CN106717138A - 具有受约束焊料互连垫的电路板 - Google Patents

具有受约束焊料互连垫的电路板 Download PDF

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Publication number
CN106717138A
CN106717138A CN201580048951.9A CN201580048951A CN106717138A CN 106717138 A CN106717138 A CN 106717138A CN 201580048951 A CN201580048951 A CN 201580048951A CN 106717138 A CN106717138 A CN 106717138A
Authority
CN
China
Prior art keywords
solder
opening
pad
circuit board
forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201580048951.9A
Other languages
English (en)
Chinese (zh)
Inventor
罗登·托帕西欧
安德鲁·Kw·莱昂
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ATI Technologies ULC
Original Assignee
ATI Technologies ULC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ATI Technologies ULC filed Critical ATI Technologies ULC
Publication of CN106717138A publication Critical patent/CN106717138A/zh
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
    • H01L23/49816—Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49822—Multilayer substrates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
    • H01L23/49894—Materials of the insulating layers or coatings
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161—Disposition
    • H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321—Disposition
    • H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732—Location after the connecting process
    • H01L2224/73201—Location after the connecting process on the same surface
    • H01L2224/73203—Bump and layer connectors
    • H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49827—Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151—Die mounting substrate
    • H01L2924/153—Connection portion
    • H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Geometry (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Wire Bonding (AREA)
  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
CN201580048951.9A 2014-10-31 2015-10-07 具有受约束焊料互连垫的电路板 Pending CN106717138A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/529,859 US10431533B2 (en) 2014-10-31 2014-10-31 Circuit board with constrained solder interconnect pads
US14/529,859 2014-10-31
PCT/CA2015/051015 WO2016065460A1 (en) 2014-10-31 2015-10-07 Circuit board with constrained solder interconnect pads

Publications (1)

Publication Number Publication Date
CN106717138A true CN106717138A (zh) 2017-05-24

Family

ID=55853496

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201580048951.9A Pending CN106717138A (zh) 2014-10-31 2015-10-07 具有受约束焊料互连垫的电路板

Country Status (6)

Country Link
US (1) US10431533B2 (enExample)
EP (1) EP3213609A4 (enExample)
JP (2) JP2017538280A (enExample)
KR (1) KR102310979B1 (enExample)
CN (1) CN106717138A (enExample)
WO (1) WO2016065460A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11640934B2 (en) * 2018-03-30 2023-05-02 Intel Corporation Lithographically defined vertical interconnect access (VIA) in dielectric pockets in a package substrate
US11804440B2 (en) * 2021-01-28 2023-10-31 Globalfoundries U.S. Inc. Chip module with robust in-package interconnects
KR20240001780A (ko) 2022-06-27 2024-01-04 삼성전자주식회사 반도체 패키지

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6057222A (en) * 1995-12-21 2000-05-02 Siemens Aktiengesellschaft Method for the production of flip-chip mounting-ready contacts of electrical components
US6717262B1 (en) * 2000-02-08 2004-04-06 Fujitsu Limited Mounted circuit substrate and method for fabricating the same for surface layer pads that can withstand pad erosion by molten solder applied over a plurality of times
US20040238953A1 (en) * 2003-05-30 2004-12-02 Masood Murtuza Built-up bump pad structure and method for same
CN102687604A (zh) * 2009-11-12 2012-09-19 Ati科技无限责任公司 带有偏移通孔的电路板
TW201424482A (zh) * 2012-11-27 2014-06-16 日本特殊陶業股份有限公司 配線基板

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US5471090A (en) 1993-03-08 1995-11-28 International Business Machines Corporation Electronic structures having a joining geometry providing reduced capacitive loading
WO1995030276A1 (de) 1994-05-02 1995-11-09 Siemens Matsushita Components Gmbh & Co. Kg Verkapselung für elektronische bauelemente
US5796589A (en) 1995-12-20 1998-08-18 Intel Corporation Ball grid array integrated circuit package that has vias located within the solder pads of a package
US5759910A (en) 1996-12-23 1998-06-02 Motorola, Inc. Process for fabricating a solder bump for a flip chip integrated circuit
US5859474A (en) 1997-04-23 1999-01-12 Lsi Logic Corporation Reflow ball grid array assembly
KR100345035B1 (ko) * 1999-11-06 2002-07-24 한국과학기술원 무전해 도금법을 이용한 고속구리배선 칩 접속용 범프 및 ｕｂｍ 형성방법
US6774474B1 (en) 1999-11-10 2004-08-10 International Business Machines Corporation Partially captured oriented interconnections for BGA packages and a method of forming the interconnections
JP2002026500A (ja) 2000-07-05 2002-01-25 Ngk Spark Plug Co Ltd 配線基板
KR100426897B1 (ko) * 2001-08-21 2004-04-30 주식회사 네패스 솔더 터미널 및 그 제조방법
US7335995B2 (en) 2001-10-09 2008-02-26 Tessera, Inc. Microelectronic assembly having array including passive elements and interconnects
TW572361U (en) 2003-06-03 2004-01-11 Via Tech Inc Flip-chip package carrier
US7367489B2 (en) 2003-07-01 2008-05-06 Chippac, Inc. Method and apparatus for flip chip attachment by post collapse re-melt and re-solidification of bumps
JP2005109187A (ja) * 2003-09-30 2005-04-21 Tdk Corp フリップチップ実装回路基板およびその製造方法ならびに集積回路装置
EP1720794A2 (en) 2004-03-01 2006-11-15 Tessera, Inc. Packaged acoustic and electromagnetic transducer chips
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KR100556351B1 (ko) * 2004-07-27 2006-03-03 동부아남반도체 주식회사 반도체 소자의 금속 패드 및 금속 패드 본딩 방법
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JP5193503B2 (ja) * 2007-06-04 2013-05-08 新光電気工業株式会社 貫通電極付き基板及びその製造方法
US7670939B2 (en) 2008-05-12 2010-03-02 Ati Technologies Ulc Semiconductor chip bump connection apparatus and method
CN102802344B (zh) 2008-09-30 2015-06-17 揖斐电株式会社 多层印刷线路板以及多层印刷线路板的制造方法
KR101022942B1 (ko) 2008-11-12 2011-03-16 삼성전기주식회사 흐름 방지용 댐을 구비한 인쇄회로기판 및 그 제조방법
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6057222A (en) * 1995-12-21 2000-05-02 Siemens Aktiengesellschaft Method for the production of flip-chip mounting-ready contacts of electrical components
US6717262B1 (en) * 2000-02-08 2004-04-06 Fujitsu Limited Mounted circuit substrate and method for fabricating the same for surface layer pads that can withstand pad erosion by molten solder applied over a plurality of times
US20040238953A1 (en) * 2003-05-30 2004-12-02 Masood Murtuza Built-up bump pad structure and method for same
CN102687604A (zh) * 2009-11-12 2012-09-19 Ati科技无限责任公司 带有偏移通孔的电路板
TW201424482A (zh) * 2012-11-27 2014-06-16 日本特殊陶業股份有限公司 配線基板

Also Published As

Publication number Publication date
JP2021185619A (ja) 2021-12-09
US20160126171A1 (en) 2016-05-05
JP7301919B2 (ja) 2023-07-03
EP3213609A1 (en) 2017-09-06
JP2017538280A (ja) 2017-12-21
US10431533B2 (en) 2019-10-01
KR20170078597A (ko) 2017-07-07
EP3213609A4 (en) 2018-07-04
KR102310979B1 (ko) 2021-10-08
WO2016065460A1 (en) 2016-05-06

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SE01 Entry into force of request for substantive examination
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RJ01 Rejection of invention patent application after publication
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Application publication date: 20170524