CN105466962B - 具有无氧铜材料的样品调整控制器 - Google Patents
具有无氧铜材料的样品调整控制器 Download PDFInfo
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- CN105466962B CN105466962B CN201410457812.9A CN201410457812A CN105466962B CN 105466962 B CN105466962 B CN 105466962B CN 201410457812 A CN201410457812 A CN 201410457812A CN 105466962 B CN105466962 B CN 105466962B
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CN201410457812.9A CN105466962B (zh) | 2014-09-10 | 2014-09-10 | 具有无氧铜材料的样品调整控制器 |
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CN201410457812.9A CN105466962B (zh) | 2014-09-10 | 2014-09-10 | 具有无氧铜材料的样品调整控制器 |
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CN105466962A CN105466962A (zh) | 2016-04-06 |
CN105466962B true CN105466962B (zh) | 2018-04-06 |
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Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2319835A (en) * | 1996-11-29 | 1998-06-03 | Shimadzu Corp | Fluorescent x-ray analyser having an evacuable chamber with selectable large and small cover cases |
CN2403016Y (zh) * | 1999-12-24 | 2000-10-25 | 中国科学院沈阳科学仪器研制中心 | 高精密五维微调样品架 |
WO2005033683A1 (en) * | 2003-10-07 | 2005-04-14 | Stmicroelectronics S.R.L. | Electron spectroscope with emission induced by a monochromatic electron beam |
JP2005291817A (ja) * | 2004-03-31 | 2005-10-20 | Rigaku Corp | 微小試料挿入容器、微小試料装着治具、x線回折装置、微小試料挿入容器の形成方法、および微小試料装着方法 |
CN2837831Y (zh) * | 2005-11-11 | 2006-11-15 | 中国科学院物理研究所 | 新型超高真空原位生长、表征和测试系统 |
CN201107035Y (zh) * | 2007-10-17 | 2008-08-27 | 深圳市新三思材料检测有限公司 | 变形测量装置 |
CN201159722Y (zh) * | 2008-02-02 | 2008-12-03 | 丹东方圆仪器有限公司 | X射线衍射仪用多功能样品架 |
CN101439843A (zh) * | 2008-10-10 | 2009-05-27 | 北京大学 | 一种微型原子气室封装设备及工艺技术方法 |
CN101672749A (zh) * | 2009-09-28 | 2010-03-17 | 北京航空航天大学 | 材料表面变形测试装置及测试方法 |
CN103217333A (zh) * | 2013-04-14 | 2013-07-24 | 中国科学院合肥物质科学研究院 | 动态液态金属环境下实现精确变形测量的蠕变实验装置及方法 |
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- 2014-09-10 CN CN201410457812.9A patent/CN105466962B/zh not_active Expired - Fee Related
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2319835A (en) * | 1996-11-29 | 1998-06-03 | Shimadzu Corp | Fluorescent x-ray analyser having an evacuable chamber with selectable large and small cover cases |
CN2403016Y (zh) * | 1999-12-24 | 2000-10-25 | 中国科学院沈阳科学仪器研制中心 | 高精密五维微调样品架 |
WO2005033683A1 (en) * | 2003-10-07 | 2005-04-14 | Stmicroelectronics S.R.L. | Electron spectroscope with emission induced by a monochromatic electron beam |
JP2005291817A (ja) * | 2004-03-31 | 2005-10-20 | Rigaku Corp | 微小試料挿入容器、微小試料装着治具、x線回折装置、微小試料挿入容器の形成方法、および微小試料装着方法 |
CN2837831Y (zh) * | 2005-11-11 | 2006-11-15 | 中国科学院物理研究所 | 新型超高真空原位生长、表征和测试系统 |
CN201107035Y (zh) * | 2007-10-17 | 2008-08-27 | 深圳市新三思材料检测有限公司 | 变形测量装置 |
CN201159722Y (zh) * | 2008-02-02 | 2008-12-03 | 丹东方圆仪器有限公司 | X射线衍射仪用多功能样品架 |
CN101439843A (zh) * | 2008-10-10 | 2009-05-27 | 北京大学 | 一种微型原子气室封装设备及工艺技术方法 |
CN101672749A (zh) * | 2009-09-28 | 2010-03-17 | 北京航空航天大学 | 材料表面变形测试装置及测试方法 |
CN103217333A (zh) * | 2013-04-14 | 2013-07-24 | 中国科学院合肥物质科学研究院 | 动态液态金属环境下实现精确变形测量的蠕变实验装置及方法 |
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Address after: 200233 Shanghai city 7 Xuhui District Guiqin Road No. 3 Building 5 floor Applicant after: GUANYAN (SHANGHAI) PATENT TECHNOLOGY CO.,LTD. Address before: 200233 Shanghai city 7 Xuhui District Guiqin Road No. 3 Building 5 floor Applicant before: GAINIA (SHANGHAI) INTELLECTUAL ASSET SERVICES, Inc. |
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