR101586984B1 (ko) | 2009-02-22 | 2016-01-20 | 마퍼 리쏘그라피 아이피 비.브이. | 리소그래피 머신을 위한 준비 유닛 |
| GB2469112A (en) | 2009-04-03 | 2010-10-06 | Mapper Lithography Ip Bv | Wafer support using controlled capillary liquid layer to hold and release wafer |
| JP5249098B2 (ja) * | 2009-03-17 | 2013-07-31 | 東京エレクトロン株式会社 | 基板処理システム及び基板処理方法 |
| TWI738166B (zh) | 2013-01-22 | 2021-09-01 | 美商布魯克斯自動機械公司 | 基材運送 |
| WO2016158421A1 (ja) | 2015-04-03 | 2016-10-06 | 株式会社日立ハイテクノロジーズ | 光量検出装置、それを用いた免疫分析装置および荷電粒子線装置 |
-
2012
- 2012-04-30 TW TW101115340A patent/TWI514089B/zh active
- 2012-04-30 US US13/460,191 patent/US8936994B2/en active Active
- 2012-04-30 TW TW101115338A patent/TWI486723B/zh not_active IP Right Cessation
- 2012-04-30 US US13/460,239 patent/US9176397B2/en active Active
- 2012-05-01 EP EP12719354.8A patent/EP2702452B1/en not_active Not-in-force
- 2012-05-01 CN CN201710164699.9A patent/CN106919006B/zh not_active Expired - Fee Related
- 2012-05-01 JP JP2014506911A patent/JP5805851B2/ja not_active Expired - Fee Related
- 2012-05-01 KR KR1020187007800A patent/KR20180031082A/ko not_active Ceased
- 2012-05-01 KR KR1020137031509A patent/KR101607618B1/ko not_active Expired - Fee Related
- 2012-05-01 KR KR1020167009917A patent/KR101892460B1/ko active Active
- 2012-05-01 WO PCT/EP2012/057959 patent/WO2012146789A1/en not_active Ceased
- 2012-05-01 JP JP2014506912A patent/JP5787331B2/ja active Active
- 2012-05-01 KR KR1020137031510A patent/KR101614475B1/ko active Active
- 2012-05-01 CN CN201280032577.XA patent/CN103649837B/zh not_active Expired - Fee Related
- 2012-05-01 WO PCT/EP2012/057955 patent/WO2012146788A1/en not_active Ceased
- 2012-05-01 CN CN201710164697.XA patent/CN106896650A/zh active Pending
-
2015
- 2015-09-11 US US14/850,997 patent/US9575418B2/en not_active Ceased
-
2019
- 2019-02-21 US US16/281,179 patent/USRE48903E1/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6573520B1 (en) * | 1999-03-26 | 2003-06-03 | Hitachi, Ltd. | Electron beam lithography system |
Also Published As
| Publication number | Publication date |
|---|---|
| US20130034421A1 (en) | 2013-02-07 |
| KR20180031082A (ko) | 2018-03-27 |
| KR101614475B1 (ko) | 2016-04-21 |
| KR20160047590A (ko) | 2016-05-02 |
| JP2014513429A (ja) | 2014-05-29 |
| JP5787331B2 (ja) | 2015-09-30 |
| CN103649837B (zh) | 2017-04-12 |
| TW201250402A (en) | 2012-12-16 |
| JP2014514769A (ja) | 2014-06-19 |
| EP2702452B1 (en) | 2016-08-03 |
| JP5805851B2 (ja) | 2015-11-10 |
| WO2012146788A1 (en) | 2012-11-01 |
| KR20140025495A (ko) | 2014-03-04 |
| USRE48903E1 (en) | 2022-01-25 |
| US20130044305A1 (en) | 2013-02-21 |
| CN106919006A (zh) | 2017-07-04 |
| KR101892460B1 (ko) | 2018-08-28 |
| US8936994B2 (en) | 2015-01-20 |
| US20160004173A1 (en) | 2016-01-07 |
| KR101607618B1 (ko) | 2016-04-11 |
| TW201250403A (en) | 2012-12-16 |
| US9176397B2 (en) | 2015-11-03 |
| TWI486723B (zh) | 2015-06-01 |
| TWI514089B (zh) | 2015-12-21 |
| CN103649837A (zh) | 2014-03-19 |
| WO2012146789A1 (en) | 2012-11-01 |
| CN106896650A (zh) | 2017-06-27 |
| KR20140041501A (ko) | 2014-04-04 |
| US9575418B2 (en) | 2017-02-21 |
| EP2702452A1 (en) | 2014-03-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106919006B (zh) | 光刻系统、在光刻系统内转移基板的装置及方法 | |
| US8895943B2 (en) | Lithography system and method of processing substrates in such a lithography system | |
| CN100550285C (zh) | 用于离子束注入器的工件转移系统 | |
| KR102108312B1 (ko) | 기판 처리 장치 및 방법 | |
| JP2026061081A (ja) | 基板搬送モジュール及び基板搬送モジュールの運用方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20190702 Address after: Holland Weide Eindhoven Applicant after: ASML Holding N.V Address before: About Holland Applicant before: MAPPER LITHOGRAPHY IP B.V. |
|
| TA01 | Transfer of patent application right | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200313 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |