CN105376936A - 具有集成的功率电子电路系统和逻辑电路系统的模块 - Google Patents

具有集成的功率电子电路系统和逻辑电路系统的模块 Download PDF

Info

Publication number
CN105376936A
CN105376936A CN201510492902.6A CN201510492902A CN105376936A CN 105376936 A CN105376936 A CN 105376936A CN 201510492902 A CN201510492902 A CN 201510492902A CN 105376936 A CN105376936 A CN 105376936A
Authority
CN
China
Prior art keywords
power semiconductor
logic
semiconductor modular
circuit plate
printing circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201510492902.6A
Other languages
English (en)
Other versions
CN105376936B (zh
Inventor
陈柳
M·丁克尔
T·萨米南
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Publication of CN105376936A publication Critical patent/CN105376936A/zh
Application granted granted Critical
Publication of CN105376936B publication Critical patent/CN105376936B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/40Forming printed elements for providing electric connections to or between printed circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L24/19Manufacturing methods of high density interconnect preforms
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L24/20Structure, shape, material or disposition of high density interconnect preforms
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/14Structural association of two or more printed circuits
    • H05K1/148Arrangements of two or more hingeably connected rigid printed circuit boards, i.e. connected by flexible means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4697Manufacturing multilayer circuits having cavities, e.g. for mounting components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00Constructional details common to different types of electric apparatus
    • H05K7/02Arrangements of circuit components or wiring on supporting structure
    • H05K7/06Arrangements of circuit components or wiring on supporting structure on insulating boards, e.g. wiring harnesses
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/04105Bonding areas formed on an encapsulation of the semiconductor or solid-state body, e.g. bonding areas on chip-scale packages
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H01L2224/0601Structure
    • H01L2224/0603Bonding areas having different sizes, e.g. different heights or widths
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H01L2224/061Disposition
    • H01L2224/0618Disposition being disposed on at least two different sides of the body, e.g. dual array
    • H01L2224/06181On opposite sides of the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/12105Bump connectors formed on an encapsulation of the semiconductor or solid-state body, e.g. bumps on chip-scale packages
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/16227Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/16235Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a via metallisation of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L2224/23Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
    • H01L2224/25Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of a plurality of high density interconnect connectors
    • H01L2224/251Disposition
    • H01L2224/2518Disposition being disposed on at least two different sides of the body, e.g. dual array
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73267Layer and HDI connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/91Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
    • H01L2224/92Specific sequence of method steps
    • H01L2224/922Connecting different surfaces of the semiconductor or solid-state body with connectors of different types
    • H01L2224/9222Sequential connecting processes
    • H01L2224/92242Sequential connecting processes the first connecting process involving a layer connector
    • H01L2224/92244Sequential connecting processes the first connecting process involving a layer connector the second connecting process involving a build-up interconnect
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/191Disposition
    • H01L2924/19101Disposition of discrete passive components
    • H01L2924/19105Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007Types of components
    • H05K2201/10166Transistor
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0017Etching of the substrate by chemical or physical means

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

具有集成功率电子电路系统和逻辑电路系统的集成功率模块包括埋置功率半导体模块、多层逻辑印刷电路板和柔性连接,该埋置功率半导体模块包括被埋置在介电材料中的一个以上功率半导体裸片,该逻辑印刷电路板具有被装配至该逻辑印刷电路板的表面的一个以上逻辑裸片,该柔性连接被整体地形成在埋置功率半导体模块和逻辑印刷电路板之间。该柔性连接将埋置功率半导体模块机械地连接至逻辑印刷电路板,并且提供埋置功率半导体模块和逻辑印刷电路板之间的电气通路。一种制造该集成功率模块的方法也被提供。

Description

具有集成的功率电子电路系统和逻辑电路系统的模块
技术领域
本申请涉及功率电子电路系统,尤其是集成有逻辑电路系统的功率电子电路系统,该逻辑电路系统控制功率电路系统的运行。
背景技术
许多应用(比如,汽车应用和工业应用)使用功率电子电路系统,比如,绝缘栅双极型晶体管(InsulatedGateBipolarTransistor,IGBT)、功率金属氧化物半导体场效应晶体管(MetalOxideSemiconductorFieldEffectTransistor,MOSFET)、功率二极管等。例如,常见的功率电路包括单相半波整流器和多相半波整流器、单相全波整流器和多相全波整流器、电压调节器等。集成功率模块(IntegratedPowerModuleIPM)包括功率电子电路系统和逻辑电路系统两者,该逻辑电路系统用于控制功率电子电路系统的运行。在一些常规IPM中,功率裸片(芯片)被附接至功率电子基板,比如,直接键合铜(DirectBondedCopperDBC)、绝缘金属基板(InsulatedMetalSubstrate,IMS)或活泼金属铜焊(ActiveMetalBrazed,AMB)基板。逻辑裸片被表面装配至单独的逻辑印刷电路板。然后,功率电子基板通过刚性连接器被连接至该逻辑印刷电路板。在其他常规IPM中,连接机制并不是这么庞大。然而,功率裸片通常被表面装配至第二印刷电路板。在这两种IPM实施中,有效面积需要容纳各个部分,这增加了IPM的总体大小和成本。其他的常规IPM把功率半导体模块嵌入至逻辑印刷电路板之内。虽然该方法减少了实施IPM所需的面积,但其具有显著变多的过程步骤并且成本昂贵。因此,需要更小的、更简单的并且更具性价比的IPM解决方案。
发明内容
根据一种使功率电子电路系统和逻辑电路系统互相连接的方法的实施例,该方法包括:提供多层的逻辑印刷电路板和埋置功率半导体模块,该埋置功率半导体模块包括被埋置在介电材料之中的一个以上功率半导体裸片;将该一个以上逻辑裸片装配至逻辑印刷电路板的表面;并且在埋置功率半导体模块和逻辑印刷电路板之间形成整体的柔性连接,该整体的柔性连接将埋置功率半导体模块机械地连接至逻辑印刷电路板,并提供埋置功率半导体模块和逻辑印刷电路板之间的电气通路。
根据一种集成功率模块的实施例,该模块包括埋置功率半导体模块、多层逻辑印刷电路板和柔性连接,该埋置功率半导体模块包括被埋置在介电材料中的一个以上功率半导体裸片,该多层逻辑印刷电路板具有被装配至该逻辑印刷电路板的表面的一个以上逻辑裸片,并且该柔性连接被整体地形成在埋置功率半导体模块和逻辑印刷电路板之间。该柔性连接将埋置功率半导体模块机械地连接至逻辑印刷电路板,并且提供埋置功率半导体模块和逻辑印刷电路板之间的电气通路。
通过阅读下面的具体实施方式以及参看附图,本领域的技术人员将能认识到其他的特征和优点。
附图说明
附图中的元件不一定是彼此相对成比例的。相似的附图标记指相应的类似部件。各种所示实施例的特征能够被结合,除非其彼此排斥。实施例在附图中被示出,并且在接下来的具体实施方式中进行了详细说明。
图1示出了集成功率模块的一个实施例的剖视图,该集成功率模块具有被整体地形成在埋置功率半导体模块和逻辑印刷电路板之间柔性连接;
图2示出了集成功率模块的另一个实施例的剖视图,该集成功率模块具有被整体地形成在埋置功率半导体模块和逻辑印刷电路板之间的柔性连接;
图3A至图3D、图4A和图4B以及图5至图10示出了使用集成功率模块来使功率电子电路系统与逻辑电路系统互相连接的方法的一个实施例的不同阶段;
图11示出了集成功率模块的另一个实施例的剖视图,该集成功率模块具有被整体地形成在埋置功率半导体模块和逻辑印刷电路板之间柔性连接;
图12示出了集成功率模块的另一个实施例的剖视图,该集成功率模块具有被整体地形成在埋置功率半导体模块和逻辑印刷电路板之间柔性连接;
图13示出了集成功率模块的又一个实施例的剖视图,该集成功率模块具有被整体地形成在埋置功率半导体模块和逻辑印刷电路板之间柔性连接;
图14至图17示出了使用集成功率模块来使功率电子电路系统与逻辑电路系统互相连接的方法的另一个实施例的不同阶段。
具体实施方式
本文中所描述的实施例提供了具有被整体地形成在埋置功率半导体模块和逻辑印刷电路板(PCB)之间柔性连接的IPM(集成功率模块。PCB使用由层压在非导电的基板材料之上的铜片(箔)蚀刻形成的导电的轨(痕)、焊盘和其他特征,机械地支撑和电连接电子部件。PCB可以是单面的(例如,一个铜层)、双面的(例如,两个铜层)或多层的。在不同层上的导体与电镀孔通孔(via)、激光钻孔的微通孔、导电胶通孔(例如,ALIVH、B2it)等被连接。先进的PCB可包括被埋置在PCB树脂材料中和/或被装配至PCB表面的部件(比如,电容器、电阻器或有源器件)。在每种情况下,IPM的逻辑PCB包括用于控制埋置功率半导体模块的功率电路系统的逻辑电路系统。IPM的柔性连接将埋置功率半导体模块机械地连接至逻辑印刷电路板,并且提供该埋置功率半导体模块和该逻辑印刷电路板之间的电气通路。本文中所描述的IPM解决方案通过使用例如柔性的互相连接技术(比如,柔性的FR-4、柔性的PCB技术、柔性的印刷电路(FCP)技术等),允许高密度逻辑PCB与埋置功率技术的结合。
图1示出了一个IPM的实施例的剖视图。根据该实施例,IPM包括埋置功率半导体模块100、多层逻辑印刷电路板(PCB)102和柔性连接104,柔性连接104被整体地形成在埋置功率半导体模块100和逻辑PCB102之间。由于模块100包括被埋置在介电材料108中的一个以上功率半导体裸片106,因此功率半导体模块100是“埋置模块”。被包括在功率半导体模块100中的功率半导体裸片106可包括任何类型的功率半导体器件,比如垂直电流功率晶体管、横向功率晶体管、分立智能功率晶体管、功率二极管等。在一个实施例中,埋置功率半导体模块100包括金属块110,功率半导体裸片106被附接至金属块110。金属块110和功率半导体裸片106被埋置在介电材料108中。在一个实施例中,功率半导体模块100的介电材料108作为层压过程的部分被形成,该层压过程被用来制造IPM。在另一个实施例中,埋置功率半导体模块100在PCB处理期间被嵌入至逻辑PCB102之中。另一种其他类型的埋置功率半导体模块可以被使用。
另外的有源部件和/或无源部件112可被装配至埋置功率半导体模块100的表面101。另外的部件112可通过图案化的金属箔114和导电通孔116被电连接至功率半导体裸片106,金属箔114位于埋置功率半导体模块100的装配表面101,导电通孔116在图案化的金属箔114和功率半导体裸片106之间延伸。在一个实施例中,IPM模块通过层压过程被形成,并且图案化的金属箔114是被层压在埋置功率半导体模块100和多层逻辑PCB102之上的最上面的层压基板的部分。用于控制功率半导体裸片106的运行的一个以上逻辑裸片118以及对应的无源部件120被装配至逻辑PCB102的外部表面103。例如,逻辑裸片118和无源部件120可以是表面装配技术(SurfaceMountTechnologySMT)器件。逻辑裸片118可包括用于控制功率半导体裸片106的运行的任何类型的电子器件(比如,控制器、驱动器等)。
在任何情况下,被整体地形成在埋置功率半导体模块100和逻辑PCB102之间的柔性连接104机械地将埋置功率半导体模块100连接至逻辑PCB102,并且还提供埋置功率半导体模块100和逻辑PCB102之间的电气通路。柔性连接104“被整体地形成”在埋置功率半导体模块100和逻辑PCB102之间,因此柔性连接104不易与埋置功率半导体模块100或逻辑PCB102分离。相反地,在IPM制造过程期间,柔性连接104变成埋置功率半导体模块100和逻辑PCB102的整体部分或组成部分。在一个实施例中,IPM通过本文中稍后将更详细描述的层压过程被形成,并且柔性连接104包括被层压至埋置功率半导体模块100和逻辑PCB102的层压基板。根据此实施例,由该整体的柔性连接所提供的电气通路由被布置在该层压基板的介电材料124上的金属箔122所形成。热沉或板126可在埋置功率半导体模块100下方被附接至金属箔122,例如用来提升在IPM的此区域中的散热,或提供与另外的组件的连接。
通常地,整体的柔性连接104可具有例如通过层压层压板和铜层被形成的一个以上电连接层。整体的柔性连接104桥接了埋置功率半导体模块100和逻辑PCB102之间的间隙或空间,并且提供功率模块100和逻辑PCB102之间的柔性机械连接和电连接。整体的柔性连接104可根据IPM所被使用的应用,以各种配置被弯曲。例如在图1中,整体的柔性连接104被弯曲,从而逻辑PCB102处于一个平面(A),并且埋置功率半导体模块100处于不同的平面(B)。在一个实施例中,柔性连接104被弯曲,从而如图1中所示的,平面A和平面B垂直。
图2示出了另一个IPM的实施例的剖视图。图2中所示的实施例类似于图1中所示的实施例。然而不同的是,整体的柔性连接104是弯曲的,从而逻辑PCB102被放置在埋置功率半导体模块100之上。也即,平面A和平面B平行,但彼此以一定距离间隔开。根据此实施例,柔性连接104是弯曲的,从而被装配至逻辑PCB102的表面103的逻辑裸片118朝向埋置功率半导体模块100。在又一个实施例中,整体的柔性连接104以与图2中所示的相反方式被弯曲,从而逻辑PCB102被放置在埋置功率半导体模块100的下方,并且被装配至逻辑PCB102的逻辑裸片118远离埋置功率半导体模块100。
图3至图11示出了一个制造图1和图2中所示的IPM的实施例。根据此实施例,位于埋置功率半导体模块100和逻辑PCB102之间的整体柔性连接104通过提供层压板被形成,该层压板包括被布置在第一层压基板和第二层压基板之间的逻辑PCB102和埋置功率半导体模块100,从而介电填充的间隙存在于逻辑PCB102和功率半导体模块100之间。然后,该层压板在该介电填充间隙的区域处被薄化,从而该层压板的薄化区域形成该整体的柔性连接。
图3包括图3A至图3D,示出了不同的示例性的逻辑PCB和功率模块,该逻辑PCB和功率模块是用于IPM的开始的芯材料。图3A示出了示例性的2层的逻辑PCB芯200,逻辑PCB芯200包括顶层金属箔和底层金属箔202、204(比如,铜箔)以及中间的树脂型介电材料206(比如,聚四氟乙烯、FR-4、FR-1、CEM-1、CEM-3、聚酰亚胺、液晶高聚物等)。图3B示出了示例性的4层的逻辑PCB芯210,逻辑PCB芯210包括顶层金属箔和底层金属箔212、214(比如,铜箔)以及被树脂型介电材料220(比如,聚四氟乙烯、FR-4、FR-1、CEM-1、CEM-3、聚酰亚胺、液晶高聚物等)分开的两层中间的金属箔216、218。仅为简化例证和说明,IPM制造过程参考图3A中所示的示例性的2层逻辑PCB芯200进行说明。通常地,任何高密度的逻辑PCB芯可被使用。图3C示出了用于实施功率半导体模块100的示例性的功率模块芯230的侧视图,并且图3D示出了对应的顶部平面图。功率模块芯230包括金属块232(比如,铜块),功率半导体裸片106被附接至金属块232。如图3D中所示,功率模块芯230可包括用于不止一个最终IPM的功率半导体裸片106。逻辑PCB芯200/210的厚度(Tlogic)等于功率模块芯230的金属块232和功率半导体裸片106的总厚度(Tpower)。
图4包括图4A和图4B,示出了逻辑PCB芯200,逻辑PCB芯200被放置为邻近各自的功率模块芯230,以形成适合于后面的处理步骤的制造面板240。图4A示出了该布置的顶部平面图,并且图4B示出了沿着图4A中标示为I-II的直线的对应剖视图。
图5示出了被布置在第一层压基板242上的面板240,面板240具有逻辑PCB芯200和功率模块芯230,从而介电填充间隙244保留在各自的逻辑PCB芯200和功率模块芯230之间。根据此实施例,位于逻辑PCB芯200和功率模块芯230之间的间隙244被填充以逻辑PCB芯200的介电材料206。第二层压基板246被类似地布置在逻辑PCB芯200和功率模块芯230上,以形成堆叠,该堆叠包括被嵌入在第一层压基板和第二层压基板242、246之间的逻辑PCB芯和功率模块芯200、230。层压基板242和246可包括被层压有各金属箔248、250的任何标准的介电质247、249(比如,聚四氟乙烯、FR-4、FR-1、CEM-1、CEM-3、聚酰亚胺、液晶高聚物等)。
图6示出了层压之后的该堆叠。层压包括将该堆叠置于压力中,并持续一段时间施加压力和热。该层压过程产生不可分割的整片的层压板252,层压板252可被钻孔、电镀、蚀刻等,以如图6中所示的在层压板252的底层金属箔和顶层金属箔248、250上形成痕(trace)。功率部分和逻辑部分被集成在一起,并且由被层压在一起的不同的逻辑PCB芯和功率模块芯200、230形成。在一个实施例中,第二层压基板246的金属箔250被蚀刻,以形成接触焊盘,用于将逻辑裸片118装配至各逻辑PCB102的表面103。第二层压基板246的金属箔250还可在不同的区域处被蚀刻,以在各埋置功率半导体模块100上形成外部连接,用于电连接至被埋置在各模块100中的功率半导体裸片106。第一层压基板242的金属箔248也可被蚀刻以为位于每个IPM的埋置功率半导体模块100和对应的PCB102之间的整体的柔性连接104形成导电痕。
图7示出了在各埋置功率半导体模块100和对应的PCB102之间形成整体的柔性连接104期间的层压板。标准的精密铣削(比如,机械铣削)可被用于如图7中朝下的箭头所指示的薄化层压板252和形成柔性连接104。例如,通过铣穿逻辑PCB芯200的位于介电填充间隙244的区域处的第二层压基板246和介电(树脂)材料206,层压板252可在位于各自的功率半导体模块100和逻辑PCB102之间的介电填充间隙244的区域处被变薄。
图8示出了在整体的柔性连接104被形成之后的层压板252。根据此实施例,第一层压基板242的介电材料247的至少一些保留在各自的功率半导体模块100和逻辑PCB102之间。第一层压基板242的剩余介电材料247和第一层压基板242的被蚀刻金属箔248在每个IPM的埋置功率半导体模块100和逻辑PCB102之间形成整体的柔性连接104。由每个整体的柔性连接104所提供的电气通路由第一层压基板242的被蚀刻的金属箔(例如,铜箔)248形成。
图9示出了在单独的IPM的分离(单个化)期间的层压板252。任何标准的层压板单个化过程可被用来如图9中向下的箭头所示的使IPM分离(比如,铣削、切割、锯切等)。
图10示出了在分离(单个化)过程之后的IPM中的一个。被整体地形成在埋置功率半导体模块100和逻辑PCB102之间的柔性连接104将埋置模块100机械连接至逻辑PCB102,并且如本文中先前所描述地提供埋置模块100和逻辑PCB102之间的电气通路。例如如图1和图2中所示的,逻辑裸片118和任何另外的部件120可在逻辑PCB102的顶表面103上被装配至图案化金属箔250,并且另外的部件112可在埋置功率半导体模块100之上被装配至相同的图案化金属箔250。
图11示出了另一个IPM的实施例的剖视图。根据此实施例,埋置功率半导体模块100作为层压过程的部分被形成,该层压过程被用来制造逻辑PCB102。位于埋置功率半导体模块100和逻辑PCB102之间的整体柔性连接104通过标准的精密铣削被形成,该精密铣削包括使在埋置功率半导体裸片106的逻辑PCB102之间的区域244处的层压板变薄。
图12和图13示出了IPM另一个实施例的剖视图。除了不同的连接至被包在埋置功率半导体模块100之内的功率半导体裸片106的电连接被形成,在图11-13中所示的实施例是类似的。通常地,通过在半导体封装领域中的标准实施,图案化层压基板的对应金属箔并且形成对应的通孔连接,任何期望的电连接可被形成在埋置功率半导体模块100和逻辑PCB102之内以及在功率半导体裸片106和逻辑PCB102之间。
图14至图17示出了另一个制造IPM的实施例。根据此实施例,埋置功率半导体模块100是预层压的镶嵌模块。位于埋置功率半导体模块100和逻辑PCB102之间的整体柔性连接104通过提供层压板被形成,该层压板包括位于第一层压基板和第二层压基板中间的逻辑PCB102和被嵌入的埋置功率半导体模块100,从而介电填充间隙存在于逻辑PCB102和功率模块嵌体100之间。然后,该层压板在该介电填充间隙的区域处被薄化,从而该层压板的薄化区域形成该整体的柔性连接104。
图14示出了面板300,面板300具有被布置在第一层压基板304上的预层压的功率半导体基板嵌体302和相应的逻辑PCB芯200,从而介电填充间隙244保留在各逻辑PCB芯200和功率半导体模块嵌体302之间。根据此实施例,位于逻辑PCB芯200和功率半导体模块嵌体302之间的间隙244被填充以逻辑PCB芯200的介电材料206。第一层压基板304包括被层压有金属箔308的介电材料306(比如,聚四氟乙烯、FR-4、FR-1、CEM-1、CEM-3、聚酰亚胺、液晶高聚物等)。金属箔308可以被图案化,并且导电通孔310可从金属箔308延伸至介电材料306的相对侧面,以与功率半导体模块嵌体302和对应的逻辑PCB芯200形成期望的电连接。第二层压基板312被类似地布置在逻辑PCB芯200和功率半导体模块嵌体302上,以形成堆叠,该堆叠包括位于第一层压基板和第二层压基板304、312之间的逻辑PCB芯和功率半导体模块嵌体200、302。第二层压基板312包括被层压有金属箔316的介电材料314(比如,聚四氟乙烯、FR-4、FR-1、CEM-1、CEM-3、聚酰亚胺、液晶高聚物等)。金属箔316可以被图案化,并且导电通孔318可从金属箔316延伸至介电材料314的相对侧面,以与功率半导体模块嵌体302和各逻辑PCB芯200形成期望的电连接。层压基板304、312可包括被层压有一个以上各金属箔308、316的任何标准的介电质306、314(比如,聚四氟乙烯、FR-4、FR-1、CEM-1、CEM-3、聚酰亚胺、液晶高聚物等)。
图15示出了该堆叠被层压之后的结构。下金属箔和上金属箔308、316中的一个或两个可被图案化,并且相应的导电通孔310、318可延伸至金属320、322(嵌入的功率半导体模块302的对应末端320、322)。通过被嵌入的功率半导体模块302之内的各内部通孔连接326,连接至功率半导体裸片106上的端子324的电连接可被完成,功率半导体裸片106被埋置在被嵌入的功率半导体模块302之中。
图16示出了在铣穿了位于邻接的逻辑PCB102和被嵌入的功率半导体模块100之间的第二层压基板312和介电填充间隙244之后,并且在单独的IPM的分离(单个化)之后的层压结构。如本文先前所描述的,任何标准的铣削过程和分离(单个化)过程可被使用。
图17示出了在分离(单个化)过程之后的IPM中的一个。被整体地形成在功率半导体模块100和逻辑PCB102之间的柔性连接104将被嵌入的功率模块100机械连接至逻辑PCB102,并且如本文先前所描述的,提供被嵌入的功率模块100和逻辑PCB102之间的电气连接。逻辑裸片118和任何另外的部件120可在逻辑PCB102的顶表面上被装配至图案化金属箔316,并且如果需要,另外的部件112(图17中未示出)可在被嵌入的功率半导体模块100之上被装配至相同的图案化金属箔316。
本文所描述的IPM使用整体的柔性连接方法将高密度逻辑PCB与埋置功率半导体模块结合,这允许3D系统设计(例如,折叠、堆叠),通过使用单个PCB板的构思简化了装配过程,降低了总成本,同时为高密度PCB和埋置功率半导体模块提供了单独的优化技术,并且允许IPM模块的微型化(缩小)。
空间相关术语比如“下(under、below、lower)”、“上(over、upper)”等被用于简化描述,以解释一个元件相对于第二元件的定位。这些术语旨在涵盖除那些在附图中所示出的不同方位之外的封装的不同方位。此外,术语比如“第一(first)”、“第二(second)”等也被用于描述各种元件、区域、部分等,并且也并非意在限制。贯穿整个描述同样的术语指同样的元件。
如本文所用,术语“具有(having)”、“包括(containing、including、comprising)”等是开放式术语,表示所陈述的元件或特征的存在,但并不排除其它的元件或特征。冠词“一(a或an)”和“该(the)”旨在包括复数形式以及单数形式,除非上下文另有明确说明。
考虑以上所述的变化和应用,应当理解的是,本发明既不受前述具体实施方式的限制,也不受附图限制。相反,本发明仅由下述权利要求及其等同物限制。

Claims (21)

1.一种使功率电子电路系统与逻辑电路系统互相连接的方法,所述方法包括:
提供多层逻辑印刷电路板和埋置功率半导体模块,所述埋置功率半导体模块包括被埋置在介电材料中的一个以上功率半导体裸片;
将一个以上逻辑裸片装配至所述逻辑印刷电路板的表面;以及
在所述埋置功率半导体模块和所述逻辑印刷电路板之间形成整体的柔性连接,所述整体的柔性连接将所述埋置功率半导体模块机械地连接至所述逻辑印刷电路板,并且提供所述埋置功率半导体模块和所述逻辑印刷电路板之间的电气通路。
2.如权利要求1所述的方法,进一步包括:
使所述整体的柔性连接弯曲,从而所述逻辑印刷电路板与所述埋置功率半导体模块处于不同的平面中。
3.如权利要求2所述的方法,
其中所述整体的柔性连接被弯曲,从而所述逻辑印刷电路板处于垂直于所述埋置功率半导体模块所处于的平面的平面。
4.如权利要求1所述的方法,进一步包括:
使所述整体的柔性连接弯曲,从而所述逻辑印刷电路板被放置在所述埋置功率半导体模块之上或在所述埋置功率半导体模块之下。
5.如权利要求4所述的方法,
其中所述整体的柔性连接被弯曲,从而被装配至所述所述逻辑印刷电路板的所述表面的所述一个以上逻辑裸片朝向所述埋置功率半导体模块。
6.如权利要求1所述的方法,其中在所述埋置功率半导体模块和所述逻辑印刷电路板之间形成所述整体的柔性连接包括:
形成层压板,所述层压板包括位于第一层压基板和第二层压基板之间的所述逻辑印刷电路板和所述埋置功率半导体模块,位于所述逻辑印刷电路板和所述埋置功率半导体模块之间存在介电填充的间隙;
薄化位于所述介电填充间隙的区域中的所述层压板,从而所述层压板的所薄化的区域形成所述整体的柔性连接。
7.如权利要求6所述的方法,
其中由所述整体的柔性连接所提供的所述电气通路由所述第一层压基板的铜箔形成。
8.如权利要求6所述的方法,进一步包括:
蚀刻所述第二层压基板的、背离所述逻辑印刷电路板和所述埋置功率半导体模块的金属箔,以形成接触焊盘,所述接触焊盘用于将所述一个以上逻辑裸片装配至所述逻辑印刷电路板的所述表面。
9.如权利要求6所述的方法,进一步包括:
蚀刻所述第二层压基板的、背离所述逻辑印刷电路板和所述埋置功率半导体模块的金属箔,以在所述埋置功率半导体模块上形成用于被埋置在所述埋置功率半导体模块中的所述一个以上功率半导体裸片的外部电气连接。
10.如权利要求6所述的方法,其中形成所述层压板包括:
在所述第一层压基板上布置所述逻辑印刷电路板和金属块,所述一个以上功率半导体裸片被附接至所述金属块,从而在所述逻辑印刷电路板和所述埋置功率半导体模块之间的所述介电填充间隙被填充以所述逻辑印刷电路板的介电材料;
将第二层压基板布置在所述逻辑印刷电路板和所述金属块上,以形成堆叠;并且
层压所述堆叠。
11.如权利要求10所述的方法,其中薄化所述层压板包括:
铣穿位于所述介电填充间隙的区域处的所述第二层压基板和所述逻辑印刷电路板的所述介电材料。
12.如权利要求6所述的方法,其中所述埋置功率半导体模块是预层压的埋置功率半导体模块,并且其中形成所述层压板包括:
在所述第一层压基板上布置所述预层压的埋置功率半导体模块,并且在所述预层压的埋置功率半导体模块上布置所述第二层压基板,以形成堆叠;以及
层压所述堆叠。
13.如权利要求12所述的方法,其中薄化所述层压板包括:
铣穿位于所述介电填充间隙的区域处的所述第二层压基板。
14.一种具有集成功率电子电路系统和逻辑电路系统的集成功率模块,包括:
埋置功率半导体模块,其包括被埋置在介电材料中的一个以上功率半导体裸片;
多层逻辑印刷电路板,其具有被装配至所述逻辑印刷电路板的表面的一个以上逻辑裸片;
柔性连接,其被整体地形成在所述埋置功率半导体模块和所述逻辑印刷电路板之间,所述柔性连接将所述埋置功率半导体模块机械地连接至所述逻辑印刷电路板,并且提供所述埋置功率半导体模块和所述逻辑印刷电路板之间的电气通路。
15.如权利要求14所述的集成功率模块,
其中所述柔性连接被弯曲,从而所述逻辑印刷电路板与所述埋置功率半导体模块处于不同的平面中。
16.如权利要求15所述的集成功率模块,
其中所述柔性连接被弯曲,从而所述逻辑印刷电路板处于垂直于所述埋置功率半导体模块所处的平面的平面。
17.如权利要求14所述的集成功率模块,
其中所述柔性连接被弯曲,从而所述逻辑印刷电路板被放置在所述埋置功率半导体模块之上或在所述埋置功率半导体模块之下。
18.如权利要求17所述的集成功率模块,
其中所述柔性连接被弯曲,从而被装配至所述所述逻辑印刷电路板的所述表面的所述一个以上逻辑裸片朝向所述埋置功率半导体模块。
19.如权利要求14所述的集成功率模块,
其中所述柔性连接包括层压基板,所述层压基板被层压至所述埋置功率半导体模块和所述逻辑印刷电路板的相同的第一侧。
20.如权利要求19所述的集成功率模块,
其中由所述整体的柔性连接所提供的所述电气通路由所述层压基板的铜箔形成。
21.如权利要求14所述的集成功率模块,
其中所述埋置功率半导体模块被嵌入至所述逻辑印刷电路板之中,并且其中所述逻辑印刷电路板的介电材料在邻近被嵌入的所述功率半导体模块的区域中被薄化,从而薄的介电层和所述逻辑印刷电路板的金属层在所示逻辑印刷电路板和被嵌入的所述功率半导体模块之间形成所述整体的柔性连接。
CN201510492902.6A 2014-08-12 2015-08-12 具有集成的功率电子电路系统和逻辑电路系统的模块 Active CN105376936B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/457,663 US9681558B2 (en) 2014-08-12 2014-08-12 Module with integrated power electronic circuitry and logic circuitry
US14/457,663 2014-08-12

Publications (2)

Publication Number Publication Date
CN105376936A true CN105376936A (zh) 2016-03-02
CN105376936B CN105376936B (zh) 2018-06-08

Family

ID=55235112

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510492902.6A Active CN105376936B (zh) 2014-08-12 2015-08-12 具有集成的功率电子电路系统和逻辑电路系统的模块

Country Status (3)

Country Link
US (1) US9681558B2 (zh)
CN (1) CN105376936B (zh)
DE (1) DE102015113208B4 (zh)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9686866B2 (en) * 2015-08-23 2017-06-20 Unimicron Technology Corp. Package structure and manufacturing method thereof
EP3288349A1 (de) * 2016-08-25 2018-02-28 Siemens Aktiengesellschaft Leistungsmodul, modulanordnung und verfahren zur herstellung eines leistungsmoduls
CN110383209B (zh) * 2017-02-24 2023-08-11 慧与发展有限责任合伙企业 用于组装出可扩展模块的方法、可扩展设备及系统
US10381844B2 (en) 2017-06-23 2019-08-13 Dell Products L.P. Sourcing power from a battery or AC-DC converter of a power storage adapter
US10476288B2 (en) 2017-06-23 2019-11-12 Dell Products L.P. Power storage adapter for peak shift operation with a portable information handling system
US10978896B2 (en) 2017-06-23 2021-04-13 Dell Products L.P. High efficiency power storage adapter
US10452102B2 (en) 2017-06-23 2019-10-22 Dell Products L.P. Power delivery contract establishment in a power storage adapter
US10389154B2 (en) 2017-06-23 2019-08-20 Dell Products L.P. Power storage adapter using a high efficiency charging method
US10928880B2 (en) 2017-06-23 2021-02-23 Dell Products L.P. Power storage adapter for communicating battery data with a portable information handling system
US10608443B2 (en) 2017-08-15 2020-03-31 Dell Products L.P. Battery management using battery temperature distribution
US10642333B2 (en) 2017-08-24 2020-05-05 Dell Products L.P. Power storage adapter for efficient supply of power of multiple portable information handling systems
US10620679B2 (en) 2017-09-01 2020-04-14 Dell Products L.P. Prioritizing supplying electrical power by a power storage adapter to connected devices
US10673271B2 (en) 2017-09-01 2020-06-02 Dell Products L.P. Efficient charging of multiple portable information handling systems based on learned charging characteristics
US10404105B2 (en) 2017-09-14 2019-09-03 Dell Products L.P. Power storage adapter for wireless power transmission
US11513928B2 (en) 2017-09-18 2022-11-29 Dell Products L.P. Power storage adapter with power cable validation
US10714797B2 (en) 2017-09-18 2020-07-14 Dell Products L.P. Multilayer thermal laminate with aerogel for battery cell enclosures
US10488906B2 (en) 2017-09-26 2019-11-26 Dell Products L.P. Power delivery based on temperature and other factors in a power storage adapter
US10278279B1 (en) * 2017-10-30 2019-04-30 Dell Products L.P. Transformer thermal radiator for power field effect transistors
US10734318B2 (en) * 2017-11-14 2020-08-04 Intel Corporation Folded semiconductor package architectures and methods of assembling same
GB201801457D0 (en) * 2018-01-30 2018-03-14 Pragmatic Printing Ltd Integrated circuit manufacturing process and apparatus
US11493713B1 (en) * 2018-09-19 2022-11-08 Psiquantum, Corp. Photonic quantum computer assembly having dies with specific contact configuration and matched CTE
KR20210009181A (ko) * 2019-07-16 2021-01-26 삼성전기주식회사 인쇄회로기판
US11147165B2 (en) 2019-10-17 2021-10-12 Infineon Technologies Austria Ag Electronic system and interposer having an embedded power device module
US11183934B2 (en) 2019-10-17 2021-11-23 Infineon Technologies Americas Corp. Embedded substrate voltage regulators
US11071206B2 (en) * 2019-10-17 2021-07-20 Infineon Technologies Austria Ag Electronic system and processor substrate having an embedded power device module
EP4229678A1 (en) 2020-10-15 2023-08-23 Hitachi Energy Switzerland AG Power semiconductor module
EP3996473A1 (en) * 2020-11-05 2022-05-11 AT & S Austria Technologie & Systemtechnik Aktiengesellschaft Component carrier with electronic components and thermally conductive blocks on both sides
DE102021101010A1 (de) 2021-01-19 2022-07-21 Infineon Technologies Ag Vorgehäuster chip, verfahren zum herstellen eines vorgehäusten chips, halbleitergehäuse und verfahren zum herstellen eines halbleitergehäuses
DE102021110251A1 (de) 2021-04-22 2022-10-27 Sma Solar Technology Ag Leistungshalbleiteranordnung und wechselrichterbrücke mit leistungshalbleiteranordnung
DE102021110607A1 (de) * 2021-04-26 2022-10-27 Semikron Elektronik Gmbh & Co. Kg Gerät mit Funktionskomponente und Kunststoffgehäuseelement und Verfahren zur Überprüfung der Echtheit eines solches Geräts
US20230106642A1 (en) * 2021-09-20 2023-04-06 Infineon Technologies Austria Ag Embedded package with delamination mitigation
TWI817496B (zh) * 2022-05-11 2023-10-01 華東科技股份有限公司 一種具絕緣板之整合封裝

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5942797A (en) * 1996-04-02 1999-08-24 Fuji Electric Co. Ltd. Power semiconductor module
US6882538B1 (en) * 1999-05-31 2005-04-19 Tyco Electronics Logistics Ag Intelligent power module
CN101027950A (zh) * 2004-09-27 2007-08-29 英特尔公司 用于高速互连的柔性电缆
US20080272829A1 (en) * 2006-08-22 2008-11-06 Nec Electronics Corporation Semiconductor device including multilayer wiring board with power supply circuit
CN102665373A (zh) * 2012-05-09 2012-09-12 聚信科技有限公司 一种印刷电路板卡,及制造方法
EP2768294A2 (de) * 2013-01-08 2014-08-20 Carl Freudenberg KG Anordnung mit einer flexiblen Leiterplatte

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3280394B2 (ja) 1990-04-05 2002-05-13 ロックヒード マーティン コーポレーション 電子装置
DE19924991A1 (de) 1999-05-31 2000-12-21 Tyco Electronics Logistics Ag Intelligentes Leistungsmodul in Sandwich-Bauweise
ES2169687B2 (es) 1999-09-30 2004-10-16 Denso Corporation Unidad electronica de control con elemento de activacion y elemento de tratamiento de control.
DE10214953A1 (de) 2002-04-04 2003-10-30 Infineon Technologies Ag Leistungsmodul mit mindestens zwei Substraten und Verfahren zu seiner Herstellung
DE10244365B4 (de) 2002-09-24 2011-02-03 Daimler Ag Verteilte Halbleiterschaltung
KR100467834B1 (ko) * 2002-12-23 2005-01-25 삼성전기주식회사 커패시터 내장형 인쇄회로기판 및 그 제조 방법
WO2005086978A2 (en) * 2004-03-11 2005-09-22 International Rectifier Corporation Embedded power management control circuit
JP2005310814A (ja) * 2004-04-16 2005-11-04 Alps Electric Co Ltd キャパシタ内蔵基板
TWI260056B (en) * 2005-02-01 2006-08-11 Phoenix Prec Technology Corp Module structure having an embedded chip
US20100020515A1 (en) 2005-03-08 2010-01-28 Smart Modular Technologies, Inc. Method and system for manufacturing micro solid state drive devices
US8120173B2 (en) * 2005-05-03 2012-02-21 Lockheed Martin Corporation Thin embedded active IC circuit integration techniques for flexible and rigid circuits
DE102005061016B4 (de) 2005-12-19 2018-12-06 Infineon Technologies Ag Leistungshalbleitermodul, Verfahren zu seiner Herstellung und Verwendung in einem Schaltnetzteil
JP5168838B2 (ja) * 2006-07-28 2013-03-27 大日本印刷株式会社 多層プリント配線板及びその製造方法
JP4799349B2 (ja) 2006-09-29 2011-10-26 株式会社フジクラ 電源分配装置およびその製造方法
KR100796982B1 (ko) * 2006-11-21 2008-01-22 삼성전기주식회사 인쇄회로기판 및 그 제조방법
DE102006056363B4 (de) 2006-11-29 2010-12-09 Infineon Technologies Ag Halbleitermodul mit mindestens zwei Substraten und Verfahren zur Herstellung eines Halbleitermoduls mit zwei Substraten
US7759777B2 (en) 2007-04-16 2010-07-20 Infineon Technologies Ag Semiconductor module
TW200905440A (en) 2007-07-25 2009-02-01 Asustek Comp Inc Modular motherboard
US20090046437A1 (en) 2007-08-17 2009-02-19 Inventec Corporation Expansion card and fixing structure for expansion card
KR101572600B1 (ko) 2007-10-10 2015-11-27 테세라, 인코포레이티드 다층 배선 요소와 마이크로전자 요소가 실장된 어셈블리
US7800222B2 (en) 2007-11-29 2010-09-21 Infineon Technologies Ag Semiconductor module with switching components and driver electronics
EP2129194B1 (en) * 2008-05-27 2013-08-07 VIA Technologies, Inc. Electronic apparatus
US7969018B2 (en) 2008-07-15 2011-06-28 Infineon Technologies Ag Stacked semiconductor chips with separate encapsulations
KR20100101000A (ko) * 2008-07-30 2010-09-15 이비덴 가부시키가이샤 플렉스 리지드 배선판 및 그의 제조 방법
TW201127228A (en) * 2010-01-22 2011-08-01 Ibiden Co Ltd Flex-rigid wiring board and method for manufacturing the same
CN102593108B (zh) 2011-01-18 2014-08-20 台达电子工业股份有限公司 功率半导体封装结构及其制造方法
DE102011076273A1 (de) 2011-05-23 2012-11-29 Continental Automotive Gmbh Leiterplatte für elektrische Bauelemente und Leiterplattensystem
KR101241544B1 (ko) * 2011-06-10 2013-03-11 엘지이노텍 주식회사 인쇄회로기판 및 그의 제조 방법
EP2538761B1 (en) 2011-06-20 2014-01-29 STMicroelectronics Srl Intelligent Power Module and related assembling method
DE102011105346A1 (de) 2011-06-21 2012-12-27 Schweizer Electronic Ag Elektronische Baugruppe und Verfahren zu deren Herstellung
DE102011113255B4 (de) 2011-09-13 2021-03-04 Infineon Technologies Ag Chipmodule und Verfahren zur Herstellung eines Chipmoduls
US8779734B2 (en) 2011-12-07 2014-07-15 Microchip Technology Incorporated Integrated circuit device with two voltage regulators
KR101319808B1 (ko) * 2012-02-24 2013-10-17 삼성전기주식회사 경연성 인쇄회로기판 제조 방법
US8648473B2 (en) 2012-03-27 2014-02-11 Infineon Technologies Ag Chip arrangement and a method for forming a chip arrangement
TWI501373B (zh) 2012-06-06 2015-09-21 Cmsc Inc 具線路佈局之預注成形模穴式立體封裝模組
JP2016006806A (ja) 2013-06-05 2016-01-14 富士電機株式会社 半導体装置
US9806051B2 (en) * 2014-03-04 2017-10-31 General Electric Company Ultra-thin embedded semiconductor device package and method of manufacturing thereof

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5942797A (en) * 1996-04-02 1999-08-24 Fuji Electric Co. Ltd. Power semiconductor module
US6882538B1 (en) * 1999-05-31 2005-04-19 Tyco Electronics Logistics Ag Intelligent power module
CN101027950A (zh) * 2004-09-27 2007-08-29 英特尔公司 用于高速互连的柔性电缆
US20080272829A1 (en) * 2006-08-22 2008-11-06 Nec Electronics Corporation Semiconductor device including multilayer wiring board with power supply circuit
CN102665373A (zh) * 2012-05-09 2012-09-12 聚信科技有限公司 一种印刷电路板卡,及制造方法
EP2768294A2 (de) * 2013-01-08 2014-08-20 Carl Freudenberg KG Anordnung mit einer flexiblen Leiterplatte

Also Published As

Publication number Publication date
US20160050768A1 (en) 2016-02-18
US9681558B2 (en) 2017-06-13
CN105376936B (zh) 2018-06-08
DE102015113208B4 (de) 2021-08-19
DE102015113208A1 (de) 2016-02-18

Similar Documents

Publication Publication Date Title
CN105376936A (zh) 具有集成的功率电子电路系统和逻辑电路系统的模块
KR100661948B1 (ko) 회로 장치 및 그의 제조 방법
KR100661946B1 (ko) 회로 장치 및 그 제조 방법
US8159828B2 (en) Low profile flip chip power module and method of making
JP4760930B2 (ja) Ic搭載基板、多層プリント配線板、及び製造方法
CN107452694B (zh) 嵌入式封装结构
US10154593B2 (en) Electronic assembly group and method for producing the same
US8759156B2 (en) Method of producing laminated device
US10756013B2 (en) Packaged semiconductor system having unidirectional connections to discrete components
CN109417062B (zh) 带有堆叠功率电子组件的冷却电子封装
CN103493610A (zh) 刚性柔性基板及其制造方法
CN106255308B (zh) 印刷基板和电子装置
US20160262260A1 (en) Multi-layered circuit board and semiconductor device
TW201507556A (zh) 具有散熱墊及電性突柱之散熱增益型線路板
JP2009010358A (ja) 電子部品内蔵モジュール及びその製造方法
TW201733010A (zh) 電路基板及電路基板之製造方法
CN203151864U (zh) 印制电路板
JP2004289133A (ja) チップ・パッケージ
KR20230142406A (ko) 배선 기판, 배선 기판을 가지는 반도체 패키지, 및 그 제조 방법
JP2004128230A (ja) 電子部品実装装置とその製造方法
WO2014181509A1 (ja) 多層基板およびこれを用いた電子装置、電子装置の製造方法
JPH0794868A (ja) 多層配線基板及びその製造方法
US20140201992A1 (en) Circuit board structure having embedded electronic element and fabrication method thereof
TW201507555A (zh) 具有複合芯層及雙增層電路之線路板
CN108550531B (zh) 封装基板的制造方法

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant