JP6114300B2 - X線検出器アレイ及びctスキャナ - Google Patents
X線検出器アレイ及びctスキャナ Download PDFInfo
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- JP6114300B2 JP6114300B2 JP2014542978A JP2014542978A JP6114300B2 JP 6114300 B2 JP6114300 B2 JP 6114300B2 JP 2014542978 A JP2014542978 A JP 2014542978A JP 2014542978 A JP2014542978 A JP 2014542978A JP 6114300 B2 JP6114300 B2 JP 6114300B2
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- 229910000416 bismuth oxide Inorganic materials 0.000 claims description 17
- TYIXMATWDRGMPF-UHFFFAOYSA-N dibismuth;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Bi+3].[Bi+3] TYIXMATWDRGMPF-UHFFFAOYSA-N 0.000 claims description 17
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- 229910052797 bismuth Inorganic materials 0.000 description 3
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 3
- 238000010292 electrical insulation Methods 0.000 description 3
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- 239000000843 powder Substances 0.000 description 3
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- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
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- 239000002270 dispersing agent Substances 0.000 description 2
- 231100000252 nontoxic Toxicity 0.000 description 2
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- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
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- FCTBKIHDJGHPPO-UHFFFAOYSA-N dioxouranium Chemical compound O=[U]=O FCTBKIHDJGHPPO-UHFFFAOYSA-N 0.000 description 1
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- 229910001938 gadolinium oxide Inorganic materials 0.000 description 1
- 229940075613 gadolinium oxide Drugs 0.000 description 1
- CMIHHWBVHJVIGI-UHFFFAOYSA-N gadolinium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[Gd+3].[Gd+3] CMIHHWBVHJVIGI-UHFFFAOYSA-N 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
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- MPARYNQUYZOBJM-UHFFFAOYSA-N oxo(oxolutetiooxy)lutetium Chemical compound O=[Lu]O[Lu]=O MPARYNQUYZOBJM-UHFFFAOYSA-N 0.000 description 1
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- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 1
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20188—Auxiliary details, e.g. casings or cooling
- G01T1/2019—Shielding against direct hits
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- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Radiology & Medical Imaging (AREA)
- Immunology (AREA)
- Theoretical Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Pulmonology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Measurement Of Radiation (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Conversion Of X-Rays Into Visible Images (AREA)
Description
2 シンチレータパック
3 シンチレータ画素
5 シンチレータ
7 シンチレータ
9 シンチレーション放射検出器
11 反射塗料の層
13 X線吸収封止部
15 電気結合
17 インターポーザ
19 電子回路
21 入出力ケーブル
27 頂面
29 側面
31 底面
101 検出器アレイ
102 シンチレータパック
103 シンチレータ画素
105 シンチレータ
107 シンチレータ
109 シンチレーション放射検出器
111 反射塗料の層
112 エンプティ空間
115 電気結合
117 板
118 電子回路
121 入出力ケーブル
Claims (14)
- シンチレータ画素のアレイであって、前記シンチレータ画素がそれぞれ、頂面、底面、および側面を有し、隣接し合うシンチレータ画素の側面が互いに面するように前記シンチレータ画素が配置された、シンチレータ画素のアレイと、
シンチレーション放射検出器のアレイであって、前記シンチレーション放射検出器の各々が、前記シンチレータ画素内で生成されるシンチレーション放射を検出するために、前記シンチレータ画素のアレイの関連するシンチレータ画素に隣接して配置され、前記シンチレーション放射検出器の各々のシンチレーション放射検出面が、関連するシンチレータ画素の側面に沿って配置されている、シンチレーション放射検出器のアレイと、
前記シンチレーション放射検出器のアレイが接続された基板と、
電気絶縁性の高X線吸収材料を含むX線吸収封止部であって、前記高X線吸収材料が50より大きい原子番号を有する、X線吸収封止部と
を有し、
前記X線吸収封止部は、シンチレータ画素の前記底面と前記基板との間の空間を充たしている、
X線検出器アレイ。 - 前記高X線吸収材料は酸化ビスマスを有する、請求項1に記載のX線検出器アレイ。
- 前記X線吸収封止部は20〜70体積%の前記高X線吸収材料を含む、請求項1または2に記載のX線検出器アレイ。
- 前記X線吸収封止部は前記高X線吸収材料の粒子を含み、前記粒子はマトリックス材料内に含められている、請求項1乃至3のいずれか一項に記載のX線検出器アレイ。
- 前記粒子の90%が1μmと50μmとの間のサイズを有する、請求項4に記載のX線検出器アレイ。
- 前記マトリックス材料はエポキシ樹脂である、請求項4または5に記載のX線検出器アレイ。
- 前記X線吸収封止部は、シンチレータ画素の各々の前記底面の少なくとも80%を覆っている、請求項1乃至6のいずれか一項に記載のX線検出器アレイ。
- 隣接し合うシンチレータ画素間の分離空間が、低X線吸収材料で少なくとも部分的に充填されている、請求項1乃至7のいずれか一項に記載のX線検出器アレイ。
- 前記X線吸収封止部は、異なる原子番号を有する材料の混合物を含む、請求項1乃至8のいずれか一項に記載のX線検出器アレイ。
- 当該X線検出器アレイは更に、前記シンチレーション放射検出器のアレイに電気的に接続された電子回路を有し、
前記X線吸収封止部は、前記シンチレータ画素のアレイと前記電子回路との間に配置されている、
請求項1乃至9のいずれか一項に記載のX線検出器アレイ。 - 前記電子回路は、CMOS技術で得られた集積回路を有する、請求項10に記載のX線検出器アレイ。
- 前記電子回路は、フリップチップASICを有する、請求項10または11に記載のX線検出器アレイ。
- 前記基板は、前記X線吸収封止部と前記電子回路との間に介在するインターポーザである、請求項10乃至12のいずれか一項に記載のX線検出器アレイ。
- 請求項1乃至13のいずれか一項に記載のX線検出器アレイを有するCTスキャナ。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161564407P | 2011-11-29 | 2011-11-29 | |
US61/564,407 | 2011-11-29 | ||
PCT/IB2012/056665 WO2013080105A2 (en) | 2011-11-29 | 2012-11-23 | Scintillator pack comprising an x-ray absorbing encapsulation and x-ray detector array comprising such scintillator pack |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2015503096A JP2015503096A (ja) | 2015-01-29 |
JP6114300B2 true JP6114300B2 (ja) | 2017-04-12 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014542978A Active JP6114300B2 (ja) | 2011-11-29 | 2012-11-23 | X線検出器アレイ及びctスキャナ |
Country Status (8)
Country | Link |
---|---|
US (1) | US9599728B2 (ja) |
EP (1) | EP2751595B1 (ja) |
JP (1) | JP6114300B2 (ja) |
CN (1) | CN103959098B (ja) |
BR (1) | BR112014012699A8 (ja) |
IN (1) | IN2014CN03832A (ja) |
RU (1) | RU2605520C2 (ja) |
WO (1) | WO2013080105A2 (ja) |
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JP6739423B2 (ja) * | 2014-09-25 | 2020-08-12 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 光を発生させるセラミック材料 |
JP6671839B2 (ja) * | 2014-10-07 | 2020-03-25 | キヤノン株式会社 | 放射線撮像装置及び撮像システム |
EP3353576B1 (en) * | 2015-09-24 | 2020-07-01 | Prismatic Sensors AB | Modular x-ray detector |
CN109690351B (zh) | 2016-09-23 | 2022-12-09 | 深圳帧观德芯科技有限公司 | 半导体x射线检测器的封装 |
EP3399344B1 (en) * | 2017-05-03 | 2021-06-30 | ams International AG | Semiconductor device for indirect detection of electromagnetic radiation and method of production |
CN109709594B (zh) * | 2018-12-18 | 2020-12-11 | 北京纳米维景科技有限公司 | 闪烁屏封装结构制造方法、闪烁屏封装结构及影像探测器 |
CN111697109A (zh) * | 2020-07-09 | 2020-09-22 | 上海大学 | 一种柔性x射线探测器的制备方法及系统 |
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2012
- 2012-11-23 JP JP2014542978A patent/JP6114300B2/ja active Active
- 2012-11-23 IN IN3832CHN2014 patent/IN2014CN03832A/en unknown
- 2012-11-23 EP EP12818815.8A patent/EP2751595B1/en active Active
- 2012-11-23 RU RU2014126371/28A patent/RU2605520C2/ru active
- 2012-11-23 US US14/358,058 patent/US9599728B2/en active Active
- 2012-11-23 BR BR112014012699A patent/BR112014012699A8/pt not_active Application Discontinuation
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IN2014CN03832A (ja) | 2015-07-03 |
EP2751595A2 (en) | 2014-07-09 |
CN103959098B (zh) | 2017-04-26 |
EP2751595B1 (en) | 2017-07-05 |
WO2013080105A3 (en) | 2013-12-27 |
US9599728B2 (en) | 2017-03-21 |
US20140321609A1 (en) | 2014-10-30 |
RU2605520C2 (ru) | 2016-12-20 |
CN103959098A (zh) | 2014-07-30 |
RU2014126371A (ru) | 2016-01-27 |
BR112014012699A8 (pt) | 2017-06-20 |
BR112014012699A2 (pt) | 2017-06-13 |
JP2015503096A (ja) | 2015-01-29 |
WO2013080105A2 (en) | 2013-06-06 |
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