IN2014CN03832A - - Google Patents

Info

Publication number
IN2014CN03832A
IN2014CN03832A IN3832CHN2014A IN2014CN03832A IN 2014CN03832 A IN2014CN03832 A IN 2014CN03832A IN 3832CHN2014 A IN3832CHN2014 A IN 3832CHN2014A IN 2014CN03832 A IN2014CN03832 A IN 2014CN03832A
Authority
IN
India
Prior art keywords
scintillator
encapsulation
ray
electronic circuit
pack
Prior art date
Application number
Inventor
Simha Levene
Nicolaas Johannes Anthonius Van Veen
Lev Gregorian
Laat Antonius Wilhelmus Maria De
Gerardus Franciscus Cornelis Maria Lijten
Rafael Goshen
Original Assignee
Koninkl Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Nv filed Critical Koninkl Philips Nv
Publication of IN2014CN03832A publication Critical patent/IN2014CN03832A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G01T1/2019—Shielding against direct hits

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Radiology & Medical Imaging (AREA)
  • Immunology (AREA)
  • Theoretical Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pulmonology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Conversion Of X-Rays Into Visible Images (AREA)

Abstract

A scintillator pack (2) and a CT X ray detector array (1) comprising such scintillator pack (2) are proposed. The scintillator pack (2) comprises an array of scintillator pixels (3). At a bottom surface (31) of each scintillator pixel (3) an X ray absorbing encapsulation(13) is provided. This encapsulation(13) comprises an electrically insulating highly X ray absorbing material having an atomic number greater than 60 such as for example Bismuth oxide (BiO ). The X ray absorbing encapsulation(13) is interposed between the scintillator pixels (3) and an electronic circuit (19). The electronic circuit (19) may be provided as an ASIC in CMOS technology and may therefore be sensitive to X ray induced damage. The encapsulation(13) provides for good X ray protection of such electronic circuit (19).
IN3832CHN2014 2011-11-29 2012-11-23 IN2014CN03832A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161564407P 2011-11-29 2011-11-29
PCT/IB2012/056665 WO2013080105A2 (en) 2011-11-29 2012-11-23 Scintillator pack comprising an x-ray absorbing encapsulation and x-ray detector array comprising such scintillator pack

Publications (1)

Publication Number Publication Date
IN2014CN03832A true IN2014CN03832A (en) 2015-07-03

Family

ID=47603861

Family Applications (1)

Application Number Title Priority Date Filing Date
IN3832CHN2014 IN2014CN03832A (en) 2011-11-29 2012-11-23

Country Status (8)

Country Link
US (1) US9599728B2 (en)
EP (1) EP2751595B1 (en)
JP (1) JP6114300B2 (en)
CN (1) CN103959098B (en)
BR (1) BR112014012699A8 (en)
IN (1) IN2014CN03832A (en)
RU (1) RU2605520C2 (en)
WO (1) WO2013080105A2 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015032865A1 (en) * 2013-09-05 2015-03-12 Koninklijke Philips N.V. Radiation detector element
WO2015186657A1 (en) * 2014-06-06 2015-12-10 シャープ株式会社 Semiconductor device and method for manufacturing same
JP6739423B2 (en) * 2014-09-25 2020-08-12 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ceramic materials that generate light
JP6671839B2 (en) * 2014-10-07 2020-03-25 キヤノン株式会社 Radiation imaging apparatus and imaging system
JP6816129B2 (en) 2015-09-24 2021-01-20 プリズマティック、センサーズ、アクチボラグＰｒｉｓｍａｔｉｃ Ｓｅｎｓｏｒｓ Ａｂ Modular X-ray detector
WO2018053778A1 (en) * 2016-09-23 2018-03-29 Shenzhen Xpectvision Technology Co.,Ltd. Packaging of semiconductor x-ray detectors
EP3399344B1 (en) * 2017-05-03 2021-06-30 ams International AG Semiconductor device for indirect detection of electromagnetic radiation and method of production
CN109709594B (en) * 2018-12-18 2020-12-11 北京纳米维景科技有限公司 Manufacturing method of scintillation screen packaging structure, scintillation screen packaging structure and image detector
CN111697109A (en) * 2020-07-09 2020-09-22 上海大学 Preparation method and system of flexible X-ray detector

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DE69927241T2 (en) * 1998-10-28 2006-06-29 Philips Intellectual Property & Standards Gmbh METHOD FOR PRODUCING A STENCILED SINTINATION DETECTOR ELEMENT
JP2001099941A (en) 1999-09-30 2001-04-13 Hitachi Metals Ltd Radiation shielding plate, radiation detector, and manufacturing method of radiation shielding plate
US6298113B1 (en) * 2000-02-07 2001-10-02 General Electric Company Self aligning inter-scintillator reflector x-ray damage shield and method of manufacture
WO2001099119A1 (en) 2000-06-20 2001-12-27 Kanebo, Limited Radiation shielding material
JP2003084066A (en) 2001-04-11 2003-03-19 Nippon Kessho Kogaku Kk Component for radiation detector, radiation detector, and radiation-detection unit
US6519313B2 (en) * 2001-05-30 2003-02-11 General Electric Company High-Z cast reflector compositions and method of manufacture
JP2003028986A (en) 2001-07-12 2003-01-29 Mitsubishi Plastics Ind Ltd Radiation shield material
US7211801B2 (en) * 2002-09-18 2007-05-01 Koninklijke Philips Electronics, N.V. Radiation detector
US7112799B2 (en) * 2002-09-18 2006-09-26 Koninklijke Philips Electronics N.V. X-ray detector with a plurality of detector units
US7379528B2 (en) * 2003-01-06 2008-05-27 Koninklijke Philips Electronics N.V. Radiation detector with shielded electronics for computed tomography
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Also Published As

Publication number Publication date
US20140321609A1 (en) 2014-10-30
EP2751595B1 (en) 2017-07-05
JP2015503096A (en) 2015-01-29
RU2014126371A (en) 2016-01-27
CN103959098A (en) 2014-07-30
BR112014012699A8 (en) 2017-06-20
WO2013080105A3 (en) 2013-12-27
BR112014012699A2 (en) 2017-06-13
WO2013080105A2 (en) 2013-06-06
EP2751595A2 (en) 2014-07-09
CN103959098B (en) 2017-04-26
US9599728B2 (en) 2017-03-21
RU2605520C2 (en) 2016-12-20
JP6114300B2 (en) 2017-04-12

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