CN103959098B - 包括x射线吸收封装的闪烁体组以及包括所述闪烁体组的x射线探测器阵列 - Google Patents

包括x射线吸收封装的闪烁体组以及包括所述闪烁体组的x射线探测器阵列 Download PDF

Info

Publication number
CN103959098B
CN103959098B CN201280058399.8A CN201280058399A CN103959098B CN 103959098 B CN103959098 B CN 103959098B CN 201280058399 A CN201280058399 A CN 201280058399A CN 103959098 B CN103959098 B CN 103959098B
Authority
CN
China
Prior art keywords
ray
scintillator
detector array
ray detector
encapsulation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201280058399.8A
Other languages
English (en)
Chinese (zh)
Other versions
CN103959098A (zh
Inventor
S·莱韦内
N·J·A·范费恩
L·格雷戈里安
A·W·M·德拉特
G·F·C·M·利杰坦恩
R·戈申
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of CN103959098A publication Critical patent/CN103959098A/zh
Application granted granted Critical
Publication of CN103959098B publication Critical patent/CN103959098B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G01T1/2019—Shielding against direct hits

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Radiology & Medical Imaging (AREA)
  • Immunology (AREA)
  • Theoretical Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pulmonology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Conversion Of X-Rays Into Visible Images (AREA)
CN201280058399.8A 2011-11-29 2012-11-23 包括x射线吸收封装的闪烁体组以及包括所述闪烁体组的x射线探测器阵列 Active CN103959098B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161564407P 2011-11-29 2011-11-29
US61/564,407 2011-11-29
PCT/IB2012/056665 WO2013080105A2 (en) 2011-11-29 2012-11-23 Scintillator pack comprising an x-ray absorbing encapsulation and x-ray detector array comprising such scintillator pack

Publications (2)

Publication Number Publication Date
CN103959098A CN103959098A (zh) 2014-07-30
CN103959098B true CN103959098B (zh) 2017-04-26

Family

ID=47603861

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201280058399.8A Active CN103959098B (zh) 2011-11-29 2012-11-23 包括x射线吸收封装的闪烁体组以及包括所述闪烁体组的x射线探测器阵列

Country Status (8)

Country Link
US (1) US9599728B2 (https=)
EP (1) EP2751595B1 (https=)
JP (1) JP6114300B2 (https=)
CN (1) CN103959098B (https=)
BR (1) BR112014012699A8 (https=)
IN (1) IN2014CN03832A (https=)
RU (1) RU2605520C2 (https=)
WO (1) WO2013080105A2 (https=)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9748300B2 (en) 2013-09-05 2017-08-29 Koninklijke Philips N.V. Radiation detector element
WO2015186657A1 (ja) * 2014-06-06 2015-12-10 シャープ株式会社 半導体装置およびその製造方法
WO2016046013A2 (en) * 2014-09-25 2016-03-31 Koninklijke Philips N.V. Ceramic material for generating light
JP6671839B2 (ja) * 2014-10-07 2020-03-25 キヤノン株式会社 放射線撮像装置及び撮像システム
KR102624385B1 (ko) 2015-09-24 2024-01-11 프리스매틱 센서즈 에이비 모듈식 x선 검출기(modular x-ray detector)
CN109690351B (zh) 2016-09-23 2022-12-09 深圳帧观德芯科技有限公司 半导体x射线检测器的封装
EP3399344B1 (en) * 2017-05-03 2021-06-30 ams International AG Semiconductor device for indirect detection of electromagnetic radiation and method of production
CN109709594B (zh) * 2018-12-18 2020-12-11 北京纳米维景科技有限公司 闪烁屏封装结构制造方法、闪烁屏封装结构及影像探测器
CN111697109A (zh) * 2020-07-09 2020-09-22 上海大学 一种柔性x射线探测器的制备方法及系统

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020181647A1 (en) * 2001-05-30 2002-12-05 Venkataramani Venkat Subramaniam High-Z cast reflector compositions and method of manufacture
US20050236573A1 (en) * 2002-09-18 2005-10-27 Gereon Vogtmeier X-ray detector with a plurality of detector units
US20070221858A1 (en) * 2006-03-27 2007-09-27 Analogic Corporation Modular X-Ray measurement system
CN101115344A (zh) * 2003-02-20 2008-01-30 因普有限公司 产生x射线的系统
CN101142497A (zh) * 2005-03-16 2008-03-12 皇家飞利浦电子股份有限公司 具有像素内处理电路的x射线检测器
CN101166997A (zh) * 2005-04-26 2008-04-23 皇家飞利浦电子股份有限公司 光谱ct的检测器阵列

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08122492A (ja) 1994-10-19 1996-05-17 Sumitomo Electric Ind Ltd 放射線遮蔽材及びその製造方法
DE69927241T2 (de) * 1998-10-28 2006-06-29 Philips Intellectual Property & Standards Gmbh Verfahren zur herstellung eines geschichteten szintillationsdetektorelements
JP2001099941A (ja) 1999-09-30 2001-04-13 Hitachi Metals Ltd 放射線遮蔽板、放射線検出器及び放射線遮蔽板の製造方法
US6298113B1 (en) * 2000-02-07 2001-10-02 General Electric Company Self aligning inter-scintillator reflector x-ray damage shield and method of manufacture
WO2001099119A1 (en) 2000-06-20 2001-12-27 Kanebo, Limited Radiation shielding material
JP2003084066A (ja) * 2001-04-11 2003-03-19 Nippon Kessho Kogaku Kk 放射線検出器用部品、放射線検出器および放射線検出装置
JP2003028986A (ja) 2001-07-12 2003-01-29 Mitsubishi Plastics Ind Ltd 放射線遮蔽材料
WO2004027453A1 (en) * 2002-09-18 2004-04-01 Koninklijke Philips Electronics N.V. Radiation detector
JP4833554B2 (ja) * 2003-01-06 2011-12-07 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 放射線検出器モジュールと該放射線検出器モジュールを用いたコンピュータ断層撮影用スキャナ、および放射線検出方法
JP2004219318A (ja) * 2003-01-16 2004-08-05 Hamamatsu Photonics Kk 放射線検出器
JP4500010B2 (ja) * 2003-06-16 2010-07-14 株式会社日立メディコ Ｘ線検出器及びこれを用いたｘ線ｃｔ装置
RU2251124C1 (ru) * 2003-10-14 2005-04-27 ГОУ ВПО Уральский государственный технический университет-УПИ СЦИНТИЛЛЯЦИОННЫЙ ДАТЧИК ЭЛЕКТРОННОГО И β-ИЗЛУЧЕНИЯ
EP1695117A1 (en) * 2003-12-09 2006-08-30 Philips Intellectual Property & Standards GmbH Shielding for an x-ray detector
US7166849B2 (en) * 2004-08-09 2007-01-23 General Electric Company Scintillator array for use in a CT imaging system and method for making the scintillator array
US7968853B2 (en) 2005-04-26 2011-06-28 Koninklijke Philips Electronics N.V. Double decker detector for spectral CT
JP4192990B2 (ja) 2006-03-13 2008-12-10 日立金属株式会社 放射線検出装置
RU2408110C2 (ru) * 2006-03-30 2010-12-27 Конинклейке Филипс Электроникс, Н.В. Матрица детекторов излучения
US20080068815A1 (en) * 2006-09-18 2008-03-20 Oliver Richard Astley Interface Assembly And Method for Integrating A Data Acquisition System on a Sensor Array
RU2487373C2 (ru) * 2007-12-21 2013-07-10 Конинклейке Филипс Электроникс Н.В. Чувствительный к излучению детектор со сцинтиллятором в композиционной смоле
JP2010096616A (ja) 2008-10-16 2010-04-30 Fujifilm Corp 放射線画像検出器
US8373132B2 (en) * 2009-02-06 2013-02-12 Koninklijke Philips Electronics N. V. Radiation detector with a stack of scintillator elements and photodiode arrays
WO2011089528A2 (en) 2010-01-22 2011-07-28 DenCT Ltd Methods and apparatus for multi-camera x-ray flat panel detector

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020181647A1 (en) * 2001-05-30 2002-12-05 Venkataramani Venkat Subramaniam High-Z cast reflector compositions and method of manufacture
US20050236573A1 (en) * 2002-09-18 2005-10-27 Gereon Vogtmeier X-ray detector with a plurality of detector units
CN101115344A (zh) * 2003-02-20 2008-01-30 因普有限公司 产生x射线的系统
CN101142497A (zh) * 2005-03-16 2008-03-12 皇家飞利浦电子股份有限公司 具有像素内处理电路的x射线检测器
CN101166997A (zh) * 2005-04-26 2008-04-23 皇家飞利浦电子股份有限公司 光谱ct的检测器阵列
US20070221858A1 (en) * 2006-03-27 2007-09-27 Analogic Corporation Modular X-Ray measurement system

Also Published As

Publication number Publication date
JP2015503096A (ja) 2015-01-29
JP6114300B2 (ja) 2017-04-12
EP2751595B1 (en) 2017-07-05
WO2013080105A2 (en) 2013-06-06
CN103959098A (zh) 2014-07-30
EP2751595A2 (en) 2014-07-09
RU2014126371A (ru) 2016-01-27
RU2605520C2 (ru) 2016-12-20
IN2014CN03832A (https=) 2015-07-03
US9599728B2 (en) 2017-03-21
BR112014012699A8 (pt) 2017-06-20
WO2013080105A3 (en) 2013-12-27
US20140321609A1 (en) 2014-10-30
BR112014012699A2 (pt) 2017-06-13

Similar Documents

Publication Publication Date Title
CN103959098B (zh) 包括x射线吸收封装的闪烁体组以及包括所述闪烁体组的x射线探测器阵列
JP5587788B2 (ja) 複合樹脂におけるシンチレータを備えた放射線感受性検出器
EP2671097B1 (en) Single or multi-energy vertical radiation sensitive detectors
CN101142497B (zh) 具有像素内处理电路的x射线检测器
CN109891269B (zh) 具有整体通孔互连件的辐射探测器闪烁体
JP2014510902A5 (https=)
JP2015521283A (ja) 少なくとも２つのシンチレータアレイ層間に配置される少なくとも１つの薄型フォトセンサを有する多層型水平コンピュータ断層撮影（ｃｔ）検出器アレイ
EP2917766B1 (en) Sub-band infra-red irradiation for detector crystals
US20200393581A1 (en) Detector array for a radiation system, and related system
US20080253507A1 (en) Computed Tomography Detector Using Thin Circuits
US7211801B2 (en) Radiation detector
KR102669620B1 (ko) 고해상도 하이브리드 방사선 디텍터
US10408952B2 (en) Radiation scintillator detector, detector package and manufacturing process thereof
CN104285163A (zh) 平铺的x射线成像器面板及其形成方法
CN109223015B (zh) 具有中间单元和评估层级的x射线检测器
CN108937979B (zh) 在载体元件上具有光源的x射线检测器
CN106324653A (zh) 具有堆叠的阻挡层的辐射检测器及形成其的方法
JP2007311454A (ja) 固体撮像装置
JP2019163937A (ja) 放射線検出器、及びその製造方法
EP3419050A1 (en) Radiation-hardened package for an electronic device and method of producing a radiation-hardened package
CN110368012B (zh) 探测器、医用放射诊断设备及探测器的组装方法
KR102604256B1 (ko) 하이브리드 섬광체 기반 엑스선 디텍터
CN119575446A (zh) 辐射检测面板及其制备方法、辐射检测器
TWI546943B (zh) 用於高能射線之非直接式感測器以及感測模組

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant