CN104064593A - 半导体装置 - Google Patents
半导体装置 Download PDFInfo
- Publication number
- CN104064593A CN104064593A CN201310731532.8A CN201310731532A CN104064593A CN 104064593 A CN104064593 A CN 104064593A CN 201310731532 A CN201310731532 A CN 201310731532A CN 104064593 A CN104064593 A CN 104064593A
- Authority
- CN
- China
- Prior art keywords
- gate electrode
- semiconductor layer
- semiconductor
- semiconductor device
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/40—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
- H10D30/47—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having 2D charge carrier gas channels, e.g. nanoribbon FETs or high electron mobility transistors [HEMT]
- H10D30/471—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT]
- H10D30/475—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs
- H10D30/4755—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs having wide bandgap charge-carrier supplying layers, e.g. modulation doped HEMTs such as n-AlGaAs/GaAs HEMTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/20—Electrodes characterised by their shapes, relative sizes or dispositions
- H10D64/27—Electrodes not carrying the current to be rectified, amplified, oscillated or switched, e.g. gates
- H10D64/311—Gate electrodes for field-effect devices
- H10D64/411—Gate electrodes for field-effect devices for FETs
- H10D64/511—Gate electrodes for field-effect devices for FETs for IGFETs
- H10D64/512—Disposition of the gate electrodes, e.g. buried gates
Landscapes
- Junction Field-Effect Transistors (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013-059337 | 2013-03-22 | ||
JP2013059337A JP2014187085A (ja) | 2013-03-22 | 2013-03-22 | 半導体装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN104064593A true CN104064593A (zh) | 2014-09-24 |
Family
ID=51552223
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201310731532.8A Pending CN104064593A (zh) | 2013-03-22 | 2013-12-26 | 半导体装置 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2014187085A (enrdf_load_stackoverflow) |
CN (1) | CN104064593A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107393954A (zh) * | 2017-08-02 | 2017-11-24 | 电子科技大学 | 一种GaN异质结纵向场效应管 |
CN109461655A (zh) * | 2018-09-21 | 2019-03-12 | 中国电子科技集团公司第五十五研究所 | 具有多栅结构的氮化物高电子迁移率晶体管制造方法 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6646363B2 (ja) * | 2015-06-02 | 2020-02-14 | 株式会社アドバンテスト | 半導体装置 |
US10276681B2 (en) | 2016-02-29 | 2019-04-30 | Infineon Technologies Austria Ag | Double gate transistor device and method of operating |
US10530360B2 (en) | 2016-02-29 | 2020-01-07 | Infineon Technologies Austria Ag | Double gate transistor device and method of operating |
JP7021034B2 (ja) * | 2018-09-18 | 2022-02-16 | 株式会社東芝 | 半導体装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070102727A1 (en) * | 2005-11-02 | 2007-05-10 | Sharp Kabushiki Kaisha | Field-effect transistor |
CN101789445A (zh) * | 2008-12-22 | 2010-07-28 | 三垦电气株式会社 | 半导体装置 |
CN102201441A (zh) * | 2010-03-26 | 2011-09-28 | 三垦电气株式会社 | 半导体装置 |
JP2012028705A (ja) * | 2010-07-27 | 2012-02-09 | Sumitomo Electric Ind Ltd | 半導体装置 |
-
2013
- 2013-03-22 JP JP2013059337A patent/JP2014187085A/ja not_active Abandoned
- 2013-12-26 CN CN201310731532.8A patent/CN104064593A/zh active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070102727A1 (en) * | 2005-11-02 | 2007-05-10 | Sharp Kabushiki Kaisha | Field-effect transistor |
CN101789445A (zh) * | 2008-12-22 | 2010-07-28 | 三垦电气株式会社 | 半导体装置 |
CN102201441A (zh) * | 2010-03-26 | 2011-09-28 | 三垦电气株式会社 | 半导体装置 |
JP2012028705A (ja) * | 2010-07-27 | 2012-02-09 | Sumitomo Electric Ind Ltd | 半導体装置 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107393954A (zh) * | 2017-08-02 | 2017-11-24 | 电子科技大学 | 一种GaN异质结纵向场效应管 |
CN107393954B (zh) * | 2017-08-02 | 2019-11-01 | 电子科技大学 | 一种GaN异质结纵向场效应管 |
CN109461655A (zh) * | 2018-09-21 | 2019-03-12 | 中国电子科技集团公司第五十五研究所 | 具有多栅结构的氮化物高电子迁移率晶体管制造方法 |
CN109461655B (zh) * | 2018-09-21 | 2022-03-11 | 中国电子科技集团公司第五十五研究所 | 具有多栅结构的氮化物高电子迁移率晶体管制造方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2014187085A (ja) | 2014-10-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20140924 |
|
WD01 | Invention patent application deemed withdrawn after publication |