JP6114300B2 - Ｘ線検出器アレイ及びｃｔスキャナ - Google Patents

Ｘ線検出器アレイ及びｃｔスキャナ Download PDF

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Publication number
JP6114300B2
JP6114300B2 JP2014542978A JP2014542978A JP6114300B2 JP 6114300 B2 JP6114300 B2 JP 6114300B2 JP 2014542978 A JP2014542978 A JP 2014542978A JP 2014542978 A JP2014542978 A JP 2014542978A JP 6114300 B2 JP6114300 B2 JP 6114300B2
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Japan
Prior art keywords
ray
scintillator
detector array
ray detector
sealing portion
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Expired - Fee Related
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JP2014542978A
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Japanese (ja)
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JP2015503096A (ja
Inventor
レヴィン，シムハ
フェーン，ニコラース ヨーハネス アントニユス ファン
フェーン，ニコラース ヨーハネス アントニユス ファン
グレゴリアン，レヴ
ラート，アントニユス ウィルヘルミュス マリア デ
ラート，アントニユス ウィルヘルミュス マリア デ
フランシスキュス コルネリス マリア レイテン，ヘラルデュス
フランシスキュス コルネリス マリア レイテン，ヘラルデュス
ゴーシェン，ラファエル
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Koninklijke Philips NV
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G01T1/2019—Shielding against direct hits

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Radiology & Medical Imaging (AREA)
  • Immunology (AREA)
  • Theoretical Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pulmonology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Conversion Of X-Rays Into Visible Images (AREA)
JP2014542978A 2011-11-29 2012-11-23 Ｘ線検出器アレイ及びｃｔスキャナ Expired - Fee Related JP6114300B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161564407P 2011-11-29 2011-11-29
US61/564,407 2011-11-29
PCT/IB2012/056665 WO2013080105A2 (en) 2011-11-29 2012-11-23 Scintillator pack comprising an x-ray absorbing encapsulation and x-ray detector array comprising such scintillator pack

Publications (2)

Publication Number Publication Date
JP2015503096A JP2015503096A (ja) 2015-01-29
JP6114300B2 true JP6114300B2 (ja) 2017-04-12

Family

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JP2014542978A Expired - Fee Related JP6114300B2 (ja) 2011-11-29 2012-11-23 Ｘ線検出器アレイ及びｃｔスキャナ

Country Status (8)

Country Link
US (1) US9599728B2 (https=)
EP (1) EP2751595B1 (https=)
JP (1) JP6114300B2 (https=)
CN (1) CN103959098B (https=)
BR (1) BR112014012699A8 (https=)
IN (1) IN2014CN03832A (https=)
RU (1) RU2605520C2 (https=)
WO (1) WO2013080105A2 (https=)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
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US9748300B2 (en) 2013-09-05 2017-08-29 Koninklijke Philips N.V. Radiation detector element
WO2015186657A1 (ja) * 2014-06-06 2015-12-10 シャープ株式会社 半導体装置およびその製造方法
WO2016046013A2 (en) * 2014-09-25 2016-03-31 Koninklijke Philips N.V. Ceramic material for generating light
JP6671839B2 (ja) * 2014-10-07 2020-03-25 キヤノン株式会社 放射線撮像装置及び撮像システム
KR102624385B1 (ko) 2015-09-24 2024-01-11 프리스매틱 센서즈 에이비 모듈식 x선 검출기(modular x-ray detector)
CN109690351B (zh) 2016-09-23 2022-12-09 深圳帧观德芯科技有限公司 半导体x射线检测器的封装
EP3399344B1 (en) * 2017-05-03 2021-06-30 ams International AG Semiconductor device for indirect detection of electromagnetic radiation and method of production
CN109709594B (zh) * 2018-12-18 2020-12-11 北京纳米维景科技有限公司 闪烁屏封装结构制造方法、闪烁屏封装结构及影像探测器
CN111697109A (zh) * 2020-07-09 2020-09-22 上海大学 一种柔性x射线探测器的制备方法及系统

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JPH08122492A (ja) 1994-10-19 1996-05-17 Sumitomo Electric Ind Ltd 放射線遮蔽材及びその製造方法
DE69927241T2 (de) * 1998-10-28 2006-06-29 Philips Intellectual Property & Standards Gmbh Verfahren zur herstellung eines geschichteten szintillationsdetektorelements
JP2001099941A (ja) 1999-09-30 2001-04-13 Hitachi Metals Ltd 放射線遮蔽板、放射線検出器及び放射線遮蔽板の製造方法
US6298113B1 (en) * 2000-02-07 2001-10-02 General Electric Company Self aligning inter-scintillator reflector x-ray damage shield and method of manufacture
WO2001099119A1 (en) 2000-06-20 2001-12-27 Kanebo, Limited Radiation shielding material
JP2003084066A (ja) * 2001-04-11 2003-03-19 Nippon Kessho Kogaku Kk 放射線検出器用部品、放射線検出器および放射線検出装置
US6519313B2 (en) * 2001-05-30 2003-02-11 General Electric Company High-Z cast reflector compositions and method of manufacture
JP2003028986A (ja) 2001-07-12 2003-01-29 Mitsubishi Plastics Ind Ltd 放射線遮蔽材料
WO2004027454A1 (en) * 2002-09-18 2004-04-01 Koninklijke Philips Electronics N.V. X-ray detector with a plurality of detector units
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JP4833554B2 (ja) * 2003-01-06 2011-12-07 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 放射線検出器モジュールと該放射線検出器モジュールを用いたコンピュータ断層撮影用スキャナ、および放射線検出方法
JP2004219318A (ja) * 2003-01-16 2004-08-05 Hamamatsu Photonics Kk 放射線検出器
CN1751543B (zh) * 2003-02-20 2011-02-02 因普有限公司 集成的x射线源模块
JP4500010B2 (ja) * 2003-06-16 2010-07-14 株式会社日立メディコ Ｘ線検出器及びこれを用いたｘ線ｃｔ装置
RU2251124C1 (ru) * 2003-10-14 2005-04-27 ГОУ ВПО Уральский государственный технический университет-УПИ СЦИНТИЛЛЯЦИОННЫЙ ДАТЧИК ЭЛЕКТРОННОГО И β-ИЗЛУЧЕНИЯ
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JP2010096616A (ja) 2008-10-16 2010-04-30 Fujifilm Corp 放射線画像検出器
US8373132B2 (en) * 2009-02-06 2013-02-12 Koninklijke Philips Electronics N. V. Radiation detector with a stack of scintillator elements and photodiode arrays
WO2011089528A2 (en) 2010-01-22 2011-07-28 DenCT Ltd Methods and apparatus for multi-camera x-ray flat panel detector

Also Published As

Publication number Publication date
JP2015503096A (ja) 2015-01-29
EP2751595B1 (en) 2017-07-05
WO2013080105A2 (en) 2013-06-06
CN103959098A (zh) 2014-07-30
EP2751595A2 (en) 2014-07-09
RU2014126371A (ru) 2016-01-27
RU2605520C2 (ru) 2016-12-20
IN2014CN03832A (https=) 2015-07-03
US9599728B2 (en) 2017-03-21
BR112014012699A8 (pt) 2017-06-20
WO2013080105A3 (en) 2013-12-27
US20140321609A1 (en) 2014-10-30
BR112014012699A2 (pt) 2017-06-13
CN103959098B (zh) 2017-04-26

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