CN104247001B - 具有馈通结构的基板支撑件 - Google Patents

具有馈通结构的基板支撑件 Download PDF

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Publication number
CN104247001B
CN104247001B CN201380016546.XA CN201380016546A CN104247001B CN 104247001 B CN104247001 B CN 104247001B CN 201380016546 A CN201380016546 A CN 201380016546A CN 104247001 B CN104247001 B CN 104247001B
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CN
China
Prior art keywords
mesh screen
conductors
conductive mesh
area
wall
Prior art date
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Active
Application number
CN201380016546.XA
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English (en)
Chinese (zh)
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CN104247001A (zh
Inventor
利昂·沃尔福夫斯基
马尤尔·G·库尔卡尼
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Applied Materials Inc
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Applied Materials Inc
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Publication of CN104247001A publication Critical patent/CN104247001A/zh
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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67103Apparatus for thermal treatment mainly by conduction
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68792Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the construction of the shaft
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B3/00Ohmic-resistance heating
    • H05B3/20Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater
    • H05B3/22Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible
    • H05B3/26Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible heating conductor mounted on insulating base

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Resistance Heating (AREA)
CN201380016546.XA 2012-03-30 2013-03-19 具有馈通结构的基板支撑件 Active CN104247001B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201261617946P 2012-03-30 2012-03-30
US61/617,946 2012-03-30
US13/845,492 US9706605B2 (en) 2012-03-30 2013-03-18 Substrate support with feedthrough structure
US13/845,492 2013-03-18
PCT/US2013/032874 WO2013148406A1 (en) 2012-03-30 2013-03-19 Substrate support with feedthrough structure

Publications (2)

Publication Number Publication Date
CN104247001A CN104247001A (zh) 2014-12-24
CN104247001B true CN104247001B (zh) 2017-06-06

Family

ID=49233841

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380016546.XA Active CN104247001B (zh) 2012-03-30 2013-03-19 具有馈通结构的基板支撑件

Country Status (6)

Country Link
US (1) US9706605B2 (enExample)
JP (1) JP6211053B2 (enExample)
KR (1) KR102123366B1 (enExample)
CN (1) CN104247001B (enExample)
TW (1) TWI624901B (enExample)
WO (1) WO2013148406A1 (enExample)

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US9698074B2 (en) 2013-09-16 2017-07-04 Applied Materials, Inc. Heated substrate support with temperature profile control
US9673025B2 (en) * 2015-07-27 2017-06-06 Lam Research Corporation Electrostatic chuck including embedded faraday cage for RF delivery and associated methods for operation, monitoring, and control
US10582570B2 (en) * 2016-01-22 2020-03-03 Applied Materials, Inc. Sensor system for multi-zone electrostatic chuck
US10892179B2 (en) * 2016-11-08 2021-01-12 Lam Research Corporation Electrostatic chuck including clamp electrode assembly forming portion of Faraday cage for RF delivery and associated methods
US10079168B2 (en) * 2016-11-08 2018-09-18 Lam Research Corporation Ceramic electrostatic chuck including embedded Faraday cage for RF delivery and associated methods for operation, monitoring, and control
KR20190042831A (ko) 2017-10-17 2019-04-25 주식회사 이에스티 정전척 및 진공 챔버의 피드스루 기밀 구조
KR102124303B1 (ko) 2018-10-15 2020-06-18 세메스 주식회사 기판 처리 장치, 기판 지지 유닛 및 기판 처리 방법
CN113632588B (zh) * 2019-03-18 2024-06-25 日本碍子株式会社 陶瓷加热器及其制法
JP2021034347A (ja) * 2019-08-29 2021-03-01 株式会社デンソーウェーブ 複合ケーブル及びロボットシステム
US11270903B2 (en) * 2019-12-17 2022-03-08 Applied Materials, Inc. Multi zone electrostatic chuck
US11551951B2 (en) 2020-05-05 2023-01-10 Applied Materials, Inc. Methods and systems for temperature control for a substrate
CN114121581B (zh) * 2020-08-27 2024-04-05 中微半导体设备(上海)股份有限公司 等离子体处理装置
KR102326329B1 (ko) 2021-03-30 2021-11-15 임하나 진공 챔버용 피드 스루 및 그 제조 방법
CN116387224A (zh) * 2021-12-22 2023-07-04 拓荆科技股份有限公司 真空吸附系统及方法
DE102024116166A1 (de) 2024-06-10 2025-12-11 Festo Se & Co. Kg System zur Bearbeitung eines Strukturkörpers
DE102024116164A1 (de) 2024-06-10 2025-12-11 Festo Se & Co. Kg System zur Bearbeitung eines Strukturkörpers

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Also Published As

Publication number Publication date
TWI624901B (zh) 2018-05-21
CN104247001A (zh) 2014-12-24
US20130256966A1 (en) 2013-10-03
WO2013148406A1 (en) 2013-10-03
JP6211053B2 (ja) 2017-10-11
JP2015518275A (ja) 2015-06-25
KR20150003229A (ko) 2015-01-08
KR102123366B1 (ko) 2020-06-16
TW201347080A (zh) 2013-11-16
US9706605B2 (en) 2017-07-11

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