CN104849217B - 分析装置及电子设备 - Google Patents
分析装置及电子设备 Download PDFInfo
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- CN104849217B CN104849217B CN201510084817.6A CN201510084817A CN104849217B CN 104849217 B CN104849217 B CN 104849217B CN 201510084817 A CN201510084817 A CN 201510084817A CN 104849217 B CN104849217 B CN 104849217B
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
- G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
Landscapes
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014027823A JP6365817B2 (ja) | 2014-02-17 | 2014-02-17 | 分析装置、及び電子機器 |
| JP2014-027823 | 2014-02-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104849217A CN104849217A (zh) | 2015-08-19 |
| CN104849217B true CN104849217B (zh) | 2019-09-24 |
Family
ID=52465311
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510084817.6A Active CN104849217B (zh) | 2014-02-17 | 2015-02-16 | 分析装置及电子设备 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9389179B2 (https=) |
| EP (1) | EP2908118A1 (https=) |
| JP (1) | JP6365817B2 (https=) |
| CN (1) | CN104849217B (https=) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014169955A (ja) | 2013-03-05 | 2014-09-18 | Seiko Epson Corp | 分析装置、分析方法、これらに用いる光学素子および電子機器、並びに光学素子の設計方法 |
| JP2015152492A (ja) * | 2014-02-17 | 2015-08-24 | セイコーエプソン株式会社 | 分析装置、及び電子機器 |
| JP6365817B2 (ja) | 2014-02-17 | 2018-08-01 | セイコーエプソン株式会社 | 分析装置、及び電子機器 |
| JP6613736B2 (ja) * | 2015-09-07 | 2019-12-04 | セイコーエプソン株式会社 | 物質検出方法および物質検出装置 |
| CN105573010A (zh) * | 2016-03-01 | 2016-05-11 | 中国科学院半导体研究所 | 用于表面增强相干反斯托克斯拉曼散射的纳米结构 |
| WO2017221981A1 (ja) * | 2016-06-21 | 2017-12-28 | 日産化学工業株式会社 | ラマン散乱による簡易センシング法 |
| WO2018044240A1 (en) * | 2016-09-05 | 2018-03-08 | Agency For Science, Technology And Research | A method of forming nano-patterns on a substrate |
| CN110291429A (zh) * | 2017-01-30 | 2019-09-27 | 阿尔托大学基金会 | 等离激元装置 |
| CN114914652B (zh) * | 2022-05-30 | 2024-03-29 | 西安工业大学 | 中心金属条溅射ITO薄膜均衡滤波SSPPs传输线及滤波器 |
| CN114883768B (zh) * | 2022-05-30 | 2024-04-02 | 西安工业大学 | 矩形波纹金属条溅射ITO薄膜均衡滤波SSPPs传输线及滤波器 |
Citations (4)
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| WO2005121754A1 (en) * | 2004-06-11 | 2005-12-22 | Consejo Superior De Investigaciones Cientificas | Device and method for detecting changes in the refractive index of a dielectric medium |
| CN101688809A (zh) * | 2007-06-26 | 2010-03-31 | 惠普开发有限公司 | 电场增强结构及使用其的检测装置 |
| JP2013231682A (ja) * | 2012-05-01 | 2013-11-14 | Seiko Epson Corp | 光学デバイス及び検出装置 |
| WO2013168401A1 (ja) * | 2012-05-10 | 2013-11-14 | セイコーエプソン株式会社 | センサーチップ並びにセンサーカートリッジおよび検出装置 |
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| JPS6137581A (ja) | 1984-07-31 | 1986-02-22 | Nissan Motor Co Ltd | 電動式動力舵取り装置 |
| US7023544B2 (en) | 2000-10-30 | 2006-04-04 | Sru Biosystems, Inc. | Method and instrument for detecting biomolecular interactions |
| US7399445B2 (en) * | 2002-01-11 | 2008-07-15 | Canon Kabushiki Kaisha | Chemical sensor |
| FR2860872A1 (fr) | 2003-10-09 | 2005-04-15 | Commissariat Energie Atomique | Micro-capteurs et nano-capteurs d'especes chimiques et biologiques a plasmons de surface |
| KR101168654B1 (ko) | 2004-05-19 | 2012-07-25 | 브이피 호울딩 엘엘씨 | 표면 증강 라만 산란에 의한 화학기의 증강된 검출을 위한 층상의 플라즈몬 구조를 가진 광센서 |
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| JP2015152493A (ja) | 2015-08-24 |
| JP6365817B2 (ja) | 2018-08-01 |
| US9389179B2 (en) | 2016-07-12 |
| CN104849217A (zh) | 2015-08-19 |
| US20150233822A1 (en) | 2015-08-20 |
| EP2908118A1 (en) | 2015-08-19 |
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