CN105466739B - 具有样品调整控制器的光电子能谱设备 - Google Patents
具有样品调整控制器的光电子能谱设备 Download PDFInfo
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- CN105466739B CN105466739B CN201410459518.1A CN201410459518A CN105466739B CN 105466739 B CN105466739 B CN 105466739B CN 201410459518 A CN201410459518 A CN 201410459518A CN 105466739 B CN105466739 B CN 105466739B
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- 238000001420 photoelectron spectroscopy Methods 0.000 title claims abstract description 19
- 230000033001 locomotion Effects 0.000 claims description 24
- 238000004458 analytical method Methods 0.000 claims description 5
- 230000005540 biological transmission Effects 0.000 claims description 5
- 238000001816 cooling Methods 0.000 claims description 2
- 210000000515 tooth Anatomy 0.000 claims 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 13
- 229910052802 copper Inorganic materials 0.000 description 13
- 239000010949 copper Substances 0.000 description 13
- 239000000463 material Substances 0.000 description 13
- 238000010586 diagram Methods 0.000 description 12
- 230000006978 adaptation Effects 0.000 description 6
- 239000000919 ceramic Substances 0.000 description 6
- 239000007789 gas Substances 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 229910001220 stainless steel Inorganic materials 0.000 description 6
- 239000010935 stainless steel Substances 0.000 description 6
- 230000005284 excitation Effects 0.000 description 5
- 239000007788 liquid Substances 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- 230000005389 magnetism Effects 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 230000005622 photoelectricity Effects 0.000 description 2
- 238000005211 surface analysis Methods 0.000 description 2
- 238000004441 surface measurement Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 239000000446 fuel Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000000314 lubricant Substances 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000009738 saturating Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- -1 superconduction Body Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Abstract
Description
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201410459518.1A CN105466739B (zh) | 2014-09-10 | 2014-09-10 | 具有样品调整控制器的光电子能谱设备 |
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CN201410459518.1A CN105466739B (zh) | 2014-09-10 | 2014-09-10 | 具有样品调整控制器的光电子能谱设备 |
Publications (2)
Publication Number | Publication Date |
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CN105466739A CN105466739A (zh) | 2016-04-06 |
CN105466739B true CN105466739B (zh) | 2018-05-04 |
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CN201410459518.1A Expired - Fee Related CN105466739B (zh) | 2014-09-10 | 2014-09-10 | 具有样品调整控制器的光电子能谱设备 |
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CN (1) | CN105466739B (zh) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2019232779A1 (zh) * | 2018-06-08 | 2019-12-12 | 立盟系统科技股份有限公司 | 样品调整控制装置 |
CN110961171B (zh) * | 2018-09-30 | 2021-11-02 | 中国科学院上海微系统与信息技术研究所 | 低温样品支架 |
CN113030141A (zh) * | 2021-02-26 | 2021-06-25 | 上海交通大学 | 一种用于真空腔的样品位置保持装置 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3166638B2 (ja) * | 1996-11-29 | 2001-05-14 | 株式会社島津製作所 | 蛍光x線分析装置 |
CN2403016Y (zh) * | 1999-12-24 | 2000-10-25 | 中国科学院沈阳科学仪器研制中心 | 高精密五维微调样品架 |
CN2496827Y (zh) * | 2001-07-06 | 2002-06-26 | 中国科学院等离子体物理研究所 | 超高真空下运送机构 |
ITVA20030037A1 (it) * | 2003-10-07 | 2005-04-08 | Stmicroelettronics Srl | Spettroscopio elettronico con emissione di elettroni indotta da fascio elettronico monocromatico. |
JP4453821B2 (ja) * | 2004-03-31 | 2010-04-21 | 株式会社リガク | 微小試料装着構造とその方法 |
CN1995996B (zh) * | 2006-12-27 | 2011-04-20 | 中国科学院物理研究所 | 一种准连续或连续激光角分辨光电子能谱分析装置 |
CN201107035Y (zh) * | 2007-10-17 | 2008-08-27 | 深圳市新三思材料检测有限公司 | 变形测量装置 |
CN201159722Y (zh) * | 2008-02-02 | 2008-12-03 | 丹东方圆仪器有限公司 | X射线衍射仪用多功能样品架 |
CN101439843B (zh) * | 2008-10-10 | 2011-08-31 | 北京大学 | 一种微型原子气室封装工艺方法 |
CN101672749B (zh) * | 2009-09-28 | 2011-02-02 | 北京航空航天大学 | 材料表面变形测试装置及测试方法 |
CN103217333A (zh) * | 2013-04-14 | 2013-07-24 | 中国科学院合肥物质科学研究院 | 动态液态金属环境下实现精确变形测量的蠕变实验装置及方法 |
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Address after: 200233 Shanghai city 7 Xuhui District Guiqin Road No. 3 Building 5 floor Applicant after: GUANYAN (SHANGHAI) PATENT TECHNOLOGY CO.,LTD. Address before: 200233 Shanghai city 7 Xuhui District Guiqin Road No. 3 Building 5 floor Applicant before: GAINIA (SHANGHAI) INTELLECTUAL ASSET SERVICES, Inc. |
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Effective date of registration: 20210726 Address after: Room 219 hall 53 Industrial Research Institute No 195 section 4 Zhongxing Road Zhudong Town Hsinchu County Taiwan China Patentee after: GAINIA INTELLECTUAL ASSET SERVICES, Inc. Address before: 200233 floor 5, building 3, No. 7 Guizhu Road, Xuhui District, Shanghai Patentee before: GUANYAN (SHANGHAI) PATENT TECHNOLOGY Co.,Ltd. |
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